JP5663132B2 - プロフィロメータ機能付きの走査型超音波顕微鏡 - Google Patents
プロフィロメータ機能付きの走査型超音波顕微鏡 Download PDFInfo
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- JP5663132B2 JP5663132B2 JP2008263547A JP2008263547A JP5663132B2 JP 5663132 B2 JP5663132 B2 JP 5663132B2 JP 2008263547 A JP2008263547 A JP 2008263547A JP 2008263547 A JP2008263547 A JP 2008263547A JP 5663132 B2 JP5663132 B2 JP 5663132B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0654—Imaging
- G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
- G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/269—Various geometry objects
- G01N2291/2697—Wafer or (micro)electronic parts
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
2007年10月10日付けで出願された米国仮出願第60/979,021号および2008年3月21日付けで出願された米国仮出願第61/038,460号の内容は、あたかもその全体を本明細書に記載されているかのように、引用によって本出願に組み込まれるものとする。以下の米国の特許および出願:米国特許第4,518,992号、第4,781,067号、第4,866,986号、第5,351,544号、第5,684,252号、第6,357,136号、第6,460,414号、第6,880,387号、第6,890,302号、第6,895,820号、第6,981,417号、第7,000,475号、ならびに2007年1月23日付けで出願された第11/626,177号は、Sonoscan(ソノスキャン)に譲渡され、概して、走査型超音波顕微鏡の様々な態様に関する。このような特許および出願は、全て、あたかもその全体を本明細書に記載されているかのように、引用によって組み込まれるものとする。
<関連技術の記載>
<開示の概要>
きる走査型超音波顕微鏡が提供される。
<詳細な説明>
ってよい。あるいは、周知のように、飛行時間データが表示されてもよい。
れたボールエンドのネジ先(不図示)がある。
基づくパーツの受け入れまたは却下に関する助言とを、ユーザに対して自動的に表示する。
ための新しい機能である。本発明のこの態様にしたがうと、デバイスの外部表面トポグラフィを、必要に応じ、内部特徴と同時にまたはそれ単独で明らかにすることができる。音響表面プロファイルソフトウェアモジュールは、例えば、サンプルの準備をいっさいともなわずにプラスチック集積回路、フリップチップ、基板、回路基板などの反りを測定するために使用することができる。モジュールは、既存の顕微鏡に搭載する、または新しい顕微鏡に組み込むことが可能である。
Claims (8)
- 超音波トランスデューサと、
データを保存するためのメモリと、
ディスプレイと、
前記超音波トランスデューサを上に取り付けられたモータによって駆動されるスキャナアセンブリと、
前記トランスデューサ、前記メモリ、前記ディスプレイおよび前記モータに電気的に接続されたコントローラと、
を備え、
前記コントローラは、
サンプルに対する経路に沿って前記モータを移動させ、
前記経路に沿った複数の位置における各位置で、前記サンプルに向かって少なくとも一つの音響エネルギのパルスを、前記超音波トランスデューサに放出させ、
前記超音波トランスデューサから放出された前記少なくとも一つのパルスのそれぞれに対応する反射信号を、該超音波トランスデューサに受信させ、
前記反射信号のそれぞれを、前記メモリに保存させ、
前記メモリに保存されている少なくとも幾つかの反射信号を使い、前記ディスプレイに表示される前記サンプルのプロファイル像を生成し、
前記少なくとも幾つかの反射信号と同じ信号を使い、前記サンプルの内部の音響インピーダンス特徴を表し、且つ、前記プロファイル像と同時に前記ディスプレイに表示される像を生成する、
ように適応され、
前記サンプルのプロファイル像は特定の線に沿った該サンプルの表面の高さのばらつきを示し、そこでは該高さのばらつきはゼロ点を基準として示され、該プロファイル像は、該サンプルの表面のトポグラフィの色付き表示を含む、
走査型超音波顕微鏡。 - 前記サンプルは、マイクロエレクトロニクスサンプルを含む、請求項1に記載の走査型超音波顕微鏡。
- 前記コントローラは、前記トランスデューサを前記サンプルに対してX−Yラスタスキャンで移動させるように適応される、請求項1に記載の走査型超音波顕微鏡。
- 前記音響インピーダンス特徴の像は、時間領域信号から生成される、請求項1に記載の走査型超音波顕微鏡。
- 前記コントローラは、前記放出されたパルスと前記時間領域信号との差の周波数領域表現を生成するために前記時間領域信号を処理するように適応される、請求項4に記載の走査型超音波顕微鏡。
- 前記サンプルは、セラミックまたは金属の板を含む、請求項1に記載の走査型超音波顕微鏡。
- 前記コントローラは、前記メモリに保存された反射信号の全部を使い、前記プロファイル像を生成する、
請求項1に記載の走査型超音波顕微鏡。 - 前記コントローラは、前記メモリに保存された反射信号の全部を使い、前記内部の音響インピーダンス特徴の像を生成する、
請求項1に記載の走査型超音波顕微鏡。
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US97902107P | 2007-10-10 | 2007-10-10 | |
US60/979,021 | 2007-10-10 | ||
US3846008P | 2008-03-21 | 2008-03-21 | |
US61/038,460 | 2008-03-21 | ||
US12/244,460 | 2008-10-02 | ||
US12/244,460 US8794072B2 (en) | 2007-10-10 | 2008-10-02 | Scanning acoustic microscope with profilometer function |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009145324A JP2009145324A (ja) | 2009-07-02 |
JP2009145324A5 JP2009145324A5 (ja) | 2011-09-22 |
JP5663132B2 true JP5663132B2 (ja) | 2015-02-04 |
Family
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Application Number | Title | Priority Date | Filing Date |
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JP2008263547A Active JP5663132B2 (ja) | 2007-10-10 | 2008-10-10 | プロフィロメータ機能付きの走査型超音波顕微鏡 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8794072B2 (ja) |
JP (1) | JP5663132B2 (ja) |
DE (1) | DE102008042709A1 (ja) |
FR (1) | FR2922312B1 (ja) |
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US10380745B2 (en) | 2016-09-01 | 2019-08-13 | Massachusetts Institute Of Technology | Methods and devices for measuring object motion using camera images |
DE102016125016B4 (de) | 2016-10-20 | 2022-03-10 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Verfahren zur ultraschallmikroskopischen Vermessung von Halbleiterproben, Computerprogramm zur ultraschallmikroskopischen Vermessung von Halbleiterproben, Computerprogrammprodukt und Ultraschallmikroskop |
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-
2008
- 2008-10-02 US US12/244,460 patent/US8794072B2/en active Active
- 2008-10-08 FR FR0856831A patent/FR2922312B1/fr not_active Expired - Fee Related
- 2008-10-09 DE DE102008042709A patent/DE102008042709A1/de active Pending
- 2008-10-10 JP JP2008263547A patent/JP5663132B2/ja active Active
Also Published As
Publication number | Publication date |
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FR2922312B1 (fr) | 2019-11-01 |
US8794072B2 (en) | 2014-08-05 |
DE102008042709A1 (de) | 2009-06-18 |
JP2009145324A (ja) | 2009-07-02 |
US20090095086A1 (en) | 2009-04-16 |
FR2922312A1 (fr) | 2009-04-17 |
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