JP5522786B2 - 半導体搭載用放熱基板の製造方法 - Google Patents
半導体搭載用放熱基板の製造方法 Download PDFInfo
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- JP5522786B2 JP5522786B2 JP2010128721A JP2010128721A JP5522786B2 JP 5522786 B2 JP5522786 B2 JP 5522786B2 JP 2010128721 A JP2010128721 A JP 2010128721A JP 2010128721 A JP2010128721 A JP 2010128721A JP 5522786 B2 JP5522786 B2 JP 5522786B2
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- heat dissipation
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- 230000017525 heat dissipation Effects 0.000 title claims description 23
- 238000004519 manufacturing process Methods 0.000 title claims description 10
- 239000004065 semiconductor Substances 0.000 title description 14
- 229910052751 metal Inorganic materials 0.000 claims description 20
- 239000002184 metal Substances 0.000 claims description 20
- 238000007747 plating Methods 0.000 claims description 20
- 239000000758 substrate Substances 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 12
- 229910001020 Au alloy Inorganic materials 0.000 claims description 5
- 229910001128 Sn alloy Inorganic materials 0.000 claims description 5
- 239000011159 matrix material Substances 0.000 claims description 4
- 239000010949 copper Substances 0.000 description 16
- 239000000463 material Substances 0.000 description 16
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000007769 metal material Substances 0.000 description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 238000007733 ion plating Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 238000005338 heat storage Methods 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 238000005096 rolling process Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910015363 Au—Sn Inorganic materials 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000002648 laminated material Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Description
1 単一基母材
3 Mo層
4 Cu層
5 Ni層
7 Au層
9 Au・Sn合金層
11 Sn層
Claims (1)
- 基母材の両面に1以上の金属層をめっきにより上下対称の配置となるように形成することを特徴とする半導体搭載用放熱基板の製造方法において、基母材が、Mo層の単一基母材であり、このMo層の単一基母材の両面にNi層とCu層とをそれぞれ順次めっきにより形成し、さらに、Cu層の上にNi層をめっきにより形成し、Ni層の上に、Au・Sn合金層又は、Au層とSn層とをいずれか外側になるように、順次めっきにより形成することを特徴とする半導体搭載用放熱基板の製造方法。
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JP2010128721A JP5522786B2 (ja) | 2010-06-04 | 2010-06-04 | 半導体搭載用放熱基板の製造方法 |
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JP2010128721A JP5522786B2 (ja) | 2010-06-04 | 2010-06-04 | 半導体搭載用放熱基板の製造方法 |
Publications (2)
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JP2011254044A JP2011254044A (ja) | 2011-12-15 |
JP5522786B2 true JP5522786B2 (ja) | 2014-06-18 |
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JP2010128721A Active JP5522786B2 (ja) | 2010-06-04 | 2010-06-04 | 半導体搭載用放熱基板の製造方法 |
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JP (1) | JP5522786B2 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2016127197A (ja) * | 2015-01-07 | 2016-07-11 | 新日鉄住金マテリアルズ株式会社 | 放熱基板 |
KR101902254B1 (ko) * | 2017-07-10 | 2018-10-01 | 주식회사 제이티엔유 | 고출력 led용 방열 기판 |
KR101918915B1 (ko) * | 2017-07-12 | 2019-02-11 | (주)엠씨피 | 고출력용 led 방열기판의 제조방법 |
KR101976627B1 (ko) * | 2018-08-30 | 2019-08-28 | 주식회사 제이티엔유 | 고출력 led용 방열 기판 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54152961A (en) * | 1978-05-24 | 1979-12-01 | Hitachi Ltd | Semiconductor device |
JP3199028B2 (ja) * | 1998-05-21 | 2001-08-13 | 日本電気株式会社 | 半導体装置及びその製造方法 |
JP2004259770A (ja) * | 2003-02-24 | 2004-09-16 | Kyocera Corp | 熱電交換モジュール用セラミック基板 |
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2010
- 2010-06-04 JP JP2010128721A patent/JP5522786B2/ja active Active
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Publication number | Publication date |
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JP2011254044A (ja) | 2011-12-15 |
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