JP5394918B2 - 漏えい磁場の分布の解析による部品の非破壊検査装置 - Google Patents

漏えい磁場の分布の解析による部品の非破壊検査装置 Download PDF

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JP5394918B2
JP5394918B2 JP2009511472A JP2009511472A JP5394918B2 JP 5394918 B2 JP5394918 B2 JP 5394918B2 JP 2009511472 A JP2009511472 A JP 2009511472A JP 2009511472 A JP2009511472 A JP 2009511472A JP 5394918 B2 JP5394918 B2 JP 5394918B2
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magnetic field
distribution
inspection
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microsensor
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JP2009537834A5 (enExample
JP2009537834A (ja
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デ.スメット.マリー−アンヌ
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エアバス オペラシオン(エス.ア.エス)
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
    • G01N27/87Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields using probes

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Magnetic Variables (AREA)
JP2009511472A 2006-05-24 2007-05-16 漏えい磁場の分布の解析による部品の非破壊検査装置 Expired - Fee Related JP5394918B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0651901 2006-05-24
FR0651901A FR2901611B1 (fr) 2006-05-24 2006-05-24 Dispositif de controle non destructif d'une piece par analyse de distribution du champ magnetique de fuite
PCT/EP2007/054751 WO2007135051A1 (fr) 2006-05-24 2007-05-16 Dispositif de contrôle non destructif d'une pièce par analyse de distribution du champ magnétique de fuite

Publications (3)

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JP2009537834A JP2009537834A (ja) 2009-10-29
JP2009537834A5 JP2009537834A5 (enExample) 2013-02-21
JP5394918B2 true JP5394918B2 (ja) 2014-01-22

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JP2009511472A Expired - Fee Related JP5394918B2 (ja) 2006-05-24 2007-05-16 漏えい磁場の分布の解析による部品の非破壊検査装置

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US (1) US8395380B2 (enExample)
EP (1) EP2030010A1 (enExample)
JP (1) JP5394918B2 (enExample)
CN (1) CN101449158B (enExample)
BR (1) BRPI0713938A2 (enExample)
CA (1) CA2650829A1 (enExample)
FR (1) FR2901611B1 (enExample)
RU (1) RU2439549C2 (enExample)
WO (1) WO2007135051A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2929008B1 (fr) * 2008-03-20 2010-04-02 Eads Europ Aeronautic Defence Dispositif de surveillance de la structure d'un vehicule
ES2651008T3 (es) * 2010-04-07 2018-01-23 L-3 Communications Avionics Systems, Inc. Procedimiento de instalación de un magnetómetro
CN102346168A (zh) * 2011-03-02 2012-02-08 江苏申锡建筑机械有限公司 非接触式擦窗机钢丝绳在线监测方法
US8823369B2 (en) * 2011-05-17 2014-09-02 Siemens Energy, Inc. Multi directional electromagnetic yoke for inspection of bores
CN102507729A (zh) * 2011-11-03 2012-06-20 江苏申锡建筑机械有限公司 一种非接触式钢丝绳无线检测系统和方法
US20130132035A1 (en) * 2011-11-23 2013-05-23 Ge Aviation Systems Llc Method for diagnosing a health of an apparatus
CN102841133B (zh) * 2012-09-26 2015-03-18 中国船舶重工集团公司第七一〇研究所 一种导磁材料无损实时检测方法和系统
EP3146323B1 (en) * 2014-05-18 2021-09-08 The Charles Stark Draper Laboratory, Inc. System and method of measuring defects in ferromagnetic materials
CN104569876A (zh) * 2015-01-07 2015-04-29 南昌航空大学 一种利用高斯计评价铁磁材料去应力退火效果的方法
JP7073617B2 (ja) * 2016-07-13 2022-05-24 株式会社Ihi 探触子、漏洩磁束探傷装置、および漏洩磁束探傷方法
US20190317048A1 (en) * 2018-04-17 2019-10-17 Illinois Tool Works Inc. Systems and methods to remotely manage non-destructive testing systems
CN114235944B (zh) * 2021-12-22 2024-03-12 江西公路开发有限责任公司 一种基于光源信号的拉索漏磁无损检测装置及方法

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1403635A (fr) 1963-08-14 1965-06-25 Massiot Philips Sa Dispositif de reproduction visuelle de clichés par télévision
US3511086A (en) * 1966-11-23 1970-05-12 Boeing Co Nondestructive testing with liquid crystals
US3970074A (en) * 1974-08-22 1976-07-20 Spitalul Clinic Filantropia Bucuresti Method of and apparatus for making medical thermographs
US4190419A (en) 1978-09-22 1980-02-26 Miles Laboratories, Inc. Device for detecting serum bilirubin
US4433637A (en) * 1979-06-04 1984-02-28 Vectra International Corporation Microencapsulated cholesteric liquid crystal temperature measuring device for determining the temperature of non-planar or planar surfaces
JPS62135778A (ja) * 1985-12-09 1987-06-18 Katsumi Yoshino 強誘電性液晶を用いる電界及び磁界の検知方法及び検知素子
FR2598250B1 (fr) 1986-04-30 1988-07-08 Thomson Csf Panneau de prise de vue radiologique, et procede de fabrication
JPH01185466A (ja) * 1988-01-19 1989-07-25 Sumitomo Metal Ind Ltd 薄膜磁気センサ
SU1536297A2 (ru) * 1988-05-05 1990-01-15 Уфимский Нефтяной Институт Преобразователь магнитных полей
US5047719A (en) * 1990-05-25 1991-09-10 The Failure Group, Inc. Flexible coil assembly for reflectance-mode nondestructive eddy-current examination
US5315234A (en) * 1992-04-03 1994-05-24 General Electric Company Eddy current device for inspecting a component having a flexible support with a plural sensor array
DE4220544B4 (de) 1992-06-24 2005-10-20 Woelfel Horst Verfahren zum Messen mechanischer Spannungskomponenten an der Oberfläche von dynamisch belasteten Meßobjekten
IT1273248B (it) 1994-03-15 1997-07-07 Europiana S R L Apparecchiatura per la misurazione della temperatura dell'epidermide
US5659248A (en) * 1994-10-17 1997-08-19 General Electric Company Multilayer eddy current probe array for complete coverage of an inspection surface without mechanical scanning
US5793206A (en) * 1995-08-25 1998-08-11 Jentek Sensors, Inc. Meandering winding test circuit
US5915277A (en) * 1997-06-23 1999-06-22 General Electric Co. Probe and method for inspecting an object
US5895629A (en) * 1997-11-25 1999-04-20 Science & Technology Corp Ring oscillator based chemical sensor
US6077228A (en) * 1998-11-04 2000-06-20 Schonberger; Milton Breast temperature scanner
DE10136756C2 (de) * 2001-07-27 2003-07-31 Siemens Ag Röntgendiagnostikeinrichtung mit einem flexiblen Festkörper-Röntgendetektor
US6812697B2 (en) * 2002-09-24 2004-11-02 General Electric Company Molded eddy current array probe
US6914427B2 (en) * 2003-03-14 2005-07-05 The Boeing Company Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method
JP3812559B2 (ja) * 2003-09-18 2006-08-23 Tdk株式会社 渦電流プローブ
JP2006046909A (ja) * 2004-07-30 2006-02-16 Olympus Corp 渦流探傷装置のマルチコイル式プローブ
JP4007386B2 (ja) * 2006-01-12 2007-11-14 Tdk株式会社 渦電流プローブ

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Publication number Publication date
RU2008151180A (ru) 2010-06-27
RU2439549C2 (ru) 2012-01-10
WO2007135051A1 (fr) 2007-11-29
JP2009537834A (ja) 2009-10-29
CA2650829A1 (fr) 2007-11-29
FR2901611B1 (fr) 2009-01-16
CN101449158A (zh) 2009-06-03
EP2030010A1 (fr) 2009-03-04
BRPI0713938A2 (pt) 2012-12-18
FR2901611A1 (fr) 2007-11-30
US8395380B2 (en) 2013-03-12
CN101449158B (zh) 2013-03-27
US20090302836A1 (en) 2009-12-10

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