JP5732493B2 - Semiconductor device - Google Patents

Description

  The present invention relates to a semiconductor device, and more particularly to a technique effective when applied to a semiconductor device on which a semiconductor chip having a bonding pad is mounted.

  For example, in Japanese Patent Laid-Open No. 03-79055 (Patent Document 1), a first part for bonding a wire or a film lead and a first part are integrally connected to the first part, and the first part and the pattern are distinguished and recognized. An electrode pad is disclosed that includes a second portion that can contact the probe needle during wafer testing.

  Japanese Patent Application Laid-Open No. 2000-164620 (Patent Document 2) has an electrode pad generated from a bonding electrode region and an inspection bonding region, and the center of the bonding electrode region and the center of the inspection bonding region. A technique is disclosed in which inspection and bonding of a semiconductor device can be surely performed by setting the distance between and a predetermined interval.

  Japanese Patent Laid-Open No. 2001-338955 (Patent Document 3) includes a bonding pad having a bonding region and a probe contact region, one end of a conductor wire is bonded to the bonding region, and a test probe is connected to the probe contact region. A wire bonding method in which the tip is brought into contact is disclosed.

  In Japanese Patent Application Laid-Open No. 2007-31814 (Patent Document 4), a plurality of pads having a first region and a second region are formed in a rectangular shape, and the pads have chamfered portions at some corners. In addition, a semiconductor device is disclosed which is provided in a zigzag arrangement, and further, a chamfered portion is provided so as to be opposed to the pads in the inner and outer rows of the zigzag arrangement, and the first region is arranged on the core logic region side of the semiconductor chip. ing.

Japanese Patent Laid-Open No. 03-79055 JP 2000-164620 A JP 2001-338955 A JP 2007-31814 A

  In a semiconductor device, as one method for connecting an integrated circuit formed on a main surface of a semiconductor chip and connection terminals (bonding leads, lands, inner leads) and the like formed on the main surface of a substrate on which the semiconductor chip is mounted. A wire bonding connection method is used. The wire bonding connection method includes a bonding pad (electrode pad, metal pad) electrically connected to an integrated circuit formed on the main surface of the semiconductor chip, and a plurality of connection terminals formed on the main surface of the substrate on which the semiconductor chip is mounted. Are electrically connected using a plurality of bonding wires made of fine metal wires (for example, 30 μmφ) such as gold (Au).

  In the manufacturing process of a semiconductor device, inspection (P inspection, probe inspection) of basic functions and the like of the integrated circuit formed on the main surface of the semiconductor chip is performed before the assembly process (mounting process, post process). It is common. In this inspection, a probe (probe) is usually brought into contact with a plurality of bonding pads in the state of a wafer to measure various electrical characteristics of an integrated circuit formed on the main surface of a semiconductor chip. . In this measurement, a probe card in which a large number of probes are arranged in advance in accordance with the arrangement of all the bonding pads of the semiconductor chip is used. The probe card is electrically connected to the tester, and signals corresponding to all probes are output from the probe card.

  By the way, when a probe is brought into contact with the bonding pad, the bonding pad may be damaged, and a metal film (for example, an aluminum (Al) film) constituting the bonding pad may be peeled off. In wire bonding connection, it is important to increase the bonding strength that an alloy of a metal film constituting the bonding pad and a metal constituting the metal ball at the tip of the bonding wire is suitably formed. However, if the metal film constituting the bonding pad is peeled off by contact with the probe, the region where the alloy is formed is reduced, and the bonding reliability between the bonding pad and the metal ball may be reduced. Therefore, in recent years, the surface area of one bonding pad is divided into an area where the bonding wire is bonded (wire bonding area) and an area where the probe is in contact (probe area), so that the bonding wire can be applied to the area not damaged by the probe. The technique of connecting is taken.

  FIG. 16 shows an example of a bonding pad investigated by the present inventors. FIG. 16A is a plan view of the main part of the bonding pad, and FIG. 16B is a cross-sectional view of the main part enlarged along the line AA ′ of FIG. In FIG. 16A, two bonding pads are illustrated, but actually, for example, bonding pads of about 300 pads are formed on one semiconductor chip.

  As shown in FIGS. 16A and 16B, the bonding pad B1 is made of, for example, a metal film whose main material is an aluminum film having a thickness of 0.85 μm, for example, the dimension in the first direction is 60 μm, and the first direction. Is a rectangular shape having a dimension in the second direction orthogonal to the width of 125 μm. The interval between adjacent bonding pads B1 is, for example, 5 μm. The surface area of the bonding pad B1 is divided into a wire bonding area B1w where the metal ball at the tip of the bonding wire is joined and a probe area B1p where the probe comes into contact.

  The peripheral edge of the bonding pad B1 is covered with a protective film (passivation film) 51. The protective film 51 is formed of a laminated film of, for example, a silicon oxide film 51a having a thickness of 0.2 μm and a silicon nitride film 51b having a thickness of 0.6 μm. The width of the protective film 51 that rides on the peripheral edge of the bonding pad B1 and covers the peripheral edge of the bonding pad B1 is, for example, 2.5 μm. A titanium nitride (TiN) film 52 having a thickness of, for example, 0.075 μm is formed between the protective film 51 and the bonding pad B1, and this is a photo when the metal film constituting the bonding pad B1 is processed. It is a film provided for preventing halation in the lithography process and having a function as an antireflection film.

  However, there are various technical problems described below for the bonding pad B1 in which the wire bonding region B1w and the probe region B1p shown in FIGS. 16A and 16B are distinguished. That is, when a metal ball at the tip of the bonding wire is bonded to the wire bonding region B1w of the bonding pad B1, the metal ball rides on the peripheral edge of the bonding pad B1, and a part of the protective film 51 is applied when ultrasonic waves are applied. It became clear that cracks occurred. FIG. 17 shows an example of the crack 53 that has entered the protective film 51. The crack 53 is mainly generated on the side surface of the end portion of the bonding pad B <b> 1 and the portion covered with the metal ball 54. Furthermore, a defect such as a part of the protective film 51 peeling off may occur due to the crack 53 entering.

  When such a defect occurs, for example, in a HAST (Highly-Accelerated Temperature and Humidity Stress Test, test condition 85 ° C./85%/Bias) test, which is one of moisture resistance tests of semiconductor products, moisture is easily bonded. Enter the pad B1. A potential difference is generated between the adjacent bonding pads B1 due to the infiltrated moisture, and the adjacent bonding pads B1 are short-circuited. Further, the infiltrated moisture is provided for preventing halation and oxidizes the titanium nitride film 52 remaining between the protective film 51 and the bonding pad B1. The titanium nitride film 52 expands when oxidized, and an interlayer insulating film provided between internal wirings lower than the bonding pad B1 is destroyed by the stress generated by the expansion, and between the internal wirings or between the bonding pads B1 and the internal wirings And short circuit. Electrical defects such as a short circuit between the bonding pads B1, a short circuit between the internal wirings, or a short circuit between the bonding pad B1 and the internal wirings significantly reduce the reliability of the semiconductor device.

  For example, cracks generated in the protective film can be prevented by changing the conditions for bonding the metal ball to the wire bonding region of the bonding pad. As an example of bonding conditions at the time of wire bonding, there is an operation in which a metal ball is vibrated by ultrasonic waves and rubbed against a bonding pad at a temperature of about 230 ° C. while applying a constant load of about 120 mN. In this way, it is important to perform wire bonding connection under the condition that an alloy of the metal film constituting the bonding pad and the metal constituting the metal ball is suitably formed in order to increase the bonding strength. It is difficult to change the joining conditions (for example, temperature, load, ultrasonic application time, etc.).

  Moreover, the crack which arises in a protective film can be prevented by making the diameter of a metal ball small, and preventing a metal ball from riding on the peripheral part of a bonding pad. However, the region where the alloy of the metal film constituting the bonding pad and the metal constituting the metal ball is formed becomes small, and there is a concern that the reliability of the bonding between the bonding pad and the metal ball is lowered.

  Further, cracks generated in the protective film can also be prevented by increasing the area of the bonding pad so that the metal ball does not run on the peripheral edge of the bonding pad. However, if the area of the bonding pad is increased without changing the interval between adjacent bonding pads, the area occupied by the bonding pad increases, and thus the size of the semiconductor chip needs to be increased. A method of enlarging the bonding pad area by narrowing the dimension between adjacent bonding pads is also conceivable, but considering the processing accuracy, it is difficult to further reduce the dimension from the current state (about 5 μm).

  In addition, by increasing the width of the protective film that overlaps the peripheral edge of the bonding pad, cracks that occur in the protective film can be prevented. However, if the width of the protective film overlapping the peripheral edge of the bonding pad is increased, the area of the probe region is reduced, the probe comes into contact with the protective film, and the possibility that the protective film is destroyed by the probe increases.

  Moreover, the crack which arises in a protective film can be prevented by setting it as the structure where a protective film does not overlap with the peripheral part of a bonding pad. However, when the opening is formed in the protective film on the bonding pad after the protective film is formed, the bonding pad is used as an etching stopper film, so that the protective film does not overlap the peripheral edge of the bonding pad. I can't. Form the top layer wiring and protective film, form an opening in the protective film to expose a portion of the top layer wiring, and then form a bonding pad to electrically connect to the top layer wiring through the opening By doing so, it is possible to have a structure in which the protective film does not overlap the peripheral edge of the bonding pad. However, since the uppermost layer wiring and the bonding pad are formed of different layers of metal films, the number of processes, material costs, and the like increase, resulting in an increase in manufacturing cost of the semiconductor device.

  An object of the present invention is to provide a technique capable of preventing the uppermost protective film of a semiconductor device from cracking and improving the reliability of the semiconductor device.

  The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

  Of the inventions disclosed in this application, an embodiment of a representative one will be briefly described as follows.

  In this embodiment, a semiconductor is mounted with a rectangular semiconductor chip having a main surface on which a plurality of rectangular bonding pads in which a bonding region and a probe region are divided, and a back surface opposite to the main surface. Device. The semiconductor chip has a protective film on the upper layer of the bonding pad, and the protective film covers the periphery of the bonding pad and is opened so that the upper surface of the bonding pad is exposed. Further, the overlapping width between the peripheral portion of the bonding pad and the protective film in the bonding region is wider than the overlapping width between the peripheral portion of the bonding pad and the protective film in the probe region.

  In addition, this embodiment mounts a rectangular semiconductor chip having a main surface on which a plurality of convex bonding pads each having a bonding region and a probe region are divided, and a back surface opposite to the main surface. It is a semiconductor device. The semiconductor chip has a protective film on the upper layer of the bonding pad, and the protective film covers the periphery of the bonding pad and is opened so that the upper surface of the bonding pad is exposed. Furthermore, the overlapping width between the peripheral edge of the bonding pad and the protective film in the bonding region is wider than the overlapping width between the peripheral edge of the bonding pad and the protective film in the probe region. Are arranged so as to be alternately shifted in the longitudinal direction of the bonding pad and so that the convex shapes are alternately inverted.

  Further, this embodiment is a semiconductor device on which a semiconductor chip having a rectangular power supply bonding pad in which a bonding region and a probe region are divided is mounted. A protective film having two openings for exposing a part of the upper surface of the power supply bonding pad across the bonding region and the probe region is formed on the upper layer of the power supply bonding pad, and bonding for power supply is performed from each of the two openings. The pad bonding area and the probe area are exposed, and only the bonding area of the power supply bonding pad between the two openings has a slit. In addition, a protective film is formed to cover the peripheral portion of the power supply bonding pad, and the overlap width between the peripheral portion of the power supply bonding pad and the protective film in the bonding region is equal to the peripheral portion of the power supply bonding pad in the probe region. Two openings are formed so as to be wider than the overlapping width with the protective film.

  Among the inventions disclosed in the present application, effects obtained by one embodiment of a representative one will be briefly described as follows.

  The crack of the uppermost protective film of the semiconductor device can be prevented, and the reliability of the semiconductor device can be improved.

1 is a plan view showing a configuration of a BGA type semiconductor device employing wire bonding connection according to the first embodiment. 1 is a cross-sectional view showing a configuration of a BGA type semiconductor device adopting wire bonding connection according to a first embodiment. It is a principal part top view which expands and shows the bonding pad by this Embodiment 1. FIG. FIG. 4 is an essential part cross-sectional view (a cross-sectional view taken along line II ′ of FIG. 3) showing a part of the bonding pad according to the first embodiment in an enlarged manner; 1 is a plan view showing a configuration of a BGA type semiconductor device employing flip chip connection according to the first embodiment. 1 is a cross-sectional view showing a configuration of a BGA type semiconductor device employing flip chip connection according to the first embodiment. It is a principal part top view which expands and shows the bonding pad by this Embodiment 2. FIG. It is principal part sectional drawing which expands and shows a part of bonding pad by this Embodiment 2 (sectional drawing along the II-II 'line | wire of FIG. 7). It is a principal part top view which expands and shows the bonding pad by this Embodiment 3. FIG. FIG. 10 is a main part cross-sectional view (a cross-sectional view taken along line III-III ′ of FIG. 9) showing an enlarged part of a bonding pad according to the third embodiment. It is a principal part top view which expands and shows the power supply bonding pad which the present inventors examined. It is principal part sectional drawing (sectional drawing along the BB 'line of FIG. 11) which expands and shows a part of bonding pad for power supplies which the present inventors examined. It is a principal part top view which expands and shows the bonding pad for power supplies by this Embodiment 4. FIG. FIG. 14 is an essential part cross-sectional view (a cross-sectional view taken along the line IV-IV ′ of FIG. 13) showing an enlarged part of a power supply bonding pad according to the fourth embodiment. It is principal part sectional drawing which expands and shows a part of modification of the power supply bonding pad by this Embodiment 4. FIG. (A) is a principal part top view which expands and shows the bonding pad which the present inventors examined, (b) is principal part sectional drawing expanded along the AA 'line of the same figure (a). It is principal part sectional drawing of the bonding pad which shows an example of the crack which entered into the protective film.

  In the following embodiments, when necessary for the sake of convenience, the description will be divided into a plurality of sections or embodiments. However, unless otherwise specified, they are not irrelevant to each other, and one is the other. There are some or all of the modifications, details, supplementary explanations, and the like.

  Further, in the following embodiments, when referring to the number of elements (including the number, numerical value, quantity, range, etc.), especially when clearly indicated and when clearly limited to a specific number in principle, etc. Except, it is not limited to the specific number, and may be more or less than the specific number. Further, in the following embodiments, the constituent elements (including element steps and the like) are not necessarily indispensable unless otherwise specified and apparently essential in principle. Needless to say. Similarly, in the following embodiments, when referring to the shapes, positional relationships, etc. of the components, etc., the shapes are substantially the same unless otherwise specified, or otherwise apparent in principle. And the like are included. The same applies to the above numerical values and ranges.

  Further, in the drawings used in the following embodiments, hatching may be added to make the drawings easy to see even if they are plan views. In the following embodiments, the term “wafer” is mainly a Si (Silicon) single crystal wafer. However, not only that, but also an SOI (Silicon On Insulator) wafer and an integrated circuit are formed thereon. Insulating film substrate or the like. The shape includes not only a circle or a substantially circle but also a square, a rectangle and the like.

  In all the drawings for explaining the following embodiments, components having the same function are denoted by the same reference numerals in principle, and repeated description thereof is omitted. Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

(Embodiment 1)
A BGA (Ball Grid Array) type semiconductor device having a face-up bonding structure employing wire bonding connection according to the first embodiment will be described with reference to FIGS. FIG. 1 is a plan view showing the configuration of a BGA type semiconductor device adopting wire bonding connection, FIG. 2 is a cross-sectional view showing the configuration of a BGA type semiconductor device adopting wire bonding connection, and FIG. 3 shows an enlarged bonding pad. FIG. 4 is a fragmentary cross-sectional view (a cross-sectional view taken along the line II ′ of FIG. 3) showing an enlarged part of the bonding pad.

  As shown in FIGS. 1 and 2, the semiconductor device 1 is not limited thereto, but the semiconductor chip 3 is disposed on the main surface 2 x side of the main surface 2 x and the back surface 2 y located on the opposite sides of the wiring substrate 2. It is mounted and has a package structure in which a plurality of solder balls 4 are arranged as external connection terminals on the back surface 2 y side of the wiring board 2.

  A semiconductor chip 3 is mounted on a main surface 2x of the wiring board 2 via a film-like adhesive such as paste or DAF (Die Attach Film), and the semiconductor chip 3 is a plane that intersects the thickness direction thereof. The shape is square. A plurality of bonding pads BP1 in a row are arranged along each side (peripheral portion) of the main surface of the semiconductor chip 3. A core region 3b is formed inside a region (pad region) 3a provided with a plurality of bonding pads BP1, and includes a CPU (Central Processing Unit), a DSP (Digital Signal Processing), and a RAM. Integrated circuits such as (Random Access Memory), PLL (Phase Locked Loop), and DLL (Delay Locked Loop) are formed.

  The plurality of bonding pads BP1 are composed of the uppermost wiring in the multilayer wiring layer (multilayer wiring layer in which a plurality of insulating films and wiring layers are stacked). A protective film 5 is formed over the plurality of bonding pads BP1 so as to cover the multilayer wiring layer, and a part of the upper surface of each bonding pad BP1 is formed by an opening 6 formed in the protective film 5. Exposed.

  The wiring board 2 is, for example, a build-up board, and the planar shape intersecting with the thickness direction is a quadrangle. The wiring board 2 mainly covers the core material, the main surface protective film formed so as to cover the main surface of the core material, and the back surface located on the opposite side of the main surface of the core material. The back surface protective film is formed. The core material has, for example, a multilayer wiring structure having wiring on its main surface, back surface, and inside.

  On the main surface 2x of the wiring board 2, a plurality of bonding leads 7 are arranged in a row along each side of the wiring board 2 in a region between the peripheral edge of the semiconductor chip 3 and the peripheral edge of the wiring board 2. Has been. These bonding leads 7 are composed of the uppermost layer wiring formed on the core material of the wiring board 2, and the upper surface of each bonding lead 7 is exposed through an opening formed in the main surface protective film. A plurality of back surface electrode pads 8 are arranged on the back surface 2 y of the wiring board 2. These back electrode pads 8 are formed of the lowermost layer wiring formed on the core material of the wiring board 2, and the lower surfaces of the respective back electrode pads 8 are exposed through openings formed in the back surface protective film. A plurality of uppermost layer wirings and a plurality of lowermost layer wirings formed in the core material are electrically connected to each other by wirings formed in a plurality of through holes penetrating the core material.

  A plurality of bonding pads BP1 arranged on the main surface of the semiconductor chip 3 and a plurality of bonding leads 7 arranged on the main surface of the wiring board 2 are electrically connected by a plurality of bonding wires 9W, respectively. For example, a gold wire of about 20 to 30 μmφ is used for the bonding wire 9W. For this wire bonding connection, for example, a nail head bonding (ball bonding) method using ultrasonic vibration in combination with thermocompression bonding can be used. The semiconductor chip 3 and the bonding wire 9 </ b> W are sealed with a resin sealing body 10 formed on the main surface of the wiring substrate 2. The resin sealing body 10 is made of an insulating resin such as epoxy.

  As shown in FIG. 3, each bonding pad BP1 has a rectangular shape, has a short side in a direction along the side of the semiconductor chip, and a long side in a direction intersecting the side of the semiconductor chip. In addition, along the direction along the long side (longitudinal direction), the surface region of one bonding pad BP1 is a region where a bonding wire is bonded (wire bonding region) BP1w and a probe for inspection (contact) Probe region) BP1p. Here, regarding the arrangement of the wire bonding region BP1w and the probe region BP1p, it is desirable to arrange the bonding pad BP1 so that the wire bonding region BP1w is closer to the side of the semiconductor chip. By disposing the wire bonding region BP1w closer to the side of the semiconductor chip, the bonding pad BP1 and the bonding formed on the main surface of the wiring board than when the probe region BP1p is disposed closer to the side of the semiconductor chip. The length of the bonding wire that electrically connects the lead 7 can be shortened, and the inductance between the bonding pad BP1 and the bonding lead 7 can be reduced.

  The bonding pad BP1 is made of, for example, a metal film mainly composed of an aluminum film, and has a thickness of about 0.85 μm, for example. Further, when the pitch (P1) of adjacent bonding pads BP1 arranged along the side of the semiconductor chip is, for example, 65 μm, the dimension of the bonding pad BP1 is, for example, one side in the longitudinal direction is 120 μm, and one side in the short direction As an example, the distance between adjacent bonding pads BP1 may be 5 μm.

  Further, since the bonding pad BP1 only needs to have a size that does not overlap the wire bonding region BP1w and the probe region BP1p, the area of the probe region BP1p and the area of the wire bonding region BP1w may be the same. . However, in the first embodiment, in order to widen the probe region BP1p, the dimension of the probe region BP1p is made longer than the dimension of the wire bonding region BP1w in the longitudinal direction of the bonding pad BP1. For example, as shown in FIG. 3, the dimension of the wire bonding region BP1w in the longitudinal direction of the bonding pad BP1 is, for example, 50 μm, and the dimension of the probe region BP1p in the longitudinal direction of the bonding pad BP1 is, for example, 62.5 μm.

  The bonding pad BP1 is composed of the uppermost wiring in the multilayer wiring layer of the semiconductor chip, and the opening formed in the protective film 5 formed so as to cover the multilayer wiring layer corresponding to each bonding pad BP1. 6 is exposed.

  As shown in FIG. 4, the protective film 5 is formed on the bonding pad BP1, and is formed of a laminated film of, for example, a silicon oxide film 5a and a silicon nitride film 5b deposited thereon. The silicon oxide film 5a is formed by, for example, a plasma CVD (Chemical Vapor Deposition) method, and the thickness thereof is, for example, about 0.2 μm. The silicon nitride film 5b is formed by, for example, a plasma CVD method, and the thickness thereof is, for example, about 0.6 μm. The silicon nitride film 5b formed by the plasma CVD method has a function of preventing moisture from entering from the outside.

  The antireflection film 11 remains between the upper surface of the bonding pad BP1 and the protective film 5. The antireflection film 11 is a film provided to prevent halation in the photolithography process when the bonding pad BP1 is formed by the photolithography method and the etching method. That is, after a metal film (for example, an aluminum film) and an antireflection film are formed on the entire surface of the wafer, the metal film and the antireflection film are processed by a photolithography method and an etching method to form the bonding pad BP1 (at the same time, Upper layer wiring is also formed). Subsequently, after forming the protective film 5 on the entire surface of the wafer, an opening 6 that exposes the upper surface of the bonding pad BP1 is formed in the protective film 5 by photolithography and etching. At this time, since the antireflection film 11 under the protective film 5 is not removed, the antireflection film 11 remains between the upper surface of the bonding pad BP1 and the protective film 5. The antireflection film 11 is made of, for example, a titanium nitride film, and has a thickness of, for example, about 0.075 μm.

  The opening 6 formed in the protective film 5 is provided on the bonding pad BP1. This is because the bonding pad BP1 is used as an etching stopper film for the protective film 5 when the opening 6 is formed in the protective film 5 formed on the bonding pad BP1. Therefore, the protective film 5 overlaps with a predetermined width on the peripheral edge of the bonding pad BP1, and the peripheral edge of the bonding pad BP1 is covered with the protective film 5.

  In the bonding pad BP1 according to the first embodiment, the width of the protective film 5 overlapping the periphery of the bonding pad BP1 is different between the wire bonding region BP1w and the probe region BP1p, and the protective film in the wire bonding region BP1w. The convex opening 6 is formed so that the overlap width of 5 is wider than the overlap width of the protective film 5 in the probe region BP1p. An example of the overlapping width of the protective film 5 in the wire bonding region BP1w is 5 μm, and an example of the overlapping width of the protective film 5 in the probe region BP1p is 2.5 μm. Therefore, the dimension of the opening 6 in the short direction of the wire bonding region BP1w is, for example, 50 μm, and the dimension of the opening 6 in the short direction of the probe region BP1p is, for example, 55 μm.

  In the case of the bonding pad BP1 having the dimensions described above, for example, in the case of a bonding wire having a diameter of 30 μm, the diameter of the metal ball at the tip thereof is, for example, about 40 μm, and if the metal ball is bonded only to the center of the wire bonding region BP1w However, it does not run over the portion where the peripheral edge portion of the bonding pad BP1 and the protective film 5 overlap. However, in the actual wire bonding process, it is difficult to perform wire bonding so that the metal ball does not run on the portion where the peripheral edge portion of the bonding pad BP1 and the protective film 5 overlap.

  The reason will be described. A wire bonding apparatus used in the wire bonding process performs wire bonding by using ultrasonic vibration in combination with thermocompression bonding. The wire bonding apparatus connects a bonding pad provided on a semiconductor chip and a bonding lead provided on a corresponding wiring substrate by a bonding wire. In the connection step, first, the capillary is lowered onto the wire bonding region of a predetermined bonding pad, and a metal ball at the tip of the bonding wire is crimped. At this time, for example, ultrasonic vibration is used in a state where heat of about 230 ° C. is applied. The load is about 120 mN, for example. Subsequently, the capillary is pulled up to a predetermined height, a loop is drawn, and the capillary is moved to the corresponding bonding lead. The bonding wire is cut off from the capillary by pressurizing the capillary on the bonding lead to slightly crush and pull up the bonding wire. This is sequentially performed on the wire bonding regions of a plurality of bonding pads arranged in a row and the bonding leads corresponding thereto. Incidentally, the time for connecting the wire bonding region of one bonding pad and one bonding lead with a bonding wire is generally as high as 0.1 seconds or less. In the connection step of the wire bonding apparatus, there are various factors that cause the metal ball to deviate from the center of the wire bonding region.

  In order to automatically execute the above-described connection step, the wire bonding apparatus is preliminarily inputted with the position coordinates of the bonding pads of the semiconductor chip and the bonding leads of the wiring board and holds the data therein. The position coordinates are generally input by image recognition using a camera provided in the wire bonding apparatus. However, humans are operating the wire bonding apparatus and determining the quality of the input image. A recognition error is inevitably caused. Further, the semiconductor chip and the wiring board to be bonded are set on the XYθ table provided on the base base of the wire bonding apparatus, and this XYθ table repeats many times of movement at the time of bonding. The movement stop error also occurs. Further, the metal balls are crushed when a load and ultrasonic waves are applied through the capillaries, but the ball diameter after the crushed also varies in the order of several μm. Furthermore, since the size of the semiconductor chip has been reduced due to the recent trend of miniaturization of semiconductor devices, and the size of the bonding pad has also been reduced accordingly, the clearance between the end of the bonding pad and the outer circumference of the metal ball is about several μm. Only remains.

  In other words, due to the above-mentioned image recognition error, movement stop error of the XYθ table, variation in ball diameter, reduction in clearance between the end of the bonding pad and the outer periphery of the metal ball, and accumulation of other factors, most of the metal balls become the periphery of the bonding pad. It rides on the part where the part and the protective film overlap.

  However, as in the first embodiment, the peripheral width of the bonding pad BP1 and the protective film 5 in the wire bonding region BP1w are increased by, for example, 5 μm so that the peripheral width of the bonding pad BP1 and the protective film 5 overlap each other. Since the strength of the overlapping portion is improved, it is possible to prevent the protective film 5 from cracking even if the metal ball rides on the overlapping portion. In addition, the alloy layer is satisfactorily formed between the metal ball and the bonding pad BP1, and by reducing the metal ball to the extent that no problem occurs in bonding, the peripheral portion of the bonding pad BP1 in the wire bonding region BP1w The overlapping width with the protective film 5 may be further increased. By doing in this way, the danger that a crack will enter into protective film 5 can be made still lower. As a result of examination by the present inventors, if the overlapping width between the peripheral edge of the bonding pad BP1 and the protective film 5 is 5 μm, a metal ball is formed on the portion where the peripheral edge of the bonding pad BP1 and the protective film 5 overlap. It has been confirmed that no cracks occur in the protective film 5 even when riding.

  On the other hand, in the semiconductor chip inspection process, if the probe contacts only the center of the probe region BP1p, the probe can be a peripheral portion of the bonding pad BP1 even if the area of the opening 6 where the bonding pad BP1 of the probe region BP1p is exposed is small. And the protective film 5 do not come into contact with each other. However, in the actual semiconductor chip inspection process, it is difficult to bring the probe into contact with only the center of the probe region BP1p.

  The reason will be described. For example, a semiconductor chip is inspected by a tester at a wafer stage before being diced by dicing. For this inspection, a probe card is used as means for connecting the tester to the semiconductor chip. The probe card is provided with a plurality of probes on one surface, and these are in contact with probe regions of a plurality of bonding pads provided on the semiconductor chip, respectively. Then, the electrical characteristics of the integrated circuit formed on the main surface of the semiconductor chip are measured by a tester via the probe. The above inspection is performed simultaneously on a plurality of semiconductor chips (for example, semiconductor chips arranged in 4 × 8), and 1000 to 2000 probes may be brought into contact with a plurality of bonding pads at a time. For this reason, the probe often deviates from the center of the probe region of the bonding pad, and the area of the opening where the bonding pad in the probe region is exposed cannot be reduced in consideration of the deviation amount.

  However, as in the first embodiment, the overlapping width of the peripheral portion of the bonding pad BP1 and the protective film 5 in the probe region BP1p is narrowed to, for example, 2.5 μm, so that the upper surface of the bonding pad BP1 is exposed. A wide area of the portion 6 can be secured. If the overlapping width between the peripheral edge of the bonding pad BP1 and the protective film 5 in the probe region BP1p is further reduced, the risk that the probe contacts the protective film 5 at the peripheral edge of the bonding pad BP1 is further reduced. However, in this case, due to misalignment between the bonding pad BP1 and the opening 6 when the opening 6 is formed in the protective film 5, the protective film 5 is etched, and at the same time, the bonding pad formed under the bonding pad BP1. The interlayer insulating film around BP1 may also be etched. From the examination results by the present inventors, it has been confirmed that the above-described processing defects do not occur when the overlapping width between the peripheral portion of the bonding pad BP1 and the protective film 5 is 2.5 μm.

  As described above, according to the first embodiment, the bonding pad BP1 is rectangular, the overlapping width of the protective film 5 in the wire bonding region BP1w of the bonding pad BP1 is set to the protective film in the probe region BP1p of the bonding pad BP1. The opening 6 is formed in the protective film 5 on the bonding pad BP1 so as to be wider than the overlapping width of 5. Thereby, in the wire bonding region BP1w of the bonding pad BP1, when the metal ball is bonded to the wire bonding region BP1w, the protective film 5 is prevented from cracking even if the metal ball rides on the peripheral edge of the bonding pad BP1. be able to. Further, in the probe region BP1p of the bonding pad BP1, the opening 6 from which the bonding pad BP1 is exposed can be widened so that the probe does not contact the protective film 5 that overlaps the peripheral edge of the bonding pad BP1. Since the former eliminates the generation of cracks, it is possible to prevent moisture from entering the bonding pads BP1 through the cracks, short-circuiting between the bonding pads BP1, short-circuiting between internal wirings, or short-circuiting between the bonding pads BP1 and internal wirings. It is possible to prevent electrical defects such as. Moreover, about the latter, destruction of the protective film 5 by a probe contacting the protective film 5 can be prevented.

  Heretofore, the case where the present invention is applied to a BGA type semiconductor device employing wire bonding connection has been described, but the present invention is not limited to this. For example, the present invention can also be applied to a semiconductor device that employs flip-chip connection in which a semiconductor chip and a wiring board are connected via bump electrodes.

  A BGA type semiconductor device having a face-down bonding structure employing flip-chip connection will be described with reference to FIGS. FIG. 5 is a plan view showing the configuration of a BGA type semiconductor device adopting flip chip connection, and FIG. 6 is a cross-sectional view showing the configuration of a BGA type semiconductor device adopting flip chip connection. In FIG. 5, the main surface of the semiconductor chip on which the bonding pad is formed is shown in order to explain the arrangement of the bonding pads. However, as shown in FIG. It faces the main surface of the wiring board.

  As shown in FIGS. 5 and 6, the shapes of the bonding pad BP1 and the opening 6 are the same as those described with reference to FIGS. That is, each bonding pad BP1 has a rectangular shape, has a short side in a direction along the side of the semiconductor chip 3, and has a long side in a direction crossing the side of the semiconductor chip. Along the longitudinal direction, the surface area of one bonding pad BP1 includes a bump bonding area (the same area as the wire bonding area BP1w shown in FIG. 3 described above) to which the bump 9B is connected and a probe area (described above FIG. 3). The same region as the probe region BP1p shown in FIG. Further, the width of the protective film 5 overlapping the peripheral edge of the bonding pad BP1 is different between the bump bonding region and the probe region, and the overlapping width of the protective film 5 in the bump bonding region is the protective film in the probe region. The convex opening 6 is formed so as to be wider than the overlapping width of 5.

  In the face-down bonding structure employing such flip chip connection, the bump bonding region is closer to the core region 3b than the side of the semiconductor chip 3 (the probe region is more than the core region 3b of the semiconductor chip 3). The bonding pad BP1 may be disposed so as to be closer to the side. By disposing the bump bonding region on the side closer to the core region 3b of the semiconductor chip 3, the bump bonding region is formed on the bonding pad BP1 and the core region 3b than when the probe region is disposed on the side closer to the core region 3b of the semiconductor chip 3. Therefore, the length of the circuit wiring that electrically connects the integrated circuit can be shortened, and the inductance caused by the circuit wiring can be reduced.

  The feature described in the first embodiment has been described by taking the case where it is applied to a BGA package as an example. However, the present invention is not limited to this, and is not limited to this. QFP (Quad Flat Package), SOP (Small Outline Package), and The present invention can also be applied to other packages such as CSP (Chip Size Package).

(Embodiment 2)
The second embodiment is a modification of the bonding pad BP1 according to the first embodiment described above, and the shape of the bonding pad and the opening and the arrangement of the bonding pad are different from those described in the first embodiment. The shape and arrangement of the bonding pad according to the second embodiment will be described with reference to FIGS. FIG. 7 is an enlarged plan view of an essential part showing the bonding pad, and FIG. 8 is an enlarged sectional view showing an essential part of the bonding pad (a sectional view taken along the line II-II ′ in FIG. 7).

  As shown in FIGS. 7 and 8, the surface area of one bonding pad BP2 is divided into a wire bonding area BP2w and a probe area BP2p, as in the first embodiment. However, unlike the first embodiment described above, the length (LB) in the direction along the side of the semiconductor chip in the wire bonding region BP2w is equal to the length (LP) in the direction along the side of the semiconductor chip in the probe region BP2p. ) And the bonding pad BP2 has a convex shape. Furthermore, each bonding pad BP2 is alternately and alternately shifted (staggered) in the longitudinal direction of the bonding pad BP2 along the side of the semiconductor chip, and the wire bonding region BP2w is located on the side of the semiconductor chip, the core The convex shapes are alternately inverted so as to be on the region side and the side of the semiconductor chip.

  The dimension of the bonding pad BP2 in the direction (longitudinal direction) intersecting the side of the semiconductor chip can be the same as that of the bonding pad BP1 according to the first embodiment described above. As the dimension of the bonding pad BP2, for example, one side in the longitudinal direction 120 μm, the dimension of the wire bonding region BP2w in the longitudinal direction of the bonding pad BP2 can be set to 50 μm, for example, and the size of the probe region BP2p in the longitudinal direction of the bonding pad BP2 can be set to 62.5 μm, for example.

  Similarly to the first embodiment described above, the pitch (P2) of the adjacent bonding pads BP2 arranged in a staggered manner along the side of the semiconductor chip 3 is, for example, 65 μm, and the minimum interval between the adjacent bonding pads BP2 is set. For example, in the case of 5 μm, the dimension of the bonding pad BP2 in the direction along the side of the semiconductor chip (short direction) is the dimension of the bonding pad BP2, for example, the dimension in the short direction of the wire bonding region BP2w is 65 μm. The dimension in the short direction of the region BP2p can be set to 60 μm. Note that the interval (S2) between the wire bonding regions BP2w of every other bonding pad BP2 only needs to be 5 μm, which is the minimum interval, and therefore, as shown by the dotted line in FIG. The dimension in the short direction can be made larger than the above 65 μm.

  The bonding pad BP2 is composed of the uppermost wiring of the multilayer wiring layers of the semiconductor chip, as in the first embodiment, and each bonding pad is formed on the protective film 5 formed so as to cover the multilayer wiring layer. It is exposed through the opening 12 formed corresponding to BP2. The opening 12 of the protective film 5 is provided on the bonding pad BP2. The protective film 5 overlaps with a predetermined width on the peripheral edge of the bonding pad BP2, and the peripheral edge of the bonding pad BP2 is the protective film 5. Covered with

  However, unlike the first embodiment described above, in the bonding pad BP2 according to the second embodiment, the shape of the opening 12 is rectangular. Therefore, the width of the protective film 5 overlapping the peripheral edge of the bonding pad BP2 is different between the wire bonding region BP2w and the probe region BP2p, and the overlapping width of the protective film 5 in the wire bonding region BP2w is different from the probe region BP2p. It becomes wider than the overlapping width of the protective film 5 in FIG. Examples of the dimension of the opening 12 include 112.5 μm on one side in the longitudinal direction and 55 μm on one side in the short direction. The overlapping width of the protective film 5 in the wire bonding region BP2w can be set to 5 μm, and the overlapping width of the protective film 5 in the probe region BP2p can be set to 2.5 μm depending on the size of the bonding pad BP2 and the size of the opening 12 described above. . Further, when the dimension in the short direction of the wire bonding region BP2w of the bonding pad BP2 is larger than 65 μm, the overlapping width of the protective film 5 in the wire bonding region BP2w can be further increased. For example, when the dimension in the short direction of the wire bonding region BP2w of the bonding pad BP2 is 125 μm, the overlapping width of the protective film 5 in the wire bonding region BP2w of 35 μm is obtained.

  Thus, according to the second embodiment, the bonding pad BP2 is formed such that the length along the side of the semiconductor chip in the wire bonding region BP2w is longer than the length along the side of the semiconductor chip in the probe region BP2p. By forming the opening 12 formed in the protective film 5 on the bonding pad BP2 into a rectangular shape, the overlapping width of the protective film 5 in the wire bonding region BP2w of the bonding pad BP2 is set to the bonding pad BP2. It can be made wider than the overlapping width of the protective film 5 in the probe region BP2p. Thus, in the probe region BP2p of the bonding pad BP2, the width of the opening 12 where the probe does not come into contact with the protective film 5 that rides on the peripheral edge of the bonding pad BP2 is secured, and in the wire bonding region BP2w of the bonding pad BP2 Even if the metal ball at the tip of the bonding wire rides on the peripheral edge of the bonding pad BP2, it is possible to prevent cracks from entering the protective film 5, so that the same effect as in the first embodiment can be obtained.

  Furthermore, each bonding pad BP2 is alternately and alternately shifted (staggered) in the longitudinal direction of the bonding pad BP2 along the side of the semiconductor chip, and the wire bonding region BP2w is located on the side of the semiconductor chip, the core The convex shapes are alternately inverted so as to be on the region side and the side of the semiconductor chip.

  With such an arrangement, a space corresponding to about one dimension (width) in the short direction of the probe region BP2p is secured between the wire bonding regions BP2w of the respective bonding pads BP2. Then, the dimension in the short direction of the wire bonding region BP2w can be increased in the reserved space, and accordingly, the overlap width of the protective film 5 can be increased, so that the crack resistance is further improved. be able to.

(Embodiment 3)
In recent years, as shown in FIG. 2 described above, environmental protection and environmental protection can be applied to the wiring board 2 on which the semiconductor chip 3 is mounted or the resin member (resin material) constituting the resin sealing body 10 for sealing the semiconductor chip 3. Halogen-free members have been used from the viewpoint of reducing load substances. Specifically, the collection and collection of waste from electrical and electronic equipment is regulated, and plastics that contain brominated flame retardants as substances that should be excluded from waste that has been separated and collected are WEEE (Waste Electrical and Electronic Equipment). ) It is defined by the directive. For this reason, the request | requirement which uses a halogen-free member with respect to the resin member (resin material) which comprises the wiring board 2 or the resin sealing body 10 is expanding. The halogen-free member used for the wiring board 2 has a chlorine content of 0.09% by weight or less, a bromine content of 0.09% by weight or less, and a total amount of chlorine and bromine of 0.15%. A material that is less than or equal to weight percent. Further, the halogen-free member used for the resin member (resin material) constituting the resin sealing body 10 has a chlorine content of 0.09% by weight or less and a bromine content of 0.09% by weight or less. The antimony content is 0.09% by weight or less. That is, when a halogen-free member is used for the resin member (resin material) constituting the wiring board 2 and the resin sealing body 10, the material specified by the above-mentioned WEEE command is used.

  However, when the halogen-free member as described above is used for the package material, for example, the adhesiveness (adhesion) between the surface of the semiconductor chip and the resin member (resin material) is reduced as compared with the conventional package material, and the package It has been found that the moisture resistance of the semiconductor device may be reduced due to the penetration of moisture inside.

  The third embodiment described below relates to a bonding pad that has the effect of preventing the generation of cracks in a protective film and ensuring the moisture resistance of a semiconductor device even when a halogen-free member is used. It is.

  The shape of the bonding pad according to the third embodiment will be described with reference to FIGS. FIG. 9 is an enlarged plan view of an essential part showing a bonding pad, and FIG. 10 is an enlarged sectional view of an essential part showing a part of the bonding pad (a sectional view taken along line III-III ′ in FIG. 9).

  As shown in FIGS. 9 and 10, each bonding pad BP3 has a rectangular shape as in the first embodiment described above, and the surface area of one bonding pad BP3 along the longitudinal direction is: It is divided into a wire bonding region BP3w and a probe region BP3p.

  The bonding pad BP3 is made of, for example, a metal film whose main material is an aluminum film, and has a thickness of, for example, 0.85 μm. Further, when the pitch (P3) of adjacent bonding pads BP3 arranged along the side of the semiconductor chip 3 is, for example, 65 μm, the dimension of the bonding pad BP3 is, for example, one side in the longitudinal direction is 120 μm, For example, 5 μm can be exemplified as an interval between adjacent bonding pads BP3 of 60 μm. The dimension of the wire bonding region BP3w in the longitudinal direction of the bonding pad BP3 is, for example, 50 μm, and the dimension of the probe region BP3p in the longitudinal direction of the bonding pad BP3 is, for example, 62.5 μm.

  The bonding pad BP3 is composed of the uppermost wiring in the multilayer wiring layer of the semiconductor chip, and the opening formed in the protective film 13 formed so as to cover the multilayer wiring layer corresponding to each bonding pad BP3. 6 is exposed.

  The protective film 13 has a structure in which, for example, a first insulating film 13a having a first thickness, a second insulating film 13b having a second thickness larger than the first thickness, and a third insulating film 13c are stacked. . However, a laminated film of the first insulating film 13a and the second insulating film 13b is formed at the peripheral edge portion of the bonding pad BP3 so as to cover the peripheral edge portion of the bonding pad BP3, and further on the bonding pad BP3 of this laminated film. A third insulating film 13c is formed so as to cover the end of the first insulating film 13c. The first insulating film 13a is a silicon oxide film formed by, for example, a plasma CVD method, and the first thickness is, for example, about 0.2 μm. The second insulating film 13b is a silicon oxide film formed by, for example, a high-density plasma CVD method, and the second thickness thereof is, for example, about 0.9 μm. The thickness of the second insulating film 13b is not limited to this, and may be any thickness that can fill the space between the adjacent bonding pads BP3. In addition, since the second insulating film 13b is expected to be embedded between adjacent bonding pads BP3, an insulating film with good coverage is preferable. The third insulating film 13c is a silicon nitride film formed by, for example, a plasma CVD method, and the thickness thereof is, for example, about 0.6 μm. The third insulating film 13c has a function of preventing moisture from entering from the outside.

  By forming the protective film 13 so as to embed between the adjacent bonding pads BP3, the strength against destruction of the protective film 13 itself is increased. In the wire bonding region BP3w of the bonding pad BP3, the bonding wire is connected to the wire bonding region BP3w. When joining the metal balls at the tips of the electrodes, for example, even if a nail head bonding method in which ultrasonic vibration is used in combination with thermocompression bonding is adopted, cracks and peeling, etc. entering the protective film 13 due to ultrasonic vibration can be suppressed.

  Also, after forming a laminated film composed of the first insulating film 13a and the second insulating film 13b and forming the opening 6a in the laminated film on the bonding pad BP3 so as to overlap the peripheral edge of the bonding pad BP3, The third insulating film 13c is formed, and the opening 6 is formed in the third insulating film 13c on the bonding pad BP3 so as to cover the end of the laminated film, so that the laminated film is completely formed by the third insulating film 13c. Since it is covered, the moisture resistance of the semiconductor chip can be improved.

  Even when the third insulating film 13c is formed so as to cover the laminated film composed of the first insulating film 13a and the second insulating film 13b, in the wire bonding region BP3w, the metal ball and the bonding pad BP3 are excellent. In order to obtain bonding, it is preferable that the area of the wire bonding region BP3w is wide, and in the probe region BP3p, the area of the probe region BP3p is not in contact with the protective film 13 overlapping the peripheral edge of the bonding pad BP3. The wider one is preferable. Therefore, in the third embodiment, similarly to the first embodiment, the overlapping width of the bonding pad BP3 and the protective film 13 in the wire bonding region BP3w is set to 5 μm, and the bonding pad BP3 and the protection in the probe region BP3p are protected. The overlap width with the film 13 is 2.5 μm. Therefore, in the Y-bonding region BP3w, for example, the overlapping width of the laminated film composed of the first insulating film 13a and the second insulating film 13b constituting the lower part of the protective film 13 is 2.5 μm, and the upper part of the protective film 13 is constituted. The overlapping width of the three insulating films 13c is 5 μm, and in the probe region BP3p, for example, the overlapping width of the laminated film composed of the first insulating film 13a and the second insulating film 13b constituting the lower portion of the protective film 13 is 1.25 μm. The overlapping width of the third insulating film 13c constituting the upper part of the film 13 is set to 1.25 μm.

  Thus, according to the third embodiment, the overlapping width of the protective film 13 in the bonding area BP3w of the bonding pad BP3 is made wider than the overlapping width of the protective film 13 in the probe area BP3p of the bonding pad BP3. In addition, the protective film 13 can be formed so as to be embedded between the adjacent bonding pads BP3 to increase the strength against destruction of the protective film 13 itself. Thereby, in the wire bonding region BP3w of the bonding pad BP3, even if the metal ball rides on the peripheral edge of the bonding pad BP3, the generation of cracks in the protective film 13 can be further suppressed than in the first embodiment. Further, since the entire region other than the opening 6 can be covered with the third insulating film 13c having a function of preventing the ingress of moisture from the outside, the invasion of moisture can be further prevented than in the first embodiment. Can do. As a result, a halogen-free member is used in the semiconductor device. For example, even when the adhesion (adhesion) between the surface of the semiconductor chip and the resin member (resin material) is reduced and moisture enters, the moisture resistance of the semiconductor device is reduced. Sex can be secured.

  Although the third embodiment has been described as an example in which the bonding pad BP1 and the opening 6 according to the first embodiment described above are modified, this modified example includes the bonding pad BP2 and the bonding pad BP2 described in the second embodiment described above. The present invention can also be applied to the opening 12.

(Embodiment 4)
In the fourth embodiment, the shape of the power bonding pad and the opening that can prevent the protective film from cracking in the power bonding pad will be described.

  Before explaining the fourth embodiment, the shape of the power supply bonding pad according to the fourth embodiment will become clearer. Therefore, the shape of the power supply bonding pad investigated by the present inventors so far will be described with reference to FIG. And it demonstrates easily using FIG. 11 is an enlarged plan view of the main part showing the bonding pad for power supply, and FIG. 12 is a sectional view of the main part showing an enlarged part of the bonding pad for power supply (cross-sectional view along the line BB ′ in FIG. 11). ).

  As shown in FIGS. 11 and 12, the power supply bonding pad VB examined by the present inventors has a quadrangular shape (for example, 125 μm × 120 μm), and two rectangular shapes are formed on the upper layer of the power supply bonding pad VB. A protective film 56 is formed having an opening 55 (for example, 55 μm × 115 μm) 55. A surface region of the power supply bonding pad VB divided into the wire bonding region VBw and the probe region VBp is exposed from each of the two openings 55. However, in the power bonding pad VB having such a shape, the tip of the bonding wire is applied to the two wire bonding regions VBw exposed from the two openings 55 by, for example, a nail head bonding method in which ultrasonic vibration is used in combination with thermocompression bonding. When the metal ball is bonded, a crack 57 may be generated not only in the region where the protective film 56 overlaps the peripheral edge of the power supply bonding pad VB but also in the protective film 56 positioned between the two openings 55.

  The shape of the power supply bonding pad according to the fourth embodiment will be described with reference to FIGS. FIG. 13 is an enlarged plan view of a main part showing a bonding pad for power supply, and FIG. 14 is a sectional view showing an enlarged main part of the bonding pad for power supply (cross section taken along line IV-IV ′ in FIG. 13). Figure). FIG. 15 shows a modification of the power supply bonding pad according to the fourth embodiment.

  As shown in FIGS. 13 and 14, the power supply bonding pad VBP1 according to the fourth embodiment is substantially the same as the shape in which the two bonding pads BP3 described in the third embodiment are connected. However, in the power supply bonding pad VBP1, one probe region BP4p and the other probe region BP4p are connected, but one wire bonding region BP4w and the other wire bonding region BP4w are not connected.

  That is, a protective film 13 having two openings 6 that expose a part of the upper surface of the power supply bonding pad VBP1 across the wire bonding region BP4w and the probe region BP4p is formed on the power supply bonding pad VBP1. The wire bonding region BP4w and the probe region BP4p of the power supply bonding pad VBP1 are exposed from each of the two openings 6. A slit 14 is formed only in the wire bonding region BP4w of the power supply bonding pad VBP1 between the two openings 6. The width of the slit 14 is, for example, 5 μm.

  For example, when a metal ball is bonded to each of two wire bonding regions BP4w by employing a nail head bonding method using ultrasonic vibration in combination with thermocompression bonding, one wire bonding region BP4w and the other wire bonding region BP4w are thus formed. By providing the slit 14 between the two, the stress or the like that the ultrasonic vibration exerts on the protective film 13 can be relieved at the portion cut by the slit 14, so that the protective film located between the two openings 6 The crack which generate | occur | produces in 13 can be prevented. Further, as in the first embodiment described above, the width of the protective film 13 that overlaps the peripheral edge of the power supply bonding pad VBP1 in the wire bonding region BP4w is set to 5 μm, for example, so that the side wall of the end of the power supply bonding pad VBP1 It is also possible to prevent cracks in the protective film 13 generated by the above. By setting the width of the protective film 13 that overlaps the peripheral edge of the power supply bonding pad VBP1 in the probe region BP4p to, for example, 2.5 μm, the destruction of the protective film 13 on the power supply bonding pad VBP1 by the probe can be prevented. .

  A modification of the power supply bonding pad according to the fourth embodiment is shown in FIG. FIG. 15 is an essential part cross-sectional view showing an enlarged part of a bonding pad for power supply.

  In the power supply bonding pad VBP1 shown in FIG. 14 described above, a first insulating film 13a and a second insulating film 13b are sequentially deposited thereon to form a two-layer film, and an opening 6a is once formed in the two-layer film. After the formation, the third insulating film 13c is formed on the two-layer film, and the opening 6 is formed in the third insulating film 13c so as to completely cover the two-layer film. On the other hand, in the power supply bonding pad VBP2 shown in FIG. 15, the first insulating film 13a, the second insulating film 13b, and the third insulating film 13c are sequentially deposited thereon to form a three-layer film, Openings 6 are formed in this three-layer film. By adopting the structure of the power supply bonding pad VBP2, the number of manufacturing steps can be reduced as compared with the case of manufacturing the power supply bonding pad VBP1.

  As described above, according to the fourth embodiment, in the wire bonding region BP4w of the power supply bonding pad VBP1, the width of the metal ball at the tip of the bonding wire overlaps with the peripheral edge of the power supply bonding pad VBP1. The width is set so that cracks do not enter the protective film 13 even when riding on the peripheral edge of the VBP 1, and the slit 14 is provided between the two wire bonding regions BP 4 w, so that two openings are also formed in the power bonding pad VBP 1. The generation of cracks in the protective film 13 between 6 can be suppressed.

  As mentioned above, the invention made by the present inventor has been specifically described based on the embodiment. However, the present invention is not limited to the embodiment, and various modifications can be made without departing from the scope of the invention. Needless to say.

  The present invention can be applied to a semiconductor device on which a semiconductor chip having a bonding pad used for wire bonding connection or flip chip connection is mounted.

DESCRIPTION OF SYMBOLS 1 Semiconductor device 2 Wiring board 2x Main surface 2y Back surface 3 Semiconductor chip 3a Pad area | region 3b Core area | region 4 Solder ball 5 Protective film 5a Silicon oxide film 5b Silicon nitride film 6, 6a Opening 7 Bonding lead 8 Back surface electrode pad 9B Bump 9W Bonding Wire 10 Resin sealing body 11 Antireflection film 12 Opening 13 Protective film 13a First insulating film 13b Second insulating film 13c Third insulating film 14 Slit 51 Protective film 51a Silicon oxide film 51b Silicon nitride film 52 Titanium nitride film 53 Crack 54 Metal Ball 55 Opening 56 Protective Film 57 Crack B1 Bonding Pad B1p Probe Area B1w Wire Bonding Area BP1, BP2, BP3 Bonding Pad BP1p, BP2p, BP3p, BP4p Probe Area BP1w, BP2w, BP3w, BP w wire bonding region VB power supply bonding pad VBp probe region VBw wire bonding region VBP1, VBP2 power source bonding pad

Claims (7)

A plurality of bonding pads, and a semiconductor chip having an insulating film formed so as to cover the peripheral edge of each of the plurality of bonding pads;
A wiring member on which the semiconductor chip is mounted;
A plurality of bonding members electrically connected to the plurality of bonding pads of the semiconductor chip and the plurality of bonding leads of the wiring member;
A sealing body for sealing the semiconductor chip and the plurality of bonding members;
The first bonding pad of the plurality of bonding pads has a rectangular shape, and its short side is arranged in a direction along the side of the semiconductor chip and its long side is arranged in a direction intersecting with the side of the semiconductor chip. And
The first bonding pad has a first region and a second region,
The overlapping width of the portion of the insulating film that overlaps the peripheral portion of the first region is larger than the overlapping width of the portion of the insulating film that overlaps the peripheral portion of the second region,
A first bonding member of the plurality of bonding members is connected to the first region of the first bonding pad;
In the second region of the first bonding pads, contact touch scratches probe is formed, the semiconductor device. The semiconductor device according to claim 1,
In plan view, the width of the portion of the first bonding pad exposed from the insulating film in the short side direction is the width of the portion of the first bonding pad exposed from the insulating film in the second region. A semiconductor device narrower than a width in the short side direction. The semiconductor device according to claim 2,
In plan view, the width of the portion of the first bonding pad that is exposed from the insulating film in the long side direction is the width of the portion of the first bonding pad that is exposed from the insulating film in the second region. A semiconductor device narrower than a width in the long side direction. The semiconductor device according to claim 3.
In plan view, the area of the portion of the first bonding pad exposed from the insulating film in the first region is smaller than the area of the portion of the first bonding pad exposed from the insulating film in the second region. apparatus. The semiconductor device according to claim 1,
The contact scratches of the probe in the first area of the first bonding pad is not formed,
A semiconductor device, wherein none of the plurality of bonding members is connected to the second region of the first bonding pad. The semiconductor device according to claim 1,
The plurality of bonding members are a plurality of bonding wires,
The semiconductor device, wherein the first region of the first bonding pad is disposed closer to the outer periphery of the semiconductor chip than the second region in plan view. The semiconductor device according to claim 1,
The insulating film has a first insulating film and a second insulating film formed on the first insulating film,
The semiconductor device, wherein an end portion of the first insulating film is covered with the second insulating film in the first region of the first bonding pad.

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