JP5534044B2 - Alignment apparatus and reflection characteristic measurement system - Google Patents

Description

  The present invention relates to a technique of an alignment apparatus for a measurement object to which a reflection characteristic measurement apparatus can be attached.

  2. Description of the Related Art A reflection characteristic measuring apparatus that measures reflected light obtained by irradiating a measurement object with light and measures the reflection characteristic of the measurement object is known.

  By using such a reflection characteristic measuring apparatus, for example, the reflection characteristic measuring apparatus is stationary, and the measurement object is measured while moving the reflection characteristic measuring apparatus while performing the spot measurement for measuring the reflection characteristic of the measurement object in a minute region. It is possible to perform scan measurement that continuously measures the reflection characteristics of an object.

  In general, when performing spot measurement, an apparatus (target mask) that aligns with a measurement target is used to eliminate a positional shift of the reflection characteristic measurement apparatus with respect to a minute region to be measured. For example, the reflection characteristic measuring device described in Patent Document 1 has a shape in which the alignment device is integrally configured to be rotatable with respect to the measurement device main body, and a minute region is formed using the alignment device. Spot measurement can be performed as a measurement target.

  On the other hand, in the scan measurement, a guide device that guides the movement of the reflection characteristic measuring device is used in order to prevent the positional deviation of the reflection characteristic measuring device with respect to the measurement object that occurs when the reflection characteristic measuring device is moved. In other words, during the scan measurement, the reflection characteristic measuring device can be placed on the guide device and moved to prevent the reflection characteristic measuring device from being displaced due to the movement of the reflection characteristic measuring device. (For example, patent document 2).

  However, since the reflection characteristic measuring device described in Patent Document 1 is configured so as not to be separated from the alignment device, when the reflection characteristic measuring device is placed on a guide device for scanning measurement, the reflection characteristic measuring device An alignment device is interposed between the guide device and the guide device, and the alignment device can be an obstacle to scan measurement. Therefore, it is desirable that the alignment device used for spot measurement can be removed during scan measurement.

  Conventionally, there is known a device in which the reflection characteristic measuring device is configured to be removable from the alignment device. For example, in Patent Document 3, it is attached to be rotatable around the lower rear surface of the measuring device main body. Possible measurement position indicator plates are described.

US Pat. No. 5,691,817 US Pat. No. 7,466,416 JP-A 63-305225

  However, in the conventional detachable alignment apparatus, since the reflection characteristic measuring device is positioned at a position away from the light receiving unit that receives the reflected light in the reflection characteristic measuring device, the micro area to be measured and the light receiving unit In the meantime, a positional deviation occurred during the measurement.

  In particular, in mouse-shaped measuring devices and horizontal measuring devices that are suitable for combined use with scan measurement, the distance from the light receiving unit to the connecting unit becomes longer when attached to the alignment device, which further increases the influence of misalignment. There is a problem.

  Therefore, the present invention provides a technique that can be easily attached and can improve the alignment accuracy with respect to the measurement object when performing measurement using an alignment apparatus that can be attached to and detached from the reflection characteristic measurement apparatus. With the goal.

In order to solve the above-mentioned problems, the invention of claim 1 is a mouse-shaped or horizontal-type reflection having a light receiving portion for receiving reflected light obtained by irradiating a measurement object with light on a bottom portion substantially parallel to the longitudinal direction. An alignment device used in combination with a characteristic measurement device for aligning the position of the light receiving unit of the reflection characteristic measurement device with respect to a minute region to be measured, with respect to the bottom surface of the reflection characteristic measurement device A first member that can be attached and detached, a second member that supports the first member, a first state in which the first member and the second member overlap each other, and the first member and the second member The first member and the second member are connected to each other so that one end of each other is connected and the other end is open, and the first member is mounted. Positioning for positioning the reflection characteristic measuring device Has a section, a mounting portion for engagement to be engaged with the reflection characteristic measuring apparatus, the second member, in a state in which the reflection characteristic measuring apparatus is attached to the first member, the light receiving portion A first measurement opening opposite to the light receiving portion, and the positioning portion is positioned more than an intermediate position between the light receiving portion and the connecting portion when the reflection characteristic measuring device is attached to the first member. It arrange | positions at the said 1st member so that it may become a position close to.

According to a second aspect of the present invention, in the alignment apparatus according to the first aspect of the invention, in the mounted state of the reflection characteristic measuring device, the first member is located on the other end side opposite to the one end. The light receiving unit of the reflection characteristic measuring apparatus is disposed.
According to a third aspect of the present invention, in the alignment apparatus according to the first or second aspect of the invention, the first member is the other end opposite to the one end when the reflection characteristic measuring device is mounted. on the side, has an opening for arranging the light receiving portion of the reflection characteristic measuring apparatus, said first member, said positioning portion, with which possess along the opening, a portion for the engagement, the It has been closed on the positioning portion.

According to a fourth aspect of the present invention, in the alignment apparatus according to the third aspect of the present invention, the engaging portion has a protrusion protruding from the positioning portion toward the inside of the opening, and the reflection characteristics. The measuring device is attached to the first member by engaging a notch portion provided around the light receiving portion of the reflection characteristic measuring device with the projection portion.

The invention of claim 5 is the positioning device according to the invention of claim 1 or claim 2, pre-Symbol first member, the two positioning members provided with a predetermined interval the positioning unit And at least one of the two positioning members is closer to the light receiving portion than an intermediate position between the light receiving portion and the connecting portion when the reflection characteristic measuring device is attached to the first member. It is provided at a close position.

According to a sixth aspect of the invention, in the alignment apparatus according to the fifth aspect of the invention, the positioning member is any one of a protrusion and a hole provided in the first member.

According to a seventh aspect of the present invention, in the alignment apparatus according to any one of the first to sixth aspects, the second member slides on a surface opposite to the surface facing the first member. The anti-slip member is provided on the one end side of the second member.

Further, the invention of claim 8 is a reflection characteristic measuring system, which has a mouse shape or a horizontal type having a light receiving portion for receiving reflected light obtained by irradiating a measurement object with light on a bottom surface portion substantially parallel to the longitudinal direction. a reflection characteristic measuring apparatus, and a corresponding reflection characteristic measurement apparatus alignment device can be mounted, said alignment device includes a first member detachably attached to the bottom portion of the reflection characteristic measuring apparatus, A second member supporting the first member; a first state in which the first member and the second member overlap each other; and one end of each of the first member and the second member connected to each other and the other end The first member has a connecting portion that connects the second member so that the second member is open, and the first member positions the mounted reflection characteristic measuring device. a positioning unit that performs, the reflection characteristic measuring instrumentation mounted And a portion for engaging the engagement with the second member, in a state in which the reflection characteristic measuring apparatus is attached to the first member, having a first measurement aperture facing said light receiving portion The positioning member is positioned closer to the light receiving unit than an intermediate position between the light receiving unit and the connecting unit when the reflection characteristic measuring device is attached to the first member. Placed in.

Further, the invention of claim 9 is the reflection characteristic measurement system according to the invention of claim 8, wherein the first member is on the other end side opposite to the one end in the mounted state of the reflection characteristic measuring device. The light receiving unit of the reflection characteristic measuring device is disposed.
According to a tenth aspect of the present invention, in the reflection characteristic measurement system according to the eighth or ninth aspect of the invention, the reflection characteristic measurement device is guided so as to be movable in a direction that coincides with the longitudinal direction of the reflection characteristic measurement device. A guide device that performs the measurement performed by attaching the alignment device to the reflection characteristic measurement device, and the measurement performed by attaching the guide device to the reflection property measurement device.

The invention according to claim 11 is the reflection characteristic measurement system according to the invention according to claim 10 , wherein the guide device is in a state in which the reflection characteristic measurement device without the alignment device is attached to the guide device. And a second measurement opening facing the light receiving part.

  ADVANTAGE OF THE INVENTION According to this invention, it becomes possible to align the light-receiving part of a reflection characteristic measuring apparatus with respect to a measurement object with a sufficient precision, and also it becomes possible to measure a desired measurement object with a sufficient precision.

1 is a top external view of a reflection characteristic measuring apparatus according to a first embodiment of the present invention. 1 is a bottom external view of a reflection characteristic measuring apparatus according to a first embodiment of the present invention. It is a system diagram containing a reflection characteristic measuring apparatus. It is an external view of the alignment apparatus which can attach or detach the reflection characteristic measuring apparatus which concerns on 1st Embodiment of this invention. It is a figure which shows the state which mounted | wore the position alignment apparatus with the reflection characteristic measuring apparatus. It is a figure which shows the state which mounted | wore the position alignment apparatus with the reflection characteristic measuring apparatus. It is a figure which shows the state which mounted | wore the guide apparatus with the reflection characteristic measuring apparatus. It is a lower surface external view of the alignment apparatus. It is a flowchart which shows the procedure in the case of performing spot measurement. It is a figure which shows a white calibration stand. It is a flowchart which shows the procedure in the case of performing a scan measurement. It is an upper surface external view of the reflection characteristic measuring apparatus which concerns on 2nd Embodiment of this invention. It is a lower surface external view of the reflection characteristic measuring apparatus which concerns on 2nd Embodiment of this invention. It is an external view of the alignment apparatus which can attach or detach the reflection characteristic measuring apparatus which concerns on 2nd Embodiment of this invention. It is a figure which shows the state which mounted | wore the position alignment apparatus with the reflection characteristic measuring apparatus. It is a figure which shows the state which mounted | wore the position alignment apparatus with the reflection characteristic measuring apparatus. It is a lower surface external view of the alignment apparatus. It is a schematic diagram which shows the state of an engaging member at the time of mounting | wearing a position alignment apparatus with a reflection characteristic measuring apparatus. It is a figure which shows the state which attached the illumination intensity attachment to the reflection characteristic measuring apparatus which concerns on 1st Embodiment of this invention. It is a flowchart which shows the procedure in the case of performing illumination intensity measurement.

  Embodiments of the present invention will be described below with reference to the drawings.

<1. First Embodiment>
[Overview]
1 and 2 are external views of a reflection characteristic measuring apparatus 1A according to the first embodiment of the present invention. Here, FIG. 1 is a top external view of the reflection characteristic measuring apparatus 1A, and FIG. 2 is a bottom external view of the reflection characteristic measuring apparatus 1A.

  The reflection characteristic measuring apparatus 1A shown in FIGS. 1 and 2 is obtained by irradiating a measurement object (also referred to as “measurement object” or simply “sample”) from the inside of the reflection characteristic measurement apparatus 1A main body. It has a function of receiving reflected light and measuring the reflection characteristics of the measurement object based on the reflected light. The reflection characteristic measuring apparatus 1A includes, for example, a spectrocolorimeter, a color meter, a gloss meter, a densitometer, and the like.

  Light irradiation to the specific object and reception of the reflected light are performed through a light receiving opening 3 provided on the lower surface side (see FIG. 2) of the reflection characteristic measuring apparatus 1A. That is, the reflected light reflected from the measurement object is guided from the light receiving opening 3 to the inside of the reflection characteristic measuring apparatus 1A, and is used for measuring the reflection characteristic in the reflection characteristic measuring apparatus 1A. Since the reflected light is guided from the light receiving opening 3 to the inside of the reflection characteristic measuring apparatus 1A, the light receiving opening 3 is also referred to as a “light receiving part” in the reflection characteristic measuring apparatus 1A.

  Various attachment parts (attachment devices) can be attached to the reflection characteristic measuring apparatus 1A. FIG. 3 is a system diagram including the reflection characteristic measuring apparatus 1A.

  Specifically, as shown in FIG. 3, the reflection characteristic measurement apparatus 1A includes an alignment apparatus 10A, a white calibration table 30, a scanning guide apparatus (also simply referred to as “guide apparatus”) 50, and an illuminance measurement apparatus. An attachment (simply referred to as “illuminance attachment”) 70 can be attached to perform measurement in various modes. Then, the measurement information acquired by the reflection characteristic measuring apparatus 1A is transmitted to the personal computer (PC) 200 via the communication line. The reflection characteristic measuring apparatus 1A equipped with the accessory parts is also referred to as a reflection characteristic measuring system.

  Hereinafter, a measurement method using the alignment device 10A and a measurement method using the guide device 50 will be described.

  When the alignment apparatus 10A is used, that is, when the reflection characteristic measurement apparatus 1A is mounted on the alignment apparatus 10A, the reflection characteristic measurement apparatus 1A is stopped and spot measurement is performed to measure the reflection characteristic of the measurement object in a minute region. It can be performed. FIG. 4 is an external view of an alignment apparatus 10A to which the reflection characteristic measuring apparatus 1A can be attached and detached. 5 and 6 are views showing a state in which the reflection characteristic measuring apparatus 1A is mounted on the alignment apparatus 10A. In particular, FIG. 6 uses the reflection characteristic measurement apparatus 1A mounted on the alignment apparatus 10A. FIG. 5 shows a state diagram when spot measurement is performed.

  As the alignment apparatus 10A of the present embodiment, an alignment apparatus 10A having a shape as shown in FIG. 4 is employed. When the reflection characteristic measurement device 1A is attached to the alignment device 10A in an open state (also referred to as “open state”), the state shown in FIG. 5 is obtained.

  When actually measuring the reflection characteristics, the user presses the reflection characteristic measuring apparatus 1A from the upper part to make a transition to the closed state (also referred to as “closed state”) shown in FIG. Then, in the closed state, the measurement button 2 provided on the side surface of the reflection characteristic measuring apparatus 1A is pressed, and spot measurement is executed.

  By performing spot measurement using the alignment apparatus 10A in this way, it is possible to prevent the positional deviation of the light receiving unit of the reflection characteristic measurement apparatus with respect to the minute region to be measured.

  On the other hand, when the guide device 50 is used, that is, when the reflection characteristic measurement device 1A not attached with the alignment device 10A is attached to the guide device 50, the reflection property measurement device 1A is moved and arranged along the movement path. It is possible to perform scan measurement that continuously measures the reflection characteristics of the color patch as the measured object. FIG. 7 is a diagram illustrating a state where the reflection characteristic measuring apparatus 1 </ b> A is mounted on the guide apparatus 50.

  As the guide device 50, for example, a guide device 50 having a linear measurement opening 51 as shown in FIG. 7 is employed. When the reflection characteristic measurement device 1 </ b> A is mounted on the guide device 50, the light receiving portion of the reflection characteristic measurement device 1 </ b> A faces the measurement opening 51 of the guide device 50. Further, when the reflection characteristic measuring device 1A is mounted on the guide device 50, a protrusion (not shown) provided on the reflection characteristic measuring device 1A is fitted into the guide groove 52 of the guide device 50, so that the reflection characteristic is measured. The measuring apparatus 1A can be moved linearly along the guide groove 52. When actually performing the scan measurement, the measurement button 2 is pressed while moving the reflection characteristic measuring apparatus 1A. Here, the guide device 50 that can move the reflection characteristic measuring apparatus 1A linearly is illustrated, but the movement path (movement locus) of the reflection characteristic measuring apparatus 1A may be curvilinear. In this case, the measurement opening provided in the guide device has a curved shape along the movement path.

  As described above, by performing the scan measurement using the guide device 50, it is possible to prevent the positional deviation of the reflection characteristic measurement device 1A from the measurement object that occurs when the reflection characteristic measurement device 1A is moved.

  In the present embodiment, the reflection characteristic measurement device 1A is mounted on the guide device 50 so that the moving direction of the reflection characteristic measurement device 1A at the time of scan measurement matches the longitudinal direction of the reflection characteristic measurement device 1A. It will be.

  According to this, as compared with the guide device 50 to which the reflection characteristic measuring apparatus 1A can be mounted, the moving direction of the reflection characteristic measuring apparatus 1A at the time of scan measurement is perpendicular to the longitudinal direction of the reflection characteristic measuring apparatus 1A. In addition, since the inclination generated in the reflection characteristic measuring apparatus 1A when the reflection characteristic measuring apparatus 1A is moved can be reduced, the movement operation of the reflection characteristic measuring apparatus 1A during the scan measurement can be stabilized.

[Registration device configuration]
Next, the configuration of the alignment apparatus 10A in the present embodiment will be described in detail. FIG. 8 is a bottom external view of the alignment apparatus 10A.

  As described above, in the spot measurement for measuring the reflection characteristic of the measurement object in the minute area, the alignment apparatus 10A is used to prevent the light receiving unit of the reflection characteristic measuring apparatus 1A from being displaced with respect to the minute area to be measured. Used.

  As shown in FIG. 4, the alignment device 10 </ b> A includes an upper member (first member) 11 that can attach and detach the reflection characteristic measuring device 1 </ b> A, and a lower member (second member) 12 that supports the upper member 11. It consists of

  The upper member 11 and the lower member 12 are rotatably connected by a connecting portion (also referred to as a “hinge portion”) 13 on one end side of each other. As a result, the upper member 11 and the lower member 12 are in a closed state (first state) where they overlap each other, and an open state in which one end of each of the upper member 11 and the lower member 12 is connected and the other end is opened ( It is possible to transition between the second state). It should be noted that a biasing member such as a spring is incorporated inside the connecting portion 13 and is always open in a normal state where no force is applied from the outside.

The upper member 11 of the alignment device 10A has a shape in which the bottom surface convex portion 7 of the reflection characteristic measurement device 1A is substantially fitted on the one end side, and the reflection member measurement device 1A has the other end side. It has a circular opening 15 in which the light receiving part is arranged. Further, the upper member 11 has a fixing member 16 for fixing the reflection characteristic measuring apparatus 1A to the alignment apparatus 10A along the opening 15. The substantially annular fixing member 16 provided along the opening 15 has a plurality of protrusions 17 protruding toward the inside (inward) of the opening 15. When mounting the reflection characteristic measuring apparatus 1A to the alignment apparatus 10A, the light receiving part of the reflection characteristic measuring apparatus 1A is fitted into the opening 15 when the bottom surface convex portion 7 of the reflection characteristic measuring apparatus 1A is fitted to the one end side. In this state, the reflection characteristic measuring device 1A and the alignment device 10A are fixed by the fixing member 16.

  Specifically, the reflection characteristic measuring apparatus 1A (see FIG. 2) has an attachment member 5 for attaching the reflection characteristic measuring apparatus 1A to the alignment apparatus 10A around the light receiving opening 3. The attachment member 5 is provided with a plurality of notches 6, and when the reflection characteristic measuring device 1 </ b> A is mounted on the alignment device 10 </ b> A, the plurality of notches 6 are provided on the alignment device 10 </ b> A. The plurality of protrusions 17 provided on the fixing member 16 are respectively fitted. Then, when the lever 18 of the fixing member 16 is slid in the rotation direction in a state where the notch 6 and the protrusion 17 are fitted, the positions of the protrusion 17 and the notch 6 are shifted, The protrusion 17 is engaged with a portion between the notches, and the reflection characteristic measuring device 1A and the alignment device 10A are fixed to each other.

  Thus, the fixing member 16 of the alignment apparatus 10A functions as a positioning unit that positions the reflection characteristic measurement apparatus 1A attached to the alignment apparatus 10A. The reflection characteristic measurement apparatus 1A is connected to the alignment apparatus 10A. On the other hand, it is fixed in the vicinity of the opening 15 into which the light receiving portion is fitted.

  That is, the fixing member 16 that functions as a positioning portion is provided on the other end side of the upper member 11 that is different from the one end side where the connecting portion 13 is present. In the positioning device 10A, the fixing member 16 is positioned on the other end side. Will be done. According to this, it becomes possible to improve the positioning accuracy with respect to the measurement object as compared with the case where positioning is performed on one end side where the connecting portion 13 exists. Further, since the periphery of the light receiving opening 3 is positioned by the concentric fixing member 16, the alignment accuracy can be further increased.

  The positioning mode of the present embodiment is such that, in the upper member 11, when the position of the light receiving unit when the reflection characteristic measuring device 1 </ b> A is mounted on the upper member 11 is used as the reference position, the reference position is more than the position of the connecting unit 13. It can also be expressed as being positioned by the fixing member 16 at a position close to. Further, the positioning mode of the present embodiment is a position on the light receiving unit side with respect to the intermediate point between the position of the light receiving unit when the reflection characteristic measuring apparatus 1A is mounted on the upper member 11 and the position of the connecting unit 13. It can also be expressed as being positioned by the fixing member 16.

  The lower member 12 of the alignment apparatus 10A has a measurement opening 14 and a knob portion 19 on the other end side, and is disposed on a base such as a desk. In the measurement, the measurement object is disposed on the base, and the lower member 12 is further disposed on the measurement object. In other words, at the time of measurement, the measurement object is disposed between the base and the lower member 12.

  The measurement opening 14 defines a minute region to be measured in spot measurement, and is provided at a position facing the position of the light receiving unit of the reflection characteristic measuring apparatus 1A attached to the upper member 11 in the closed state.

  Since the spot measurement is performed on an object that is accommodated in the measurement opening 14, the position of the measurement object and the alignment device 10 </ b> A is set so that the measurement object is accommodated in the measurement opening 14 when performing spot measurement. Will be adjusted.

  The knob portion 19 is used for position adjustment between the measurement object and the alignment device 10A. By providing the knob part 19 on the lower member 12, the knob part 19 can be operated with the hand opposite to the hand operating the reflection characteristic measuring apparatus 1A while operating the reflection characteristic measuring apparatus 1A. The position adjustment can be easily performed. Further, in the position adjustment using the knob portion 19, the position of the measurement object and the alignment device 10A can be finely adjusted.

  Further, as shown in FIG. 8, in the lower member 12, an anti-slip member 20 is provided on the ground contact surface with the base. At the time of spot measurement, a pressing force acts directly below the connecting portion 13, so that the anti-slip member 20 is located at one end of the lower member 12 where the connecting portion 13 exists, that is, directly below the connecting portion 13. It is preferable to be provided. Thus, by providing the anti-slip member 20 on the ground contact surface of the lower member 12 with the base, it is possible to suppress blurring of the alignment device 10A during measurement.

  Moreover, it is preferable that all the lower side members 12 are comprised using a permeable member. According to the configuration using the transmissive member, the measurement object overlapped with the lower member 12 can be visually recognized, so that the position adjustment between the measurement object and the alignment device 10A is facilitated.

[Measurement procedure]
Next, an operation process for performing spot measurement and an operation process for performing scan measurement will be described. FIG. 9 is a flowchart showing a procedure when spot measurement is performed. FIG. 10 is a diagram showing the white calibration table 30.

  As shown in FIG. 9, when spot measurement is performed, in step SP11, the reflection characteristic measurement device 1A is placed on the white calibration table 30 with no accessory attached. As shown in FIG. 10, the white calibration table 30 has a white calibration plate (white plate) 31. The reflection characteristic measuring apparatus 1A is disposed on the white calibration table 30 so that the light receiving part of the reflection characteristic measuring apparatus 1A is aligned with the white plate 31.

  In step SP12, the reflection characteristic of the white calibration plate 31 is measured, and the white calibration of the reflection characteristic measuring apparatus 1A is performed.

  In the next step SP13, the reflection characteristic measuring apparatus 1A is attached to the alignment apparatus 10A.

  In step SP14, the alignment device 10A is placed on the sample, and alignment is performed to align the measurement opening 14 of the alignment device 10A with a portion to be measured in the sample.

  In step SP15, the reflection characteristic measuring apparatus 1A is pressed from the top, and the light receiving opening 3 of the reflection characteristic measuring apparatus 1A is brought into close contact with the measurement opening 14.

  In step SP16, the measurement button 2 is pressed with the light receiving opening 3 in close contact with the measurement opening 14, and the reflection characteristic is measured.

  In step SP17, measurement data is transmitted from the reflection characteristic measuring apparatus 1A to the PC. In step SP18, the measurement result is displayed on the PC.

  In this way, when performing spot measurement, after performing white calibration (steps SP11 and SP12), the reflection characteristic measuring device 1A is mounted on the alignment device 10A (step SP13), and the reflection characteristic of the measurement object is determined. Measured (steps SP14 to SP18).

  Next, a procedure for performing scan measurement will be described. FIG. 11 is a flowchart illustrating a procedure for performing scan measurement.

  As shown in FIG. 11, when performing scan measurement, in step SP21, the reflection characteristic measuring device 1A is placed on the white calibration table 30 in a state in which no accessory is mounted, as in step SP11.

  In step SP22, as in step SP12, the reflection characteristic of the white calibration plate 31 is measured, and the white calibration of the reflection characteristic measuring apparatus 1A is performed.

  In the next step SP23, the guide device 50 is positioned and arranged on the color patch to be measured.

  In step SP24, the reflection characteristic measuring apparatus 1A is attached to the guide apparatus 50.

  In step SP25, the reflection characteristic is measured while moving the reflection characteristic measuring apparatus 1A.

  In step SP26, as in step SP17, the measurement data is transmitted from the reflection characteristic measuring apparatus 1A to the PC.

  In step SP27, the measurement result is displayed on the PC as in step SP18.

  Thus, when performing scan measurement, after performing white calibration (steps SP21 and SP22), the reflection characteristic measurement device 1A is mounted on the guide device 50 (step SP24), and the reflection characteristic of the measurement object is measured. (Steps SP25 to SP27).

  As described above, the alignment device 10A according to the present embodiment irradiates the measurement object with light, and receives the reflected light obtained from the reflection characteristic measurement device 1A having the light receiving unit, and the detachable upper member 11; The lower member 12 that supports the upper member 11, the closed state in which the upper member 11 and the lower member 12 overlap each other, one end of the upper member 11 and the lower member 12 are connected, and the other end is opened. A connecting portion 13 that connects the upper member 11 and the lower member 12 is provided so as to be in an open state. The upper member 11 includes a positioning unit that positions the mounted reflection characteristic measuring device 1A. The positioning unit receives light when the reflection characteristic measuring device is mounted on the upper member 11 in the upper member 11. Positioning is performed at a position closer to the light receiving part than an intermediate position between the part and the connecting part 13.

  According to such an alignment apparatus 10A, it is possible to improve the alignment accuracy with respect to the measurement object as compared with the case where the positioning is performed on the one end side where the connecting portion 13 of the upper member 11 is present. It is possible to accurately measure the measurement object.

<2. Second Embodiment>
Next, a second embodiment of the present invention will be described. The alignment apparatus 10B according to the second embodiment is configured such that a reflection characteristic measurement apparatus 1B larger than the reflection characteristic measurement apparatus 1A of the first embodiment can be mounted on the upper member. 12 and 13 are external views of a reflection characteristic measuring apparatus 1B according to the second embodiment of the present invention. Here, FIG. 12 is a top external view of the reflection characteristic measuring apparatus 1B, and FIG. 13 is a bottom external view of the reflection characteristic measuring apparatus 1B. FIG. 14 is an external view of an alignment apparatus 10B to which the reflection characteristic measuring apparatus 1B can be attached and detached. 15 and 16 are views showing a state in which the reflection characteristic measuring apparatus 1B is mounted on the alignment apparatus 10B. In particular, FIG. 16 uses the reflection characteristic measurement apparatus 1B mounted on the alignment apparatus 10B. It is a state diagram when performing spot measurement.

  As shown in FIG. 12, the reflection characteristic measuring apparatus 1B includes a display unit 101 that displays information such as a measurement mode on the upper surface of the housing and an operation button 102, and a power switch 103 and a measurement button on the side of the housing. 104.

  As shown in FIG. 13, the reflection characteristic measuring apparatus 1 </ b> B includes a light receiving opening 105 that functions as a light receiving portion, a positioning groove 106 formed in the vicinity of the light receiving opening 105, and a light receiving opening 106. A positioning projection 107 formed at one end away from the positioning groove, and a substantially D-shaped engaging recess 108 formed between the positioning groove 106 and the positioning projection 107. Further, an engagement hole 109 (see FIG. 18) that is partially opened in the lateral direction is provided on a side surface of the engagement recess 108.

  Since the reflection characteristic measuring apparatus 1B according to the present embodiment includes the display unit 101, the reflection characteristic measuring apparatus 1B has a larger casing than the reflection characteristic measuring apparatus 1A according to the first embodiment. For this reason, when performing spot measurement using the reflection characteristic measuring apparatus 1B, the reflection characteristic measuring apparatus does not have the opening 15 provided in the alignment apparatus 10A of the first embodiment, that is, in the upper member 111. An alignment apparatus 10B having a shape as shown in FIG. 14 that does not have a portion surrounding the light receiving portion 1B is used.

  FIG. 15 shows an open state when the reflection characteristic measuring device 1B is attached to the alignment device 10B. Since the alignment device 10B does not have the opening 15 and does not have a member constituting the alignment device 10B around the light receiving portion, the alignment device 10B can be used to surround the light receiving portion. Visibility can be improved.

  When actually measuring the reflection characteristics, the user presses the reflection characteristic measuring apparatus 1B from above, and makes a transition to the closed state shown in FIG. In the closed state, the measurement button 104 provided on the side surface of the reflection characteristic measuring apparatus 1B is pressed, and spot measurement is performed.

  Here, the configuration of the alignment apparatus 10B in the present embodiment will be described in detail. FIG. 17 is a bottom external view of the alignment apparatus 10B. FIG. 18 is a schematic diagram showing a state in which a part of the engaging member 115 enters the engaging hole 109 and the reflection characteristic measuring device 1B and the alignment device 10B are engaged.

  As shown in FIG. 14, the alignment device 10 </ b> B includes an upper member (first member) 111 to which the reflection characteristic measuring device 1 </ b> B can be attached and detached, and a lower member (second member) 112 that supports the upper member 111. It consists of

  The upper member 111 and the lower member 112 are rotatably connected by a connecting portion (also referred to as a “hinge portion”) 113 on one end side of each other. As a result, the upper member 111 and the lower member 112 are in a closed state (first state) where they overlap each other, and an open state in which one end of the upper member 111 and the lower member 112 is connected and the other end is opened ( It is possible to transition between the second state). It should be noted that an urging member such as a spring is incorporated inside the connecting portion 113 and is always open in a normal state where no force is applied from the outside.

  The upper member 111 of the alignment apparatus 10B has a substantially D-shaped engagement member 115 that engages the reflection characteristic measurement apparatus 1B near the center. When the reflection characteristic measuring apparatus 1B is mounted on the alignment apparatus 10B, the engaging member 115 has a substantially D-shaped linear portion that coincides with the engaging recess 108 (see FIG. 13) of the reflection characteristic measuring apparatus 1B. Fit in the state. Then, when the lever 118 connected to the engagement member 115 is rotated clockwise in FIG. 17 with the engagement member 115 fitted in the engagement recess 108 of the reflection characteristic measuring apparatus 1B, the engagement member 115 rotates. By rotating around the shaft 110 and a part of the engagement member 115 enters the engagement hole 109 on the side surface of the engagement recess 108 (see FIG. 18), the reflection characteristic measuring device 1B and the alignment device 10B are connected. Engaged.

  Furthermore, the upper member 111 has a positioning projection 116 and a positioning hole 117. The positioning protrusion 116 and the positioning hole 117 function as a positioning unit that positions the reflection characteristic measuring apparatus 1B.

  Specifically, when the reflection characteristic measuring apparatus 1B is mounted on the alignment apparatus 10B, the positioning protrusion 116 is fitted into the positioning groove 106 of the reflection characteristic measuring apparatus 1B, and the positioning hole 117. Is fitted with the positioning projection 107 of the reflection characteristic measuring apparatus 1B. The positioning protrusion 116 and the positioning hole 117 are provided at a predetermined distance (interval) from each other in the upper member 111. That is, the positioning hole 117 is provided in the vicinity of the position where the reflection characteristic measuring device 1B and the upper member 111 are engaged, and the positioning groove 106 into which the positioning protrusion 116 is fitted is received by the reflection characteristic measuring device 1B. It is provided in the vicinity of the part 105. When the positioning protrusion 116 is fitted in the positioning groove 106 of the reflection characteristic measuring apparatus 1B and the positioning hole 117 is fitted in the positioning protrusion 107 of the reflection characteristic measuring apparatus 1B, the reflection characteristic measuring apparatus 1B is positioned. It will be positioned with respect to the alignment apparatus 10B.

  As described above, the positioning protrusion 116 that functions as a positioning portion in the alignment device 10B is provided on the other end side of the upper member 111 that is different from the one end side where the coupling portion 113 exists. The positioning is also performed on the other end side. According to this, it is possible to improve the alignment accuracy with respect to the measurement object as compared with the case where the positioning is performed only on one end side where the connecting portion 113 exists. That is, the positioning accuracy can be increased by positioning both the vicinity of the position where the upper member 111 and the reflection characteristic measuring apparatus 1B are fixed and the vicinity of the light receiving unit 105.

  The positioning mode of the present embodiment is such that, in the upper member 111, when the position of the light receiving unit when the reflection characteristic measuring device 1B is mounted on the upper member 111 is used as the reference position, the reference position is more than the position of the connecting unit 113. It can also be expressed as being positioned by the positioning unit at a position close to. Further, the positioning mode of the present embodiment is a position on the light receiving unit side with respect to the intermediate point between the position of the light receiving unit when the reflection characteristic measuring apparatus 1B is mounted on the upper member 111 and the position of the connecting unit 113. It can also be expressed as being positioned by the positioning unit.

  Further, the positioning protrusion 116 and the positioning hole 117 are also referred to as positioning members, and either the protrusion (convex portion) or the hole (concave portion) may be selected for the positioning member. When the projection is selected as the positioning member, the reflection characteristic measuring apparatus 1B is provided with a groove (hole) corresponding to the projection. When the hole is selected as the positioning member, the reflection characteristic measuring apparatus 1B A projection corresponding to the hole is provided.

  The lower member 112 of the alignment apparatus 10B has a measurement opening 114 on the other end side, and is disposed on a base such as a desk.

  The measurement opening 114 defines a minute region to be measured for spot measurement, and is provided at a position facing the position of the light receiving unit of the reflection characteristic measurement device 1B attached to the upper member 111 in the closed state.

  Since spot measurement is performed on an object that is contained in the measurement opening 114, when performing spot measurement, the positions of the measurement object and the alignment device 10A are adjusted so that the measurement object is contained in the measurement opening 114. Will be adjusted.

  Further, as shown in FIG. 17, in the lower member 112, an anti-slip member 119 is provided on the ground contact surface with the base. When spot measurement is performed, a pressing force acts directly below the connecting portion 113, so that the anti-slip member 119 is located at one end of the lower member 112 where the connecting portion 113 exists, that is, directly below the connecting portion 113. It is preferable to be provided.

  A lever 118 connected to the engaging member 115 is provided on the grounding surface side of the lower member 112. By rotating the lever 118, it is possible to select an engaged state in which the reflection characteristic measuring device 1B and the alignment device 10B are engaged and a released state of the engaged state.

  In the lower member 112, at least the peripheral portion of the measurement opening 114 is preferably configured using a permeable member. According to the configuration using the permeable member, the measurement object overlapped with the lower member 112 can be visually recognized, so that the position adjustment between the measurement object and the alignment device 10B becomes easy.

  As described above, the alignment device 10B according to the present embodiment includes the upper member 111 that can attach and detach the reflection characteristic measurement device 1B having the light receiving unit that receives the reflected light obtained by irradiating the measurement object, and the upper member. 111, a closed state in which the upper member 111 and the lower member 112 overlap each other, and an open state in which one end of each of the upper member 111 and the lower member 112 is connected and the other end is opened. The connecting part 113 that connects the upper member 111 and the lower member 112 is provided. The upper member 111 includes a positioning unit that positions the mounted reflection characteristic measuring apparatus 1B. The positioning unit receives light when the reflection characteristic measuring apparatus is mounted on the upper member 111 in the upper member 111. Positioning is performed at a position closer to the light receiving unit than an intermediate position between the coupling unit 113 and the coupling unit 113.

  According to such an alignment apparatus 10B, it is possible to improve the alignment accuracy with respect to the measurement object as compared with the case where positioning is performed on one end side of the upper member 111 where the connecting portion 113 exists. It becomes possible to accurately measure a desired measurement object.

<3. Modification>
Although the embodiments of the present invention have been described above, the present invention is not limited to the contents described above.

  For example, in the first embodiment, the case where the alignment device 10A is mounted on the mounting member 5 provided around the light receiving opening 3 of the reflection characteristic measuring device 1A is illustrated, but other accessory components are mounted. It is good also as an aspect. FIG. 19 is a diagram showing a state in which the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A.

  Specifically, as shown in FIG. 19, an illuminance attachment 70 can be attached to the reflection characteristic measuring apparatus 1A as an accessory. The illuminance attachment 70 is an accessory used for measuring the characteristics of ambient light (environmental light), and includes a diffusion plate 71 and a holder 72.

  A protrusion (not shown) similar to the protrusion 17 provided on the fixing member 16 of the alignment apparatus 10A is provided inside the holder 72, and the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A. At this time, the protrusion is fitted into a notch 6 provided in the attachment member 5. Then, the illuminance attachment 70 can be attached to the reflection characteristic measuring apparatus 1A by rotating the holder in a state where the protrusion and the notch 6 are fitted.

  Thus, the attachment mechanism for the alignment device 10A in the reflection characteristic measuring apparatus 1A also functions as a bayonet-type attachment mechanism, so that it can be shared with other attachment parts attachment mechanisms. As described above, by using a common attachment mechanism for each accessory part, the number of parts can be reduced as compared with the case where a plurality of attachment mechanisms are provided, and the external shape of the reflection characteristic measuring apparatus 1A is simplified. can do.

  Here, an operation process in the case of performing illuminance measurement using the illuminance attachment 70 will be described. FIG. 20 is an operation flowchart when illuminance measurement is performed.

  As shown in FIG. 20, when illuminance measurement is performed, in step SP31, the reflection characteristic measuring device 1A is placed on the white calibration table 30 in a state where no accessory is mounted.

  In step SP32, the reflection characteristic of the white calibration plate 31 is measured, and the white calibration of the reflection characteristic measuring apparatus 1A is performed.

  In the next step SP33, the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A.

  In step SP34, the reflection characteristic measuring apparatus 1A is held upward by, for example, a measurer.

  In step SP35, the measurement button 2 is pressed and illuminance measurement is performed.

  In step SP36, measurement data is transmitted from the reflection characteristic measuring apparatus 1A to the PC. In step SP37, the measurement result is displayed on the PC.

  Thus, when performing illuminance measurement, after performing white calibration (steps SP31 and SP32), the illuminance attachment 70 is attached to the reflection characteristic measuring apparatus 1A (step SP33), and illuminance measurement is performed (step SP34). ~ SP37).

1A, 1B Reflection characteristic measuring device 2,104 Measurement button 3,105 Light receiving aperture (light receiving portion)
DESCRIPTION OF SYMBOLS 5 Mounting member 10A, 10B Positioning apparatus 11, 111 Upper member 12, 112 Lower member 13, 113 Connection part 14,114 Measurement opening 16 Fixing member 17 Protrusion part 116 Positioning protrusion (positioning member)
117 Positioning hole (positioning member)

Claims (11)

A micro-region that is used in combination with a mouse-shaped or horizontal reflection characteristic measuring device that has a light-receiving unit that receives reflected light obtained by irradiating light to the measurement object on the bottom surface that is substantially parallel to the longitudinal direction. An alignment device for aligning the position of the light receiving unit of the reflection characteristic measuring device,
A first member detachable from the bottom surface portion of the reflection characteristic measuring device;
A second member for supporting the first member;
A first state in which the first member and the second member overlap each other and a second state in which one end of each of the first member and the second member is connected and the other end is open can be taken. A connecting portion for connecting the first member and the second member;
With
Said first member,
A positioning unit for positioning the instrumentation wearing has been the reflection characteristic measuring apparatus,
A portion for engaging with the mounted reflection characteristic measuring device;
Have
The second member has a first measurement opening facing the light receiving unit in a state where the reflection characteristic measuring device is mounted on the first member,
The positioning portion is positioned on the first member so that when the reflection characteristic measuring device is attached to the first member, the positioning portion is closer to the light receiving portion than an intermediate position between the light receiving portion and the connecting portion. Arranged alignment device. In the mounted state of the reflection characteristic measuring apparatus, the first member is at the other side opposite to said one end, said to arrange the light receiving portion of the reflection characteristic measuring apparatus, alignment apparatus of claim 1 . In the mounted state of the reflection characteristic measurement device, the first member has an opening for disposing the light receiving unit of the reflection characteristic measurement device on the other end side opposite to the one end.
The alignment according to claim 1, wherein the first member has the positioning portion along the opening and has the engaging portion on the positioning portion. apparatus. The engaging portion has a protrusion protruding from the positioning portion toward the inside of the opening,
The reflection characteristic measuring apparatus, said a notch portion provided around the light receiving portion is engaged with said projecting portion of the reflection characteristic measuring apparatus, according to claim 3 which is attached to the first member Alignment device. The first member has two positioning members provided at a predetermined interval as the positioning portion,
At least one of the two positioning members is provided at a position closer to the light receiving unit than an intermediate position between the light receiving unit and the connecting unit when the reflection characteristic measuring device is attached to the first member. The alignment apparatus according to claim 1 or 2 , wherein the alignment apparatus is provided. The positioning member, the alignment device according to claim 5 Ru der any projections and holes provided in the first member. The second member has a non-slip member on a surface opposite to the surface facing the first member,
The alignment device according to any one of claims 1 to 6, wherein the anti-slip member is provided on the one end side of the second member . A mouse-shaped or horizontal-type reflection characteristic measuring device having a light receiving portion for receiving reflected light obtained by irradiating a measurement object with light on a bottom surface portion substantially parallel to the longitudinal direction;
An alignment device capable of mounting the reflection characteristic measuring device;
With
The alignment device includes:
A first member detachable from the bottom surface portion of the reflection characteristic measuring device;
A second member for supporting the first member;
A first state in which the first member and the second member overlap each other and a second state in which one end of each of the first member and the second member is connected and the other end is open can be taken. A connecting portion for connecting the first member and the second member;
Have
The first member is
A positioning unit for positioning the mounted reflection characteristic measuring device;
A portion for engaging with the mounted reflection characteristic measuring device;
Have
The second member has a first measurement opening facing the light receiving unit in a state where the reflection characteristic measuring device is mounted on the first member,
The positioning portion is positioned on the first member so that when the reflection characteristic measuring device is attached to the first member, the positioning portion is closer to the light receiving portion than an intermediate position between the light receiving portion and the connecting portion. Arranged reflection characteristic measurement system. 9. The reflection characteristic measurement according to claim 8 , wherein in the mounted state of the reflection characteristic measuring device, the first member is arranged with the light receiving portion of the reflection characteristic measuring device on the other end side opposite to the one end. system. The reflection characteristic measurement system further includes a guide device that guides the reflection characteristic measurement device to be movable in a direction that coincides with the longitudinal direction of the reflection characteristic measurement device,
Measurement performed by attaching the alignment device to the reflection characteristic measurement device;
The reflection characteristic measurement system according to claim 8 or 9, wherein measurement can be performed by mounting the guide device on the reflection characteristic measurement apparatus. The reflection characteristic according to claim 10, wherein the guide device has a second measurement opening facing the light receiving unit in a state where the reflection characteristic measurement device without the alignment device is attached to the guide device. Measuring system.

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