JP5808807B2 - 放射方向振幅支援トランスファのための線形イオントラップ - Google Patents

放射方向振幅支援トランスファのための線形イオントラップ Download PDF

Info

Publication number
JP5808807B2
JP5808807B2 JP2013522063A JP2013522063A JP5808807B2 JP 5808807 B2 JP5808807 B2 JP 5808807B2 JP 2013522063 A JP2013522063 A JP 2013522063A JP 2013522063 A JP2013522063 A JP 2013522063A JP 5808807 B2 JP5808807 B2 JP 5808807B2
Authority
JP
Japan
Prior art keywords
ions
region
linear ion
ion trap
potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2013522063A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013532893A5 (enExample
JP2013532893A (ja
Inventor
アレクサンダー ロボダ,
アレクサンダー ロボダ,
Original Assignee
ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド
ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド, ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド filed Critical ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド
Publication of JP2013532893A publication Critical patent/JP2013532893A/ja
Publication of JP2013532893A5 publication Critical patent/JP2013532893A5/ja
Application granted granted Critical
Publication of JP5808807B2 publication Critical patent/JP5808807B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/36—Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/4285—Applying a resonant signal, e.g. selective resonant ejection matching the secular frequency of ions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2013522063A 2010-08-04 2011-08-03 放射方向振幅支援トランスファのための線形イオントラップ Expired - Fee Related JP5808807B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US37049210P 2010-08-04 2010-08-04
US61/370,492 2010-08-04
PCT/CA2011/000889 WO2012016330A1 (en) 2010-08-04 2011-08-03 A linear ion trap for radial amplitude assisted transfer

Publications (3)

Publication Number Publication Date
JP2013532893A JP2013532893A (ja) 2013-08-19
JP2013532893A5 JP2013532893A5 (enExample) 2014-09-11
JP5808807B2 true JP5808807B2 (ja) 2015-11-10

Family

ID=45558883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013522063A Expired - Fee Related JP5808807B2 (ja) 2010-08-04 2011-08-03 放射方向振幅支援トランスファのための線形イオントラップ

Country Status (6)

Country Link
US (1) US8680463B2 (enExample)
EP (1) EP2601672A4 (enExample)
JP (1) JP5808807B2 (enExample)
CN (1) CN103119689B (enExample)
CA (1) CA2807246C (enExample)
WO (1) WO2012016330A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2924425B1 (en) * 2012-11-22 2019-09-11 Shimadzu Corporation Tandem quadrupole mass spectrometer
GB2528152B (en) 2014-04-11 2016-09-21 Micromass Ltd Ion entry/exit device
GB2541384B (en) * 2015-08-14 2018-11-14 Thermo Fisher Scient Bremen Gmbh Collision cell having an axial field
CN108475616B (zh) * 2016-01-15 2019-12-27 株式会社岛津制作所 正交加速飞行时间型质谱分析装置
US9978578B2 (en) 2016-02-03 2018-05-22 Fasmatech Science & Technology Ltd. Segmented linear ion trap for enhanced ion activation and storage
EP3794630A4 (en) * 2018-05-14 2022-01-26 Mobilion Systems, Inc. Coupling of ion mobility spectrometer with mass spectrometer
EP4506964A1 (en) * 2023-08-09 2025-02-12 Infineon Technologies Austria AG Devices for controlling trapped ions and methods for manufacturing thereof

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2229070C (en) * 1995-08-11 2007-01-30 Mds Health Group Limited Spectrometer with axial field
JP2008500684A (ja) * 2004-05-24 2008-01-10 エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス トラップイオン用の装置および方法
JP5424085B2 (ja) * 2005-11-30 2014-02-26 エムディーエス インコーポレイテッド パルス軸方向場を使用した質量選択的軸方向輸送のための方法および装置
US7582864B2 (en) * 2005-12-22 2009-09-01 Leco Corporation Linear ion trap with an imbalanced radio frequency field
GB0526043D0 (en) * 2005-12-22 2006-02-01 Micromass Ltd Mass spectrometer
US7633060B2 (en) * 2007-04-24 2009-12-15 Thermo Finnigan Llc Separation and axial ejection of ions based on m/z ratio
US7847240B2 (en) * 2007-06-11 2010-12-07 Dana-Farber Cancer Institute, Inc. Mass spectroscopy system and method including an excitation gate
GB0713590D0 (en) * 2007-07-12 2007-08-22 Micromass Ltd Mass spectrometer
WO2009094760A1 (en) * 2008-01-31 2009-08-06 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Divison Method of operating a linear ion trap to provide low pressure short time high amplitude excitation with pulsed pressure
CN101515532B (zh) * 2009-02-20 2011-02-16 复旦大学 含有高阶场成份的四极杆电极系统及其用途
JP5299476B2 (ja) * 2011-06-03 2013-09-25 株式会社島津製作所 質量分析装置及びイオンガイド

Also Published As

Publication number Publication date
US8680463B2 (en) 2014-03-25
CN103119689A (zh) 2013-05-22
CA2807246C (en) 2018-07-03
CN103119689B (zh) 2016-10-05
EP2601672A4 (en) 2017-03-29
WO2012016330A1 (en) 2012-02-09
EP2601672A1 (en) 2013-06-12
JP2013532893A (ja) 2013-08-19
US20130299689A1 (en) 2013-11-14
CA2807246A1 (en) 2012-02-09

Similar Documents

Publication Publication Date Title
JP4872088B2 (ja) 質量分析計用イオンガイド
CN103988278B (zh) 高占空比离子光谱仪
CN101421818B (zh) 具有破碎单元和离子存储设备的质谱仪装置
JP5301285B2 (ja) 集束型質量分析計イオンガイド、分光計および方法
JP4918846B2 (ja) 質量分析装置及び質量分析方法
JP4792220B2 (ja) 多極質量分析計における改善された軸方向放出分解能
US8637816B1 (en) Systems and methods for MS-MS-analysis
JP2013532893A (ja) 放射方向振幅支援トランスファのための線形イオントラップ
US9916971B2 (en) Systems and methods of suppressing unwanted ions
CA2673790A1 (en) Ion trap
US20130193318A1 (en) Ion source for mass spectrometers
GB2502155A (en) Controlling ions using descending order multipole electric fields
JP2015503825A (ja) イオントラップから低m/z比を有するイオンを抽出する方法
JP6321546B2 (ja) イオントラップ質量分析のためのイオン励起方法
JP4654087B2 (ja) 質量分析計及び質量分析方法
EP3249680B1 (en) Systems and methods for reducing the kinetic energy spread of ions radially ejected from a linear ion trap
JP2013532893A5 (enExample)
CN114616647B (zh) 傅立叶变换质谱法的方法和系统
JP2011508381A (ja) イオン電荷蓄積装置の電荷制御
EP3357080A1 (en) Mass-selective axial ejection linear ion trap
JP2022500813A (ja) Rfイオントラップイオン装填方法
WO2023028696A1 (en) Method and apparatus to increase sensitivity of inductively coupled plasma mass spectrometry
CN121753135A (zh) 用于执行串联ms/ms/ms质谱分析的方法和系统
WO2019211918A1 (ja) 直交加速飛行時間型質量分析装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140724

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140724

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20150422

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150424

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150522

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150908

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150909

R150 Certificate of patent or registration of utility model

Ref document number: 5808807

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees