GB2505998B - X-ray analysis apparatus, x-ray analysis system, x-ray analysis method, and x-ray analysis program - Google Patents

X-ray analysis apparatus, x-ray analysis system, x-ray analysis method, and x-ray analysis program

Info

Publication number
GB2505998B
GB2505998B GB1312610.7A GB201312610A GB2505998B GB 2505998 B GB2505998 B GB 2505998B GB 201312610 A GB201312610 A GB 201312610A GB 2505998 B GB2505998 B GB 2505998B
Authority
GB
United Kingdom
Prior art keywords
ray analysis
program
ray
analysis method
analysis system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1312610.7A
Other languages
English (en)
Other versions
GB201312610D0 (en
GB2505998A (en
Inventor
Ito Kazuki
Ueji Yoshinori
Kajiyoshi Koichi
Nishi Kunio
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Publication of GB201312610D0 publication Critical patent/GB201312610D0/en
Publication of GB2505998A publication Critical patent/GB2505998A/en
Application granted granted Critical
Publication of GB2505998B publication Critical patent/GB2505998B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
GB1312610.7A 2012-07-18 2013-07-15 X-ray analysis apparatus, x-ray analysis system, x-ray analysis method, and x-ray analysis program Active GB2505998B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012159863A JP5798526B2 (ja) 2012-07-18 2012-07-18 Ｘ線分析装置、ｘ線分析システム、ｘ線分析方法およびｘ線分析プログラム

Publications (3)

Publication Number Publication Date
GB201312610D0 GB201312610D0 (en) 2013-08-28
GB2505998A GB2505998A (en) 2014-03-19
GB2505998B true GB2505998B (en) 2018-05-02

Family

ID=49081268

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1312610.7A Active GB2505998B (en) 2012-07-18 2013-07-15 X-ray analysis apparatus, x-ray analysis system, x-ray analysis method, and x-ray analysis program

Country Status (4)

Country Link
US (1) US9006673B2 (enExample)
JP (1) JP5798526B2 (enExample)
DE (1) DE102013214015A1 (enExample)
GB (1) GB2505998B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9897559B2 (en) * 2015-12-22 2018-02-20 Bruker Axs, Inc. Method for collecting accurate X-ray diffraction data with a scanning two-dimensional detector
US10478133B2 (en) * 2016-10-20 2019-11-19 General Electric Company Systems and methods for calibrating a nuclear medicine imaging system
JP6873414B2 (ja) * 2017-10-17 2021-05-19 株式会社リガク 処理装置、方法およびプログラム
CN117372502B (zh) * 2023-11-15 2024-05-14 北京理工大学 针对目标易损性分析的群目标投影面积计算方法及系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008053777A1 (fr) * 2006-10-30 2008-05-08 Uni-Hite System Corporation Reconfiguration d'image tomographique aux rayons x convenant pour orbite à courbure large
JP2008257333A (ja) * 2007-04-02 2008-10-23 Shimadzu Corp ３次元画像化方法およびｘ線断層撮像装置
WO2013047403A1 (ja) * 2011-09-28 2013-04-04 株式会社 東芝 Ｘ線ｃｔ装置、物質特定方法、及び画像処理装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5204944A (en) 1989-07-28 1993-04-20 The Trustees Of Columbia University In The City Of New York Separable image warping methods and systems using spatial lookup tables
US5204994A (en) 1992-03-30 1993-04-27 Herzberg Richard P Skull-cap/clip-retainer combination
US6242743B1 (en) 1998-08-11 2001-06-05 Mosaic Imaging Technology, Inc. Non-orbiting tomographic imaging system
JP4700930B2 (ja) * 2004-05-28 2011-06-15 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線断層撮影装置および検出器素子位置ズレ量測定装置
JP5497304B2 (ja) * 2009-02-13 2014-05-21 住友重機械工業株式会社 断層撮影装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008053777A1 (fr) * 2006-10-30 2008-05-08 Uni-Hite System Corporation Reconfiguration d'image tomographique aux rayons x convenant pour orbite à courbure large
JP2008257333A (ja) * 2007-04-02 2008-10-23 Shimadzu Corp ３次元画像化方法およびｘ線断層撮像装置
WO2013047403A1 (ja) * 2011-09-28 2013-04-04 株式会社 東芝 Ｘ線ｃｔ装置、物質特定方法、及び画像処理装置

Also Published As

Publication number Publication date
DE102013214015A1 (de) 2014-01-23
JP5798526B2 (ja) 2015-10-21
US9006673B2 (en) 2015-04-14
JP2014020925A (ja) 2014-02-03
GB201312610D0 (en) 2013-08-28
US20140021364A1 (en) 2014-01-23
GB2505998A (en) 2014-03-19

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