JP5435868B2 - マイクロ放電装置、マイクロ放電装置アレイ、誘電体で覆われた電極を製造する方法 - Google Patents
マイクロ放電装置、マイクロ放電装置アレイ、誘電体で覆われた電極を製造する方法 Download PDFInfo
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- JP5435868B2 JP5435868B2 JP2007534902A JP2007534902A JP5435868B2 JP 5435868 B2 JP5435868 B2 JP 5435868B2 JP 2007534902 A JP2007534902 A JP 2007534902A JP 2007534902 A JP2007534902 A JP 2007534902A JP 5435868 B2 JP5435868 B2 JP 5435868B2
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- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 46
- 239000002184 metal Substances 0.000 claims description 46
- 238000000034 method Methods 0.000 claims description 23
- 239000000758 substrate Substances 0.000 claims description 20
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 17
- 229910052782 aluminium Inorganic materials 0.000 claims description 12
- 239000004020 conductor Substances 0.000 claims description 12
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 11
- 230000003647 oxidation Effects 0.000 claims description 6
- 238000007254 oxidation reaction Methods 0.000 claims description 6
- 239000011148 porous material Substances 0.000 claims description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 3
- 238000007743 anodising Methods 0.000 claims description 3
- 239000002071 nanotube Substances 0.000 claims description 3
- 238000007789 sealing Methods 0.000 claims description 3
- 229910052719 titanium Inorganic materials 0.000 claims description 3
- 239000010936 titanium Substances 0.000 claims description 3
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 2
- 229910001507 metal halide Inorganic materials 0.000 claims description 2
- 239000007789 gas Substances 0.000 description 26
- 230000008569 process Effects 0.000 description 15
- 239000000463 material Substances 0.000 description 12
- 239000003989 dielectric material Substances 0.000 description 8
- 239000011888 foil Substances 0.000 description 8
- 230000015556 catabolic process Effects 0.000 description 7
- 238000012545 processing Methods 0.000 description 7
- 238000002048 anodisation reaction Methods 0.000 description 6
- 238000003491 array Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- 239000010408 film Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- 239000003929 acidic solution Substances 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 238000003486 chemical etching Methods 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 230000000873 masking effect Effects 0.000 description 3
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- 239000000126 substance Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 239000002041 carbon nanotube Substances 0.000 description 2
- 229910021393 carbon nanotube Inorganic materials 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
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- 230000005593 dissociations Effects 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000002086 nanomaterial Substances 0.000 description 2
- 229910052756 noble gas Inorganic materials 0.000 description 2
- 238000012856 packing Methods 0.000 description 2
- VLTRZXGMWDSKGL-UHFFFAOYSA-N perchloric acid Chemical compound OCl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-N 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000002341 toxic gas Substances 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000012993 chemical processing Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229960002523 mercuric chloride Drugs 0.000 description 1
- LWJROJCJINYWOX-UHFFFAOYSA-L mercury dichloride Chemical compound Cl[Hg]Cl LWJROJCJINYWOX-UHFFFAOYSA-L 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000005459 micromachining Methods 0.000 description 1
- 150000007522 mineralic acids Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 238000000879 optical micrograph Methods 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000003334 potential effect Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000003980 solgel method Methods 0.000 description 1
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- 239000002904 solvent Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J17/00—Gas-filled discharge tubes with solid cathode
- H01J17/02—Details
- H01J17/04—Electrodes; Screens
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Gas-Filled Discharge Tubes (AREA)
- Micromachines (AREA)
- Manufacturing Of Electric Cables (AREA)
Description
本発明の以上の特性は、添付の図面を参照して成される以下の詳細な説明を参照することによって、より容易に理解されるであろう。
Claims (17)
- マイクロ放電装置であり、
第1の電極(230)を含み、前記第1の電極は導体及びマイクロキャビティを含み、前記マイクロキャビティは前記導体を部分的に貫通し、前記第1の電極内に画定された前記マイクロキャビティ内の全体に放電媒体を含むように構成され、前記放電媒体は、バックグラウンド気体中でのマイクロ放電の動作により加熱される時に所望の蒸気を発生する、金属ハロゲン化物塩を少量マイクロキャビティに導入することにより実現され、前記マイクロキャビティが第1の誘電体で封止されることなく、前記第1の電極および前記マイクロキャビティの壁は前記第1の誘電体で覆われており、
第2の電極(240)を含み、前記第2の電極は電位が前記電極間に与えられたときに、前記マイクロキャビティ中に放電を引き起こすように構成されており、前記マイクロキャビティが一端で閉じている、放電装置。 - 前記第2の電極は第2の誘電体で覆われている導体を含む、請求項1に記載の装置。
- 前記第1の誘電体はナノポーラス誘電体である、請求項1または2に記載の装置。
- 複数の請求項1の前記マイクロ放電装置を含むマイクロ放電装置アレイ。
- 前記第1の電極は、誘電体で覆われた複数の前記導体を含み、前記覆われた金属電極は複数のマイクロキャビティを含んでおり、
前記第2の電極は共通電極(840)を含み、前記共通電極は電位が前記共通電極と前記金属電極アレイとの間に与えられたときに前記複数のマイクロキャビティのそれぞれに放電を引き起こすように構成されている、請求項4に記載のマイクロ放電装置アレイ。 - 前記共通電極は透明である、請求項5に記載のアレイ。
- 前記第1の電極は、誘電体で覆われた複数の前記導体からなる電極アレイ(910)を含み、前記覆われた金属電極は複数のマイクロキャビティを含んでおり、
前記第2の電極は前記複数のマイクロキャビティのそれぞれに放電を引き起こすように構成された、第2の誘電体で覆われた、前記複数の前記導体を横切るように設けられた、複数の横切る電極(920)を含む、請求項4に記載のアレイを含むディスプレー応用のためのマイクロ放電装置アレイ。 - 前記複数のマイクロキャビティの個別の1つが、閾値を超える時間変化性電位が第1の電極と前記複数の横切る電極の横切る電極の1つとの間に与えられたときのみマイクロ放電を作り出すように構成されている、請求項7のディスプレー応用のためのマイクロ放電装置アレイ。
- 前記第1の誘電体及び前記第2の誘電体の少なくとも1つがナノポーラス誘電体である、請求項8に記載のアレイ。
- 前記第1の電極は金属円筒を含み、前記金属円筒は中心軸により特徴づけられ、前記円筒の内部表面上に複数のマイクロキャビティが形成され、前記マイクロキャビティは第1の誘電体で封止されることなく、前記マイクロキャビティの壁は前記第1の誘電体で覆われており、
前記第2の電極は前記円筒の前記中心軸に沿って構成し配置されており、時間変化性電位が前記中心電極と前記円筒との間に与えられたときに、前記複数のマイクロ放電装置のそれぞれに放電を引き起こすように構成されている、請求項4に記載のアレイを含む円筒状マイクロ放電装置アレイ。 - 前記第2電極は透明な電気的導電性のチューブを含む、請求項10に記載のアレイ。
- 前記第2の電極は金属導体を含む、請求項11に記載のアレイ。
- 誘電体で覆われた電極を製造する方法であって、
少なくとも1つのマイクロキャビティを含む金属基板を用意し、
前記基板を陽極酸化して細孔を含む第1の層を形成し、
前記第1の層の部分を溶解し、
前記第1の層の前記部分が溶解されたときに、前記第1の層の第2の陽極酸化を実行し、堆積層を形成し、これにより前記マイクロキャビティが第1の誘電体で封止されることなく、前記第1の電極および前記マイクロキャビティの壁が前記第1の誘電体で覆われるように形成することを含む、方法。 - 金属、誘電体、及びナノチューブの1つで、前記堆積層の前記細孔を特定の深さまで満たすことを更に含む、請求項13に記載の方法。
- 前記金属はアルミニウムであり、前記堆積層はAl2O3を含む、請求項13に記載の方法。
- 前記金属はチタンであり、前記堆積層はTiO2を含む、請求項13に記載の方法。
- 前記堆積層の厚さが前記基板のマイクロキャビティの壁上の部分と前記基板のマイクロキャビティの壁上以外の部分との間で異なる、請求項13に記載の方法。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/958,174 | 2004-10-04 | ||
US10/958,175 | 2004-10-04 | ||
US10/958,175 US7573202B2 (en) | 2004-10-04 | 2004-10-04 | Metal/dielectric multilayer microdischarge devices and arrays |
US10/958,174 US7297041B2 (en) | 2004-10-04 | 2004-10-04 | Method of manufacturing microdischarge devices with encapsulated electrodes |
PCT/US2005/035782 WO2007011388A2 (en) | 2004-10-04 | 2005-10-04 | Microdischarge devices with encapsulated electrodes and method of making |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008516380A JP2008516380A (ja) | 2008-05-15 |
JP5435868B2 true JP5435868B2 (ja) | 2014-03-05 |
Family
ID=37669273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007534902A Expired - Fee Related JP5435868B2 (ja) | 2004-10-04 | 2005-10-04 | マイクロ放電装置、マイクロ放電装置アレイ、誘電体で覆われた電極を製造する方法 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1797579B1 (ja) |
JP (1) | JP5435868B2 (ja) |
KR (1) | KR20070060151A (ja) |
WO (1) | WO2007011388A2 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1905057B1 (en) * | 2005-07-15 | 2016-03-09 | The Board Of Trustees Of The University Of Illinois | Arrays of microcavity plasma devices with dielectric encapsulated electrodes |
JP2007250284A (ja) * | 2006-03-14 | 2007-09-27 | National Univ Corp Shizuoka Univ | プラズマ電極 |
WO2009055765A2 (en) * | 2007-10-25 | 2009-04-30 | The Board Of Trustees Of The University Of Illinois | Microcavity plasma devices with non-uniform cross-section microcavities |
US8689537B1 (en) * | 2008-10-20 | 2014-04-08 | Cu Aerospace, Llc | Micro-cavity discharge thruster (MCDT) |
DE102009035411B3 (de) * | 2009-07-31 | 2010-10-28 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Plasmastempel und Verfahren zur Plasmabehandlung einer Oberfläche |
JP6026079B2 (ja) * | 2011-03-01 | 2016-11-16 | マイクロプラズマ株式会社 | プラズマ電極 |
WO2012177762A2 (en) | 2011-06-24 | 2012-12-27 | The Board Of Trustees Of The University Of Illinois | Arrays of metal and metal oxide microplasma devices with defect free oxide |
KR101355187B1 (ko) * | 2012-03-22 | 2014-01-27 | (주)지니아텍 | 공기 청정기용 플라즈마 발생모듈 및 플라즈마 발생모듈 제조방법 |
JP6542053B2 (ja) * | 2015-07-15 | 2019-07-10 | 株式会社東芝 | プラズマ電極構造、およびプラズマ誘起流発生装置 |
CN109196741B (zh) * | 2016-06-03 | 2020-10-16 | 日本碍子株式会社 | 电荷产生元件以及微粒数检测器 |
JP2021501710A (ja) * | 2017-10-01 | 2021-01-21 | スペース ファウンドリー インコーポレイテッド | プラズマジェット印刷用のモジュール式プリントヘッドアセンブリ |
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US5686789A (en) * | 1995-03-14 | 1997-11-11 | Osram Sylvania Inc. | Discharge device having cathode with micro hollow array |
JP3765901B2 (ja) * | 1996-02-26 | 2006-04-12 | 株式会社東芝 | プラズマディスプレイ及びプラズマ液晶ディスプレイ |
DE69738752D1 (de) * | 1996-08-26 | 2008-07-17 | Nippon Telegraph & Telephone | Verfahren zur herstellung poröser, anodisierter aluminiumfilme |
JP3714507B2 (ja) * | 1996-08-26 | 2005-11-09 | 日本電信電話株式会社 | 多孔性陽極酸化アルミナ膜の作製方法 |
US6016027A (en) * | 1997-05-19 | 2000-01-18 | The Board Of Trustees Of The University Of Illinois | Microdischarge lamp |
JP3631015B2 (ja) * | 1997-11-14 | 2005-03-23 | キヤノン株式会社 | 電子放出素子及びその製造方法 |
JP3754876B2 (ja) * | 2000-07-03 | 2006-03-15 | キヤノン株式会社 | 細孔を有する構造体の製造方法及び細孔を有する構造体 |
US20020030437A1 (en) * | 2000-09-13 | 2002-03-14 | Nobuhiro Shimizu | Light-emitting device and backlight for flat display |
JP2003100498A (ja) * | 2001-09-20 | 2003-04-04 | Japan Vilene Co Ltd | 放電用電極 |
US6695664B2 (en) * | 2001-10-26 | 2004-02-24 | Board Of Trustees Of The University Of Illinois | Microdischarge devices and arrays |
KR100441751B1 (ko) * | 2001-12-28 | 2004-07-27 | 한국전자통신연구원 | 전계 방출 소자의 제조 방법 |
JP2004178863A (ja) * | 2002-11-25 | 2004-06-24 | Toshiba Corp | 電子源装置および表示装置 |
JP2004227990A (ja) * | 2003-01-24 | 2004-08-12 | Kunihide Tachibana | プラズマ処理方法およびプラズマ処理装置 |
ITTO20030167A1 (it) * | 2003-03-06 | 2004-09-07 | Fiat Ricerche | Procedimento per la realizzazione di emettitori nano-strutturati per sorgenti di luce ad incandescenza. |
JP2004273315A (ja) * | 2003-03-10 | 2004-09-30 | Sharp Corp | イオン発生装置、空気調節装置および荷電装置 |
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2005
- 2005-10-04 WO PCT/US2005/035782 patent/WO2007011388A2/en active Application Filing
- 2005-10-04 JP JP2007534902A patent/JP5435868B2/ja not_active Expired - Fee Related
- 2005-10-04 KR KR1020077010176A patent/KR20070060151A/ko not_active Application Discontinuation
- 2005-10-04 EP EP05858440.0A patent/EP1797579B1/en not_active Not-in-force
Also Published As
Publication number | Publication date |
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EP1797579A4 (en) | 2009-04-15 |
WO2007011388A3 (en) | 2007-06-14 |
JP2008516380A (ja) | 2008-05-15 |
WO2007011388A2 (en) | 2007-01-25 |
EP1797579B1 (en) | 2015-09-02 |
KR20070060151A (ko) | 2007-06-12 |
EP1797579A2 (en) | 2007-06-20 |
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