BRPI1006738A8 - método e dispositivo optoeletrônico para monitoramento de um analito em uma atmosfera - Google Patents

método e dispositivo optoeletrônico para monitoramento de um analito em uma atmosfera

Info

Publication number
BRPI1006738A8
BRPI1006738A8 BRPI1006738A BRPI1006738A BRPI1006738A8 BR PI1006738 A8 BRPI1006738 A8 BR PI1006738A8 BR PI1006738 A BRPI1006738 A BR PI1006738A BR PI1006738 A BRPI1006738 A BR PI1006738A BR PI1006738 A8 BRPI1006738 A8 BR PI1006738A8
Authority
BR
Brazil
Prior art keywords
analyte
atmosphere
monitoring
optoelectronic
optoelectronic method
Prior art date
Application number
BRPI1006738A
Other languages
English (en)
Inventor
F Rybacha Andrzej
Scheffler Arthur
C Hulteen John
S Kanukurthy Kiran
A Rakow Neal
L Rylander Richard
Zupanc Zeljko
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of BRPI1006738A2 publication Critical patent/BRPI1006738A2/pt
Publication of BRPI1006738A8 publication Critical patent/BRPI1006738A8/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/78—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour
    • G01N21/783—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour for analysing gases
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B33—ADDITIVE MANUFACTURING TECHNOLOGY
    • B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
    • B33Y80/00—Products made by additive manufacturing
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2217/00—Coatings on glass
    • C03C2217/40—Coatings comprising at least one inhomogeneous layer
    • C03C2217/425—Coatings comprising at least one inhomogeneous layer consisting of a porous layer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3155—Measuring in two spectral ranges, e.g. UV and visible

Abstract

método e dispositivo optoeletrônico para monitoramento de um analito em uma atmosfera a presente invenção apresenta métodos e dispositivos optoeletrônicos para detectar a presença de um analito. tais métodos e dispositivos podem compreender pelo menos um elemento de detecção que é responsivo à presença de um analito de interesse e que pode ser interrogado opticamente mediante o uso de pelo menos uma fonte de luz e pelo menos um detector de luz.
BRPI1006738A 2009-03-30 2010-03-20 método e dispositivo optoeletrônico para monitoramento de um analito em uma atmosfera BRPI1006738A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16449609P 2009-03-30 2009-03-30
PCT/US2010/028074 WO2010117599A2 (en) 2009-03-30 2010-03-20 Optoelectronic methods and devices for detection of analytes

Publications (2)

Publication Number Publication Date
BRPI1006738A2 BRPI1006738A2 (pt) 2016-02-23
BRPI1006738A8 true BRPI1006738A8 (pt) 2019-01-29

Family

ID=42936787

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI1006738A BRPI1006738A8 (pt) 2009-03-30 2010-03-20 método e dispositivo optoeletrônico para monitoramento de um analito em uma atmosfera

Country Status (9)

Country Link
US (2) US8576400B2 (pt)
EP (1) EP2414816A4 (pt)
JP (1) JP5889182B2 (pt)
KR (1) KR101720364B1 (pt)
CN (1) CN102439422B (pt)
AU (1) AU2010235022B2 (pt)
BR (1) BRPI1006738A8 (pt)
RU (1) RU2487337C2 (pt)
WO (1) WO2010117599A2 (pt)

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Also Published As

Publication number Publication date
JP2012522249A (ja) 2012-09-20
US8576400B2 (en) 2013-11-05
RU2487337C2 (ru) 2013-07-10
KR20120000102A (ko) 2012-01-03
US20140036270A1 (en) 2014-02-06
AU2010235022B2 (en) 2013-08-22
CN102439422B (zh) 2016-05-18
AU2010235022A1 (en) 2011-11-03
EP2414816A2 (en) 2012-02-08
WO2010117599A2 (en) 2010-10-14
US8817265B2 (en) 2014-08-26
EP2414816A4 (en) 2015-01-21
WO2010117599A3 (en) 2011-01-13
US20100277740A1 (en) 2010-11-04
CN102439422A (zh) 2012-05-02
JP5889182B2 (ja) 2016-03-22
RU2011139508A (ru) 2013-05-10
BRPI1006738A2 (pt) 2016-02-23
KR101720364B1 (ko) 2017-03-27

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B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

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B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2506 DE 15-01-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.