JP5497676B2 - 分析方法 - Google Patents
分析方法 Download PDFInfo
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- JP5497676B2 JP5497676B2 JP2011020405A JP2011020405A JP5497676B2 JP 5497676 B2 JP5497676 B2 JP 5497676B2 JP 2011020405 A JP2011020405 A JP 2011020405A JP 2011020405 A JP2011020405 A JP 2011020405A JP 5497676 B2 JP5497676 B2 JP 5497676B2
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- fluorescent
- standard sample
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Description
Claims (5)
- 屋外に配置された測定対象となる構造物の表面に直接X線を照射して対象となる元素の蛍光X線測定を行い前記元素の第1蛍光X線強度を得る第1ステップと、
X線吸収量が既知の基材に前記元素が既知の含有量で含まれている内標準試料を前記構造物に重ねた状態で、前記内標準試料を通して前記構造物の表面にX線を照射して前記元素の蛍光X線測定を行い前記元素の第2蛍光X線強度を得る第2ステップと、
前記第1蛍光X線強度、前記第2蛍光X線強度、前記内標準試料における前記元素の含有量、および前記基材のX線吸収量から前記構造物の表面に付着している前記元素の量を求める第3ステップと
を少なくとも備えることを特徴とする分析方法。 - 請求項1記載の分析方法において、
前記元素は、前記構造物に対する腐食因子物質を構成する元素であり、
求められた前記元素の量より、前記構造物に付着している前記腐食因子物質の付着量を求める第4ステップを備えることを特徴とする分析方法。 - 請求項1または2記載の分析方法において、
前記基材は、ポリマーフィルムであることを特徴とする分析方法。 - 請求項3記載の分析方法において、
前記ポリマーフィルムは、厚さが既知とされていることを特徴とする分析方法。 - 請求項3または4記載の分析方法において、
前記元素は、硫黄および塩素より選択されたものであることを特徴とする分析方法。
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JP2011020405A JP5497676B2 (ja) | 2011-02-02 | 2011-02-02 | 分析方法 |
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JP2011020405A JP5497676B2 (ja) | 2011-02-02 | 2011-02-02 | 分析方法 |
Publications (2)
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JP2012159449A JP2012159449A (ja) | 2012-08-23 |
JP5497676B2 true JP5497676B2 (ja) | 2014-05-21 |
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JP2011020405A Expired - Fee Related JP5497676B2 (ja) | 2011-02-02 | 2011-02-02 | 分析方法 |
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JP (1) | JP5497676B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN108645882A (zh) * | 2018-04-25 | 2018-10-12 | 上海化工研究院有限公司 | X射线荧光法测定硫包衣尿素中硫含量的标定方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0224545A (ja) * | 1988-07-12 | 1990-01-26 | Fujikura Ltd | 蛍光x線分析方法 |
JPH0222544A (ja) * | 1988-07-12 | 1990-01-25 | Fujikura Ltd | 蛍光x線分析方法 |
JPH0754305B2 (ja) * | 1989-02-27 | 1995-06-07 | 日本碍子株式会社 | 碍子汚損量測定方法 |
US5510266A (en) * | 1995-05-05 | 1996-04-23 | Bayer Corporation | Method and apparatus of handling multiple sensors in a glucose monitoring instrument system |
US7474730B2 (en) * | 2006-10-17 | 2009-01-06 | Oxford Instruments Analytical Oy | Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser |
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