JP5699085B2 - 低電力のガスプラズマ源 - Google Patents
低電力のガスプラズマ源 Download PDFInfo
- Publication number
- JP5699085B2 JP5699085B2 JP2011531547A JP2011531547A JP5699085B2 JP 5699085 B2 JP5699085 B2 JP 5699085B2 JP 2011531547 A JP2011531547 A JP 2011531547A JP 2011531547 A JP2011531547 A JP 2011531547A JP 5699085 B2 JP5699085 B2 JP 5699085B2
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- plasma source
- plasma
- rod
- source
- coupler
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000000034 method Methods 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 5
- 230000001133 acceleration Effects 0.000 claims description 3
- 238000005468 ion implantation Methods 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 239000007943 implant Substances 0.000 claims 1
- 239000007789 gas Substances 0.000 description 23
- 238000004519 manufacturing process Methods 0.000 description 18
- 230000005684 electric field Effects 0.000 description 12
- 210000004180 plasmocyte Anatomy 0.000 description 10
- 150000002500 ions Chemical class 0.000 description 8
- 239000011810 insulating material Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 230000005672 electromagnetic field Effects 0.000 description 4
- 230000005284 excitation Effects 0.000 description 4
- 210000004027 cell Anatomy 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 230000005670 electromagnetic radiation Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 229910052805 deuterium Inorganic materials 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000003058 plasma substitute Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/16—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/02—Details
- H01J61/04—Electrodes; Screens; Shields
- H01J61/06—Main electrodes
- H01J61/067—Main electrodes for low-pressure discharge lamps
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/061—Construction
- H01J2237/062—Reducing size of gun
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
- H01J2237/0815—Methods of ionisation
- H01J2237/0817—Microwaves
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Combustion & Propulsion (AREA)
- Electron Sources, Ion Sources (AREA)
- Plasma Technology (AREA)
- Discharge Lamps And Accessories Thereof (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
Description
Claims (9)
- 高周波信号により励起されるプラズマ源において、
4分の1波長アンテナを構成する第1のロッドを備えており、
前記第1のロッドは、該第1のロッドと略同一の長さを有し基準電圧に設定されたカプラを構成する少なくとも2本の平行なロッドに囲まれており、
前記カプラを構成するロッドは、前記第1のロッドの周りに4分の1波長の半分乃至20分の1の距離を置いてラジアル方向に規則的に配置されており、
前記アンテナ及び前記カプラは同一の方向に向いていることを特徴とするプラズマ源。 - 高周波トランジスタ発振器から構成されている0.4 乃至10GHz の範囲内の高周波発生器に関連付けられていることを特徴とする請求項1に記載のプラズマ源。
- 光源の作製への請求項1のプラズマ源の使用方法であって、
前記プラズマ源は3本のカプラを備えていることを特徴とする使用方法。 - 前記プラズマ源は、透明な導電性筐体に囲まれていることを特徴とする請求項3に記載の使用方法。
- 前記プラズマ源は、導電性メッシュで覆われた絶縁性筐体に囲まれていることを特徴とする請求項3に記載の使用方法。
- プラズマが存在する状態での基板の打込みへの請求項1のプラズマ源の使用方法であって、
前記ロッドの端部が軸方向の磁場に配置されており、
前記プラズマ源は、前記基板から短距離の位置に配置されており、
プラズマ中での生成が望まれている原子種に応じて選択された真空雰囲気に、組立体が囲まれていることを特徴とする使用方法。 - イオン注入装置を作製すべく、3本のロッドを囲むチャンバが金属製のチャンバであり、該チャンバは、前記ロッドの端部に平行であり開口部を有して加速電極に対向して配置された面を有していることを特徴とする請求項6に記載の使用方法。
- 並設された複数の請求項1に記載のプラズマ源の組立体を備えた拡張性プラズマ源であって、
各プラズマ源は、高周波トランジスタ発振器に関連付けられていることを特徴とする拡張性プラズマ源。 - 同一の磁石が隣接したプラズマ源に軸方向の磁場を加えることを特徴とする請求項8に記載の拡張性プラズマ源。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0857068 | 2008-10-17 | ||
FR0857068A FR2937494B1 (fr) | 2008-10-17 | 2008-10-17 | Source de plasma gazeux basse puissance |
PCT/FR2009/051986 WO2010043831A1 (fr) | 2008-10-17 | 2009-10-16 | Source de plasma gazeux basse puissance |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012506116A JP2012506116A (ja) | 2012-03-08 |
JP5699085B2 true JP5699085B2 (ja) | 2015-04-08 |
Family
ID=40651732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011531547A Active JP5699085B2 (ja) | 2008-10-17 | 2009-10-16 | 低電力のガスプラズマ源 |
Country Status (11)
Country | Link |
---|---|
US (1) | US8664862B2 (ja) |
EP (1) | EP2338318B1 (ja) |
JP (1) | JP5699085B2 (ja) |
KR (1) | KR20110089849A (ja) |
CN (1) | CN102187743B (ja) |
BR (1) | BRPI0920339A2 (ja) |
DK (1) | DK2338318T3 (ja) |
FR (1) | FR2937494B1 (ja) |
MX (1) | MX2011004105A (ja) |
PL (1) | PL2338318T3 (ja) |
WO (1) | WO2010043831A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2971261B1 (fr) * | 2011-02-08 | 2013-09-20 | Centre Nat Rech Scient | Dispositif et procede de pulverisation ionique |
KR101492175B1 (ko) * | 2011-05-03 | 2015-02-10 | 주식회사 엘지화학 | 양극 활물질 입자의 표면 처리 방법 및 이로부터 형성된 양극 활물질 입자 |
KR101488659B1 (ko) * | 2012-03-06 | 2015-02-02 | 코닝정밀소재 주식회사 | 고주파 가열 장치 |
CN105636329B (zh) * | 2014-10-30 | 2019-05-17 | 北京航天长征飞行器研究所 | 一种用于小空间的等离子体产生装置 |
JPWO2017126055A1 (ja) * | 2016-01-20 | 2018-02-01 | 三菱電機株式会社 | アンテナ装置 |
FR3062770B1 (fr) * | 2017-02-06 | 2019-03-29 | Polygon Physics | Source de plasma |
US10522315B2 (en) * | 2017-09-08 | 2019-12-31 | Schlumberger Technology Corporation | Compact multi antenna based ion sources |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4266167A (en) * | 1979-11-09 | 1981-05-05 | Gte Laboratories Incorporated | Compact fluorescent light source and method of excitation thereof |
JPH07105537B2 (ja) * | 1987-09-10 | 1995-11-13 | 三菱電機株式会社 | プラズマ装置 |
JPH01241798A (ja) * | 1988-03-22 | 1989-09-26 | Matsushita Electric Ind Co Ltd | マイクロ波プラズマ装置 |
JPH02238626A (ja) * | 1989-03-13 | 1990-09-20 | Matsushita Electric Ind Co Ltd | 絶縁膜作成装置 |
JPH0479141A (ja) * | 1990-07-20 | 1992-03-12 | Sharp Corp | イオン注入装置 |
DE9102438U1 (de) * | 1991-03-01 | 1992-06-25 | Röhm GmbH, 6100 Darmstadt | Niederdruck-Plasmagenerator |
JP3149002B2 (ja) * | 1992-12-18 | 2001-03-26 | 和夫 杉山 | 同軸形のマイクロ波プラズマ発生器 |
JP2641390B2 (ja) * | 1994-05-12 | 1997-08-13 | 日本電気株式会社 | プラズマ処理装置 |
JPH09120900A (ja) * | 1995-10-26 | 1997-05-06 | Micro Denshi Kk | マイクロ波を利用したプラズマ発生装置 |
US5936352A (en) * | 1995-11-28 | 1999-08-10 | Nec Corporation | Plasma processing apparatus for producing plasma at low electron temperatures |
JPH09245658A (ja) * | 1996-03-12 | 1997-09-19 | Nissin Electric Co Ltd | 永久磁石によるecr共鳴を利用するプラズマ生成機構 |
GB2336240A (en) * | 1998-04-09 | 1999-10-13 | Jenton International Limited | Apparatus for emitting light |
JP3430959B2 (ja) * | 1999-03-04 | 2003-07-28 | 東京エレクトロン株式会社 | 平面アンテナ部材、これを用いたプラズマ処理装置及びプラズマ処理方法 |
JP2001053069A (ja) * | 1999-08-10 | 2001-02-23 | Matsushita Electric Ind Co Ltd | プラズマ処理方法とプラズマ処理装置 |
US6356026B1 (en) * | 1999-11-24 | 2002-03-12 | Texas Instruments Incorporated | Ion implant source with multiple indirectly-heated electron sources |
US6888504B2 (en) * | 2002-02-01 | 2005-05-03 | Ipr Licensing, Inc. | Aperiodic array antenna |
US7819981B2 (en) * | 2004-10-26 | 2010-10-26 | Advanced Technology Materials, Inc. | Methods for cleaning ion implanter components |
FR2884043A1 (fr) * | 2005-04-01 | 2006-10-06 | Pascal Sortais | Source lumineuse alimentee par radiofrequence pour traitements de substances et procede d'utilisation d'une telle source |
JP4714868B2 (ja) * | 2005-10-20 | 2011-06-29 | 国立大学法人静岡大学 | 放電灯装置 |
JP4757654B2 (ja) * | 2006-02-15 | 2011-08-24 | スタンレー電気株式会社 | 光源装置 |
US7976674B2 (en) * | 2007-06-13 | 2011-07-12 | Tokyo Electron Limited | Embedded multi-inductive large area plasma source |
-
2008
- 2008-10-17 FR FR0857068A patent/FR2937494B1/fr active Active
-
2009
- 2009-10-16 JP JP2011531547A patent/JP5699085B2/ja active Active
- 2009-10-16 BR BRPI0920339A patent/BRPI0920339A2/pt active IP Right Grant
- 2009-10-16 MX MX2011004105A patent/MX2011004105A/es active IP Right Grant
- 2009-10-16 WO PCT/FR2009/051986 patent/WO2010043831A1/fr active Application Filing
- 2009-10-16 CN CN200980141425.1A patent/CN102187743B/zh active Active
- 2009-10-16 DK DK09760171.0T patent/DK2338318T3/en active
- 2009-10-16 EP EP09760171.0A patent/EP2338318B1/fr active Active
- 2009-10-16 KR KR1020117011253A patent/KR20110089849A/ko not_active Application Discontinuation
- 2009-10-16 US US13/124,451 patent/US8664862B2/en active Active
- 2009-10-16 PL PL09760171T patent/PL2338318T3/pl unknown
Also Published As
Publication number | Publication date |
---|---|
FR2937494A1 (fr) | 2010-04-23 |
DK2338318T3 (en) | 2015-06-29 |
KR20110089849A (ko) | 2011-08-09 |
WO2010043831A1 (fr) | 2010-04-22 |
BRPI0920339A2 (pt) | 2016-03-01 |
EP2338318B1 (fr) | 2015-04-01 |
JP2012506116A (ja) | 2012-03-08 |
CN102187743B (zh) | 2014-09-24 |
MX2011004105A (es) | 2011-09-06 |
FR2937494B1 (fr) | 2012-12-07 |
US20110260621A1 (en) | 2011-10-27 |
CN102187743A (zh) | 2011-09-14 |
EP2338318A1 (fr) | 2011-06-29 |
PL2338318T3 (pl) | 2015-09-30 |
US8664862B2 (en) | 2014-03-04 |
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