JP5481115B2 - 質量分析計及び質量分析方法 - Google Patents

質量分析計及び質量分析方法 Download PDF

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Publication number
JP5481115B2
JP5481115B2 JP2009166279A JP2009166279A JP5481115B2 JP 5481115 B2 JP5481115 B2 JP 5481115B2 JP 2009166279 A JP2009166279 A JP 2009166279A JP 2009166279 A JP2009166279 A JP 2009166279A JP 5481115 B2 JP5481115 B2 JP 5481115B2
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JP
Japan
Prior art keywords
ion
ions
electrode
ion guide
ion trap
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2009166279A
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English (en)
Japanese (ja)
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JP2011023184A (ja
JP2011023184A5 (enExample
Inventor
益之 杉山
雄一郎 橋本
久志 永野
英樹 長谷川
安章 高田
益義 山田
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Priority to JP2009166279A priority Critical patent/JP5481115B2/ja
Priority to US13/383,371 priority patent/US8835834B2/en
Priority to PCT/JP2010/004464 priority patent/WO2011007528A1/ja
Publication of JP2011023184A publication Critical patent/JP2011023184A/ja
Publication of JP2011023184A5 publication Critical patent/JP2011023184A5/ja
Application granted granted Critical
Publication of JP5481115B2 publication Critical patent/JP5481115B2/ja
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0095Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2009166279A 2009-07-15 2009-07-15 質量分析計及び質量分析方法 Expired - Fee Related JP5481115B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009166279A JP5481115B2 (ja) 2009-07-15 2009-07-15 質量分析計及び質量分析方法
US13/383,371 US8835834B2 (en) 2009-07-15 2010-07-09 Mass spectrometer and mass spectrometry method
PCT/JP2010/004464 WO2011007528A1 (ja) 2009-07-15 2010-07-09 質量分析計及び質量分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009166279A JP5481115B2 (ja) 2009-07-15 2009-07-15 質量分析計及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2011023184A JP2011023184A (ja) 2011-02-03
JP2011023184A5 JP2011023184A5 (enExample) 2012-05-17
JP5481115B2 true JP5481115B2 (ja) 2014-04-23

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ID=43449140

Family Applications (1)

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JP2009166279A Expired - Fee Related JP5481115B2 (ja) 2009-07-15 2009-07-15 質量分析計及び質量分析方法

Country Status (3)

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US (1) US8835834B2 (enExample)
JP (1) JP5481115B2 (enExample)
WO (1) WO2011007528A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5771456B2 (ja) * 2011-06-24 2015-09-02 株式会社日立ハイテクノロジーズ 質量分析方法
JP5947567B2 (ja) 2012-03-02 2016-07-06 株式会社日立ハイテクノロジーズ 質量分析システム
JP5927089B2 (ja) * 2012-09-14 2016-05-25 株式会社日立ハイテクノロジーズ 質量分析装置及び方法
EP3033763B1 (en) * 2013-08-13 2021-05-26 Purdue Research Foundation Sample quantitation with a miniature mass spectrometer
US8907272B1 (en) * 2013-10-04 2014-12-09 Thermo Finnigan Llc Radio frequency device to separate ions from gas stream and method thereof
US9837256B2 (en) * 2013-12-24 2017-12-05 Dh Technologies Development Pte. Ltd. Simultaneous positive and negative ion accumulation in an ion trap for mass spectroscopy
WO2018069982A1 (ja) * 2016-10-11 2018-04-19 株式会社島津製作所 イオンガイド及び質量分析装置
US11728153B2 (en) * 2018-12-14 2023-08-15 Thermo Finnigan Llc Collision cell with enhanced ion beam focusing and transmission
GB2605395B (en) * 2021-03-30 2024-12-11 Thermo Fisher Scient Bremen Gmbh Ion trap
CN116403884A (zh) * 2021-12-27 2023-07-07 昆山禾信质谱技术有限公司 飞行时间质谱仪及其离子囚禁释放装置、控制方法
JP2024029800A (ja) * 2022-08-23 2024-03-07 株式会社日立ハイテク イオンガイド、およびそれを備える質量分析装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5179278A (en) 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5420425A (en) 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5783824A (en) 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
WO1997007530A1 (en) * 1995-08-11 1997-02-27 Mds Health Group Limited Spectrometer with axial field
US6177668B1 (en) 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
JP2001176444A (ja) * 1999-12-15 2001-06-29 Jeol Ltd 垂直加速型飛行時間型質量分析装置
US7026613B2 (en) * 2004-01-23 2006-04-11 Thermo Finnigan Llc Confining positive and negative ions with fast oscillating electric potentials
JP4384542B2 (ja) * 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ 質量分析装置
GB0511386D0 (en) * 2005-06-03 2005-07-13 Shimadzu Res Lab Europe Ltd Method for introducing ions into an ion trap and an ion storage apparatus
EP1944791B1 (en) * 2005-10-31 2015-05-06 Hitachi, Ltd. Mass-spectrometer and method for mass-spectrometry
GB0624740D0 (en) * 2006-12-12 2007-01-17 Micromass Ltd Mass spectrometer
JP4212629B2 (ja) * 2007-03-29 2009-01-21 株式会社日立製作所 質量分析計

Also Published As

Publication number Publication date
JP2011023184A (ja) 2011-02-03
US8835834B2 (en) 2014-09-16
WO2011007528A1 (ja) 2011-01-20
US20120112059A1 (en) 2012-05-10

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