JP5823053B2 - 検知用途で使用する装置及び検知の用途を果たす方法 - Google Patents
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4412—Scattering spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
- G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Spectroscopy & Molecular Physics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
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Description
少なくとも1つを表すことを意図している。本明細書において用いられるときに、「〜を含む(include)」という用語は、限定はしないが、〜含む、を意味しており、「〜を含む〜(including)」という用語は、限定はしないが、〜を含む〜、を意味する。「〜に基づく」という用語は、少なくとも部分的に〜に基づく、を意味する。さらに、「光」という用語は、電磁スペクトルの可視部分の波長と、電磁スペクトルの赤外部分及び紫外部分を含む電磁スペクトルの不可視部分の波長と、を有する電磁スペクトルを指している。
Claims (14)
- 検知用途で使用する装置であって、該装置は、
開口部を有するキャビティを有する本体と、
前記キャビティ内に配置される複数のナノフィンガーと、
前記複数のナノフィンガーを保護するように前記キャビティにおける前記開口部を覆う容易に破壊可能なカバーと、を備え、
該容易に破壊可能なカバーは前記複数のナノフィンガーの利用を可能にするように破壊されることになり、
前記キャビティ及び前記容易に破壊可能なカバーを含む前記本体の部分は、被試験物質の中に入れられることになり、前記容易に破壊可能なカバーは前記被試験物質内で所定の時間内に分解する材料を含む、装置。 - 請求項1に記載の装置であって、前記複数のナノフィンガーはそれぞれの基部及び先端を含み、該装置は、
前記複数のナノフィンガーのそれぞれの先端に付着したラマン活性材料ナノ粒子を更に備える、請求項1に記載の装置。 - 前記複数のナノフィンガーは、前記本体の表面上に直接形成されるか、又は前記キャビティ内に配置される基板上に形成される、請求項1に記載の装置。
- 前記容易に破壊可能なカバーは前記キャビティの開口部の周囲の領域に、前記キャビティを気密封止するように取り付けられる、請求項1に記載の装置。
- 前記複数のナノフィンガーと前記容易に破壊可能なカバーとの間に間隙が設けられ、該間隙は、前記複数のナノフィンガーと実質的に相互作用しない充填材料で満たされる、請求項1に記載の装置。
- 前記被試験物質は燃料生成物を含む、請求項1に記載の装置。
- 前記複数のナノフィンガーと前記容易に破壊可能なカバーとの間に間隙が設けられ、該間隙は前記複数のナノフィンガーと実質的に相互作用しない充填材料で満たされる、請求項1に記載の装置。
- 前記複数のナノフィンガーのそれぞれは可撓性材料から構成され、前記複数のナノフィンガーの先端が互いに実質的に接触するように、前記複数のナノフィンガーは互いに向かって傾倒する、請求項1に記載の装置。
- 請求項1に記載の装置を作製する方法であって、該方法は、
前記キャビティを有する前記本体を得ることと、
前記本体の表面及び前記キャビティ内に配置される基板の少なくとも一方の上に前記複数のナノフィンガーを形成することと、
前記キャビティにおける前記開口部を前記容易に破壊可能なカバーで覆うことと、
を含む、方法。 - 前記キャビティにおける前記開口部を前記容易に破壊可能なカバーで覆う前に、前記複数のナノフィンガーの前記先端にラマン活性材料ナノ粒子を付着させることを更に含む、
請求項9に記載の方法。 - 前記キャビティにおける前記開口部を前記容易に破壊可能なカバーで覆うことは、前記キャビティを前記容易に破壊可能なカバーで気密封止することを更に含む、請求項9に記載の方法。
- 請求項9に記載の方法であって、
前記キャビティを前記容易に破壊可能なカバーで覆うことは、前記複数のナノフィンガーと前記容易に破壊可能なカバーとの間に間隙が設けられるように前記キャビティを覆うことを更に含み、該方法は、
前記間隙を前記複数のナノフィンガーと実質的に相互作用しない充填材料で満たすことを更に含む、請求項9に記載の方法。 - 開口部を有するキャビティを有する本体と、
前記キャビティ内に配置される複数のナノフィンガーと、
前記複数のナノフィンガーを保護するように前記キャビティにおける前記開口部を覆う容易に破壊可能なカバーと、
前記複数のナノフィンガーのそれぞれの先端に付着したラマン活性材料ナノ粒子と、
を備え、
該容易に破壊可能なカバーは前記複数のナノフィンガーの利用を可能にするように破壊されることになり、
前記複数のナノフィンガーはそれぞれの基部及び先端を含む、装置を用いて検知の用途を果たす方法であって、
前記容易に破壊可能なカバーは、被試験物質内で所定の時間内に溶解する材料を含み、該方法は、
前記装置の少なくとも一部を被試験物質の中に挿入することであって、前記被試験物質によって前記容易に破壊可能なカバーは溶解し、それにより、前記被試験物質を前記複数のラマン活性材料ナノ粒子に暴露することと、
前記検知装置を前記被試験物質から取り出すことと、
前記ラマン活性材料ナノ粒子上に、又はその付近に残る前記被試験物質の部分において検知の用途を果たすこととを含む、方法。 - 請求項13に記載の方法であって、
前記被試験物質は流体を含み、該方法は、
前記検知の用途を果たす前に、前記ラマン活性材料ナノ粒子から前記被試験物質を実質的に乾燥させることを更に含み、前記物質を乾燥させることによって、前記ラマン活性材料ナノ粒子が互いに向かって傾倒する、請求項13に記載の方法。
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PCT/US2011/057884 WO2013062540A1 (en) | 2011-10-26 | 2011-10-26 | Apparatus for use in a sensing application having a destructible cover |
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JP5823053B2 true JP5823053B2 (ja) | 2015-11-25 |
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US (1) | US20140218727A1 (ja) |
EP (1) | EP2771658B1 (ja) |
JP (1) | JP5823053B2 (ja) |
CN (1) | CN104011520B (ja) |
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CN108827928B (zh) | 2012-08-10 | 2021-12-24 | 浜松光子学株式会社 | 表面增强拉曼散射单元及其使用方法 |
US9863883B2 (en) | 2012-08-10 | 2018-01-09 | Hamamatsu Photonics K.K. | Surface-enhanced raman scattering element |
US9863884B2 (en) | 2012-08-10 | 2018-01-09 | Hamamatsu Photonics K.K. | Surface-enhanced Raman scattering element, and method for producing same |
WO2014025034A1 (ja) * | 2012-08-10 | 2014-02-13 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
USD740439S1 (en) | 2013-07-05 | 2015-10-06 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD740440S1 (en) | 2013-07-05 | 2015-10-06 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD733912S1 (en) | 2013-07-05 | 2015-07-07 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD739954S1 (en) | 2013-07-05 | 2015-09-29 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
KR101448111B1 (ko) * | 2013-09-17 | 2014-10-13 | 한국기계연구원 | 표면 증강 라만 분광용 기판 및 이의 제조방법 |
USD733911S1 (en) | 2013-12-30 | 2015-07-07 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
USD733913S1 (en) | 2013-12-30 | 2015-07-07 | Hamamatsu Photonics K.K. | Substrate for spectroscopic analysis |
CN107615048B (zh) | 2015-05-29 | 2020-08-21 | 浜松光子学株式会社 | 表面增强拉曼散射单元 |
US9494550B1 (en) * | 2015-06-05 | 2016-11-15 | Freescale Semiconductor, Inc. | Protected sensor field effect transistors |
WO2017082930A1 (en) | 2015-11-13 | 2017-05-18 | Hewlett-Packard Development Company, L.P. | Substance detection device |
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EP2771658A1 (en) | 2014-09-03 |
EP2771658A4 (en) | 2015-04-15 |
CN104011520A (zh) | 2014-08-27 |
WO2013062540A1 (en) | 2013-05-02 |
US20140218727A1 (en) | 2014-08-07 |
EP2771658B1 (en) | 2016-04-27 |
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CN104011520B (zh) | 2016-11-02 |
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