JP5397936B2 - Metallized film capacitors - Google Patents

Description

  The present invention relates to a metallized film capacitor used for smoothing and filtering inverter circuits for industrial equipment and automobiles.

  The conventional metallized film capacitor has a metallized near-metallized vapor deposition electrode 2 on the polypropylene film 1 shown in FIG. 1 thick and a non-metallized vapor-deposited electrode 3 thinly deposited, and an insulating margin 4 is formed at the end facing the metallicon. Film is being used. This metallized film capacitor has a self-healing function for recovering the insulation of the dielectric breakdown part due to scattering of the vapor deposition electrode around the dielectric breakdown part by the discharge energy at the time of dielectric breakdown of the polypropylene film. However, at high temperatures and high voltages, the number of dielectric breakdowns increases, so that the self-recovery function cannot be obtained sufficiently, and the capacitor may reach the short mode. For example, as shown in FIG. 11, in a metallized film capacitor in which a metallized film having a vapor-deposited metal film is laminated and wound on a dielectric (plastic film), the dielectric is shown at the x mark in the drawing. When the body breaks down and self-healing (spattering of the deposited metal) is insufficient, it is conducted with the deposited metal on the metallized film disposed under the metallized film via the broken dielectric part. Become.

  The smoothing capacitor of the inverter circuit is used at a high temperature and a high voltage, and has a strong demand for safety, and a metallized film in which the vapor deposition electrode is divided into a plurality of parts is employed (see, for example, Patent Documents 1 to 3). Examples of metallized films on which such divided electrodes are formed are shown in [FIG. 2-A] to [FIG. 2-C].

  In FIG. 2A, an insulating margin 12 is formed at the end of the metallized film facing the metallicon connection portion 10 in the width direction, and the divided electrode 7 is formed by the width direction insulating slit 5 and the longitudinal direction insulating slit 6. Is formed. These divided electrodes 7 are connected in parallel by a fuse 8. Further, the vapor deposition electrode in the vicinity of the metallicon has a configuration in which the metallicon connection portion 10 and the divided electrode 7 are separated by a longitudinal insulating slit 9, and the metallicon connection portion 10 and the divided electrode 7 are connected by a fuse 11.

  In FIG. 2B, an insulating margin 12a is formed at the end of the metallized film that faces the metallicon connecting portion 10a in the width direction, and a honeycomb-shaped divided electrode 7a is formed by the Y-shaped insulating slit 13a. . These divided electrodes 7a are connected in parallel by a fuse 8a.

  In FIG. 2C, an insulating margin 12b is formed at the end of the metallized film facing the metallicon connecting portion 10b in the width direction, and a honeycomb-shaped divided electrode 7b is formed by the Mueller-rear insulating slit 14a. ing. These divided electrodes 7b are connected in parallel by a fuse 8b.

  When a dielectric breakdown occurs in a metallized film capacitor using a metallized film having such divided electrodes, it has the above-described self-healing function. At the same time, even if dielectric breakdown that exceeds the self-healing function of the metallized film occurs, current flows from the surrounding split electrode to the split electrode where dielectric breakdown occurs, and the vapor deposition electrode of the fuse part is scattered, insulating by fuse operation The divided electrode in which the breakdown has occurred is separated from other divided electrodes and has a function of restoring insulation, and high safety is ensured.

  Furthermore, if the area of the divided electrode is reduced, the capacity reduction due to the fuse operation can be suppressed, and the life of the capacitor can be extended. However, if the material is too finely divided, the energy of the divided electrodes becomes small, and when a dielectric breakdown occurs, the fuse operation becomes difficult and the safety of the capacitor decreases. This phenomenon becomes more prominent as the temperature increases.

  Further, when the divided electrode area is reduced, the number of fuses increases. However, since the fuse has a higher resistance than the divided electrode, it has been reported that the heat generation of the capacitor increases (for example, patents). Reference 4). An increase in the ambient temperature and an increase in self-heating in such a metallized film capacitor cause a decrease in voltage resistance and safety.

  Therefore, in order to improve the above-described problems, a means has been devised in which divided electrode portions and electrodes that are not divided and have a large area (non-divided electrode portions) are collectively arranged (see, for example, Patent Document 5). In the metallized film capacitor described in Patent Document 5, a plurality of small divided electrodes partitioned by slits are provided on the insulating margin side, and a non-divided electrode portion is provided on the terminal connection portion side. And the some division | segmentation small electrode is comprised so that the area of a vapor deposition electrode may become small as it approaches an insulation margin.

Japanese Patent Laid-Open No. 08-250367 Japanese Patent Laid-Open No. 11-26281 JP-A-11-26280 JP 2003-338422 A JP 2005-12082 A

  By the way, capacitors used for smoothing an inverter circuit for automobiles are used at high temperatures, high frequencies, and high voltages, and miniaturization and high reliability are required. For this reason, it is necessary to reduce the thickness of the dielectric film to reduce the size of the capacitor and to improve the voltage resistance and safety at high temperatures.

  However, in the metallized film capacitor described in Patent Document 5, the divided small electrodes (divided electrode portions) are concentrated on the insulation margin side, while the non-divided electrode portions are arranged on the terminal connection portion side. It was not always the case that the safety of the company was sufficiently secured. Specifically, when breakdown occurs in the divided electrode portion, a current sufficient to operate the fuse does not flow from the divided electrode adjacent to the divided electrode in which breakdown occurs, and the fuse is operated particularly at a high temperature. There was a risk of not being able to.

  In addition, although there are no insulating slits in the non-divided electrode portion, insulating slits are formed in the divided electrodes. For this reason, it is necessary to apply the masking oil to the metallized film in order to form the divided electrodes. However, the residual masking oil adhered during vapor deposition affects the slipping of the metalized film between the non-divided electrode part and the divided electrode part. There was a difference in sex.

  However, the metallized film capacitor described in Patent Document 5 is provided with a plurality of divided small electrodes on the insulation margin side, and a non-divided large electrode part on the terminal connection side, so that the insulating slit on the metallized film is provided. The position of is greatly biased in the width direction. As a result, the slidability of the metallized film is remarkably different in the width direction, and when the metallized film is wound, the element winding state varies, which may affect the voltage resistance at high temperatures.

  This invention is made | formed in view of the said subject, and it aims at providing the metallized film capacitor which has the favorable safety | security at high temperature and withstand voltage property.

  The present invention solves the above-mentioned problem, and forms a capacitor element by winding or laminating a metallized film provided with a vapor deposition electrode on at least one surface of a dielectric film, and forming electrodes on both end surfaces of the capacitor element. In a metallized film capacitor to which a metallicon for extraction is connected, a divided electrode part is formed by dividing a vapor deposition electrode by a plurality of insulating slits arranged in the longitudinal direction of the metallized film, and the vapor deposition electrode is continuous in the longitudinal direction. The non-divided electrode portions are alternately arranged in the width direction of the metallized film, and each of the divided electrodes corresponding to the segment of the divided electrode portion is formed between the end portions of the adjacent insulating slits. It is characterized by being connected to the non-divided electrode portion by a fuse.

  According to the invention thus configured, the vapor deposition electrode is divided into a plurality of divided electrodes by the insulating slit, and each of the divided electrodes is connected to the non-divided electrode portion which is continuous in the longitudinal direction by the fuse. . Such divided electrode portions and non-divided electrodes are alternately arranged in the width direction of the metallized film. For this reason, even if the divided electrode area is reduced (even if the divided electrode portion is subdivided), stable security can be obtained, and the capacity reduction due to the fuse operation can be suppressed. That is, the capacity reduction due to the fuse operation can be suppressed by subdividing the divided electrode portion. On the other hand, if it is subdivided, the fuse operation becomes difficult and the security is lowered. On the other hand, according to the present invention, even if dielectric breakdown occurs in the divided electrode portion, the divided electrode portion and the non-divided electrode portion are alternately arranged in the width direction, and at least one end portion of the divided electrode portion Is adjacent to the non-divided electrode part, so that a sufficient current flows into the fuse, and the fuse can be operated reliably (spraying the vapor deposition electrode of the fuse part), so that the divided electrode part causing the dielectric breakdown can be separated. . Thereby, stable security can be obtained even if the divided electrodes are made smaller.

  Moreover, since the divided electrode portions and the non-divided electrodes are alternately arranged in the width direction of the metallized film, the position of the insulating slit on the metallized film is prevented from being unevenly distributed in the width direction, and the metallized film Can be leveled in the width direction. As a result, when the metallized film is wound, it is possible to suppress variation in the element winding state, and to ensure good voltage resistance at high temperatures. Therefore, it is possible to provide a metallized film capacitor having good safety and voltage resistance at a high temperature (for example, a temperature exceeding 100 ° C.).

  Here, in the metallized film capacitor in which the capacitor element is formed by a pair of metallized films formed by stacking two metallized films, all of the non-divided electrode portions formed on one of the pair of metallized films are It is preferable to constitute so as to face the divided electrode portion formed on the other of the pair of metallized films. According to this configuration, even when a dielectric breakdown exceeding the self-healing function (self-healing function) of the metallized film occurs in the non-divided electrode formed on one of the pair of metallized films, the pair of metallizations facing each other Sufficient current flows into the split electrode from the non-split electrode adjacent to the split electrode formed on the other side of the film. For this reason, the fuse formed between the divided electrode and the non-divided electrode formed on the other of the pair of metallized films is operated reliably (the evaporated electrode of the fuse portion is scattered), and the divided electrode is divided into other divided electrodes. Can be separated from the electrode. Thereby, even when a dielectric breakdown occurs in the non-divided electrode formed on one of the pair of metallized films, the insulation of the non-divided electrode can be recovered and the function as a capacitor can be maintained.

  Furthermore, it is preferable to arrange a non-divided electrode portion on the metallicon connection portion side of the metallized film for electrode drawing. This is because, when a divided electrode part is arranged on the metallicon connection part side, when dielectric breakdown occurs in the divided electrode part, if a fuse connecting the divided electrode part and the non-divided electrode part operates, the divided electrode part Current path is completely cut off and may not function as a capacitor. On the other hand, even if dielectric breakdown occurs in the non-divided electrode on the electrode lead-out side (non-divided electrode formed on one of the pair of metallized films) by disposing the non-divided electrode portion on the metallicon connection portion side. As a capacitor, the fuse that connects the split electrode formed on the opposing metallized film (the other metallized film of the pair of metallized films) and the non-split electrode adjacent to the split electrode operates. It is possible to leave a functioning electrode region (to ensure a current path from the non-divided electrode).

  Here, the metallized film capacitor can be specifically configured in the following manner. For example, in a metallized film capacitor having an insulating margin in which a vapor deposition electrode is not formed at the end opposite to the metallicon connection portion in the width direction, the metalized film has a plurality of Y-shaped insulating slits in the longitudinal direction on the insulating margin side. And a Mueller-Rear-shaped insulating slit arranged in parallel with the arrangement direction of the Y-shaped insulating slit, and the Mueller-Rear insulating slit arranged in parallel with the arrangement direction of the Y-shaped insulating slit. And a second divided electrode portion in which a divided electrode is formed between the insulating slits, and a non-divided electrode portion can be formed between the first divided electrode portion and the second divided electrode portion. Here, a plurality of second divided electrode portions may be formed in the width direction, and a non-divided electrode portion may be formed between the plurality of second divided electrodes. Furthermore, a plurality of Y-shaped insulating slits are arranged along the longitudinal direction on the metallicon connection portion side to include a third divided electrode portion in which a divided electrode is formed between the Y-shaped insulating slits, A non-divided electrode part can be formed between the third divided electrode part.

  In addition, a plurality of Y-shaped insulating slits are arranged along the longitudinal direction on the insulating margin side, whereby a plurality of Y-shaped insulating slits are formed between the Y-shaped insulating slits, and a plurality of Y-shaped insulating slits are formed on the metallicon connection portion side. The Y-shaped insulating slits are arranged along the longitudinal direction so that the Y-shaped insulating slit has a metallicon connection part-side divided electrode part in which a divided electrode is formed, and the insulating margin-side divided electrode part and the metallicon connection part-side division are provided. You may comprise so that an undivided electrode part may be formed between electrode parts.

  According to the present invention, it is possible to provide a metallized film capacitor having good safety and voltage resistance at high temperatures.

It is a figure which shows the laminated constitution of the metallized film currently used for the conventional metallized film capacitor. It is a top view which shows the conventional metallized film provided with the division | segmentation electrode, [FIG. 2-A] is a rectangular division | segmentation electrode, [FIG. 2-B] is a honeycomb-shaped division | segmentation formed by the Y-shaped insulation slit. FIG. 2C is a diagram showing a case of a honeycomb-shaped divided electrode formed by Mueller-Rear type insulating slits. It is a top view by the example by which the divided electrode and the non-divided electrode were alternately arrange | positioned by the metallized film which comprises the metallized film capacitor of this invention. It is the top view by the other example by which the divided electrode and the non-divided electrode are alternately arrange | positioned with the metallized film which comprises the metallized film capacitor | condenser of this invention. It is the top view by the other example by which the divided electrode and the non-divided electrode are alternately arrange | positioned with the metallized film which comprises the metallized film capacitor | condenser of this invention. It is a top view which shows the metallized film by the comparative example provided with the division | segmentation electrode. It is a figure which shows the internal structure of the metallized film capacitor of this invention. It is a figure which shows the electric current path at the time of the dielectric breakdown in the division | segmentation electrode position of the metallized film which comprises the metallized film capacitor of this invention. It is a figure which shows the electric current path at the time of the dielectric breakdown in the division | segmentation electrode position of the metallized film which comprises the metallized film capacitor by a comparative example. It is a figure which shows the modification of the metallized film which comprises the metallized film capacitor of this invention. It is a figure which shows an example of the laminated constitution of the conventional metallized film capacitor. It is a figure which shows an example of the lamination | stacking state in the metallized film capacitor of this invention. It is a figure which shows the other example of the lamination | stacking state in the metallized film capacitor of this invention. It is a figure which shows the comparative example of the lamination | stacking state in a metallized film capacitor.

Hereinafter, embodiments according to the present invention will be described in detail with reference to the drawings.
In Examples 1 to 4, as shown in FIGS. 3 to 5, (i) a plurality of insulating slits arranged at a constant pitch along the longitudinal direction of the metallized film, the deposition electrodes (vapor deposition metal) are divided into a plurality of segments. Divided electrode parts divided and non-divided electrode parts in which no insulating slit exists and vapor deposition electrodes are continuous in the longitudinal direction are alternately arranged in the film width direction of the metallized film, and (ii) divided electrodes The divided electrode corresponding to the segment of the portion is connected to the non-divided electrode portion by a fuse formed between the end portions of the adjacent insulating slits.

[Embodiment 1] FIG. 3, "Y-shaped + Muller rear type (one row)" insulating slit, pitch 12.0 mm
FIG. 3 is a view showing an embodiment of the metallized film capacitor according to the present invention. In the pair of metallized films shown in FIG. 3, one end part (electrode formation region) in the width direction of the metallized film constitutes a metallicon connection part to which an electrode drawing metallicon is connected, and an insulation margin ( A region 12 where no vapor deposition electrode is formed is formed at one end in the width direction of the metallized film. On the insulating margin 12 side of the metallized film, a plurality of Y-shaped insulating slits 13 (width 0.2 mm) are arranged at a constant pitch in the longitudinal direction. The base end portion of the Y-shaped insulating slit 13 is coupled to the insulating margin 12. In the divided electrode portion (corresponding to the “first divided electrode portion” in the present application) provided with the Y-shaped insulating slits 13 arranged in this manner, the vapor deposition electrode is divided into a plurality of segments by the Y-shaped insulating slit 13. A split electrode 15 is formed between the letter-shaped insulating slits 13. The electrode region sandwiched between the end (metallicon connecting portion side) and the end (metallicon connecting portion side) of the Y-shaped insulating slits 13 adjacent to each other forms a fuse 18.

  In addition, at the same pitch as the Y-shaped insulating slit 13, a row of Mueller-Rear shapes (inward arrows at both ends of a predetermined length of the line segment extending in the width direction) parallel to the arrangement direction of the Y-shaped insulating slit. The shape having blades) Insulating slits 14 (width 0.2 mm) are arranged. The divided electrode portion (corresponding to the “second divided electrode portion” in the present application) having the Mueller-Rear type insulating slits 14 arranged in this way is divided into a plurality of segments by the Mueller-Rear type insulating slit 14. A divided electrode 16 is formed between the Mueller-Rear type insulating slits 14. The electrode regions sandwiched between the end portions (both ends) and the end portions (both ends) of the adjacent Mueller-Rear type insulating slits 14 constitute a fuse 18.

  A non-divided electrode portion 17 is formed between the first divided electrode portion and the second divided electrode portion that faces the first divided electrode portion while being separated from the first divided electrode portion in the width direction. The non-divided electrode portion 17 has no insulating slit, and the vapor deposition electrode is continuously formed in the longitudinal direction.

  The divided electrode 15 divided by the Y-shaped insulating slit 13 is connected to the non-divided electrode portion 17 by a fuse 18 formed between the adjacent Y-shaped insulating slits 13, while the Mueller-Rear type insulating slit 14 The divided electrode 16 is connected to the non-divided electrode portion 17 by a fuse 18 formed between the adjacent Mueller-Rear insulating slits 14.

  The pitch of the insulating slits 13 and 14 that divide the divided electrodes 15 and 16 in the film longitudinal direction is 12.0 mm, the area of the divided electrode 15 is half that of the divided electrode 16, and the non-divided electrode portion 17 and the divided electrodes 15 and 16 The width of the fuse 18 connecting the two is 0.2 mm. The dielectric was a 2.5 μm polypropylene film, the film resistance value of the metallicon connection portion deposition electrode was 4Ω / □, and the film resistance value of the non-metallicon vicinity deposition electrode excluding the metallicon connection portion deposition electrode was 10Ω / □.

  Two metallized films as described above are stacked and wound so that the metallicon connection portion and the insulation margin are opposed to each other to form a capacitor element. The two metallized films are overlaid with the electrode forming surface on which the vapor deposition electrode is formed facing in the same direction. That is, the vapor deposition electrodes and the dielectric films are alternately arranged in the stacking direction so that the dielectric film is sandwiched between the vapor deposition electrodes. Then, after the capacitor element was formed into an oval shape, a metallicon for extracting an electrode was formed at both ends of the element to obtain a capacitor element. Further, as shown in FIG. 7, five capacitor elements 25 are connected by an electrode plate 26 and lead terminals 27 are connected, housed in a case 28, filled with epoxy resin 29, cured, and 800 μF metallized film. Five capacitors were produced.

  Here, among the pair of metallized films formed by overlapping two metallized films, all of the non-divided electrode parts formed on one metallized film are divided electrode parts formed on the other metallized film. It is preferable to configure so as to face the surface. According to this configuration, for example, as shown in FIG. 12, the self-healing function of the metallized film in the non-divided electrode formed on one of the pair of metallized films (the metallized film located on the upper layer side in the figure) ( Even when dielectric breakdown exceeding the self-healing function (dielectric breakdown at the position of the x mark) occurs (when the vapor deposition electrodes conduct between a pair of metallized films through the broken dielectric portion) Non-divided electrode adjacent to the divided electrode formed on the other of the pair of metallized films facing each other (the metallized film located on the lower layer side in the figure) (the divided by being alternately arranged with the divided electrodes in the width direction) Current flows into the split electrode from the non-split electrode adjacent to the electrode. For this reason, the fuse formed between the divided electrode and the non-divided electrode formed on the other of the pair of metallized films operates (sprays the vapor deposition electrode of the fuse portion), and the divided electrode is separated from the other divided electrodes. Can be separated. Thereby, even when a dielectric breakdown occurs in the non-divided electrode formed on one of the pair of metallized films, the insulation of the non-divided electrode can be recovered and the function as a capacitor can be maintained.

[Embodiment 2] FIG. 3, "Y-shaped + Muller rear type (one row)" insulating slit, pitch 6.0 mm
A metallized film capacitor was formed under the same conditions as in Example 1 except that the pitch of the insulating slits 13 and 14 for dividing the metallized film split electrodes 15 and 16 shown in FIG. Produced.

[Embodiment 3] FIG. 4, “Y-shape + Muller rear type (2 rows)” insulating slit, pitch 6.0 mm
In the metallized film capacitor shown in FIG. 4, a plurality of Y-shaped insulating slits 13 are arranged at a constant pitch in the longitudinal direction on the insulating margin 12 side of the metallized film, and divided electrodes 15 are formed between the Y-shaped insulating slits 13. Has been. Two rows of Mueller-rear insulating slits 14 are arranged at the same pitch as the Y-shaped insulating slits 13 in parallel with the arrangement direction of the Y-shaped insulating slits 13, and the divided electrodes are arranged between the Mueller-rear insulating slits 14. 16 is formed. Then, the divided electrode portion (first divided electrode portion) in which the Y-shaped insulating slits 13 are arranged, and one Mueller-Rear type insulating slit 14 that faces the first divided electrode portion while being spaced apart in the width direction are arranged. A divided electrode portion (second divided electrode portion) between which the divided electrode portion (second divided electrode portion) and one Mueller-rear insulating slit 14 are arranged, and a width direction in the Mueller-rear insulating slit 14 A non-divided electrode portion 17 is formed between the divided electrode portion (second divided electrode portion) in which other Mueller-Rear-type insulating slits 14 facing each other while being separated from each other are arranged. The divided electrode 15 and the non-divided electrode portion 17 and the divided electrode 16 and the non-divided electrode portion 17 are connected by a fuse 18. Thus, in this embodiment, the non-divided electrode portion 17 is formed between the plurality of second divided electrode portions.

  Then, using the metallized film shown in FIG. 4, the pitch of the insulating slits 13 and 14 that divide the divided electrodes 15 and 16 in the film longitudinal direction is 6.0 mm, and the area of the divided electrode 15 is half that of the divided electrode 16. A metallized film capacitor was produced under the same conditions as in Example 1 except that.

[Embodiment 4] FIG. 5, “Y-shaped (two opposing rows)” insulating slit, pitch 6.0 mm
In the metallized film capacitor shown in FIG. 5, a plurality of Y-shaped insulating slits 13 are arranged at a constant pitch in the longitudinal direction on the insulating margin 12 side of the metallized film. The base end portion of the Y-shaped insulating slit 13 is coupled to the insulating margin 12. In this way, the divided electrode portion (corresponding to the “insulating margin side divided electrode portion” in the present application) having the Y-shaped insulating slits 13 arranged on the insulating margin 12 side has a plurality of vapor deposition electrodes formed by the Y-shaped insulating slit 13. The divided electrode 15 is formed between the Y-shaped insulating slits 13. An electrode region sandwiched between an end portion (metallicon connection portion 10 side) and an end portion (metallicon connection portion 10 side) of the Y-shaped insulating slits 13 adjacent to each other forms a fuse 18.

  On the other hand, a plurality of Y-shaped insulating slits 13 different from the Y-shaped insulating slits 13 are arranged at a constant pitch in the longitudinal direction on the metallicon connecting part 10 side of the metallized film. In this way, the divided electrode part (corresponding to the “metallicon connection part side divided electrode part” of the present application) provided with the Y-shaped insulating slits 13 arranged on the side of the metallicon connecting part side allows the vapor deposition electrode to be formed by the Y-shaped insulating slit 13. Divided into a plurality of segments, a divided electrode 19 is formed between the Y-shaped insulating slits 13. A base end portion (end portion on the metallicon connection portion side) of each Y-shaped insulating slit 13 is coupled to an insulating slit 9 provided in each Y-shaped insulating slit 13 and extending in the longitudinal direction. An electrode region sandwiched between an end portion (insulation margin side) and an end portion (insulation margin side) of the Y-shaped insulating slits 13 adjacent to each other forms a fuse 18.

  A non-divided electrode portion 17 is formed between the insulating margin side divided electrode portion and the metallicon connection portion side divided electrode portion. The divided electrode 15 formed on the insulating margin 12 side is connected to the non-divided electrode part 17 by the fuse 18 formed between the adjacent Y-shaped insulating slits 13, while the divided electrode formed on the metallicon connecting part side. The electrode 19 is connected to the non-divided electrode portion 17 by a fuse 18 formed between the adjacent Y-shaped insulating slits 13.

  Further, a fuse 18a is also provided on the metallicon connection 10 side, and the fuse 18a is formed between the insulating slits 9 extending in the longitudinal direction of the base of the Y-shaped insulating slit 13 on the metallicon connection 10 side. Further, at the center in the width direction of the other metallized film on which the metallized film is superposed, Mueller-Rear type insulating slits 14 are arranged at a constant pitch, and a divided electrode 16 composed of a plurality of segments is formed. .

  The pitch of the insulating slits 13 and 14 that divide the divided electrodes 15, 16, and 19 of the metallized film shown in FIG. 5 in the film longitudinal direction is 6.0 mm, and the area of the divided electrodes 15 and 19 is half that of the divided electrode 16. The same conditions as in Example 1 except that the width of the fuse 18 connecting the non-divided electrode 17 and the divided electrode is 0.2 mm, and the width of the fuse on the metallicon connection portion side is 0.15 mm. A metallized film capacitor was produced.

(Comparative Example 1) FIG. 6, Y-shaped-Muller-Rear type combined insulating slit, pitch 12.0 mm
The metallized film shown in FIG. 6 has a metallized insulating slit 20 in which a Y-shaped insulating slit is connected to the insulating margin 12 side, and a Mueller-rear insulating slit is connected to the Y-shaped insulating slit in the center in the width direction of the metalized film. It is formed repeatedly in the longitudinal direction of the film. Then, the divided electrodes 21 and 22 divided into segments by the insulating slit 20 were formed in a range in the width direction half (insulating margin 12 side) of the metallized film, and the area of the divided electrode 21 was made half of the divided electrode 22. The remaining half of the metallized film in the width direction (metallicon connecting portion side) constitutes the non-divided electrode 23.

  Further, the pitch of the insulating slits 20 for dividing the metallized film split electrodes 21 and 22 in the longitudinal direction of the metallized film is set to 12.0 mm, and the width of the fuse 18 connecting the non-split electrode 23 and the split electrode 22 is set. 0.2 mm. A metallized film capacitor was produced under the same conditions as in Example 1 except for the above.

(Comparative Example 2) FIG. 6, Y-shaped-Muller-Rear type combined insulating slit, pitch 6.0 mm
A metallized film capacitor was produced under the same conditions as in Comparative Example 1 except that the pitch of the insulating slits 20 of the divided electrode metallized film shown in FIG. 6 was 6.0 mm.

(Conventional example 1) FIG. 2-A, rectangular insulating slit, pitch 6.0 mm
The pitch of the insulating slits 5 for dividing the metallized film dividing electrode 7 shown in FIG. 2-A into a rectangular shape in the film longitudinal direction is 6.0 mm, and the area of the dividing electrode is equal to the dividing electrode 16 of FIG. A metallized film capacitor was produced under the same conditions as in Example 1 except that the width of the fuses 8 and 11 connecting the divided electrodes was 0.2 mm.

(Conventional example 2) Fig. 2-B, formation of honeycomb-shaped divided electrodes by Y-shaped insulating slits The honeycomb-shaped divided electrodes 7a of the metallized film shown in Fig. 2-B are provided, and the area of the divided electrodes is divided electrodes of Fig. 4 A metallized film capacitor was produced under the same conditions as in Example 1 except that the width of the fuse 8a connecting the divided electrodes was set to 0.2 mm.

(Conventional Example 3) FIG. 2-C, Formation of Honeycomb Divided Electrode by Müller-Rear Insulating Slit Dividing electrode 7b of the metallized film shown in FIG. A metallized film capacitor was manufactured under the same conditions as in Example 1 except that the area of the electrode was made equal to the divided electrode 16 of FIG. 4 and the width of the fuse 8b connecting the divided electrodes was 0.2 mm. .

  Using each of the five samples of Examples 1 to 4, Comparative Examples 1 and 2 and Conventional Examples 1 to 3, a durability test (temperature 120 ° C., 750 VDC, applied for 1000 hours) was performed, and The capacity change rate [%] was measured. The test results are shown in Table 1.

  As is clear from Table 1, in Examples 1 to 4, the short mode was not observed at the end of the test, whereas in Comparative Examples 1 and 2 and Conventional Examples 1 to 3, the area of the divided electrodes and the fuse dimensions were the same. Even so, the short mode occurs during the test. In this embodiment, the vapor deposition electrode is divided into a plurality of divided electrodes, each divided electrode is connected to the non-divided electrode by a fuse, and the divided electrode and the non-divided electrode are alternately arranged in the film width direction. With this structure, when dielectric breakdown occurs in the dielectric polypropylene film as shown in FIG. 8, sufficient current 31 flows toward the dielectric breakdown location 30. As a result, even if the divided electrode is made smaller, the fuse is reliably operated (the vapor deposition electrode in the fuse portion is scattered), the divided electrode is separated, and stable security can be obtained. On the other hand, when the dielectric breakdown occurs in the conventional divided electrode metallized film shown in FIG. 9, only a small current 34 flows into the fuse connected to the divided electrode toward the dielectric breakdown point 32, and the fuse is It is considered that the short mode occurs because the scattering cannot be performed.

  Here, it is common to use a masking oil for forming the split electrode metal. In Comparative Examples 1 and 2, there is a slight amount of masking oil on the polarization electrode side, and a masking oil on the non-split electrode side. Therefore, if there is a deviation in the width direction between the divided electrode and the non-divided electrode, the friction coefficient of the metallized film is different in these parts, so that the slipping property of the divided electrode and the non-divided electrode can be different, and the element winding Wrinkles are generated at the time of operation, and the safety at high temperatures accompanying this is deteriorated.

  On the other hand, in the vapor deposition pattern in which the divided electrodes and the non-divided electrodes are alternately arranged as in the example, the position of the insulating slit on the metallized film is prevented from being unevenly distributed in the width direction, and slips in the width direction. Therefore, the generation of wrinkles at the time of winding the element is suppressed, the safety at high temperature is stabilized, and the productivity is improved. Therefore, according to the present Example, the division | segmentation electrode metallized film capacitor can be reduced in size, and even if it uses at high temperature over 100 degreeC, a capacity | capacitance reduction is few and stable security can be acquired.

Furthermore, when two metallized films are overlaid as described above, it is preferable to dispose an undivided electrode part on the metallicon connection part side of the metallized film for electrode drawing. This is because, for example, as shown in FIG. 14, when the divided electrode portion is arranged on the metallicon connection portion side (electrode lead side), dielectric breakdown occurs at the divided electrode portion (at the position of the x mark in the divided electrode). When a breakdown occurs, if the fuse connecting the divided electrode portion and the non-divided electrode portion is operated, the current path from the divided electrode portion may be completely cut off, and may not function as a capacitor.
On the other hand, for example, as shown in FIG. 12, by arranging the non-divided electrode portion on the metallicon connection portion side, the non-divided electrode on the electrode lead-out side (the non-divided electrode formed on one of the pair of metallized films, In FIG. 12, even when dielectric breakdown occurs in the non-divided electrode formed on the metallized film arranged on the upper layer side, the metallized film (the other metallized film of the pair of metallized films) 12, the fuse that connects the divided electrode formed on the metallized film disposed on the lower layer side and the non-divided electrode adjacent to the divided electrode operates to leave an electrode region that functions as a capacitor (non-divided) Current passage from the electrode can be secured).
Further, for example, as shown in FIG. 13, even when dielectric breakdown occurs at a plurality of locations of the non-divided electrode (a dielectric breaks at the position of the x mark in the non-divided electrode), the opposing metallized film The electrode region conducted between the upper and lower films by the fuse operation can be separated from the other electrode regions and function as a capacitor.

  The present invention is not limited to the above-described embodiment, and various modifications other than those described above can be made without departing from the spirit of the present invention. For example, in the metallized film shown in FIGS. 3 and 4, a plurality of Y-shaped insulating slits are arranged along the longitudinal direction on the metallicon connection portion side to form a divided electrode portion (with divided electrodes formed between the Y-shaped insulating slits ( (Corresponding to the “third divided electrode portion” of the present application) and between the divided electrode portion (second divided electrode portion) in which the divided electrode is formed between the Mueller-Rear insulating slits 14 and the third divided electrode portion. Alternatively, a non-divided electrode portion may be formed. Thereby, reduction of the further capacity reduction and improvement of security can be aimed at.

  Moreover, in the said embodiment, although the fuse 18 is provided along the width direction in the connection part of a division | segmentation electrode part and a non-division electrode part, as shown in FIG. The fuse 18b may be formed so as to connect the two and the divided electrodes. Specifically, the fuse 18b may be provided by partially cutting a central portion of the insulating slit extending in the width direction and forming a vapor deposition electrode in the divided portion. In this case, it is preferable that the size of the narrowest portion of the fuse 18b connecting the divided electrodes adjacent in the longitudinal direction is smaller than the size of the narrowest portion of the fuse 18 connecting the divided electrode and the non-divided electrode portion. According to this configuration, when dielectric breakdown occurs in the divided electrode portion, it is preferentially scattered from the fuse 18b, so that a decrease in capacity can be suppressed.

  In the above-described embodiments, the split electrodes are shown in the case of Y-shaped combinations (pentagonal shape), Mueller-Rear-shaped combinations (hexagonal, honeycomb-shaped), and honeycomb deformation. In the case of the same repetition, a small capacity reduction and good security were obtained as well.

  In the above embodiment, the insulating slits are arranged at a constant pitch along the longitudinal direction. However, the invention is not limited to this, and the arrangement may be arbitrarily arranged at irregular pitches along the longitudinal direction. .

DESCRIPTION OF SYMBOLS 1 Polypropylene film 2 Metallicon vicinity vapor deposition electrode 3 Non-metallicon vicinity vapor deposition electrode 4 Insulation margin 5 Width direction insulation slit 6 Longitudinal insulation slit 7, 7a, 7b Divided electrode 8, 8a, 8b Fuse 9 Metallicon vicinity longitudinal insulation slit 10, 10a DESCRIPTION OF SYMBOLS 10b Metallicon connection part 11 Metallicon vicinity fuse 12, 12a, 12b Insulation margin 13, 13a Y-shaped insulation slit 14, 14a Muller rear type insulation slit 15 Divided electrode 16 Divided electrode 17 Non-divided electrode 18, 18a, 18b Fuse 19 Divided Electrode 20 Y-shaped-Muller-Rear coupling insulating slit 21 Split electrode 22 Split electrode 23 Non-split electrode 24 Fuse 25 Capacitor element 26 Electrode plate 27 Lead terminal 28 Case 29 Epoxy resin 30 Insulation Current flowing into the current 34 divided electrodes flows to the current 32 breakdown point 33 divided electrodes flowing into 壊箇 office 31 divided electrodes

Claims (6)

In a metallized film capacitor in which a metallized film provided with an evaporation electrode on at least one surface of a dielectric film is wound or laminated to form a capacitor element, and metallicons for electrode drawing are connected to both end surfaces of the capacitor element.
A divided electrode portion in which the vapor deposition electrode is divided by a plurality of insulating slits arranged in the longitudinal direction of the metallized film to form a divided electrode;
Non-divided electrode portions in which the vapor deposition electrodes are continuous in the longitudinal direction are alternately arranged in the width direction of the metallized film,
Each of the divided electrodes corresponding to the segment of the divided electrode portion is connected to the non-divided electrode portion by a fuse formed between the end portions of the adjacent insulating slits , and
The capacitor element is formed of a pair of metallized films formed by superimposing two metallized films, and all of the non-divided electrode portions formed on one of the pair of metallized films are formed of the pair of metallized films. A metallized film capacitor, wherein the metallized film capacitor faces a divided electrode portion formed on the other side . 2. The metallized film capacitor according to claim 1, wherein the non-divided electrode part is disposed on the metallized connection part side of the metallized film. The metallized film capacitor according to claim 1 or 2, wherein the metallized film has a metallicon connection part and an insulating margin in which a vapor deposition electrode is not formed at an end on the opposite side in the width direction.
A plurality of Y-shaped insulating slits arranged along the longitudinal direction on the insulating margin side, whereby a divided electrode is formed between the Y-shaped insulating slits;
A second divided electrode portion in which a Mueller-rear insulating slit is arranged in parallel with the arrangement direction of the Y-shaped insulating slit, and a divided electrode is formed between the Mueller-rear insulating slit;
With
The metallized film capacitor , wherein the non-divided electrode portion is formed between the first divided electrode portion and the second divided electrode portion . A plurality of the second divided electrode portions are formed in the width direction,
The metallized film capacitor according to claim 3, wherein the non-divided electrode portion is formed between the plurality of second divided electrodes . A plurality of Y-shaped insulating slits arranged along the longitudinal direction on the metallicon connecting portion side, further comprising a third divided electrode portion in which divided electrodes are formed between the Y-shaped insulating slits;
The metallized film capacitor according to claim 3 or 4, wherein the non-divided electrode portion is formed between the second divided electrode portion and the third divided electrode portion . An insulating margin side divided electrode portion in which a plurality of Y-shaped insulating slits are arranged along the longitudinal direction on the insulating margin side so that a divided electrode is formed between the Y-shaped insulating slits;
A plurality of Y-shaped insulating slits are arranged along the longitudinal direction on the metallicon connecting portion side, and a metallicon connecting portion-side divided electrode portion in which a divided electrode is formed between the Y-shaped insulating slits,
2. The metallized film capacitor according to claim 1, wherein the non-divided electrode portion is formed between the insulating margin side divided electrode portion and the metallicon connection portion side divided electrode portion .

Images