JP5798526B2 - Ｘ線分析装置、ｘ線分析システム、ｘ線分析方法およびｘ線分析プログラム - Google Patents

Ｘ線分析装置、ｘ線分析システム、ｘ線分析方法およびｘ線分析プログラム Download PDF

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JP5798526B2
JP5798526B2 JP2012159863A JP2012159863A JP5798526B2 JP 5798526 B2 JP5798526 B2 JP 5798526B2 JP 2012159863 A JP2012159863 A JP 2012159863A JP 2012159863 A JP2012159863 A JP 2012159863A JP 5798526 B2 JP5798526 B2 JP 5798526B2
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JP2014020925A (ja
JP2014020925A5 (enExample
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和輝 伊藤
和輝 伊藤
義徳 上ヱ地
義徳 上ヱ地
功系兆 梶芳
功系兆 梶芳
邦夫 西
邦夫 西
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Rigaku Corp
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Rigaku Corp
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Priority to JP2012159863A priority Critical patent/JP5798526B2/ja
Priority to US13/905,559 priority patent/US9006673B2/en
Priority to GB1312610.7A priority patent/GB2505998B/en
Priority to DE201310214015 priority patent/DE102013214015A1/de
Publication of JP2014020925A publication Critical patent/JP2014020925A/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2012159863A 2012-07-18 2012-07-18 Ｘ線分析装置、ｘ線分析システム、ｘ線分析方法およびｘ線分析プログラム Active JP5798526B2 (ja)

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JP2012159863A JP5798526B2 (ja) 2012-07-18 2012-07-18 Ｘ線分析装置、ｘ線分析システム、ｘ線分析方法およびｘ線分析プログラム
US13/905,559 US9006673B2 (en) 2012-07-18 2013-05-30 X-ray analysis apparatus, X-ray analysis system, X-ray analysis method, and X-ray analysis program
GB1312610.7A GB2505998B (en) 2012-07-18 2013-07-15 X-ray analysis apparatus, x-ray analysis system, x-ray analysis method, and x-ray analysis program
DE201310214015 DE102013214015A1 (de) 2012-07-18 2013-07-17 Röntgen-Analysevorrichtung, Röntgenanalysesystem, Röntgenanalyseverfahren und Röntgenanalyseprogramm

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JP2012159863A JP5798526B2 (ja) 2012-07-18 2012-07-18 Ｘ線分析装置、ｘ線分析システム、ｘ線分析方法およびｘ線分析プログラム

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JP2014020925A JP2014020925A (ja) 2014-02-03
JP2014020925A5 JP2014020925A5 (enExample) 2014-09-11
JP5798526B2 true JP5798526B2 (ja) 2015-10-21

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US (1) US9006673B2 (enExample)
JP (1) JP5798526B2 (enExample)
DE (1) DE102013214015A1 (enExample)
GB (1) GB2505998B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9897559B2 (en) * 2015-12-22 2018-02-20 Bruker Axs, Inc. Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector
US10478133B2 (en) * 2016-10-20 2019-11-19 General Electric Company Systems and methods for calibrating a nuclear medicine imaging system
JP6873414B2 (ja) * 2017-10-17 2021-05-19 株式会社リガク 処理装置、方法およびプログラム
CN117372502B (zh) * 2023-11-15 2024-05-14 北京理工大学 针对目标易损性分析的群目标投影面积计算方法及系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5204944A (en) 1989-07-28 1993-04-20 The Trustees Of Columbia University In The City Of New York Separable image warping methods and systems using spatial lookup tables
US5204994A (en) 1992-03-30 1993-04-27 Herzberg Richard P Skull-cap/clip-retainer combination
US6242743B1 (en) 1998-08-11 2001-06-05 Mosaic Imaging Technology, Inc. Non-orbiting tomographic imaging system
JP4700930B2 (ja) * 2004-05-28 2011-06-15 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置および検出器素子位置ズレ量測定装置
JP2008110020A (ja) * 2006-10-30 2008-05-15 Uni-Hite System Corp 幅広い曲線軌道に対して有効なｘ線ｃｔ画像再構成
JP2008257333A (ja) * 2007-04-02 2008-10-23 Shimadzu Corp ３次元画像化方法およびｘ線断層撮像装置
JP5497304B2 (ja) * 2009-02-13 2014-05-21 住友重機械工業株式会社 断層撮影装置
JP6073616B2 (ja) * 2011-09-28 2017-02-01 東芝メディカルシステムズ株式会社 Ｘ線ｃｔ装置、画像処理装置及びプログラム

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DE102013214015A1 (de) 2014-01-23
US9006673B2 (en) 2015-04-14
JP2014020925A (ja) 2014-02-03
GB201312610D0 (en) 2013-08-28
GB2505998B (en) 2018-05-02
US20140021364A1 (en) 2014-01-23
GB2505998A (en) 2014-03-19

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