JP5297906B2 - Image probe calibration method and shape measuring machine - Google Patents

Description

  The present invention relates to an image probe calibration method and a shape measuring machine.

  2. Description of the Related Art Conventionally, a shape measuring machine that can exchange a touch probe and an image probe according to a measurement object has been used. In such a shape measuring machine, it is necessary to calibrate the position of the image probe when the touch probe is replaced with the image probe. As a calibration method, for example, a calibration method described in Patent Document 1 is known.

  In the calibration method described in Patent Document 1, when the touch probe is replaced with the image probe, first, the image probe is moved directly above the D-shaped reference gauge in plan view provided on the table, and the image probe is used. A D-shaped reference gauge in plan view is imaged from directly above. Then, the center position of the D-shaped arc portion and the inclination of the straight line portion are calculated from the acquired captured image, and the position (position coordinates) of the image probe is calibrated based on the center position, and the inclination of the straight line portion is adjusted. Based on this, the rotation angle around the optical axis of the image probe is calibrated.

JP 2001-165630 A

  By the way, in recent years, shape measuring machines have been developed in which the imaging direction of the image probe is inclined and the imaging direction can be changed in order to expand the measurement range. In such a shape measuring machine, it is preferable to calibrate the image probe every time the imaging direction is changed. However, in the calibration method described in Patent Document 1, since it is necessary to image the reference gauge from directly above to directly below by the image probe, when the imaging direction of the image probe is tilted and the imaging direction is changed, There is a problem that the calibration method described in Patent Document 1 cannot be used.

  An object of the present invention is to provide an image probe calibration method and a shape measuring machine that can calibrate an image probe even when the imaging direction of the image probe is changed.

  An image probe calibration method according to the present invention includes an image probe that images a measurement object via an objective lens, a moving mechanism that relatively moves a table on which the image probe and the measurement object are placed, In the shape measuring machine provided with a change mechanism for changing the imaging direction, the image probe is used when the imaging probe is used with its imaging direction inclined with respect to a direction perpendicular to the table. On the table, a calibration gauge having a central axis and a planar straight line portion and a planar arcuate portion centering on the central axis is provided, and a reference sphere, and the light of the objective lens in the image probe An attachment process for attaching a touch probe having first and second measuring elements around an axis, and an imaging direction of the image probe in a direction perpendicular to the table A relative positional relationship acquisition step of measuring the calibration gauge with the image probe and each measuring element in a held state, and acquiring a relative positional relationship between the optical axis center of the image probe and each measuring element; A reference sphere measurement step of measuring the reference sphere with a probe and registering a position of the reference sphere; an inclination step of inclining an imaging direction of the image probe at a desired angle with respect to a direction perpendicular to the table; The reference sphere is measured by each measuring element in a state where the imaging direction of the image probe is inclined to the desired angle, and the position of each measuring element is obtained from the measurement result and the registered position of the reference sphere. A probe calibration process for calibrating the rotation angle around the optical axis of the image probe and the position of the image probe based on the obtained position of each probe and the relative positional relationship. Characterized in that it comprises and.

According to the present invention, first, a calibration gauge and a reference sphere are provided on a table, and a touch probe having first and second measuring elements is attached to an image probe (attachment process). Next, the calibration gauge is measured by the image probe and each probe while the imaging direction of the image probe is held in a direction perpendicular to the table, and the relative positional relationship between the optical axis center of the image probe and each probe is obtained ( Relative positional relationship calculation step). Subsequently, the reference sphere is measured with one of the measuring elements, and the position of the reference sphere is registered (reference sphere measurement step).
Next, in a state where the imaging direction of the image probe is inclined at a desired angle with respect to the direction perpendicular to the table (inclination process), the reference sphere is measured by each measuring element, and the measurement result and the registered reference sphere The position of each measuring element on the shape measuring machine is obtained from the position. Since the relative positional relationship between the optical axis center of the image probe and each probe is already acquired, the rotation angle around the optical axis of the image probe and the position of the image probe can be calibrated from the obtained position of each probe (probe calibration). Process).
As described above, in the present invention, the rotation angle and position around the optical axis of the image probe can be calibrated even when the imaging direction of the image probe is tilted with respect to the direction perpendicular to the table. Can be measured.
In addition, the rotation angle and position of the image probe can be calibrated using a calibration device (calibration gauge, reference sphere, and touch probe) having a simple configuration, and the calibration cost can be reduced.
In addition, the rotation angle and position of the image probe can be calibrated by a simple method, and the rotation angle and position of the image probe can be easily calibrated.

  The shape measuring machine of the present invention includes an image probe that images a measurement object via an objective lens, a moving mechanism that relatively moves a table on which the image probe and the measurement object are placed, and an imaging direction of the image probe A change mechanism for changing the image probe, a touch probe provided around the optical axis of the objective lens in the image probe, having a first and a second probe, a reference sphere provided on the table, and a central axis. A straight line portion in plan view and a circular arc portion in plan view centered on the central axis, and a calibration gauge provided on the table, and holding the imaging direction of the image probe in a direction perpendicular to the table After measuring the calibration gauge with the image probe and each measuring element in the state, and obtaining the relative positional relationship between the optical axis center of the image probe and each measuring element, The position of the reference sphere is registered by measuring the reference sphere with either one of the measuring elements, and each of the image probes is tilted at a desired angle with respect to a direction perpendicular to the table. The reference sphere is measured by a measuring element, the position of each measuring element is determined from the measurement result and the registered position of the reference sphere, and based on the determined position of each measuring element and the relative positional relationship, The rotation angle around the optical axis of the image probe and the position of the image probe are calibrated.

  According to the present invention, since the image probe can be calibrated by the same method as the image probe calibration method, the object to be measured can be measured with high accuracy.

The perspective view which shows the shape measuring machine which concerns on one Embodiment of this invention. The perspective view which expands and shows a calibration apparatus. The flowchart which shows the calibration method of an image probe. The figure which shows the captured image of a calibration gauge. The perspective view which shows the measuring machine of the state which inclined the image probe. The perspective view which shows the touch probe of a modification.

Hereinafter, an embodiment of the present invention will be described with reference to the drawings.
FIG. 1 is a perspective view showing a shape measuring machine 1 (hereinafter referred to as a measuring machine) according to the present embodiment.
The measuring machine 1 includes a table 2 on which the object to be measured is placed, an image probe 3 that images the object to be measured through an objective lens (not shown), and a moving mechanism 4 that moves the image probe 3 relative to the object to be measured. And a changing means 5 provided between the image probe 3 and the moving mechanism 4 for changing the imaging direction of the image probe 3 and a calibration device 6 for calibrating the position of the image probe 3. Hereinafter, the Z-axis direction is defined as a direction perpendicular to the table 2, and the X-axis direction and the Y-axis direction are defined as directions orthogonal to the Z-axis direction and orthogonal to each other.
A ring light 31 is attached to the image probe 3. The ring light 31 includes a plurality of light emitting diodes provided in a ring shape so as to surround an objective lens (not shown), and illuminates an object to be measured.

  The moving mechanism 4 is erected on both ends of the table 2 in the X-axis direction, and is provided with columns 41 provided so as to be slidable along the Y-axis direction, beams 42 spanned between the upper ends of the columns 41, 42, an X slider 43 provided so as to be slidable along the X-axis direction, and a ram 44 provided so as to be slidable along the Z-axis direction within the X-slider 43. The image probe 3 is attached to the lower end of the ram 44 via the changing means 5.

  The changing means 5 holds the image probe 3 and includes a rotation axis A along the Z-axis direction and a rotation axis B along the Y-axis direction, and rotates the image probe 3 around the two axes. The imaging direction of the image probe 3 is changed. Instead of the image probe 3, a touch probe having a contact can be attached to the changing unit 5.

FIG. 2 is an enlarged perspective view showing the calibration device 6.
The calibration device 6 includes touch probes 61A and 61B, a calibration gauge 62, and a reference sphere 63.
The touch probes 61A and 61B are attached around the optical axis of the objective lens in the ring light 31 and have first and second measuring elements 611A and 611B, respectively. Each of the touch probes 61A and 61B is formed sufficiently shorter than the depth of focus of the image probe 3 so as not to interfere with the object to be measured during measurement by the image probe 3. The touch probes 61A and 61B are provided sufficiently apart from each other so that the reference sphere 63 can be measured by the touch probes 61A and 61B.

The calibration gauge 62 is provided on the table 2 and is formed in a substantially cylindrical shape having a central axis C. Specifically, the calibration gauge 62 has an outer surface composed of a planar arcuate part 621 centered on the central axis C and a planar straight line part 622 (hereinafter referred to as an arcuate part or a straight part). In addition, it is formed in a columnar shape having a D-shape in plan view. The calibration gauge 62 has a flat top surface 623. Such a calibration gauge 62 is installed such that the linear portion 622 is parallel to the Y axis.
The reference sphere 63 has a predetermined diameter and is provided at a predetermined position on the table 2.

  In the measuring machine 1 described above, when the imaging direction of the image probe 3 is changed, the optical axis center position of the image probe 3 is shifted from a predetermined mounting position, or the rotation angle around the optical axis of the image probe 3 is predetermined. Therefore, every time the imaging direction of the image probe 3 is changed, it is necessary to calibrate the position and rotation angle of the image probe 3.

Hereinafter, a method for calibrating the image probe 3 will be briefly described with reference to the flowchart of FIG.
First, the operator provides the calibration gauge 62 and the reference sphere 63 on the table 2, and attaches the touch probes 61A and 61B having the measuring elements 611A and 611B to the image probe 3 (step S1). This process S1 becomes an attachment process.
After step S1, the measuring instrument 1 sets the imaging direction of the image probe 3 to a direction perpendicular to the table 2 (step S2).

FIG. 4 is a diagram showing a captured image Im of the calibration gauge 62 by the image probe 3.
After step S2, the measuring instrument 1 images the calibration gauge 62 with the image probe 3, obtains the center position of the calibration gauge 62 from the arcuate part 621, and obtains the inclination of the straight line part 622 with reference to the cross line L. A rotation angle around the optical axis of the image probe 3 is obtained from the inclination of the straight line portion 622 (step S3).

  After step S3, the measuring instrument 1 brings the measuring elements 611A and 611B of the touch probes 61A and 61B into contact with the arc-shaped portion 621 and the top surface 623 of the calibration gauge 62, respectively, and obtains the center position of the calibration gauge 62 ( Step S4). The measuring instrument 1 acquires the above measurement result, that is, the measurement result representing the relative positional relationship between the optical axis center of the image probe and each probe by the above steps S2 to S4. In the present embodiment, a relative positional relationship acquisition process is configured by these processes S2 to S4.

  After step S4, the measuring instrument 1 measures the reference sphere 63 with one measuring element 611A and registers the position of the reference sphere 63 (step S5). This step S5 is a reference sphere measurement step.

FIG. 5 is a perspective view showing the measuring instrument 1 with the image probe 3 tilted.
After step S5, the measuring instrument 1 rotates the image probe 3 at least around the B axis, tilts the imaging direction of the image probe 3 with respect to the direction perpendicular to the table 2, and sets the imaging direction of the image probe 3 to a desired value. The direction is changed (step S6). This process S6 becomes an inclination process.

After step S6, the measuring instrument 1 measures the reference sphere 63 with the measuring elements 611A and 611B (step S7).
After step S7, the measuring instrument 1 obtains the positions of the measuring elements 611A and 611B on the measuring instrument 1 from the measurement result of step S7 and the registered position of the reference sphere 63. Since the measurement results representing the relative positional relationship between the optical axis center of the image probe 3 and the respective measuring elements 611A and 611B have already been obtained in the above steps S2 to S4, the respective measuring elements 611A and 611B on the measuring instrument 1 thus obtained are obtained. The rotation angle around the optical axis of the image probe 3 and the position of the image probe 3 can be calibrated from the position (step S8). These steps S7 and S8 are probe calibration steps. When changing the imaging direction of the image probe 3 again, the steps S6 to S8 are repeated.

According to the present embodiment as described above, the following effects can be obtained.
Even when the imaging direction of the image probe 3 is tilted with respect to the direction perpendicular to the table 2, the position of the image probe 3 and the rotation angle around the optical axis can be calibrated, so that the object to be measured can be accurately measured. Become. In addition, the rotation angle and position of the image probe 3 can be calibrated using the calibration device 6 (touch probes 61A and 61B, calibration gauge 62, and reference sphere 63) having a simple configuration, thereby reducing the calibration cost. it can. In addition, the rotation angle and position of the image probe 3 can be calibrated by a simple method, and the rotation angle and position of the image probe 3 can be easily calibrated.

[Modification of Embodiment]
It should be noted that the present invention is not limited to the above-described embodiment, and modifications, improvements, etc. within a scope that can achieve the object of the present invention are included in the present invention.
FIG. 6 is a perspective view showing a touch probe 61C according to a modification.
In the embodiment, the two touch probes 61A and 61B are provided and have the first and second measuring elements 611A and 611B, respectively, but the touch probe 61C is an objective lens in the ring light 31 as shown in FIG. One touch probe 61 </ b> C may be provided with first and second measuring elements 612 and 613. Even in the measuring instrument 1A including such a touch probe 61C, the image probe 3 can be calibrated by the same method as in the above embodiment.

  In the embodiment, the moving mechanism 4 moves the image probe 3 relative to the object to be measured by moving the column 41, the X slider 43, and the ram 44. However, the moving mechanism 4 includes the column 41, the X slider. In addition to 43 and the ram 44, the image probe 3 may be moved relative to the object to be measured by moving the table 2 or by moving only the table 2.

  The present invention can be used for an image probe calibration method and a shape measuring machine.

DESCRIPTION OF SYMBOLS 1 Shape measuring machine 1A Measuring machine 2 Table 3 Image probe 4 Moving mechanism 5 Changing means 61A, 61B, 61C Touch probe 62 Calibration gauge 63 Reference | standard sphere 612,613,611A, 611B 1st, 2nd measuring element 621 Top view circular arc shape 622 Straight line portion C in plan view Center axis of calibration gauge

Claims (2)

An image probe that images a measurement object via an objective lens, a moving mechanism that relatively moves a table on which the image probe and the measurement object are placed, and a change mechanism that changes an imaging direction of the image probe In the shape measuring machine, the image probe is used when the imaging direction is inclined with respect to a direction perpendicular to the table,
On the table, a calibration gauge having a central axis and a straight line portion in plan view and a circular arc portion in plan view centered on the central axis are provided, and a reference sphere. An attaching step of attaching a touch probe having first and second measuring elements around the optical axis;
The calibration gauge is measured by the image probe and each measuring element in a state where the imaging direction of the image probe is held in a direction perpendicular to the table, and the relative positional relationship between the optical axis center of the image probe and each measuring element A relative positional relationship acquisition step of acquiring
A reference sphere measuring step of measuring the reference sphere with any one of the measuring elements and registering a position of the reference sphere;
A tilting step of tilting the imaging direction of the image probe at a desired angle with respect to a direction perpendicular to the table;
The reference sphere is measured by each measuring element in a state where the imaging direction of the image probe is inclined to the desired angle, and the position of each measuring element is obtained from the measurement result and the registered position of the reference sphere. And a probe calibration step for calibrating the rotation angle around the optical axis of the image probe and the position of the image probe based on the obtained position of each measuring element and the relative positional relationship. Probe calibration method. An image probe that images the object to be measured via the objective lens, a moving mechanism that relatively moves a table on which the image probe and the object to be measured are placed, a change mechanism that changes an imaging direction of the image probe, In the image probe, a touch probe provided around the optical axis of the objective lens and having first and second measuring elements, a reference sphere provided on the table, a linear axis having a central axis and the center A circular arc-shaped portion in plan view with the axis as the center is formed, and includes a calibration gauge provided on the table,
The calibration gauge is measured by the image probe and each measuring element in a state where the imaging direction of the image probe is held in a direction perpendicular to the table, and the relative positional relationship between the optical axis center of the image probe and each measuring element After getting
Measure the reference sphere with one of the measuring elements and register the position of the reference sphere,
The reference sphere is measured by each measuring element in a state where the imaging direction of the image probe is inclined at a desired angle with respect to a direction perpendicular to the table, and the measurement result and the registered position of the reference sphere are used. The position of each probe is obtained, and the rotation angle around the optical axis of the image probe and the position of the image probe are calibrated based on the obtained position of each probe and the relative positional relationship. Shape measuring machine.

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