JP5301147B2 - 電子回路 - Google Patents
電子回路 Download PDFInfo
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- JP5301147B2 JP5301147B2 JP2007322071A JP2007322071A JP5301147B2 JP 5301147 B2 JP5301147 B2 JP 5301147B2 JP 2007322071 A JP2007322071 A JP 2007322071A JP 2007322071 A JP2007322071 A JP 2007322071A JP 5301147 B2 JP5301147 B2 JP 5301147B2
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- transistor
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- 230000000052 comparative effect Effects 0.000 description 12
- 238000010586 diagram Methods 0.000 description 7
- 230000014509 gene expression Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 230000003503 early effect Effects 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/267—Current mirrors using both bipolar and field-effect technology
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/082—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including bipolar components only
- H01L27/0823—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including bipolar components only including vertical bipolar transistors only
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Nonlinear Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Control Of Electrical Variables (AREA)
- Semiconductor Integrated Circuits (AREA)
- Amplifiers (AREA)
Description
Vref=Vbe1+Vr2 (1)
ここで、Vr2は第2抵抗R2の両端の電圧差であり、式(2)で表される。
Vr2=(R2/R1)・(Κ・T/q)・ln(n4) (2)
ここで、R1,R2はそれぞれ第1抵抗R1および第2抵抗R2の抵抗値、Κはボルツマン定数、Tは温度、qは電子の電荷量である。
Ic1=Ic2 (3)
一方、第6トランジスタTr6のエミッタ面積は、第1トランジスタTr1のエミッタ面積のn1倍である。よって、式(4)となる。
Ic6=n1×Ic1 (4)
また、第3トランジスタTr3のゲート幅は、第4トランジスタTr4のn3倍である。第5トランジスタTr5のエミッタ面積は、第1トランジスタのn2倍である。よって、式(5)、(6)となる。
Ic5=n3×Ic6 (5)
Ic5=n2×Ic1 (6)
式(4)、(5)および(6)から、 n2=n1×n3 であることが好ましい。
20 カレントミラー回路
30 制御回路
Claims (9)
- それぞれのベースが第1ノードにおいて互いに接続されたバイポーラトランジスタである第1トランジスタおよび第2トランジスタを有するバンドギャップ回路と、
それぞれの制御端子が第2ノードにおいて互いに接続された第3トランジスタおよび第4トランジスタと、前記第3トランジスタの出力端子に接続されベースが前記第2トランジスタのコレクタに接続されたバイポーラトランジスタである第5トランジスタと、前記第4トランジスタの出力端子に接続されベースが前記第1ノードに接続されたバイポーラトランジスタである第6トランジスタと、を有するカレントミラー回路と、
前記カレントミラー回路の出力に基づき、前記バンドギャップ回路に供給される電流を制御する制御回路と、
前記制御回路と前記バンドギャップ回路との間に設けられた参照電圧を出力する参照電圧出力端子と、
を具備することを特徴とする電子回路。 - 前記第1トランジスタのエミッタ面積に対する前記第5トランジスタのエミッタ面積の比をn2とし、
前記第1トランジスタのエミッタ面積に対する前記第6トランジスタのエミッタ面積の比をn1倍とし、
前記第4トランジスタの出力電流に対する前記第3トランジスタの出力電流の比をn3としたとき、
n2=n1×n3
であることを特徴とする請求項1記載の電子回路。 - 前記第1トランジスタと前記第2トランジスタとのベース電流が同じであることを特徴とする請求項2記載の電子回路。
- 前記第2トランジスタは、前記第1トランジスタの形状と同じ形状を有する複数のトランジスタが並列接続されたことを特徴とする請求項3記載の電子回路。
- 前記第2トランジスタのエミッタに接続された第1抵抗と、
前記参照電圧出力端子と前記第1トランジスタのコレクタとの間に設けられた第2抵抗と、を具備し、
前記第1トランジスタのコレクタと前記第1ノードとが接続されたことを特徴とする請求項1から4のいずれか一項記載の電子回路。 - 前記第1トランジスタのベースエミッタ電圧の温度係数と前記第2抵抗の両端の電圧の温度係数とは、お互いに逆符号であることを特徴とする請求項5記載の電子回路。
- 前記第1トランジスタのベースエミッタ電圧の温度係数の絶対値と前記第2抵抗の両端の電圧の温度係数の絶対値とは、同じであることを特徴とする請求項6記載の電子回路。
- 前記制御回路は、前記カレントミラー回路の出力が制御端子に接続された第7トランジスタを含むことを特徴とする請求項1から7のいずれか一項記載の電子回路。
- 前記第7トランジスタはノーマリオン型トランジスタであることを特徴とする請求項8記載の電子回路。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007322071A JP5301147B2 (ja) | 2007-12-13 | 2007-12-13 | 電子回路 |
US12/334,221 US7893681B2 (en) | 2007-12-13 | 2008-12-12 | Electronic circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007322071A JP5301147B2 (ja) | 2007-12-13 | 2007-12-13 | 電子回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009146116A JP2009146116A (ja) | 2009-07-02 |
JP5301147B2 true JP5301147B2 (ja) | 2013-09-25 |
Family
ID=40752327
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007322071A Active JP5301147B2 (ja) | 2007-12-13 | 2007-12-13 | 電子回路 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7893681B2 (ja) |
JP (1) | JP5301147B2 (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010086056A (ja) * | 2008-09-29 | 2010-04-15 | Sanyo Electric Co Ltd | 定電流回路 |
US8618784B2 (en) * | 2009-04-10 | 2013-12-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Regulator control circuits, switching regulators, systems, and methods for operating switching regulators |
US7772920B1 (en) * | 2009-05-29 | 2010-08-10 | Linear Technology Corporation | Low thermal hysteresis bandgap voltage reference |
JP5554081B2 (ja) * | 2010-02-16 | 2014-07-23 | ローム株式会社 | 基準電圧回路 |
WO2011107160A1 (en) * | 2010-03-05 | 2011-09-09 | Epcos Ag | Bandgap reference circuit and method for producing the circuit |
US8278995B1 (en) * | 2011-01-12 | 2012-10-02 | National Semiconductor Corporation | Bandgap in CMOS DGO process |
CN107644872B (zh) * | 2016-07-20 | 2021-04-16 | 上海和辉光电有限公司 | 半导体结构及其制备方法、带隙基准电路结构、版图结构 |
CN113359929B (zh) * | 2021-07-23 | 2022-07-29 | 成都华微电子科技股份有限公司 | 带隙基准电路和低失调高电源抑制比带隙基准源 |
US11714444B2 (en) * | 2021-10-18 | 2023-08-01 | Texas Instruments Incorporated | Bandgap current reference |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5646518A (en) * | 1994-11-18 | 1997-07-08 | Lucent Technologies Inc. | PTAT current source |
JPH08339232A (ja) * | 1996-06-25 | 1996-12-24 | Rohm Co Ltd | 基準電圧回路 |
JP3529601B2 (ja) * | 1997-09-19 | 2004-05-24 | 株式会社東芝 | 定電圧発生回路 |
US6150872A (en) * | 1998-08-28 | 2000-11-21 | Lucent Technologies Inc. | CMOS bandgap voltage reference |
US6225856B1 (en) * | 1999-07-30 | 2001-05-01 | Agere Systems Cuardian Corp. | Low power bandgap circuit |
US7030598B1 (en) * | 2003-08-06 | 2006-04-18 | National Semiconductor Corporation | Low dropout voltage regulator |
US20050093531A1 (en) * | 2003-08-28 | 2005-05-05 | Broadcom Corporation | Apparatus and method for a low voltage bandgap voltage reference generator |
JP4583135B2 (ja) * | 2004-10-19 | 2010-11-17 | 三洋電機株式会社 | 低電圧動作回路 |
US20070040543A1 (en) * | 2005-08-16 | 2007-02-22 | Kok-Soon Yeo | Bandgap reference circuit |
-
2007
- 2007-12-13 JP JP2007322071A patent/JP5301147B2/ja active Active
-
2008
- 2008-12-12 US US12/334,221 patent/US7893681B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP2009146116A (ja) | 2009-07-02 |
US7893681B2 (en) | 2011-02-22 |
US20090153125A1 (en) | 2009-06-18 |
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