JP5319300B2 - プラズマ堆積微小多孔性の検体検出層 - Google Patents

プラズマ堆積微小多孔性の検体検出層 Download PDF

Info

Publication number
JP5319300B2
JP5319300B2 JP2008547356A JP2008547356A JP5319300B2 JP 5319300 B2 JP5319300 B2 JP 5319300B2 JP 2008547356 A JP2008547356 A JP 2008547356A JP 2008547356 A JP2008547356 A JP 2008547356A JP 5319300 B2 JP5319300 B2 JP 5319300B2
Authority
JP
Japan
Prior art keywords
layer
analyte
semi
reflective
reflective layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008547356A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009521679A5 (enExample
JP2009521679A (ja
Inventor
エム． デイビッド，モーゼス
エー． レイカウ，ニール
エム． ポウルチ，ドーラ
イー． トレンド，ジョン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of JP2009521679A publication Critical patent/JP2009521679A/ja
Publication of JP2009521679A5 publication Critical patent/JP2009521679A5/ja
Application granted granted Critical
Publication of JP5319300B2 publication Critical patent/JP5319300B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/78—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B32—LAYERED PRODUCTS
    • B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B3/00—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
    • B32B3/10—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a discontinuous layer, i.e. formed of separate pieces of material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N2021/7706—Reagent provision
    • G01N2021/7723—Swelling part, also for adsorption sensor, i.e. without chemical reaction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N2021/7706—Reagent provision
    • G01N2021/7726—Porous glass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7793—Sensor comprising plural indicators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/78—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour
    • G01N21/783—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour for analysing gases

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
JP2008547356A 2005-12-21 2006-12-15 プラズマ堆積微小多孔性の検体検出層 Expired - Fee Related JP5319300B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/275,277 2005-12-21
US11/275,277 US8293340B2 (en) 2005-12-21 2005-12-21 Plasma deposited microporous analyte detection layer
PCT/US2006/047958 WO2007075443A1 (en) 2005-12-21 2006-12-15 Plasma deposited microporous analyte detection layer

Publications (3)

Publication Number Publication Date
JP2009521679A JP2009521679A (ja) 2009-06-04
JP2009521679A5 JP2009521679A5 (enExample) 2010-02-04
JP5319300B2 true JP5319300B2 (ja) 2013-10-16

Family

ID=38174065

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008547356A Expired - Fee Related JP5319300B2 (ja) 2005-12-21 2006-12-15 プラズマ堆積微小多孔性の検体検出層

Country Status (7)

Country Link
US (1) US8293340B2 (enExample)
EP (1) EP1963850A4 (enExample)
JP (1) JP5319300B2 (enExample)
KR (1) KR101331710B1 (enExample)
CN (1) CN101341404B (enExample)
BR (1) BRPI0620330A2 (enExample)
WO (1) WO2007075443A1 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7887889B2 (en) * 2001-12-14 2011-02-15 3M Innovative Properties Company Plasma fluorination treatment of porous materials
KR101476487B1 (ko) * 2007-10-05 2014-12-24 쓰리엠 이노베이티브 프로퍼티즈 컴파니 플라즈마-증착된 미공성 층을 포함하는 유기 화학적 센서와, 제조 및 사용 방법
US8459200B2 (en) * 2008-06-30 2013-06-11 3M Innovative Properties Company Exposure indicating device
JP5662945B2 (ja) * 2008-12-23 2015-02-04 スリーエム イノベイティブ プロパティズ カンパニー 微多孔性有機ケイ酸塩材料を有する有機化学センサ
EP2376907A4 (en) * 2008-12-23 2017-12-13 3M Innovative Properties Company Organic chemical sensor with microporous organosilicate material
AU2010235022B2 (en) 2009-03-30 2013-08-22 3M Innovative Properties Company Optoelectronic methods and devices for detection of analytes
US8225782B2 (en) * 2009-05-22 2012-07-24 3M Innovative Properties Company Filter cartridge having location-registered view window for end-of-service-life-indicator (ESLI)
US8336543B2 (en) * 2009-05-22 2012-12-25 3M Innovative Properties Company Filter cartridge having cover for masking service life indicator
US8871148B2 (en) * 2009-05-22 2014-10-28 3M Innovative Properties Company Multilayer colorimetric sensors
US8365723B2 (en) * 2009-05-22 2013-02-05 3M Innovative Properties Company Filter cartridge having cone of visibility for end-of-service-life-indicator (ESLI)
JP5572210B2 (ja) * 2009-05-22 2014-08-13 スリーエム イノベイティブ プロパティズ カンパニー 多層比色センサアレイ
KR20110020186A (ko) * 2009-08-21 2011-03-02 한양대학교 산학협력단 고분자 전해질형 연료 전지용 고분자 전해질 막, 이의 제조 방법 및 이를 포함하는 고분자 전해질형 연료 전지 시스템
US10516182B2 (en) 2009-08-21 2019-12-24 Iucf-Hyu (Industry-University Cooperation Foundation Hanyang University) Polymer ion exchange membrane and method of preparing same
RU2537093C2 (ru) 2010-04-02 2014-12-27 3М Инновейтив Пропертиз Компани Фильтрующая система, включающая оптические датчики аналитов и оптические считывающие устройства
CN102834710A (zh) 2010-04-02 2012-12-19 3M创新有限公司 用于被分析物传感器光学读出器的对准配准特征结构
BR112012025178A2 (pt) 2010-04-02 2016-06-14 3M Innovative Properties Co sistema de filtro que incluem sensores ópticos de analito
EP2583090B1 (en) 2010-06-15 2016-04-06 3M Innovative Properties Company Variable capacitance sensors and methods of making the same
EP2622334B1 (en) 2010-09-30 2016-05-25 3M Innovative Properties Company Sensor element, method of making the same, and sensor device including the same
WO2012044430A2 (en) 2010-10-01 2012-04-05 3M Innovative Properties Company Method for correlating a monitoring device to the end of service life of a filter cartridge
JP6045496B2 (ja) 2010-10-01 2016-12-14 スリーエム イノベイティブ プロパティズ カンパニー 耐用期間終点表示用の可搬型モニター
TWI427288B (zh) 2010-10-11 2014-02-21 Univ Nat Chiao Tung 垂直式感測器
CN103492872B (zh) 2011-04-13 2016-04-06 3M创新有限公司 使用吸收性传感器元件的方法
KR20140026469A (ko) 2011-04-13 2014-03-05 쓰리엠 이노베이티브 프로퍼티즈 컴파니 일체형 가열을 갖는 센서 요소를 포함하는 증기 센서
CN103477215B (zh) * 2011-04-13 2015-07-29 3M创新有限公司 检测挥发性有机化合物的方法
LU91841B1 (en) 2011-07-15 2013-01-16 Ct De Rech Public Gabriel Lippmann Method for forming gas sensing layers
AU2012352762B2 (en) 2011-12-12 2016-02-18 3M Innovative Properties Company End of service life indicating systems for layered filter cartridges
BR112015023574A2 (pt) 2013-03-15 2017-07-18 3M Innovative Properties Co sistemas de indicação de fim de vida útil de cartuchos de filtro em camadas
EP3036544A4 (en) * 2013-08-23 2017-03-29 Pregtech Pty Ltd. Methods and sensors for detecting a biological parameter
DE102014112972A1 (de) * 2013-09-12 2015-03-12 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Messmembran für einen optochemischen oder amperometrischen Sensor
CN106404860A (zh) * 2016-08-30 2017-02-15 济南大学 一种氮化碳修饰三维石墨电极的制备方法及电致化学发光传感应用
FR3066603B1 (fr) * 2017-05-22 2019-07-05 Universite D'aix-Marseille Dispositif optique de detection et de quantification de composes volatils
DE102018116345A1 (de) * 2018-07-05 2020-01-09 Endress+Hauser Conducta Gmbh+Co. Kg Sensormembran, Sensorkappe und Verfahren zum Aufbringen einer Sensormembran

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4685940A (en) * 1984-03-12 1987-08-11 Abraham Soffer Separation device
JPS62224299A (ja) * 1985-12-06 1987-10-02 Fuji Photo Film Co Ltd γ―グルタミルトランスフェラーゼ活性測定用試薬シート及び一体型多層分析要素
JPH03231142A (ja) * 1990-02-07 1991-10-15 Nippon Sheet Glass Co Ltd 光化学センサー
US5015843A (en) * 1990-02-15 1991-05-14 Polysense, Inc. Fiber optic chemical sensors based on polymer swelling
GB9014903D0 (en) * 1990-07-05 1990-08-22 Unilever Plc Assays
AT403746B (de) * 1994-04-12 1998-05-25 Avl Verbrennungskraft Messtech Optochemischer sensor sowie verfahren zu seiner herstellung
JPH08184560A (ja) 1994-12-28 1996-07-16 Hoechst Japan Ltd 有機溶剤蒸気を検出するための光センサ装置
US5763836A (en) * 1995-06-21 1998-06-09 C & M Corporation Of Connecticut Retractable multiconductor coil cord
JP4128628B2 (ja) * 1996-05-15 2008-07-30 ハイピリオン カタリシス インターナショナル インコーポレイテッド 堅い多孔質炭素構造体及びその製造方法
US6416938B1 (en) * 1996-06-25 2002-07-09 Ronald M. Kubacki Photosensitive organosilicon films
CN1174916C (zh) * 1999-04-21 2004-11-10 张震 碳毫微管的形成方法
US6180318B1 (en) * 1999-05-19 2001-01-30 3M Innovative Properties Company Method of imaging an article
US6297293B1 (en) * 1999-09-15 2001-10-02 Tda Research, Inc. Mesoporous carbons and polymers
US6396616B1 (en) * 2000-10-10 2002-05-28 3M Innovative Properties Company Direct laser imaging system
GB0120202D0 (en) * 2001-08-18 2001-10-10 Psimedica Body fluid collection and analysis
US6878419B2 (en) * 2001-12-14 2005-04-12 3M Innovative Properties Co. Plasma treatment of porous materials
JP2004026547A (ja) 2002-06-24 2004-01-29 Nippon Sheet Glass Co Ltd 断熱合わせガラス
EP1523512B1 (en) * 2002-07-22 2019-12-25 Aspen Aerogels Inc. Polyimide aerogels, carbon aerogels, and metal carbide aerogels and methods of making same
US20040062682A1 (en) * 2002-09-30 2004-04-01 Rakow Neal Anthony Colorimetric sensor
US7449146B2 (en) * 2002-09-30 2008-11-11 3M Innovative Properties Company Colorimetric sensor
US7098149B2 (en) * 2003-03-04 2006-08-29 Air Products And Chemicals, Inc. Mechanical enhancement of dense and porous organosilicate materials by UV exposure
TWI240959B (en) * 2003-03-04 2005-10-01 Air Prod & Chem Mechanical enhancement of dense and porous organosilicate materials by UV exposure
GB0317557D0 (en) 2003-07-26 2003-08-27 Univ Manchester Microporous polymer material
US7524455B2 (en) * 2003-11-24 2009-04-28 General Electric Company Methods for deposition of sensor regions onto optical storage media substrates and resulting devices
US7033667B2 (en) * 2003-12-18 2006-04-25 3M Innovative Properties Company Printed circuits on shrink film
JP2007523321A (ja) * 2003-12-31 2007-08-16 ユニヴァーシティー オブ サウスカロライナ 気体及び他の流体のための薄層多孔光センサ
JP2005300528A (ja) * 2004-03-18 2005-10-27 Fuji Photo Film Co Ltd 検体の検査方法に使用する分析要素。

Also Published As

Publication number Publication date
US20070141580A1 (en) 2007-06-21
KR101331710B1 (ko) 2013-11-20
CN101341404B (zh) 2013-07-17
BRPI0620330A2 (pt) 2011-11-08
WO2007075443A1 (en) 2007-07-05
CN101341404A (zh) 2009-01-07
EP1963850A1 (en) 2008-09-03
EP1963850A4 (en) 2011-03-02
KR20080078682A (ko) 2008-08-27
JP2009521679A (ja) 2009-06-04
US8293340B2 (en) 2012-10-23

Similar Documents

Publication Publication Date Title
JP5319300B2 (ja) プラズマ堆積微小多孔性の検体検出層
CN101573470B (zh) 等离子体沉积的微孔碳材料
Gao et al. Porous-silicon vapor sensor based on laser interferometry
EP2074423B1 (en) Method of forming a permeable nanoparticle reflector
US7042570B2 (en) Porous thin film time-varying reflectivity analysis of samples
KR101194470B1 (ko) 비색 센서
EP2483669A1 (en) Nanoplasmonic device
JP2003533691A (ja) 表面プラズモン共鳴分光装置及び表面プラズモン共鳴分光方法
Brigo et al. Silver nanoprism arrays coupled to functional hybrid films for localized surface plasmon resonance-based detection of aromatic hydrocarbons
Tietze et al. Parts-per-Million detection of volatile organic compounds via surface plasmon polaritons and Nanometer-Thick Metal–Organic framework films
KR20170010083A (ko) 미세다공성 유기실리케이트 재료를 갖는 유기 화학적 센서
US20130063717A1 (en) Laminated structure for measuring reflected light intensity, device containing laminated structure for measuring reflected light intensity, and method for measuring film thickness and/or mass and/or viscosity of thin film
Parry et al. Attenuated total reflection FT-IR spectroscopy to measure interfacial reaction kinetics at silica surfaces
US20180328838A1 (en) Sensor, apparatus and method for determining a concentration of a solute in a solution
JP2009133787A (ja) 局在プラズモン共鳴センサーユニット、およびその製造方法
CN110462380B (zh) 氢检测用元件、氢检测用元件的制造方法以及氢检测装置
WO2011058502A2 (en) Gas sensing device having a photonic structure operating by means of bloch surface waves and corresponding manufacturing process
정경선 Fabrication and characterization of DBR porous silicon chip for the detection of chemical nerve agents
Kim Optical characterization of smart dust based on photonic crystals and its sensing applications
US12270764B2 (en) Waveguide with outer coating for analyte detection
Modaresialam et al. Sol-gel TiO 2 nanoimprinted metasurface combined to hybrid-silica sensitive layers for selective VOC detection with high refractive index sensitivity
Wang et al. Return-path ellipsometry in gas sensing
Sohn Chemical sensors based on distributed Bragg reflector porous silicon smart particles
Chan Chemical modification of porous silicon for the detection of explosive gases
Gao Vapor sensors using porous silicon-based optical interferometers

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091210

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20091210

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120222

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120410

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20120710

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20120718

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130611

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130711

R150 Certificate of patent or registration of utility model

Ref document number: 5319300

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees