JP5419099B2 - 直接変換型放射線検出器およびイオン化放射線を直接電流に変換する方法 - Google Patents

直接変換型放射線検出器およびイオン化放射線を直接電流に変換する方法 Download PDF

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JP5419099B2
JP5419099B2 JP2010508583A JP2010508583A JP5419099B2 JP 5419099 B2 JP5419099 B2 JP 5419099B2 JP 2010508583 A JP2010508583 A JP 2010508583A JP 2010508583 A JP2010508583 A JP 2010508583A JP 5419099 B2 JP5419099 B2 JP 5419099B2
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electrode plates
dielectric material
cathode
radiation
anode
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JP2010527453A5 (enExample
JP2010527453A (ja
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カーウィン、デービット、ビー．
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エアロフレックス コロラド スプリングス インコーポレイテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/28—Measuring radiation intensity with secondary-emission detectors

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP2010508583A 2007-05-15 2008-05-15 直接変換型放射線検出器およびイオン化放射線を直接電流に変換する方法 Expired - Fee Related JP5419099B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US93811407P 2007-05-15 2007-05-15
US60/938,114 2007-05-15
PCT/US2008/063740 WO2008144414A1 (en) 2007-05-15 2008-05-15 Energy sensitive direct conversion radiation detector

Publications (3)

Publication Number Publication Date
JP2010527453A JP2010527453A (ja) 2010-08-12
JP2010527453A5 JP2010527453A5 (enExample) 2011-06-30
JP5419099B2 true JP5419099B2 (ja) 2014-02-19

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JP2010508583A Expired - Fee Related JP5419099B2 (ja) 2007-05-15 2008-05-15 直接変換型放射線検出器およびイオン化放射線を直接電流に変換する方法

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US (1) US7589327B2 (enExample)
EP (1) EP2147334B1 (enExample)
JP (1) JP5419099B2 (enExample)
IL (1) IL202115A (enExample)
WO (1) WO2008144414A1 (enExample)

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WO2013020130A1 (en) * 2011-08-04 2013-02-07 John Lewellen Bremstrahlung target for intensity modulated x-ray radiation therapy and stereotactic x-ray therapy
US8829454B2 (en) 2012-02-27 2014-09-09 Analog Devices, Inc. Compact sensor module
US9239258B1 (en) * 2012-09-28 2016-01-19 The United States Of America As Represented By Secretary Of The Navy High efficiency photoelectric cell
US9116022B2 (en) 2012-12-07 2015-08-25 Analog Devices, Inc. Compact sensor module
EP3146364A4 (en) * 2014-05-23 2018-01-24 Brigham and Women's Hospital, Inc. Detectors, system and method for detecting ionizing radiation using high energy current
US10074624B2 (en) 2015-08-07 2018-09-11 Analog Devices, Inc. Bond pads with differently sized openings
WO2019003374A1 (ja) * 2017-06-29 2019-01-03 株式会社島津製作所 放射線計測器および放射線撮影装置
US11056455B2 (en) 2017-08-01 2021-07-06 Analog Devices, Inc. Negative fillet for mounting an integrated device die to a carrier
WO2020118102A1 (en) 2018-12-06 2020-06-11 Analog Devices, Inc. Shielded integrated device packages
EP3891793A4 (en) 2018-12-06 2022-10-05 Analog Devices, Inc. INTEGRATED DEVICE PACKAGES WITH PASSIVE DEVICE ARRANGEMENTS
JP7292868B2 (ja) * 2018-12-18 2023-06-19 キヤノン株式会社 検出器
WO2020142975A1 (en) * 2019-01-10 2020-07-16 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor radiation detector
US20200339780A1 (en) 2019-04-29 2020-10-29 Chevron Phillips Chemical Company Lp Additive Systems Containing an Antioxidant and a Glycerol Stearate for Improved Color in Polyethylene Resins
US11933925B2 (en) 2019-06-11 2024-03-19 Bundesrepublik Deutschland, Vertreten Durch Das Bundesministerium Fur Wirtschaft Und Energie, Dieses Vertreten Durch Den Prasidenten Der Physikalisch-Technischen Bundesanstalt Particle energy measuring device and method for determining a beam energy of a particle beam
US11226297B2 (en) 2019-06-12 2022-01-18 Raytheon Company X-ray dosage mitigation for semiconductors and material inspection systems
CN110174693A (zh) * 2019-06-26 2019-08-27 中国工程物理研究院流体物理研究所 一种堆叠式多通道康普顿二极管探测器及测量方法
ES2823949B2 (es) * 2019-11-07 2022-02-02 Consejo Superior Investigacion Dispositivo y metodo de deteccion de fotones y particulas cargadas y uso de los mismos
US11664340B2 (en) 2020-07-13 2023-05-30 Analog Devices, Inc. Negative fillet for mounting an integrated device die to a carrier
CN117015346A (zh) * 2021-03-01 2023-11-07 纽约州州立大学研究基金会 用于光谱成像和对比度增强的数字乳房断层合成的双层检测器系统和方法

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JPH07107941B2 (ja) * 1986-03-03 1995-11-15 株式会社東芝 放射線検出装置
JPH065291B2 (ja) * 1986-07-02 1994-01-19 株式会社日立製作所 放射線検出器
JPH03273687A (ja) * 1990-03-22 1991-12-04 Matsushita Electric Ind Co Ltd 放射線吸収材料および放射線検出器
DE4125929A1 (de) * 1991-08-05 1993-02-11 Siemens Ag Strahlungsdetektor
US6002829A (en) * 1992-03-23 1999-12-14 Minnesota Mining And Manufacturing Company Luminaire device
US5434417A (en) * 1993-11-05 1995-07-18 The Regents Of The University Of California High resolution energy-sensitive digital X-ray
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Also Published As

Publication number Publication date
WO2008144414A1 (en) 2008-11-27
EP2147334B1 (en) 2019-07-03
EP2147334A1 (en) 2010-01-27
IL202115A (en) 2015-01-29
IL202115A0 (en) 2010-06-16
EP2147334A4 (en) 2012-06-06
US20080283764A1 (en) 2008-11-20
US7589327B2 (en) 2009-09-15
JP2010527453A (ja) 2010-08-12

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