JP6319627B2 - Eyeglass lens peripheral shape measuring apparatus and spectacle lens peripheral shape measuring method - Google Patents

Description

  The present invention relates to a spectacle lens peripheral shape measuring apparatus for measuring a bevel peripheral length formed on a peripheral edge (edge) of a processed spectacle lens and a spectacle lens peripheral shape measuring program executed in the spectacle lens peripheral shape measuring apparatus.

  In spectacle lens processing, a spectacle lens is held by a pair of lens chuck shafts, and a processing tool such as a grindstone attached to a processing tool rotation shaft parallel to the lens chuck shaft is connected to the lens chuck shaft and the processing tool rotation shaft. By changing the distance between the axes, the peripheral edge of the lens is processed based on the target lens shape. At this time, in flat finishing or beveling, the edge surface of the lens (or the normal direction in which the bevel ridges face) is fixedly formed at an angle substantially parallel to the lens chuck shaft (Patent Document). 1).

  In recent years, as represented by a high-curve lens, an eyeglass lens processing apparatus that performs peripheral processing so as to incline the edge surface of the lens according to the curve shape of the lens has been proposed (see Patent Document 2). This is because, in a lens such as a high curve lens, when the edge surface (or the normal direction in which the crest of the bevel faces) is parallel to the lens chuck axis, the fit to the lens frame may be deteriorated. Because.

  Further, in order to confirm whether the bevel formed on the edge surface conforms to the frame shape of the spectacle frame, the bevel is brought into contact with a probe having a V groove at the apex of the bevel formed on the edge surface of the lens. A bevel circumference measuring device for measuring the circumference of a vertex and a three-dimensional shape has been proposed (see Patent Document 3).

JP 2008-254078 A JP 2014-50891 A International Publication WO2009 / 123143

  However, in the conventional apparatus such as Patent Document 3, the edge surface (or normal direction in which the bevel peak faces) of the base of the bevel (also called the bevel shoulder) is greatly inclined with respect to the lens chuck shaft. Because the probe did not contact the bevel apex correctly, it was difficult to accurately measure the bevel position. When the bevel position measurement is inaccurate, the bevel circumference value based on the bevel is also inaccurate, and the pass / fail judgment of the processed lens cannot be performed accurately.

  An object of the present invention is to provide a spectacle lens peripheral shape measuring apparatus and a spectacle lens peripheral shape measuring program capable of more accurately measuring the bevel peripheral length formed on the edge of a processed lens.

(1) A spectacle lens peripheral shape measuring device provided by a typical embodiment of the present disclosure is brought into contact with a lens holding unit having a holding shaft for holding a processed lens, and a bevel formed on the edge of the processed lens. A spectacle lens peripheral shape measuring apparatus for measuring a bevel circumference of a processed lens by detecting a movement position of the measuring element, the measuring element having a groove with respect to the holding shaft. An inclination means for relatively inclining, an inclination angle acquiring means for acquiring at least one inclination angle in a direction in which the edge surface and the bevel of the processed lens face the axial direction of the holding shaft, and the inclination angle acquiring means. Based on the tilt angle, the tilting means is controlled to tilt the probe relative to the holding shaft for each radial angle of the processed lens, and the bevel circumference of the processed lens is controlled. And a measurement control means for measuring the length.
(2) A spectacle lens peripheral shape measurement program provided by a typical embodiment of the present disclosure is brought into contact with a lens holding unit having a holding shaft that holds a processed lens, and a bevel formed on the edge of the processed lens. Eyeglasses comprising a measuring element having a groove and an inclination means for inclining the measuring element relative to the holding shaft, and measuring a bevel circumference of the processed lens by detecting a moving position of the measuring element A spectacle lens periphery shape measurement program executed in a control device for controlling the operation of the lens periphery shape measuring device, wherein the inclination angle of at least one of the edge surface of the processed lens and the beveled direction with respect to the axial direction of the holding shaft Inclination angle acquisition step for acquiring the inclination angle, and based on the acquired inclination angle, the measuring element is inclined relative to the holding axis for each radial angle of the processed lens. And a measurement control step of measuring the bevel circumference of the processed lens by controlling the tilting means.

  According to the present invention, the bevel circumference formed on the edge of the processed lens can be measured more accurately.

1 is a schematic external view of a spectacle lens peripheral shape measuring apparatus. It is a reference diagram showing an example of a spectacle lens periphery processing device. It is a figure which shows the structural example of a lens holding unit. It is a schematic block diagram of the moving mechanism of the measurement unit of the XYZ direction. It is a figure which shows the structural example of the measuring element holding | maintenance unit 0. FIG. It is explanatory drawing of a structure of a VH unit. It is explanatory drawing of a structure of a VH unit. It is a control block diagram of a spectacle lens periphery shape measuring device. It is a figure explaining the measurement operation | movement of the spectacle lens peripheral shape measuring apparatus. It is a figure which shows the acquired tip center data and the measurement result of an edge surface (mountain peak). It is a flowchart of the measurement control program of edge surface shape measurement. It is explanatory drawing of the inclination operation | movement of a measuring element axis | shaft at the time of a bevel circumference measurement. It is a flowchart of the measurement control program of a bevel circumference measurement.

  Hereinafter, typical embodiments according to the present invention will be described. FIG. 1 is a schematic external view of a spectacle lens peripheral shape measuring apparatus 1 (hereinafter abbreviated as a measuring apparatus 1).

  In FIG. 1, a measuring apparatus 1 includes a lens holding unit 300 configured to hold a processed lens PLE, a measuring unit 200 configured to measure a spectacle lens peripheral shape, and various data and command signals. An input unit 3 configured to input data and a switch unit 4 having a measurement start switch and the like are provided. The input unit 3 is composed of a display having a touch panel function, for example. Various setting data can be input by the input unit 3. The measuring apparatus 1 is connected to a spectacle lens peripheral edge processing apparatus 1000 (hereinafter abbreviated as a processing apparatus 1000) by a communication cable (or wireless communication) 1002 so as to be communicable. Further, the measuring apparatus 1 is connected to the processing apparatus 1000 via a communication means (for example, a communication cable or wireless communication) 1002 so as to be communicable. The communication unit 1002 is also an example of the input unit 3.

  In FIG. 1, in this embodiment, the left-right direction toward the measuring device 1 is the X direction, the front-back direction of the measuring device 1 is the Y direction, and the up-down direction of the measuring device 1 (vertical direction orthogonal to the XY direction) is Z. The direction. An axis (AXIS) A1 of the holding shaft of the lens holding unit 300 that holds the processed lens PLE extends in the Z direction.

  FIG. 2 is a reference diagram illustrating an example of the processing apparatus 1000, and is an example of an apparatus disclosed in Japanese Patent Application Laid-Open No. 2014-50891, for example. In FIG. 2, the spectacle lens LE is held by a pair of lens chuck shafts 22R and 22L via a cup PCU (not shown in FIG. 2) which is a processing jig. The cup PCU is attached to the front surface of the lens LE by a known cup attachment device, and the base of the cup PCU is attached to the cup holder of the lens chuck shaft 22L. The peripheral edge of the lens LE held by the lens chuck shafts 22R and 22L is a rough processing tool 60a attached to the processing tool rotating shaft 40a and a finishing tool 65a attached to the processing tool rotating shaft 45a, and has a bevel finish groove. And a finishing tool 65a having a flat processed surface. In addition, the processing apparatus 1000 has an axis angle changing mechanism that changes the relative axis angles of the lens chuck shafts 22R and 22L with respect to the processing tool rotation shafts 40a and 65a. In the processing apparatus 1000, the peripheral edge (edge surface) of the lens LE is processed not only in parallel to the lens chuck shafts 22R and 22L but also at a free angle with respect to the lens chuck shafts 22R and 22L. .

  FIG. 3 is a diagram illustrating a configuration example of the lens holding unit 300. The lens holding unit 300 includes an arm 301 that extends forward from the rear of the apparatus 1. A shaft (holding shaft) 313 for holding the processed lens PLE is attached to the front side of the arm 301 so as to extend in the Z direction. The processed lens PLE is held by the shaft 313 so that an axis (AXIS) A1 that is the central axis of the shaft 313 passes through the front surface and the rear surface of the processed lens PLE. For example, the processed lens PLE is a lens processed by the processing apparatus 1000 illustrated in FIG. 2, and a cup PCU used when processing the processing apparatus 1000 is attached to the front surface of the processed lens PLE. A cup holder 315 to which a cup PCU can be attached is attached to the shaft 313. By attaching the cup PCU to the cup holder 315, the processed lens PLE is held by the lens holding unit 300. Then, the processed lens PLE is held by the lens holding unit 300 so that the center axis of the cup PCU coincides with the axis A1 of the lens holding unit 300, whereby a processing reference axis (lens chuck shaft 22R) in the processing apparatus 1000 is obtained. 22L) and the reference axis at the time of measurement of the measuring apparatus 1 correspond to each other.

  Next, a configuration example of the measurement unit 200 will be described. FIG. 4 is a schematic configuration diagram of a moving mechanism in the XYZ directions that the measurement unit 200 has. The measuring unit 200 includes a base portion 211 having a rectangular frame extending in the horizontal direction (XY direction), a measuring element holding unit 250 that holds at least one of the measuring element 281 and the measuring element 286 (see FIG. 5), A moving unit 210 that moves the probe holding unit 250 relative to the processed lens PLE. A probe 281 (stylus) is used to contact the edge of the processed lens PLE. A probe 286 (stylus) is used to contact the bevel formed on the processed lens PLE during the bevel circumference measurement. In a typical embodiment, the measuring element shaft 282 is held by the measuring element holding unit 250, and the measuring element 281 and the measuring element 286 are attached to the measuring element shaft 282. The measuring element 286 is used when measuring the bevel circumference, and when the bevel circumference measurement is not performed, the measuring element 286 may be omitted. On the contrary, when the edge surface shape of the processed lens PLE is not measured, the probe 281 may be omitted. The moving unit 210 moves the probe 281 and the like relative to the processed lens PLE held by the lens holding unit 300.

  In the exemplary embodiment, the moving unit 210 includes a Y moving unit 230 that moves the probe holding unit 250 in the Y direction, an X moving unit 240 that moves the Y moving unit 230 in the X direction, and a probe holding unit 250. And a Z moving unit 220 for moving the Z in the Z direction. The Y moving unit 230 includes a guide rail extending in the Y direction, and moves the probe holding unit 250 in the Y direction along the guide rail by driving the motor 235. The X moving unit 240 includes a guide rail 241 extending in the X direction, and moves the Y moving unit 230 in the X direction by driving a motor 245. The Y moving unit 230 and the X moving unit 240 constitute a moving direction moving unit that moves the probe holding unit 230 in the moving direction of the lens PLE. The Z moving unit 220 is attached to the Y moving unit 230 and moves the probe holding unit 250 in the Z direction along the guide rail 221 extending in the Z direction by driving the motor 225.

  In an exemplary embodiment, the X moving unit 240 and the Y moving unit 230 move the stylus holding unit 250 relatively in the radial direction of the processed lens PLE, and the periphery of the processed lens PLE. And a second moving unit that relatively moves the probe holding unit 250 along the direction. As another example of the second moving unit, the shaft 313 of the lens holding unit 300 may be rotated around the axis A1 by a motor or the like. In this case, the first moving unit in the radial direction only needs to have one of the X moving unit 240 or the Y moving unit 230.

  A configuration example of the probe holding unit 250 will be described with reference to FIGS. The tracing stylus holding unit 250 holds the tracing stylus shaft 282 so as to be movable in the vertical direction (Z direction) and also holds the tracing stylus shaft 282 so as to be movable in the distal direction of the tracing stylus 281 and 286. A unit (hereinafter referred to as a VH unit) 280, and a rotation unit 260 that rotates the VH unit 280 about an axis LO extending in the Z direction. In the following embodiments, the movement, inclination and rotation of the measuring element shaft 282 are handled as including the movement, inclination and rotation of the measuring element 281 and the measuring element 286 directly.

  In this embodiment, the VH unit 280 has the direction of the tip of the measuring element 281 and the groove direction of the measuring element 286 (the direction of the bisector of the opening angle Vk1 of the V groove 286a) through the measuring element shaft 282 as the axis A1. A tilting mechanism 272 that tilts relative to each other is provided. For example, the VH unit 280 tilts the probe shaft 282 in the tip direction Hf and the rear end direction Hr (hereinafter referred to as H direction) of the probe 281 and 286 with the fulcrum set below the probe shaft 282 as the center. It is configured to let you.

  The measuring element 281 has, for example, a needle-like rod shape. The tip shape of the measuring element 281 is, for example, a hemispherical surface 281Ra. The radius ra of the hemispherical surface 281Ra centered on the spherical center 281CO is, for example, 0.5 mm (see FIG. 6). However, the tip shape of the probe 281 is not limited to the hemispherical surface 281Ra. Further, in measuring the edge surface shape of the processed lens PLE in the direction of the axis A1, there may be no mechanism for inclining the tracing stylus shaft 282. In this case, the tracing stylus shaft 282 may be arranged in the Z direction, and the tracing stylus 281 may be a plate member parallel to the XY direction, with the tip formed in a circular shape.

  FIG. 5 is an overall perspective view of the probe holding unit 250. The rotation unit 260 includes a rotation base 261 that holds the VH unit 280 and a motor 265 that rotates the rotation base 261. The rotation base 261 is held by the Z movement support base 222 so as to be rotatable about an axis (Axis) LO extending in the Z direction. The Z movement support base 222 is guided by the guide rail 221 shown in FIG. 4 and is moved in the Z direction by the drive of the motor 225. The rotation base 261 is rotated around the axis LO through a rotation transmission mechanism such as a gear by driving the motor 265. The rotation angle of the rotation base 261 is detected by an encoder 266 attached to the rotation shaft of the motor 265. By rotating the rotation base 261, the orientations of the tips of the measuring element 281 and the measuring element 286 are changed so as to face the edge surface of the processed lens PLE.

  6 and 7 are explanatory diagrams of the configuration of the VH unit 280. FIG. A guide shaft 263 extending in the Z direction is fixed to the lower surface of the flange 262 formed integrally with the rotation base 261. The Z movement support base 270 of the VH unit 280 is fixed to a cylindrical member 264 passed through the guide shaft 263. The VH unit 280 is held so as to be movable in the Z direction along the guide shaft 263 via the Z movement support base 270 and the cylindrical member 264. Further, the VH unit 280 is provided with a spring (biasing member) 267 between the flange 262 and the tubular member 264 in order to reduce or balance the load. The movement position in the Z direction of the VH unit 280 (measuring elements 281 and 286) relative to the reference position of the rotary base 261 is detected by an encoder 268 which is an example of a position detector (see FIG. 7A).

  FIG. 7A is an explanatory diagram of the VH unit 280 in a state where the rotation base 261, the flange 262, and the like are removed, and is an explanatory diagram of the VH unit 280 viewed from the back side of the drawing with respect to FIG. FIG. 7B is an explanatory diagram of the VH unit 280 in a state in which the tracing stylus shaft 282 and the like are removed from FIG. 7A.

  The probe shaft 282 can be inclined in the H direction (the tip direction Hf and the rear end direction Hr of the probe 281) about the shaft (shaft) S1 via a bearing 271 held on the upper portion of the Z movement support base 270. , VH unit 280. That is, the measuring element 281 and the measuring element 286 are held by the VH unit 280 (the measuring element holding unit 250) so as to be able to be inclined relative to the axis A1. A rotation angle detection plate 283 is attached below the tracing stylus shaft 282 via an attachment member 284. The inclination angle (rotation angle) of the measuring element shaft 282 around the axis S1 in the H direction is detected by the encoder 285, which is an example of a rotation angle detector, via the rotation angle detection plate 283.

  Further, in order to limit the inclination of the probe shaft 282, a limiting member 291 that is in contact with the left end of the mounting member 284 is attached to the rotating plate 292 in FIG. Further, as shown in FIG. 6, a spring (biasing member) 290 as a first measurement pressure applying mechanism for applying a measurement pressure in the distal direction of the measuring element 281 includes a mounting plate 284, a cylindrical member 264, and the like. It is arranged between. A biasing force (measurement pressure) is always applied by the spring 290 so that the measuring element shaft 282 is inclined in the tip direction Hf of the measuring element 281.

  In the initial state when measuring the edge surface of the lens or the like, the attachment member 284 comes into contact with the limiting member 291 so that the inclination of the tracing stylus shaft 282 is limited in the state shown in FIG. This initial state is a state in which the measuring element shaft 282 is inclined by a predetermined angle (for example, 2 degrees) in the direction Hf opposite to the tip direction of the measuring element 281 with respect to the vertical Z axis. The rotary plate 292 is pivotally supported below the Z movement support base 270 so as to be rotatable counterclockwise (in the direction of the arrow C1) on the fulcrum 292 in FIG. 7B. The clockwise rotation of the rotating plate 292 is restricted by a restricting member (not shown). The rotating plate 292 is always rotated clockwise in FIG. 7B by a spring (biasing member) 293 which is an example of a measurement pressure applying mechanism disposed between the Z moving support base 270 and the rotating plate 292. An urging force (measurement pressure) is applied to rotate in the direction. The biasing force of the spring 293 is larger than the biasing force of the spring 290. Thereby, in the initial state at the time of measurement of the lens periphery, the tracing stylus shaft 282 maintains the state of FIG.

  The tilt mechanism 272 configured to tilt the probe shaft 282 includes a spring 290 disposed in the VH unit 280, a moving unit 210 that moves the probe holding unit 250, and the like in a typical embodiment. In this state, the probe holding unit 250 is further moved to the lens PLE side (axis A1 direction) in a state where the probe 286 is in contact with the bevel of the lens PLE. However, as the tilting mechanism 272, the measuring element 286 is not limited to the lens PLE, and a driving unit (for example, a motor) that applies a driving force for forcibly tilting the measuring element shaft 282 with the axis S1 as a fulcrum. ) May be provided in the VH unit 280 or the measurement unit 200. The configuration of the tilt mechanism 272 is not limited to a typical embodiment, and various modifications are possible.

  When measuring only the radial length of the processed lens PLE with respect to the axis A1, the back surface 282a of the probe shaft 282 (a surface located in the Hr direction opposite to the tip direction of the probe 281) is used. Is done. When the back surface 282a of the probe shaft 282 is brought into contact with the periphery of the lens PLE, and the VH unit 280 is moved in the Hr direction by the moving unit 210 controlled by the control unit 50, the probe shaft 282 moves the axis S1. It is inclined in the Hf direction as a fulcrum. Due to the inclination of the tracing stylus shaft 282 in the Hf direction, the attachment member 284 positioned below the tracing stylus shaft 282 pushes the limiting member 291 and the rotating plate 292 is rotated in the direction of the arrow C1. At this time, a measurement pressure in the Hr direction is applied to the back surface 282 a of the probe shaft 282 by the spring 293. In this way, when measuring only the radial direction of the lens PLE with respect to the axis A1, the probe shaft 282 is also used as a probe shaft that is brought into contact with the periphery of the lens PLE. For example, the tracing stylus axis 282 is configured to be further tiltable by 2 to 5 degrees in the Hf direction with respect to the vertical direction (Z direction).

  When measuring the edge surface shape in the direction of the axis A1 of the processed lens PLE, the VH unit 280 does not have to have the tilt mechanism 272 for tilting the probe shaft 282, and the VH unit 280 has the probe 281 ( What is necessary is just to make it the mechanism which hold | maintains the measuring element axis | shaft 282) so that a movement in the front-end | tip direction (XY direction horizontal) of the measuring element 281 is possible.

  FIG. 8 is a control block diagram of the measuring apparatus 1. The control unit 50 is connected to the motors 225, 235, 245, 265 and encoders 268, 285 of the moving unit 210. The control unit 50 is connected to the display 3 and the switch unit 4. The control unit 50 is connected to a memory 51 that stores measurement results and the like. The control unit 50 functions as a control device that controls the operation of the spectacle lens peripheral shape measuring device. The memory 51 functions as a storage device that stores a control program of the control unit 50 that controls the operation of the measuring apparatus 1.

  In addition, the control unit 50 is connected to the machining apparatus 1000 and an external computer 2000 so that data communication is possible. From the external computer 2000, the peripheral value data of the rim of the spectacle frame in which the processed lens PLE is framed is transmitted, and the peripheral value data of the rim can be acquired by the control unit 50. Further, the edge surface shape data of the processed lens PLE and the bevel circumference data calculated by the control unit 50 can be output to the external computer 2000. The control unit 50 has a function of controlling the moving unit 210 and the like and a calculation function for calculating a measurement result in order to measure the edge shape of the processed lens.

  In the configuration of the probe holding unit 250 and the moving unit 210 described above, the XY detection unit (detection means) 210XY that detects the XY position (radial radius direction) with respect to the axis A1 is measured with respect to the axis (Axis) LO of the rotation base 261. A first XY detection unit that detects the XY position of the tip of the probe 281 and the V groove 286a of the probe 286, and a second XY detection unit that detects the XY position of the probe holder unit 250 are configured. In the embodiment, the first XY detection unit detects the rotation angle of the rotation base 261 and the encoder 285 that detects the inclination angle (rotation angle) of the measuring element shaft 282 (measurement element 286) around the axis S1 in the H direction. Encoder 266. That is, in the embodiment, the second XY detection unit uses the drive control data of the motor 245 included in the X movement unit 240 and the drive control data of the motor 235 included in the Y movement unit 230. However, as the XY detection unit 210XY, for example, a sensor that directly detects the position of the probe 281 or the like may be used.

  In the configuration example of the probe holding unit 250 and the moving unit 210 described above, the tip of the probe 281 and the V groove 286a of the probe 286 with respect to a predetermined reference position (for example, the front position of the lens PLE on the axis A1). The Z detection unit (detection means) 210Z that detects the position in the Z direction (position in the axis A1 direction) detects the Z position of the encoder 268 and the encoder 285, which are examples of the first Z detection unit, and the stylus holding unit 250. A second Z detection unit. In the embodiment, the second Z detection unit uses drive control data of the motor 225 included in the Z movement unit 220. However, as the Z detection unit 210Z, for example, a sensor that directly detects the position of the probe 281 or the like may be used. Also in this case, the Z detection unit 210Z includes a detector (encoder 285) that detects an inclination angle (rotation angle) of the measuring element shaft 282 (the measuring element 286) in the H direction.

  Next, the operation of the measuring apparatus 1 having the above configuration will be described. First, the measurement operation of the edge surface shape in the axis A1 direction of the processed lens PLE held by the lens holding unit 300 will be described (see the flowchart of the measurement control program in FIG. 11). A measuring element 281 is used to measure the edge surface shape. Note that the radial angle of the lens PLE with respect to the axis A1 in the measurement of the edge surface shape may be set in advance, for example, 0 degrees, 90 degrees, 180 degrees, 270 degrees, etc. 3 can be arbitrarily set. Here, the measurement when the radial angle is set to 0 degrees will be described. The edge surface shape in the Z-axis direction (axis A1 direction) can also be treated as a lens edge cross-sectional shape at a set radius angle. In the present embodiment, the edge shape in the cross section including the axis A1 and passing through the edge position on the set radial angle is measured as the edge surface shape in the Z-axis direction. That is, the edge surface shape in the Z-axis direction is the surface shape of the edge surface on a plane including the axis A1.

  When the measurement start signal is input by the measurement start switch of the switch unit 4, the control unit 50 controls the driving of the moving unit 210, and sets the Z-axis at the set radial angle (0 degree) of the processed lens PLE. At least one of the front edge position and the rear edge position of the lens PLE in the direction (axis A1 direction) is acquired. Hereinafter, an example in which the front edge position is acquired will be described.

  The control unit 50 controls the driving of the moving unit 210, and the tracing stylus shaft 282 is positioned at a position sufficiently away from the moving radius of the processed lens PLE in the direction of the set moving radius angle (0 degree). As described above, the measuring element holding unit 250 (the measuring element 281) is moved. Further, the control unit 50 controls the driving of the rotation unit 260 so that the back surface 282a of the tracing stylus shaft 282 faces the axis A1. Next, the control unit 50 controls the driving of the motor 225 to raise the measuring element 281 to a predetermined height position so as to be higher than the position of the cup PCU. Thereafter, the moving unit 210 is controlled and moved in the direction of the axis A1 until the back surface 282a comes into contact with the periphery of the lens PLE (for example, the bevel LEy formed on the edge of the lens PLE) (see FIG. 9A). . The contact of the back surface 282a of the probe shaft 282 with the lens PLE is detected by an encoder 285 as an example of a detector.

  Next, the rotation unit 260 is controlled by the control unit 50 so that the tip direction of the measuring element 281 is directed to the axis A1, and the driving of the moving unit 210 is controlled. The measuring element 281 is separated from the edge surface of the lens PLE so as to be located inside the distance (for example, 1.5 mm). Thereafter, the probe holding unit 250 is lowered in the Z direction. Then, as shown in FIG. 9B, when the probe 281 contacts the front surface of the lens PLE, the movement of the probe holding unit 250 is stopped. That the probe 281 has contacted the front surface of the lens PLE is determined by the control unit 50 based on the change of the encoder 268. The control unit 50 determines the front edge position of the lens PLE in the Z direction (axis A1 direction) based on the drive control data in the Z direction of the probe holding unit 250 (control data of the motor 225) and the Z position by the encoder 268. get. When the front edge position is obtained, the driving of the moving unit 210 is controlled by the control unit 50, the measuring element holding unit 250 is moved in a direction away from the axis A1, and the measuring element 281 is detached from the lens PLE.

  In the acquisition of at least one of the front edge position and the rear edge position of the lens PLE, when there is processing data in the processing apparatus 1000, the control unit 50 acquires the processing data input from the processing apparatus 1000. You can do it.

  Next, the control unit 50 controls the moving unit 210 to bring the measuring element 281 into contact with a plurality of positions in the axis A1 direction (Z direction) of the edge surface of the processed lens PLE, and the XY detection unit 210XY and the Z detection unit. Based on the detection result obtained by 210Z, the shape of the edge surface LEp of the processed lens PLE is measured.

  For example, based on the acquired front edge position of the lens PLE, the control unit 50 determines a position Lh1 where the measuring element 281 is brought into contact with the edge surface of the lens PLE in the Z direction. For example, since the edge thickness of the lens PLE is at least 2 mm or more, if the position Lh1 from the front edge position is determined as 1 mm, which is half the distance of 2 mm, the measuring element 281 on the edge surface LEp of the lens PLE with high probability. Will be touched.

  Next, the control unit 50 moves the measuring element 281 along the axis A1 direction (Z direction) while bringing the measuring element 281 into contact with the edge surface LEp, and obtains detection results of a plurality of positions of the measuring element 281 in the axis A1 direction.

  The controller 50 controls the moving unit 210 to lower the probe holding unit 250 so that the probe 280 is positioned at the determined height Lh1. Thereafter, the moving unit 210 is controlled to move the probe holding unit 250 to the axis A1 side at a low speed. As shown in FIG. 9C, when the tip of the probe 281 contacts the edge surface LEp and the probe shaft 282 is inclined backward by a predetermined angle K1 (for example, 7 degrees), the movement of the probe holding unit 250 is moved. Stopped. The probe axis 282 is tilted about the axis S1. The tilt angle of the probe shaft 282 is detected by the encoder 285.

  Next, the control unit 50 controls the moving unit 210 so as to move the measuring element 281 along the direction of the axis A1 while bringing the measuring element 281 into contact with the edge surface LEp. For example, first, the probe holding unit 250 is raised at a slow speed so that the probe 281 moves from the position Lh1 toward the front surface of the lens PLE. During this time, the measuring element shaft 282 is applied with measuring pressure by a spring (biasing member) 290 so as to incline in the Hr direction in FIG. 7A, and moves in the tip direction of the measuring element 281 and the opposite direction. It is held by the VH unit 280 to be possible (can be tilted about the axis S1). As the probe holding unit 250 is raised, the tip of the probe 281 is raised while being in contact with the edge surface LEp. In addition, after the tip of the probe 281 contacts the edge surface LEp, the control unit 50 determines the center position of the tip of the probe 281 (coordinates of the sphere center 281CO) at regular time intervals (for example, every 10 milliseconds). Monitored and acquired, and stored in the memory 51. The Z position and the radial position (XY position) of the center position of the tip of the measuring element 281 are mathematically obtained by the control unit 50 based on the detection results of the Z detection unit 210Z and the XY detection unit 210XY.

  When the leading end of the measuring element 281 moves out of the front edge position of the edge surface LEp due to the rising of the measuring element 281, the measuring element 281 moves forward by the force of the spring 290, and the signal of the detection value of the encoder 285 changes abruptly. Therefore, by monitoring the output value of the encoder 285, it can be detected that the measuring element 281 has come off the edge surface LEp. The control unit 50 stops the movement of the measuring element holding unit 250 when the measuring element 281 comes off the edge surface LEp.

  Subsequently, the controller 50 moves the probe holding unit 250 in order to measure the lens rear surface direction after detaching the probe 281 from the lens PLE, and again moves the probe 281 to the position Lh1 on the edge surface LEp. The tip is brought into contact (this operation is the same as when the front side of the lens is measured). Then, the control unit 50 controls the moving unit 210 to move the measuring element holding unit 250 so that the measuring element 281 moves from the position Lh1 toward the rear surface of the lens PLE while bringing the measuring element 281 into contact with the edge surface LEp. It descends at a slow speed. When the tip of the probe 281 deviates from the rear edge position of the edge surface LEp, the control unit 50 stops the movement of the probe holding unit 250. During this time, the center position of the tip of the probe 281 (the coordinates of the sphere center 281CO) is monitored and acquired by the control unit 50 and stored in the memory 51.

  The control unit 50 arranges the acquired center position data of the measuring element 281 and obtains the shape of the edge surface LEp. FIG. 10A is a diagram showing acquired tip center (coordinates of the sphere center 281CO) data. In FIG. 10A, a point that is separated by the radius ra of the hemispherical surface of the measuring element 281 in the direction perpendicular to the locus CLT of the tip center data is calculated as the locus of the edge surface LEp of the lens PLE. Since the front edge position and the rear edge position of the lens PLE are calculated as points when the output value of the encoder 285 is abruptly converted, the shape of the edge surface LEp in the axis A1 direction is specified.

  Further, by measuring the shape of the edge surface LEp, the inclination angle EK1 of the edge surface LEp with respect to the axis A1 (Z direction) is obtained as shown in FIG. When the bevel LY is formed on the edge surface, in addition to the inclination angle EK1 of the edge surface LEpr at the rear edge of the bevel and the inclination angle EK1 of the edge surface LEpf at the front edge of the bevel, the edge surface LEp has a bevel shape. The shape of LY is required. For example, at least one of the position of the bevel apex LEy in the Z direction, the inclination angle of the front slope LYf of the bevel LY with respect to the Z direction, and the inclination angle of the rear slope LYr is obtained. Then, by obtaining the inclination angle of the front slope LYf and the inclination angle of the rear slope LYr, the direction LYB1 (hereinafter abbreviated as the bevel direction LYB1) in which the mountain of the bevel LY heads is obtained based on these. The bevel direction LYB1 is obtained as the direction of the bisector of the bevel angle, which is the angle formed by the front slope LYf and the rear slope LYr. Note that the inclination angle EK1 of the edge surfaces LEpr and LEpf at the bottom of the bevel is normally the normal direction of the bevel direction LYB1 (direction perpendicular to the direction LYB1).

  Preferably, the shape measurement of the edge surface LEp (including the shape of the bevel LY) as described above is performed at a plurality of radial angles of the processed lens PLE. For example, the radial angle in the measurement of the edge surface LEp is set to four positions of 90 degrees, 180 degrees, and 270 degrees in addition to 0 degrees. By measuring the shape of the edge surface LEp of the lens PLE at a plurality of locations, the pass / fail determination of the processed lens PLE can be performed more accurately.

  When the edge surface LEp is flattened, the inclination angle EK1 of the edge surface LEp can be obtained by obtaining a measurement result by bringing the measuring element 281 into contact with the edge surface LEp at least two points. . For example, based on at least one of the front edge position and the rear edge position, the controller 50 determines the edge surface position Lh2 with which the probe 281 is brought into contact separately from the position Lh1, and determines the edge surface LEp from the two measurement results. It is also possible to obtain the inclination angle EK1.

  Further, even if the processed lens PLE is formed with a bevel, the inclination angle EK1 can be obtained as long as at least one of the rear base surface LEpr and the front base surface LEpf of the bevel can be measured as the shape of the edge surface LEp. it can. Therefore, the measurement may be performed by bringing the probe 281 into contact with at least two points with respect to the rear skirt surface LEpr or the front skirt surface LEpf.

  When the measurement data of the edge surface LEp is obtained as described above, the processing data of the processed lens PLE processed by the processing apparatus 1 is acquired by the input unit 3, and the acquired measurement data of the edge surface LEp and the processed lens are acquired. The pass / fail of the processed lens PLE can be determined by comparing the processing data of the PLE. In particular, in the lens PLE on which the bevel LY is formed, whether or not the bevel is formed in the bevel apex LEy, the bevel direction LYB1, or the like is accurately determined. This determination is performed by the control unit 50 and the determination result is output to the display of the input unit 3 or the like. The display of the input unit 3 has a function of an output unit of the determination result. Moreover, you may output a determination result to another indicator.

  Next, measurement of the circumference of the bevel LY (bevel apex LEy) formed on the edge surface of the processed lens PLE will be described. A probe 286 is used for measuring the bevel circumference.

  Examples of the probe 286 are shown in FIGS. In the embodiment, the measuring element 286 is arranged at a position above the measuring element axis 282 so as not to interfere with the measuring element 281. A V-groove (V-shaped groove) 286a to be inserted into the bevel LY formed on the processed lens PLE is formed at the tip of the measuring element 286 (see FIG. 6). The opening angle Vk1 of the V groove 286a is wider than the apex angle (for example, 110 degrees) of a general bevel LY, and is formed at, for example, 140 degrees. The groove depth Vd1 is smaller than a general bevel LY height (for example, 0.8 mm), and is formed to be, for example, 0.5 mm. As a result, even if the tilt angle of the probe shaft 282 is slightly deviated from the tilt angle of the lens edge surface LEp, interference between the probe 286 and the lens edge surface is less likely to occur. Note that the tip of the probe 286 extends in the same direction as the tip of the probe 281. For this reason, like the probe 281, the tip of the probe 286 is inclined in the directions Hf and Hr in FIG. 7A, and the V-groove 286 a is easily along the bevel LY formation direction.

  When the measuring unit 200 is applied only to the measurement of the bevel circumference, the measuring element 281 for measuring the shape of the edge surface is not necessary, and the measuring element 286 is replaced with the measuring element axis 282 instead of the measuring element 281. The structure provided in the upper end of the may be sufficient.

  Hereinafter, the operation of the bevel circumference measurement using the probe 286 will be described (see the flowchart of the measurement control program in FIG. 13). First, the control unit 50 at least one of the inclination angle EK1 of the edge surface LEp with respect to the axis A1 and the inclination angle of the bevel direction LYB1 for each radius vector angle of a predetermined step (for example, 0.36 degree step) of the processed lens PLE. Get. The inclination angle EK1 of the edge surface LEp is obtained by the inclination angle of at least one of the edge surfaces LEPr and LEPf at the bottom of the bevel. The reason why the bevel direction LYB1 may be obtained instead of the tilt angle EK1 is that the normal tilt angle of the bevel direction LYB1 can be treated as the tilt angle EK1 of the edge surface of the bevel skirt. Hereinafter, “inclination angle EK1” includes the case where the bevel direction LYB1 is obtained.

  For example, the controller 50 determines that the inclination angle EK1 at the radial angle of 45 degrees is 0 degrees, 45 degrees, 90 degrees, 135 degrees, 180 degrees,... If it is obtained, the inclination angle EK1 for each radial angle is obtained by linear interpolation between these. Although the inclination angle EK1 is used to incline the tracing stylus axis 282 when measuring the bevel circumference, the inclination angle EK1 does not have to be exact, and even complementary data can be used practically.

  In addition, about the processed lens PLE processed by the processing apparatus 1, when the processing data from the processing apparatus 1 is acquired, it is also possible to acquire the inclination angle EK1 for each radial angle included in the processing data. It is. Further, when the lens PLE is processed by a method in which the tilt angle EK1 is tilted in the normal direction with respect to the lens front surface of the lens PLE corresponding to the target lens shape, curve data of the target lens shape and the front lens surface is acquired. Thus, the control unit 50 can obtain the inclination angle EK1 for each radial angle by calculation.

  The control unit 50 obtains the position Lz1 in the Z direction of the bevel apex LEy at the measurement starting radial angle (for example, 0 degree radial angle). For example, as shown in FIG. 12, if the edge surface shape at the radius angle of 0 degree is obtained by the measurement of the edge surface shape, the position Lz1 can be obtained from the measurement result. Further, when the machining data from the machining apparatus 1 is acquired, the position Lz1 at the 0-radius angle included in the machining data can be acquired. FIG. 12 is an explanatory diagram of the tilting operation of the tracing stylus shaft 282 at the time of measuring the bevel circumference.

  When a measurement start command signal is input from the switch unit 4 or the like, the control unit 50 controls the driving of the moving unit 210 and sets the measuring element holding unit at the initial position of measurement start (for example, a radial angle of 0 degrees). Move 250. Further, the driving of the rotating unit 260 is controlled so that the tip of the measuring element 286 is directed to the axis A1. Then, the driving of the motor 225 is controlled so that the center of the V groove 286a of the measuring element 286 is positioned at the position Lz1 of the bevel apex in the Z direction, and the measuring element holding unit 250 is raised. Thereafter, the probe holding unit 250 is moved to the lens PLE side so that the probe 286 contacts the bevel apex LEy of the lens PLE. After the tracing stylus 286 contacts the bevel apex LEy, the control unit 50 causes the VH unit 280 to function, and the tracing stylus axis 282 is tilted according to the tilt angle EK1 of the edge surface LEPr. For example, as shown in FIG. 12, the control unit 50 is configured so that the inclination of the measuring element shaft 282 follows the inclination angle EK1 of the edge surface LEPr in a state where the measuring element 286 is in contact with the bevel apex LEy. The VH unit 280 which is a part is made to function. In a typical embodiment, in a state where the probe 286 is in contact with the bevel apex LEy of the lens PLE, the probe holding unit 250 (VH unit 280) is further moved to the lens PLE side (axis A1 direction) by the moving unit 210. Thus, the tracing stylus shaft 282 can be inclined. The inclination angle of the tracing stylus shaft 282 is detected by an encoder 285 which is an example of a detector. The control unit 50 controls driving of the moving unit 210 based on the detection result of the encoder 285.

  When the inclination angle of the tracing stylus shaft 282 is changed by a driving unit such as a motor, the tracing stylus holding unit 250 is mounted after the inclination angle of the tracing stylus axis 282 is made to coincide with the inclination angle EK1 of the edge surface LEPr at the initial position. You may move to the lens PLE side.

  Subsequently, in order to obtain the measurement result of the bevel apex LEy of the entire circumference, the control unit 50 controls the driving of the moving unit 210 while maintaining the state in which the V groove 286a of the probe 286 is in contact with the bevel apex LEy. The probe 286 is moved along the bevel of PLE. In measuring the entire circumference, the rotation of the rotary unit 260 is controlled so that the tip of the measuring element 286 is directed in the direction of the axis A1 for each radial angle (for example, every 0.36 degree step radial angle). The VH unit 280 is rotated around the center. By the rotation control of the rotation unit 260, the tracing stylus shaft 282 is set to be inclined with respect to the axis A1.

  And the control part 50 controls the movement unit 210 which comprises a part of inclination mechanism 272 so that the measuring element axis | shaft 282 may incline according to inclination-angle EK1 for every radius vector angle acquired beforehand, The probe holding unit 250 is moved in the trend direction. For example, the measuring element holding unit 250 is moved in the radial direction so that the inclination of the measuring element shaft 282 is substantially along the inclination angle EK1. By tilting the probe axis 282, the V groove 286a of the probe 286 comes into proper contact with the bevel apex LEy when measuring the bevel apex position of the entire circumference of the lens PLE, so that an accurate bevel position can be measured. it can. The movement position (that is, the three-dimensional trajectory data of the bevel apex LEy) of the measuring element 286 (V groove 286a) at each radial angle is obtained by the Z detection unit 210Z and the XY detection unit 210XY. The Z detection unit 210Z and the XY detection unit 210XY include a detector (encoder 285) that detects the inclination angle of the measurement element 286 (measurement element shaft 282), and the movement position of the measurement element 286 at each radial angle is measured. It is obtained mathematically in consideration of the inclination angle of the child 286.

  In addition, in the structure provided with the drive part (for example, motor etc.) which gives the drive force for inclining the measuring element axis | shaft 282 without the measuring element 286 being restrict | limited to the lens PLE, the control part 50 is the drive The measuring axis 282 is inclined according to the inclination angle EK1 of each radial angle.

  In measuring the bevel position of the entire circumference of the lens PLE, in the configuration of this embodiment, the control unit 50 controls the moving unit 210 and the like as follows. For example, when the radius information of a predetermined number of measurement points (for example, 5 points) is obtained from the start of measurement, the control unit 50 changes the next measurement point (unmeasured point) based on the measured radius information. Based on the result, the moving unit 210 is controlled so that the tracing stylus 286 follows the bevel apex LEy, and the tracing stylus axis 282 maintains the inclination angle EK1 at each radial angle. The probe holding unit 250 is moved in the XY directions. In addition, the control unit 50 controls the drive of the motor 265 to rotate the rotation base 261, thereby rotating the VH unit 280 around the axis LO so that the tip of the measuring element 286 faces the axis A1. Also in the Z direction, the control unit 50 predicts the Z position change of the next measurement point (unmeasured point) based on the measured Z position information, and follows the change of the bevel apex LEy based on the result. The moving unit 210 is controlled to move the measuring element holding unit 250 in the Z direction so that the measuring element 286 and the measuring element shaft 282 move.

  In the configuration of the bevel circumference measurement, in the configuration in which the probe holding unit 250 is relatively moved in the radial direction of the processed lens PLE and the shaft 313 of the lens holding unit 300 is rotated, the processed lens is used. The moving position of the measuring element 286 in the radial direction is obtained by the XY detection unit 210XY for each radial angle of rotation of the PLE. The radial information in the three-dimensional trajectory data of the bevel apex LEy is based on the rotational angle data of the shaft 313 (processed lens PLE) and the movement position of the measuring element 282 in the radial direction. Obtained by. The Z direction (perpendicular to the radial direction) in the three-dimensional trajectory data of the bevel apex LEy is obtained by the Z detection unit 210Z.

  When the measurement as described above is completed, the control unit 50 calls the measurement data stored in the memory 51, and for the Z position data and radial length data (XY data) for each measurement point (for each predetermined radial angle), The circumference value of the bevel apex locus of the processed lens PLE is calculated by a known circumference calculation calculation (for example, calculation such as adding up the lengths between two measurement points). Then, the peripheral value data of the rim of the spectacle frame in which the processed lens PLE is framed is obtained from the external computer 2000, and the peripheral value of the bevel apex locus of the processed lens PLE is compared with the peripheral value of the rim. The pass / fail of the processed lens PLE is determined depending on whether or not the difference is within an allowable value. The pass / fail of the processed lens PLE may be performed on the external computer 2000 side by outputting the peripheral length value of the bevel apex locus of the processed lens PLE to the external computer 2000.

  The measuring apparatus 1 according to the embodiment as described above can more accurately measure the peripheral shape (edge surface shape) of the processed lens PLE. Moreover, the measuring apparatus 1 of an Example can measure the locus | trajectory of a bevel apex more correctly, even when it is a case where the edge surface of a processed lens inclines. As a result, a more accurate bevel circumference value can be obtained.

  In the above exemplary embodiment, the tracing stylus holding unit 250 is moved in the Z direction by the motor 225 so that the tracing stylus 286 moves in the Z direction with a light force following the change of the bevel apex LEy. Although the configuration is adopted, it is not limited to this. If the measuring element 282 is held so as to be movable in the Z direction by the amount of fluctuation in the Z direction, there is no need to move the measuring element holding unit 250 in the Z direction.

DESCRIPTION OF SYMBOLS 1 Eyeglass lens peripheral shape measuring apparatus 50 Control part 51 Memory 200 Measurement unit 210 Movement unit 210XY XY detection unit 210Z Z detection unit 220 Z movement unit 230 Y movement unit 240 X movement unit 250 Measuring element holding unit 260 Rotation unit 268 Encoder 272 Inclination Mechanism 280 Measuring element axis movement holding unit 281 Measuring element 282 Measuring element axis 285 Encoder 286 Measuring element 286a V groove 300 Lens holding unit 313 Shaft A1 axis

Claims (4)

A lens holding means having a holding shaft for holding the processed lens, and a measuring element having a groove that contacts the bevel formed on the edge of the processed lens, and processed by detecting the moving position of the measuring element A spectacle lens peripheral shape measuring apparatus for measuring a bevel circumference of a lens,
Tilting means for tilting the probe relative to the holding shaft;
Inclination angle acquisition means for acquiring at least one inclination angle in the direction in which the edge surface and the bevel of the processed lens face the axial direction of the holding shaft;
Based on the inclination angle acquired by the inclination angle acquisition means, the processed lens is controlled by controlling the inclination means so that the measuring element is inclined relative to the holding shaft for each radial angle of the processed lens. Measurement control means for measuring the bevel circumference of
An eyeglass lens peripheral shape measuring apparatus comprising: In the spectacle lens peripheral shape measuring apparatus according to claim 1,
The tilting means has a measuring element holding unit that holds the measuring element so as to be inclined with respect to the axial direction of the holding shaft, and a drive unit that applies a driving force for inclining the measuring element,
The spectacle lens peripheral shape measuring device includes a first moving unit that relatively moves the probe holding unit in a radial direction of the processed lens, and a relative movement of the probe holding unit along the circumferential direction of the processed lens. Second moving means for moving to
The measurement control unit controls the first moving unit so that the probe contacts the bevel for each radius angle of the processed lens, and the probe becomes a bevel for each radius angle of the processed lens. In the contact state, the driving unit is controlled so that the measuring element is inclined according to the inclination angle acquired by the inclination angle acquiring unit, and the measuring element is circumferentially along the bevel of the processed lens. The eyeglass lens peripheral shape measuring apparatus , wherein the second moving means is controlled to move to the eyeglass lens. In the spectacle lens peripheral shape measuring apparatus according to claim 1 or 2 ,
A first detecting means for detecting a first movement position of the measuring element in the axial direction of the holding shaft, the first detecting means including an inclination angle detecting means for detecting an inclination angle of the measuring element; and a processed lens A second detection means for detecting a second movement position of the probe in the radial direction of the second detection means, the second detection means including the inclination angle detection means,
The measurement control means obtains the bevel circumference of the processed lens based on the first movement position detected by the first detection means and the second movement position detected by the second detection means. Eyeglass lens peripheral shape measuring device. Lens holding means having a holding shaft for holding the processed lens, a measuring element having a groove that contacts a bevel formed on the edge of the processed lens, and the measuring element is inclined relative to the holding axis. A spectacle lens peripheral shape measuring program executed in a control device that controls the operation of the spectacle lens peripheral shape measuring device that detects the movement position of the measuring element and measures the bevel circumference of the processed lens. Because
An inclination angle acquisition step of acquiring at least one inclination angle in a direction in which the edge surface and the bevel of the processed lens face the axial direction of the holding shaft;
Based on the acquired tilt angle, the bevel circumference of the processed lens is measured by controlling the tilting means so that the measuring element is tilted relative to the holding shaft for each radius angle of the processed lens. A measurement control step to
An eyeglass lens peripheral shape measuring program comprising: