JP5817379B2 - Eyeglass frame shape measuring device - Google Patents

Description

  The present invention relates to a spectacle frame shape measuring apparatus that measures the shape of a rim of a spectacle frame and is suitable for measuring the shape of a template (including a demo lens).

  A spectacle frame holding mechanism for holding the spectacle frame in an expected state, and a probe inserted into a groove of the rim (lens frame) of the spectacle frame is moved along the groove of the rim, and the movement of the probe is detected. A spectacle frame shape measuring apparatus including a measuring mechanism for obtaining a three-dimensional shape of a rim is known. In recent years, high curve frames with large rim warping have increased. In order to accurately measure the rim of a high curve frame, the spectacle frame shape measuring device that traces the rim by tilting the tip of the probe (measurer axis) according to the height of the rim warp (vertical direction) Has been proposed (see, for example, Patent Documents 1 and 2).

JP 2001-174252 A JP 2011-122898 A

  In this type of spectacle frame shape measuring apparatus, a template (demo lens) can also be measured. In the measuring mechanism of the template, it is advantageous to use the measuring shaft for measuring the rim as a measuring shaft for contacting the edge of the template. However, in Patent Document 2 in which the tracing stylus axis is freely tilted, the side surface on which the tracing stylus axis does not tilt is in contact with the template, and the follow-up accuracy of the template trace is further improved. In this case, the mechanism of the apparatus becomes complicated, the size must be increased, and the control of the measurement pressure becomes complicated. The configuration in which the measurement axis for template tracing is provided exclusively makes the apparatus complicated and increases the cost.

  In view of the above-described conventional apparatus, the present invention enables high-accuracy measurement of a high curve frame, and also improves the accuracy of the template trace in the template measurement without complicating the configuration and increasing the cost. It is an object of the present invention to provide a spectacle frame shape measuring device that can be achieved.

In order to solve the above problems, the present invention is characterized by having the following configuration.
(1) A measuring unit that detects the moving position of a probe inserted in the rim groove of the spectacle frame and obtains the shape of the rim in the radial direction (XY direction) and the direction perpendicular to the radial direction (Z direction). A measuring element holding unit having the measuring element shaft to which the measuring element is attached, and holding the measuring element axis so as to be tiltable in a tip direction of the measuring element, and a moving means for moving the measuring element holding unit, In a spectacle frame shape measuring apparatus comprising a measurement unit having
Measurement mode selection means for selecting a rim measurement mode and a template measurement mode;
An inclination angle detecting means for detecting an inclination angle of the probe axis when measuring the template,
Calculation to obtain radial information of the template by controlling the moving means so that the back surface of the probe axis located on the opposite side of the probe in contact with the edge of the template in the template measurement mode a control means, in the middle measurement of the template, based on the measured information of said mold plate, and a calculation control means for tilting of the stylus shaft to control the moving means so as to maintain the vertical ,
The calculation control means corrects position information of the probe holding unit based on inclination information of the probe axis detected by the inclination angle detection means at the time of measuring the template, and radius information of the template It is characterized by calculating | requiring .
( 2 ) In the spectacle frame shape measuring apparatus according to (1) , a first measurement pressure applying mechanism for applying a measurement pressure so that the measuring element axis is inclined in a tip direction of the measuring element at the time of measuring a rim, and the template A second measurement pressure applying mechanism for applying a measurement pressure so that a back surface of the probe shaft is inclined toward the template when measuring, and a switching means for switching between the first measurement pressure applying mechanism and the second measurement pressure applying mechanism. It is characterized by providing.
( 3 ) In the spectacle frame shape measuring apparatus according to ( 1) or (2) , the moving means includes a rotating means for rotating the measuring element holding unit about the vertical axis, and the calculation control means includes: The radial information of the template is obtained based on positional information in the radial direction of the probe holding unit, rotation information of the rotating means, and inclination information of the probe axis.
( 4 ) A measuring element holding unit having a measuring element shaft to which the measuring element is attached, and a measuring element holding unit that tiltably holds the measuring element axis; and a moving unit that moves the measuring element holding unit; with inclined axis, while inserting the measuring element into the groove of the rim of the spectacle frame, the eyeglass frame shape-measuring apparatus comprising a measuring unit for obtaining the shape of the rim by detecting the movement position of the measurement piece, the mold plate Inclination angle detecting means for detecting the inclination angle of the tracing stylus axis at the time of measurement, and at the time of measuring the template, the back surface of the tracing stylus axis located on the opposite side of the tracing stylus is in contact with the template Calculation means for controlling the moving means to obtain the shape of the template, and the calculation control means moves the movement so that the inclination of the probe axis during the measurement of the template is suppressed. control means, measuring the mold plate Sometimes, based on the inclination information of the stylus shaft detected by the inclination angle detection means, and corrects the positional information of the measuring element holding unit and obtains the radius vector information of the template.

  According to the present invention, it is possible to improve the accuracy of the template trace without making the configuration complicated and costly even in the template measurement while enabling high-accuracy measurement of the high curve frame. .

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a schematic external view of a spectacle frame shape measuring apparatus. The spectacle frame shape measuring apparatus 1 includes a frame holding unit 100 that holds the spectacle frame F in an expected state, and a measuring element that is inserted into a groove of a rim of the spectacle frame held by the frame holding unit 100 to move the measuring element. And a measurement unit 200 that measures the three-dimensional shape of the rim (lens shape) by detecting. The cover of the measuring apparatus 1 has an opening window 2, and a frame holding unit 100 is disposed under the opening window 2. In addition, an attachment portion 300 for detachably attaching a template holder 310 used when measuring the template TP (or including a demo lens attached to a spectacle frame) is provided at the left and right center of the apparatus 1. It is arranged at the rear. The measurement unit 200 is also used as a template measurement unit for the measurement object TP attached to the template holder 310.

  A switch unit 4 having a measurement start switch and the like is disposed on the front side of the housing of the apparatus 1. A panel unit 3 having a touch panel display is disposed on the rear side of the casing of the apparatus 1. When processing the peripheral edge of the lens, lens layout data for the lens shape data, lens processing conditions, and the like are input by the panel unit 3. The three-dimensional shape data of the rim obtained by the apparatus 1 and the data input by the panel unit 3 are transmitted to the spectacle lens peripheral edge processing apparatus. In addition, the apparatus 1 is good also as a structure incorporated in a spectacles lens peripheral processing apparatus similarly to Unexamined-Japanese-Patent No. 2000-314617 etc.

  FIG. 2 is a top view of the frame holding unit 100 in a state where the eyeglass frame F is held. The left-right direction in FIG. 2 is the X direction, and the vertical direction is the Y direction. The radial direction of the rim of the spectacle frame F is the XY direction. A vertical direction orthogonal to the XY direction is taken as a Z direction. In the following, the vertical direction of the device 1 is the vertical direction (Z direction). FIG. 3 is a perspective view of the frame holding unit 100 in a state in which the template holder 310 is attached to the attachment portion 300.

  A measurement unit 200 is provided below the frame holding unit 100. A first slider 102 and a second slider 103 for holding the spectacle frame F substantially horizontally are placed on the holding unit base 101. The first slider 102 has a first surface 1021 that abuts the upper side in the vertical direction of the left rim RIL and the right rim RIR of the frame F. The second slider 103 has a second surface 1031 that contacts the lower side in the vertical direction of the left rim RIL and the right rim RIR. The first surface 1021 and the second surface 1031 face each other.

  The first surface 1021 of the first slider 102 and the second surface 1031 of the second slider 103 are opened and closed in the direction in which the distance between them is opened and closed (the direction in which the distance between the two is widened and the direction in which the distance between the two is narrowed). The mechanism 110 is held so as to be movable. The opening / closing movement mechanism 110 includes two guide rails 1101 arranged on the left and right of the holding unit base 101 and extending in the Y direction, two pulleys 1105 and 1107 arranged in the Y direction on the left side in FIG. A wire 1109 spanned between pulleys 1105 and 1107, and a spring 1110 (see FIG. 3) that constantly biases the first slider 102 and the second slider 103 in the closing direction. In FIG. 2, the right end portion 102E of the first slider 102 is attached to the left side of the wire, and the right end portion 103E of the second slider 103 is attached to the right side of the wire. With the opening / closing movement mechanism 110 having these configurations, the first slider 102 and the second slider 103 are centered on the center line FX between them, the direction in which the distance between the two increases, and the direction in which the distance between the two decreases. Is held movable. When one of the first slider 102 and the second slider 103 is moved, the other is also moved in conjunction.

  Next, the configuration of the measurement unit 200 will be described. FIG. 4 is a schematic configuration diagram of a moving mechanism in the XYZ directions that the measurement unit 200 has. The measurement unit 200 holds a base part 211 having a rectangular frame extending in the horizontal direction (XY direction), and a measuring element shaft 282 having a measuring element 281 inserted into the grooves of the rims RIL and RIR attached to the upper end. And a moving unit 210 that moves the measuring element holding unit 250 in the XYZ directions. The base part 211 is disposed under the frame holding unit 100. The moving unit 210 includes a Y moving unit 230 that moves the probe holding unit 250 in the Y direction, an X moving unit 240 that moves the Y moving unit 230 in the X direction, and a Z that moves the probe holding unit 250 in the Z direction. Mobile unit 220. The Y moving unit 230 includes a guide rail extending in the Y direction, and moves the probe holding unit 250 in the Y direction along the guide rail by driving the motor 235. The X moving unit 240 includes a guide rail 241 extending in the X direction, and moves the Y moving unit 230 in the X direction by driving a motor 245. The Z moving unit 220 is attached to the Y moving unit 230 and moves the probe holding unit 250 in the Z direction along the guide rail 221 extending in the Z direction by driving the motor 225.

  The configuration of the probe holding unit 250 will be described with reference to FIGS. The tracing stylus holding unit 250 holds the tracing stylus 281 so as to be movable in the vertical direction (Z direction) in which the tracing stylus 281 is attached. The tracing stylus shaft 282 is centered on a fulcrum set below the tracing stylus shaft 282. Is tilted in the tip direction of the probe 281 (hereinafter referred to as direction H) so as to be tiltable, and a rotation unit 260 that rotates the VH unit 280 about an axis LO extending in the Z direction. And comprising. The measuring element 281 has a needle-like tip shape. Thereby, the measuring element 281 is easily inserted into the groove of the rim even when the measuring element 281 is inclined.

  FIG. 5 is an overall perspective view of the probe holding unit 250. The rotation unit 260 includes a rotation base 261 that holds the VH unit 280 and a motor 265 that rotates the rotation base 261. The rotation base 261 that holds the VH unit 280 is held by the Z movement support base 222 so as to be rotatable about the axis LO. The Z movement support base 222 is guided by the guide rail 221 shown in FIG. 4 and is moved in the Z direction by the drive of the motor 225. The rotation base 261 is rotated around the axis LO through a rotation transmission mechanism such as a gear by driving the motor 265. The rotation angle of the rotation base 261 is detected by an encoder 266 attached to the rotation shaft of the motor 265.

  FIG. 6 is an explanatory diagram of the configuration of the VH unit 280. A guide shaft 263 extending in the Z direction is fixed to the lower surface of the flange 262 formed integrally with the rotation base 261. The Z movement support base 270 of the VH unit 280 is fixed to a cylindrical member 264 passed through the guide shaft 263. The VH unit 280 is held so as to be movable in the Z direction along the guide shaft 263 via the Z movement support base 270 and the cylindrical member 264. Further, the VH unit 280 is provided with a spring (biasing member) 267 between the flange 262 and the cylindrical member 264 in order to reduce the load or balance the load. The movement position in the Z direction of the VH unit 280 (the movement position in the Z direction with respect to the rotation base 261) is detected by an encoder 268 that is a position detector (see FIG. 7A).

  FIG. 7A is an explanatory diagram of the VH unit 280 in a state where the rotation base 261, the flange 262, and the like are removed, and is an explanatory diagram of the VH unit 280 viewed from the back side of the drawing with respect to FIG. FIG. 7B is an explanatory diagram of the VH unit 280 in a state in which the tracing stylus shaft 282 and the like are removed from FIG. 7A. The tracing stylus shaft 282 is held so as to be tiltable in the H direction about the axis S1 (fulcrum) via a bearing 271 held on the top of the Z movement support base 270. A rotation angle detection plate 283 is attached below the tracing stylus shaft 282 via an attachment member 284. The inclination angle (rotation angle) of the measuring element shaft 282 around the axis S1 in the H direction is detected by the encoder 285 that is a rotation angle detector via the rotation angle detection plate 283.

  Further, in order to limit the inclination of the measuring element 281 in the distal direction, a limiting member 291 that is in contact with the left end of the mounting member 284 is attached to the rotating plate 292 in FIG. Further, as shown in FIG. 6, a spring (biasing member) 290 as a first measurement pressure applying mechanism for applying a measurement pressure in the distal direction of the measuring element 281 includes a mounting plate 284, a cylindrical member 264, and the like. It is arranged between. A biasing force (measurement pressure) is always applied by the spring 290 so that the measuring element shaft 282 is inclined in the tip direction Hf of the measuring element 281. In the initial state at the time of measuring the rim, the attachment member 284 comes into contact with the limiting member 291 so that the inclination of the measuring element shaft 282 is limited in the state shown in FIG. This initial state is a state in which the probe axis 282 is inclined by a predetermined angle (2 degrees) in the direction Hf opposite to the tip direction of the probe 281 with respect to the vertical Z axis. The rotary plate 292 is pivotally supported below the Z movement support base 270 so as to be rotatable counterclockwise (in the direction of the arrow C1) on the fulcrum 292 in FIG. 7B. The clockwise rotation of the rotating plate 292 is restricted by a restricting member (not shown). The rotating plate 292 is always rotated clockwise in FIG. 7B by a spring (biasing member) 293 as a second measurement pressure applying mechanism arranged between the Z moving support base 270 and the rotating plate 292. An urging force (measurement pressure when measuring the template) is applied so as to rotate in the direction. The biasing force of the spring 293 is larger than the biasing force of the spring 290. Thereby, in the initial state when measuring the rim and the template TP, the tracing stylus shaft 282 maintains the state of FIG. However, when measuring the template TP, the back surface 282a of the probe shaft 282 (the surface located in the Hr direction opposite to the tip direction of the probe 281) is in contact with the edge of the template TP, and is further controlled by the control unit 50. When the VH unit 280 is moved in the Hr direction by the moving unit 210, the tracing stylus shaft 282 is inclined in the Hf direction with the axis S1 as a fulcrum. Due to the inclination of the tracing stylus shaft 282 in the Hf direction, the attachment member 284 positioned below the tracing stylus shaft 282 pushes the limiting member 291 and the rotating plate 292 is rotated in the direction of the arrow C1. At this time, a measurement pressure in the Hr direction is applied to the back surface 282 a of the probe shaft 282 by the spring 293. With such a configuration, the first measurement pressure application mechanism is switched to the second measurement pressure application mechanism during template measurement.

  The probe shaft 282 (the back surface 282a) is also used as a probe shaft to be brought into contact with the edge of the template TP. For this reason, the tracing stylus axis 282 is configured to be further tiltable by 2 to 5 degrees in the Hf direction with respect to the vertical direction (Z direction).

  FIG. 8 is a control block diagram of the apparatus 1. The control unit 50 is connected to the motors 225, 235, 245, 265, the encoders 268, 288, the panel unit 3, and the switch unit 4.

  Next, the operation of the apparatus 1 having the above configuration will be described. First, the measurement operation of the rim of the frame F will be described. A rim measurement mode and a template measurement mode can be selected by a measurement mode selection switch (measurement mode selection means) arranged in the switch unit 4. In addition, when the template holder 310 is attached to the attachment portion 300 as shown in FIG. 3 with the first slider 102 and the second slider 103 opened as shown in FIG. 3, the first slider 102 becomes the template holder. In contact with 310, the movement of the first slider 102 toward the front side (operator side) is restricted. When this state is detected by a detector (not shown), the measurement mode is automatically selected as the template measurement mode, and the first slider 102 and the second slider 103 are closed more than the state shown in FIG. The rim measurement mode may be automatically selected.

  In the rim measurement mode, when measuring the radial direction of the rim RIR, the control unit 50 determines the XY position to move the probe holding unit 250 based on the measured radial information of the lens frame, and determines the determined XY position. Accordingly, the driving of each motor of the moving unit 210 is controlled. Preferably, the control unit 50 predicts a change in the radius of the unmeasured portion of the lens frame based on the measured radius information of the lens frame, and the tip of the probe 281 moves along the change in the radius of the unmeasured portion. The XY position at which the probe holding unit 250 is moved so as to move is determined.

  Based on the measurement start signal input by the switch unit 4, the control unit 50 moves the probe holding unit 250 located at the initial position in the XYZ directions, and starts measuring the rim RIR held by the clamp pins 230a and 230b. The tip of the probe 281 is inserted into the groove (position cranked by the clamp pins 230a and 230b of the second slider 103). The insertion of the tip of the measuring element 281 into the groove of the rim RIR is detected by the encoder 285 detecting that the measuring element shaft 282 is inclined 5 degrees in the Hr direction.

  The control unit 50 moves the probe holding unit 250 in the X direction on the assumption that the moving radius of the rim RIR has changed in the X direction at the time of starting measurement. The probe shaft 282 is inclined so that the tip of the probe 281 is moved following the rim radius change. By detecting the inclination angle of the probe shaft 282 by the encoder 285, XY position information of the tip of the probe 281 with respect to the reference position of the probe holding unit 250 is obtained. Radial radius information of the rim is obtained from this XY position information and drive information of the motors 235 and 245 that move the probe holding unit 250 in the XY direction.

  When the control unit 50 obtains the radius information of a predetermined number of measurement points from the start of measurement (for example, the number of 5 points when measuring the whole 1000 points), the control unit 50 determines the next measurement point based on the measured radius information. A change in (unmeasured point) is predicted, and based on the result, the probe holding unit 250 is moved in the XY directions so that the probe 281 follows the rim RIR. Further, the control unit 50 controls the driving of the motor 265 and rotates the rotation base 261 to rotate the VH unit 280 about the axis LO. The rotation angle at this time is determined so that the tip direction of the probe 281 is in the normal direction with respect to the predicted rim radial change. Alternatively, the rotation angle is determined as a radial angle centered on a reference point at the start of measurement of the rim (a point on the center line FX in FIG. 2 in the Y direction of the measurement start point). Alternatively, the rotation angle is determined as an angle between the radius angle around the reference point at the start of measurement and the normal direction with respect to the radius change of the rim. By repeating this operation, the radius vector information of the entire rim is measured.

  Also, the position of the rim in the Z direction from the start of measurement follows the change of the rim in the Z direction, and the measuring element shaft 282 is moved in the Z direction together with the measuring element 281. By detecting the movement position of the tracing stylus shaft 282 in the Z direction by the encoder 268, Z position information of the tracing stylus shaft 282 with respect to the reference position of the tracing stylus holding unit 250 is obtained. The Z position information of the rim is obtained from the Z position information and the drive information of the motor 225 that moves the probe holding unit 250 in the Z direction.

  When the control unit 50 obtains the Z position information of a predetermined number of measurement points (5 points) from the start of measurement, the control unit 50 changes the Z position change of the next measurement point (unmeasured point) based on the measured Z position information. Based on the prediction, the measuring element holding unit 250 is moved in the Z direction so that the measuring element 281 follows the rim. In addition, when the rim is warped upward from the measurement start point (when the Z position of the unmeasured point is higher in the upward direction), the control unit 50, depending on the height of the Z position, The probe holding unit 250 is moved XY so that the probe axis 282 is greatly inclined in the Hr direction. Thereby, the direction of the tip of the measuring element 281 is inclined according to the inclination of the rim RIR. For this reason, even when measuring the rim of the high curve frame, the measuring element 281 is not easily detached from the rim, and the high curve frame can be measured with high accuracy. By repeating this operation, the Z position information of the entire rim is measured.

  Next, the measurement operation of the template TP will be described. The operator attaches the template holder 310 to the attachment unit 300 in a predetermined state, and then selects the template measurement mode with the switch of the switch unit 4 (or automatically selects the template measurement mode) to perform measurement. The measurement of the pattern object TP is started by pressing the start switch. The control unit 50 moves the probe holding unit 250 located in the initial position in the XY directions so that the edge position of the template TP on the center line LX (see FIG. 2) is the measurement start point. Further, at the measurement start point, the control unit 50 controls the rotation unit 260 so that the back surface 282a of the probe shaft 282 positioned in the direction opposite to the tip of the probe 281 (Hr direction) faces the edge of the template TP. The driving of the motor 265 is controlled, and the probe holding unit 250 is rotated.

  Note that the VH unit 280 is positioned at the lowest point with respect to the probe holding unit 250 in the initial state, and the Z position of the VH unit 280 is the center height of the template TP held by the template holder 231 and the probe axis 282. Is set to be a predetermined distance (40 mm) from the distance of the axis S1, which is the center of inclination.

When the tracing stylus holding unit 250 moves toward the template TP, the back surface 282a of the tracing stylus shaft 282 contacts the edge of the template TP, and when the tracing stylus holding unit 250 is further moved to the template TP, The probe axis 282 is inclined in the Hf direction against the urging force of 293. The inclination angle of the tracing stylus shaft 282 in the Hf direction is detected by the encoder 285. When the tracing stylus axis 282 is in the vertical direction (when it coincides with the Z direction), the control unit 50 stops the movement of the tracing stylus holding unit 250 toward the template TP, and starts measurement from this point.

  When measuring the template TP, the control unit 50 determines the XY position of the probe holding unit 250 and the rotation unit 260 so that the probe axis 282 is positioned in the vertical direction based on the measured radius information of the template TP. And the driving of the moving unit 210 and the rotating unit 260 is controlled. Preferably, the control unit 50 predicts a change in the radius of the unmeasured portion of the template TP based on the measured radius information of the template TP, and the probe axis 282 along the radius change of the unmeasured portion. XY position of the tracing stylus holding unit 250 and the rotation angle of the rotation unit 260 are determined so as to move while maintaining vertical.

  The control unit 50 moves the tracing stylus holding unit 250 in the Y direction on the assumption that the moving radius of the template TP has changed in the Y direction at the start of measurement. If the actual moving radius of the template TP changes with respect to the direction in which the radial radius of the template TP is planned (Y direction at the start of measurement), the tracing stylus shaft 282 follows the change and moves in the H direction. It is inclined in the (Hr or Hf direction) and deviates from the vertical direction. The inclination angle of the probe shaft 282 with respect to the vertical direction is detected by the encoder 285. When the tracing stylus axis 282 is kept vertical, the radius vector information of the template TP is obtained as XY position information of the tracing stylus holding unit 250, but the tracing stylus axis 282 is tilted with respect to the vertical direction. If so, correct that amount.

When the inclination angle of the tracing stylus axis 282 with respect to the vertical direction is α, and the distance from the center of the template plate to the tilting center of the tracing stylus axis 282 (axis S1) is L, the radius correction amount ΔR of the radial radius is
ΔR = L × sinα
Sought by. This calculation is performed by the control unit 50. The control unit 50 obtains radius vector information of the template TP based on this correction calculation and drive information of the motors 235 and 245 that move the probe holding unit 250 in the XY direction.

  Note that the point at which the template TP and the back surface 282a of the tracing stylus shaft 282 are in contact with each other is slightly shifted according to the difference in thickness of the template TP (difference in the height position of the edge of the demo lens). Therefore, practical accuracy is ensured.

When the radius information of a predetermined number of measurement points (5 points) is obtained from the start of measurement, the control unit 50 predicts the change of the next measurement point (unmeasured point) based on the measured radius information. Based on the result, the tracing stylus holding unit 250 is moved in the XY directions so that the tracing stylus axis 282 is kept vertical and along the edge of the template TP. Further, the control unit 50 controls the driving of the motor 265 to rotate the rotation base 261 and rotate the VH unit 280. The rotation angle at this time is determined so that the back surface 282a of the tracing stylus shaft 282 is in the normal direction with respect to the radius of the template TP. Alternatively, the rotation angle is determined as a radius vector angle based on the holding center of the template holder 310. Alternatively, the rotation angle is determined as an angle between the radial angle with respect to the holding center of the template holder 310 and the normal direction with respect to the rim radial change. By repeating such an operation, the radius vector information of the entire circumference of the template TP is measured.

  During template measurement, the control unit 50 determines that the inclination angle of the probe shaft 282 detected by the encoder 285 is out of a specified range (for example, 0.5 degrees) with respect to the vertical direction. It is determined that the shape cannot be traced, template measurement is stopped, and a warning device (display 3) warns that effect. The shape that cannot be traced is unevenness having a diameter smaller than the radius of the probe axis 282.

  As described above, in order to accurately measure the rim RIR (RIL) of the high curve frame, the back surface 282a (measurement) of the tracing stylus axis 282 can be achieved even in the configuration in which the tracing stylus axis 282 is inclined according to the height of the rim. By using the measurement surface that contacts the edge of the template TP with the surface opposite to the tip of the child 281 as the measurement surface, the movement mechanism and detection mechanism for rim measurement are shared, and the accuracy of the template trace is improved. Can be achieved. In addition, since it is not necessary to provide a dedicated measurement axis for tracing the template, it is possible to avoid a complicated configuration and an increase in cost.

1 is a schematic external view of a spectacle frame shape measuring apparatus. It is a top view of a frame holding unit. It is a perspective view of the frame holding unit in a state where the template holder 310 is attached to the attachment portion. It is a schematic block diagram of the moving mechanism of an XYZ direction. It is a whole perspective view of a measuring element holding unit. It is explanatory drawing of a structure of a vertical inclination holding | maintenance unit. It is explanatory drawing of a structure of a vertical inclination holding | maintenance unit. It is a control block diagram of an apparatus.

DESCRIPTION OF SYMBOLS 50 Control part 100 Frame holding unit 200 Measuring unit 210 Moving unit 250 Measuring element holding unit 260 Rotating unit 280 Vertical inclination holding unit 281 Measuring element 282 Measuring element axis 282a Back surface 285 Encoder

Claims (4)

A measurement unit that detects a moving position of a probe inserted in a groove of a rim of a spectacle frame and obtains a shape in a radial direction (XY direction) of the rim and a direction perpendicular to the radial direction (Z direction), A measuring instrument having a measuring element shaft to which a measuring element is attached, and a measuring element holding unit that holds the measuring element axis so as to be tiltable in a tip direction of the measuring element, and a moving unit that moves the measuring element holding unit. In a spectacle frame shape measuring apparatus including a unit,
Measurement mode selection means for selecting a rim measurement mode and a template measurement mode;
An inclination angle detecting means for detecting an inclination angle of the probe axis when measuring the template,
Calculation to obtain radial information of the template by controlling the moving means so that the back surface of the probe axis located on the opposite side of the probe in contact with the edge of the template in the template measurement mode a control means, in the middle measurement of the template, based on the measured information of said mold plate, and a calculation control means for tilting of the stylus shaft to control the moving means so as to maintain the vertical ,
The calculation control means corrects position information of the probe holding unit based on inclination information of the probe axis detected by the inclination angle detection means at the time of measuring the template, and radius information of the template spectacle frame shape measuring apparatus and obtaining the. In the spectacle frame shape measuring apparatus according to claim 1,
A first measurement pressure applying mechanism for applying a measurement pressure so that the measuring element shaft is inclined toward the tip of the measuring element at the time of measuring the rim; and a back surface of the measuring element axis on the template side when measuring the template An eyeglass frame shape measuring apparatus comprising: a second measurement pressure applying mechanism that applies a measurement pressure so as to incline; and a switching unit that switches between the first measurement pressure applying mechanism and the second measurement pressure applying mechanism. 3. The spectacle frame shape measuring apparatus according to claim 1 , wherein the moving means includes rotating means for rotating the measuring element holding unit about the vertical axis, and the calculation control means includes the measuring element holding unit. The eyeglass frame shape measuring apparatus is characterized in that the radial information of the template is obtained on the basis of position information in the radial direction, rotational information of the rotating means, and inclination information of the measuring element shaft. A measuring element holding unit having a measuring element shaft to which the measuring element is attached, and holding the measuring element axis in a tiltable manner; and a moving means for moving the measuring element holding unit; and the inclination of the measuring element axis In the spectacle frame shape measuring apparatus comprising a measuring unit that detects the moving position of the measuring element while inserting the measuring element into the groove of the rim of the spectacle frame using
An inclination angle detecting means for detecting an inclination angle of the probe axis when measuring the template,
An arithmetic control means for controlling the moving means to obtain the shape of the template by bringing the back surface of the probe axis located on the opposite side of the probe into contact with the template when measuring the template; With
The arithmetic control means controls the moving means so that the inclination of the probe axis during measurement of the template is suppressed, and the measurement element detected by the inclination angle detection means at the time of measuring the template. A spectacle frame shape measuring apparatus, wherein the radial information of the template is obtained by correcting position information of the probe holding unit based on axis inclination information .

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