JP5437918B2 - 磁界補償 - Google Patents
磁界補償 Download PDFInfo
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- JP5437918B2 JP5437918B2 JP2010128582A JP2010128582A JP5437918B2 JP 5437918 B2 JP5437918 B2 JP 5437918B2 JP 2010128582 A JP2010128582 A JP 2010128582A JP 2010128582 A JP2010128582 A JP 2010128582A JP 5437918 B2 JP5437918 B2 JP 5437918B2
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- magnetic field
- sensor
- compensating
- pass filter
- analog
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- 230000005291 magnetic effect Effects 0.000 title claims description 77
- 238000005259 measurement Methods 0.000 claims description 33
- 230000000694 effects Effects 0.000 description 16
- 230000005355 Hall effect Effects 0.000 description 4
- 239000002131 composite material Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000003321 amplification Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000005294 ferromagnetic effect Effects 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000005358 geomagnetic field Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
- G01R33/0029—Treating the measured signals, e.g. removing offset or noise
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
- G01N27/9053—Compensating for probe to workpiece spacing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/0206—Three-component magnetometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/025—Compensating stray fields
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measuring Magnetic Variables (AREA)
Description
F2:16、67Hzバンドパスフィルタ
F3:その地域の電源周波数に従って50Hz(またはそれぞれ60Hz)バンドパスフィルタ
F4〜Fn:それぞれのバンドパスフィルタとして電源周波数の整数倍、したがって2×50Hz/2×60Hz、3×50Hz/3×60Hzなど
Claims (8)
- 磁界センサと、
測定増幅器ループとを
有する磁界測定装置を備える、磁界を補償するためのデバイスであって、
前記磁界センサは単一の磁気抵抗センサであり、少なくとも2つの測定増幅器ループを並列に有し、その一方のループはアナログ広帯域コントローラ・ループであり、他方のループはデジタル広帯域コントローラ・ループであり、
前記デジタル広帯域コントローラは、並列に接続された、異なる周波数領域(F1、F2、F3)のための複数のコントローラ(R1、R2、・・・、Rn)を備える、デバイス。 - 前記磁気抵抗センサが3軸である、請求項1に記載の磁界を補償するためのデバイス。
- 前記磁界センサを前記測定増幅器ループの間で切り換えることができる、請求項1または2に記載の磁界を補償するためのデバイス。
- 前記デジタル広帯域コントローラが0〜1kHzの領域を有するローパスフィルタと直列に接続され、前記アナログ広帯域コントローラが1kHzから少なくとも170kHzのハイパスフィルタと直列に接続される、請求項1に記載の磁界を補償するためのデバイス。
- 前記デジタル広帯域コントローラ・ループが、直列に接続された20Hzより低い周波数のためのローパスフィルタを含み、前記アナログ広帯域コントローラが、直列に接続された20Hzより高い周波数のためのハイパスフィルタを含む、請求項1に記載の磁界を補償するためのデバイス。
- 前記測定増幅器ループの1つに、選択可能なハイパスフィルタが直列に接続された、請求項1に記載の磁界を補償するためのデバイス。
- 前記磁気抵抗センサがヘルムホルツ・コイル装置(H)によって取り囲まれた、請求項1に記載の磁界を補償するためのデバイス。
- 前記磁気抵抗センサが単一コイル装置によって取り囲まれた、請求項1に記載の磁界を補償するためのデバイス。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102009024268.6 | 2009-06-05 | ||
DE102009024268.6A DE102009024268B4 (de) | 2009-06-05 | 2009-06-05 | Magnetfeldkompensation |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010281821A JP2010281821A (ja) | 2010-12-16 |
JP2010281821A5 JP2010281821A5 (ja) | 2011-11-17 |
JP5437918B2 true JP5437918B2 (ja) | 2014-03-12 |
Family
ID=42799801
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010128582A Active JP5437918B2 (ja) | 2009-06-05 | 2010-06-04 | 磁界補償 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8598869B2 (ja) |
EP (1) | EP2259081B1 (ja) |
JP (1) | JP5437918B2 (ja) |
DE (1) | DE102009024268B4 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102011106433B4 (de) | 2011-07-04 | 2016-10-13 | Integrated Dynamics Engineering Gmbh | Integrierbare Magnetfeldkompensation für den Einsatz an Raster- und Transmissionselektronenmikroskopen, Schwingungsisolationssystem sowie Verfahren zum Abbilden, Untersuchen und / oder Bearbeiten einer Probe |
FR2979742B1 (fr) * | 2011-09-07 | 2014-06-27 | Commissariat Energie Atomique | Generateur d'un champ magnetique homogene |
DE102011086773A1 (de) * | 2011-11-22 | 2013-05-23 | Robert Bosch Gmbh | Metallsensor |
WO2014088602A1 (en) * | 2012-12-08 | 2014-06-12 | Vtbnet, Inc. | Industrial sensor system and method of use |
US9389281B2 (en) | 2013-03-21 | 2016-07-12 | Vale S.A. | Magnetic compensation circuit and method for compensating the output of a magnetic sensor, responding to changes in a first magnetic field |
US9857179B2 (en) * | 2014-12-30 | 2018-01-02 | Northrop Grumman Systems Corporation | Magnetic anomaly tracking for an inertial navigation system |
US10067204B2 (en) | 2015-01-05 | 2018-09-04 | The Penn State Research Foundation | Method and device for compensation of temporal magnetic field fluctuations in powered magnets |
DE102016202494A1 (de) * | 2016-02-18 | 2017-08-24 | Continental Automotive Gmbh | Batteriesensor |
RU193692U1 (ru) * | 2018-04-24 | 2019-11-11 | Акционерное общество "Научно-производственное объединение измерительной техники" | Магнитный компенсатор для волоконно-оптического гироскопа |
EP3620806B1 (de) | 2018-09-06 | 2023-07-19 | Integrated Dynamics Engineering GmbH | System zur magnetfeldkompensation |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3801877A (en) * | 1972-09-15 | 1974-04-02 | Foerster Inst Dr Friedrich | Apparatus for producing a region free from interfering magnetic fields |
DE2828484A1 (de) * | 1977-07-04 | 1979-01-25 | Smiths Industries Ltd | Regelsystem zum ableiten eines ausgangssignals |
DE3308717A1 (de) * | 1983-03-11 | 1984-09-13 | elevit Schutzrechtverwertungs- und Vertriebsgesellschaft mbH, 8000 München | Vorrichtung zum ausmessen von magnetfeldern |
US5225999A (en) * | 1990-07-06 | 1993-07-06 | The Trustees Of The University Of Pennsylvania | Magnetic environment stabilization for effective operation of magnetically sensitive instruments |
US5519318A (en) * | 1992-12-28 | 1996-05-21 | The United States Of America As Represented By The Secretary Of The Navy | Triaxial magnetic heading sensing apparatus having magnetaresistors and nulling coils |
US5465012A (en) * | 1992-12-30 | 1995-11-07 | Dunnam; Curt | Active feedback system for suppression of alternating magnetic fields |
US5586064A (en) * | 1994-11-03 | 1996-12-17 | The Trustees Of The University Of Pennsylvania | Active magnetic field compensation system using a single filter |
DE19718649A1 (de) * | 1997-05-02 | 1998-11-05 | Peter Heiland | Vorrichtung und Verfahren zur aktiven Kompensation magnetischer und elektromagnetischer Störfelder |
US6124712A (en) * | 1997-05-16 | 2000-09-26 | The Regents Of The University Of California | Apparatus and method for imaging metallic objects using an array of giant magnetoresistive sensors |
DE10024986C2 (de) | 2000-05-19 | 2002-03-07 | Sartorius Gmbh | Elektronischer Wägeaufnehmer |
JP4353465B2 (ja) | 2003-08-22 | 2009-10-28 | 独立行政法人交通安全環境研究所 | 鉄道車両の磁界測定方法および磁界測定装置 |
US7400142B2 (en) * | 2003-11-06 | 2008-07-15 | Stephen John Greelish | Dynamic magnetic anomaly compensation |
JP4700287B2 (ja) | 2004-03-29 | 2011-06-15 | 一郎 笹田 | アクティブ磁気シールド装置 |
TWI361503B (en) * | 2005-03-17 | 2012-04-01 | Yamaha Corp | Three-axis magnetic sensor and manufacturing method therefor |
DE502006005450D1 (de) | 2006-03-29 | 2010-01-07 | Integrated Dynamics Eng Gmbh | Verfahren und Vorrichtung zur Regelung von Schwingungsisolationssystemen |
JP2009539098A (ja) | 2006-05-30 | 2009-11-12 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 適応型磁界補償センサー装置 |
DE502006007889D1 (de) * | 2006-07-01 | 2010-10-28 | Integrated Dynamics Eng Gmbh | Magnetfeldkompensationssystem mit erhöhter Bandbreite |
-
2009
- 2009-06-05 DE DE102009024268.6A patent/DE102009024268B4/de not_active Expired - Fee Related
-
2010
- 2010-06-02 EP EP10005738A patent/EP2259081B1/de active Active
- 2010-06-03 US US12/792,862 patent/US8598869B2/en active Active
- 2010-06-04 JP JP2010128582A patent/JP5437918B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
DE102009024268A1 (de) | 2010-12-09 |
JP2010281821A (ja) | 2010-12-16 |
EP2259081A1 (de) | 2010-12-08 |
US20100308811A1 (en) | 2010-12-09 |
EP2259081B1 (de) | 2012-08-22 |
US8598869B2 (en) | 2013-12-03 |
DE102009024268B4 (de) | 2015-03-05 |
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