JP5517160B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP5517160B2
JP5517160B2 JP2010145469A JP2010145469A JP5517160B2 JP 5517160 B2 JP5517160 B2 JP 5517160B2 JP 2010145469 A JP2010145469 A JP 2010145469A JP 2010145469 A JP2010145469 A JP 2010145469A JP 5517160 B2 JP5517160 B2 JP 5517160B2
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reagent
analysis
item
reagent container
automatic analyzer
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JP2010145469A
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Japanese (ja)
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JP2012008053A (ja
JP2012008053A5 (https=
Inventor
孝明 萩原
佳幸 田中
和方 山澤
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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JP2010145469A 2010-06-25 2010-06-25 自動分析装置 Active JP5517160B2 (ja)

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JP2010145469A JP5517160B2 (ja) 2010-06-25 2010-06-25 自動分析装置

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JP2010145469A JP5517160B2 (ja) 2010-06-25 2010-06-25 自動分析装置

Publications (3)

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JP2012008053A JP2012008053A (ja) 2012-01-12
JP2012008053A5 JP2012008053A5 (https=) 2012-09-20
JP5517160B2 true JP5517160B2 (ja) 2014-06-11

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Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5898972B2 (ja) * 2012-01-23 2016-04-06 株式会社日立ハイテクノロジーズ 自動分析装置
JP6054642B2 (ja) * 2012-06-05 2016-12-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP2014009989A (ja) * 2012-06-28 2014-01-20 Hitachi High-Technologies Corp 自動分析装置
JP6121668B2 (ja) * 2012-08-31 2017-04-26 東芝メディカルシステムズ株式会社 自動分析装置
JP6177532B2 (ja) * 2013-01-23 2017-08-09 株式会社日立ハイテクノロジーズ 自動分析システムおよび制御方法
US11041870B2 (en) 2015-08-27 2021-06-22 Hitachi High-Tech Corporation Automatic analysis device
US11565266B2 (en) 2017-08-09 2023-01-31 Hitachi High-Tech Corporation Automatic analyzer
WO2024135279A1 (ja) * 2022-12-23 2024-06-27 株式会社日立ハイテク 自動分析装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01288768A (ja) * 1988-05-17 1989-11-21 Hitachi Ltd 自動分析装置
JP2944772B2 (ja) * 1991-03-26 1999-09-06 株式会社東芝 自動化学分析装置
JPH10232234A (ja) * 1997-02-19 1998-09-02 Hitachi Ltd 自動分析装置
JP4299403B2 (ja) * 1999-06-01 2009-07-22 シスメックス株式会社 自動分析装置
JP4033060B2 (ja) * 2003-07-17 2008-01-16 株式会社日立ハイテクノロジーズ 自動分析装置
JP4110101B2 (ja) * 2004-01-28 2008-07-02 株式会社日立ハイテクノロジーズ 自動分析装置
EP1582874B1 (en) * 2004-03-31 2008-07-09 Roche Diagnostics GmbH Modular analysing apparatus
JP4890070B2 (ja) * 2006-03-31 2012-03-07 シスメックス株式会社 分析装置
JP5009684B2 (ja) * 2006-06-30 2012-08-22 シスメックス株式会社 試料分析装置
JP4851266B2 (ja) * 2006-06-30 2012-01-11 シスメックス株式会社 試料分析装置
US20080020469A1 (en) * 2006-07-20 2008-01-24 Lawrence Barnes Method for scheduling samples in a combinational clinical analyzer
JP2006337386A (ja) * 2006-09-25 2006-12-14 Hitachi High-Technologies Corp 自動分析装置
JP4142073B2 (ja) * 2006-10-13 2008-08-27 株式会社コナミデジタルエンタテインメント 表示装置、表示方法、ならびに、プログラム
WO2008050396A1 (en) * 2006-10-24 2008-05-02 Olympus Corporation Analyzer
JP4500822B2 (ja) * 2007-02-19 2010-07-14 株式会社日立ハイテクノロジーズ 自動分析装置
JP4948230B2 (ja) * 2007-03-29 2012-06-06 シスメックス株式会社 試料分析装置および試料分析方法
JP2008298692A (ja) * 2007-06-01 2008-12-11 Hitachi High-Technologies Corp 試料攪拌装置、及び検体分析装置
JP2009068993A (ja) * 2007-09-13 2009-04-02 Olympus Corp 分析装置
JP4977634B2 (ja) * 2008-01-18 2012-07-18 株式会社日立ハイテクノロジーズ 自動分析装置
JP5295612B2 (ja) * 2008-04-04 2013-09-18 株式会社東芝 自動分析装置
JP5216408B2 (ja) * 2008-05-08 2013-06-19 株式会社日立ハイテクノロジーズ 自動分析システム

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