JP5273621B2 - 光検出素子及び太陽電池素子 - Google Patents
光検出素子及び太陽電池素子 Download PDFInfo
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- 230000008859 change Effects 0.000 claims description 102
- 239000013078 crystal Substances 0.000 claims description 46
- 239000004065 semiconductor Substances 0.000 claims description 41
- 150000001875 compounds Chemical class 0.000 claims description 29
- 229910052742 iron Inorganic materials 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims description 10
- 230000003287 optical effect Effects 0.000 claims description 9
- 229910052691 Erbium Inorganic materials 0.000 claims description 7
- 229910052775 Thulium Inorganic materials 0.000 claims description 7
- 229910052769 Ytterbium Inorganic materials 0.000 claims description 7
- 229910052719 titanium Inorganic materials 0.000 claims description 7
- 229910052727 yttrium Inorganic materials 0.000 claims description 7
- 229910052689 Holmium Inorganic materials 0.000 claims description 6
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- 229910052793 cadmium Inorganic materials 0.000 claims description 6
- 229910052791 calcium Inorganic materials 0.000 claims description 6
- 229910052802 copper Inorganic materials 0.000 claims description 6
- 229910052733 gallium Inorganic materials 0.000 claims description 6
- 229910052735 hafnium Inorganic materials 0.000 claims description 6
- 229910052738 indium Inorganic materials 0.000 claims description 6
- 229910052749 magnesium Inorganic materials 0.000 claims description 6
- 229910052748 manganese Inorganic materials 0.000 claims description 6
- 239000000843 powder Substances 0.000 claims description 6
- 229910052706 scandium Inorganic materials 0.000 claims description 6
- 229910052712 strontium Inorganic materials 0.000 claims description 6
- 229910052725 zinc Inorganic materials 0.000 claims description 6
- 229910052692 Dysprosium Inorganic materials 0.000 claims description 5
- 229910052789 astatine Inorganic materials 0.000 claims description 4
- 238000002347 injection Methods 0.000 claims description 2
- 239000007924 injection Substances 0.000 claims description 2
- 125000002091 cationic group Chemical group 0.000 claims 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 34
- 238000010586 diagram Methods 0.000 description 23
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 21
- 229910052710 silicon Inorganic materials 0.000 description 21
- 239000010703 silicon Substances 0.000 description 21
- 238000005259 measurement Methods 0.000 description 18
- 239000010409 thin film Substances 0.000 description 18
- 238000000034 method Methods 0.000 description 16
- 230000000694 effects Effects 0.000 description 11
- 239000000126 substance Substances 0.000 description 10
- 239000000758 substrate Substances 0.000 description 10
- 230000004044 response Effects 0.000 description 9
- 230000005684 electric field Effects 0.000 description 7
- 150000002500 ions Chemical group 0.000 description 6
- 230000010287 polarization Effects 0.000 description 6
- 230000009881 electrostatic interaction Effects 0.000 description 5
- 238000005452 bending Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 230000031700 light absorption Effects 0.000 description 4
- 206010021143 Hypoxia Diseases 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000004913 activation Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- 229910052723 transition metal Inorganic materials 0.000 description 3
- 150000003624 transition metals Chemical class 0.000 description 3
- 229910017135 Fe—O Inorganic materials 0.000 description 2
- 229910052765 Lutetium Inorganic materials 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 239000011358 absorbing material Substances 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005621 ferroelectricity Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000002847 impedance measurement Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 230000001443 photoexcitation Effects 0.000 description 1
- -1 rare earth ion Chemical group 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/09—Devices sensitive to infrared, visible or ultraviolet radiation
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photovoltaic Devices (AREA)
- Thermistors And Varistors (AREA)
Description
E(eV)=1.24/λ(μm)
と表され、例えば波長1.0μmの光のエネルギは1.24eVである。
浜川圭弘、桑野幸徳、著、「太陽エネルギー工学 アドバンストエレクトロニクスシリーズ 1−3、培風館、1994年、第21頁、図2.6、第23頁、図2.7 N. Ikeda et al., "Ferroelectricity from iron valence ordering in the charge-frustrated system LuFe2O4", Nature, Vol.436, No.7054, pp.1136-1138 (2005) N. Ikeda et al., "Charge Frustration and Dielectric Dispersion in LuFe2O4", Journal of the Physical Society of Japan, Vol.69, No.5, pp.1526-1532 (2000)
f=f0exp(−U/kT)
におけるパラメータUを決定する。ここで、kはボルツマン定数、f0はフィッティングの際の定数である。
Claims (12)
- 外部から光が入射したときに、入射光のエネルギに応じて内部の電子の状態が変化することで電気伝導度が変化する電気伝導度変化体を備え、
前記電気伝導度変化体は、その組成が(RMbO3−δ)n(MaO)m(Rは、In,Sc,Y,Dy,Ho,Er,Tm,Yb,Lu,Ti,Ca,Sr,Ce,Sn,Hfから選ばれる少なくとも1種類の元素、Ma、Mbは、Ti,Mn,Fe,Co,Cu,Ga,Zn,Al,Mg,Cdから重複を許して選ばれる少なくとも1種類の元素、nは1以上の整数、mは0以上の整数、δは0以上0.2以下の実数)で表され、層状三角格子構造を有する化合物からなるとともに、
前記電気伝導度変化体上に形成された第1電極と、
前記電気伝導度変化体上に、前記第1電極に対して電気的に離れて配置された第2電極とを備え、
前記電気伝導度変化体に光が入射したときに生じる電気伝導度の変化を、前記第1電極と前記第2電極との間で検出可能に構成されていることを特徴とする光検出素子。 - 前記層状三角格子構造を有する化合物は、RFe 2 O 4−δ であることを特徴とする請 求項1記載の光検出素子。
- 前記電気伝導度変化体は、0.3eV以上1.4eV以下のエネルギを有する光の入射 に対して電気伝導度が変化する前記層状三角格子構造を有する化合物によって構成されて いることを特徴とする請求項1または2記載の光検出素子。
- 前記電気伝導度変化体は、2μm以上の波長を有する赤外光の入射に対して電気伝導度 が変化する前記層状三角格子構造を有する化合物によって構成されていることを特徴とす る請求項1〜3のいずれか一項記載の光検出素子。
- 前記電気伝導度変化体は、前記層状三角格子構造を有する化合物の単結晶、多結晶、ま たはその粉末の集合体からなることを特徴とする請求項1〜4のいずれか一項記載の光検 出素子。
- 外部から光が入射したときに、入射光のエネルギに応じて内部の電子の状態が変化することで電気伝導度が変化する電気伝導度変化体を備え、
前記電気伝導度変化体は、その組成が(RMbO3−δ)n(MaO)m(Rは、In,Sc,Y,Dy,Ho,Er,Tm,Yb,Lu,Ti,Ca,Sr,Ce,Sn,Hfから選ばれる少なくとも1種類の元素、Ma、Mbは、Ti,Mn,Fe,Co,Cu,Ga,Zn,Al,Mg,Cdから重複を許して選ばれる少なくとも1種類の元素、nは1以上の整数、mは0以上の整数、δは0以上0.2以下の実数)で表され、層状三角格子構造を有する化合物からなるとともに、
前記電気伝導度変化体に対して所定位置に設けられた、p型半導体及びn型半導体によるpn接合構造を備え、
前記電気伝導度変化体において電気伝導度の変化に伴って発生した電子を前記pn接合構造での接合界面に導くことで入射光のエネルギを電力に変換することが可能に構成されていることを特徴とする太陽電池素子。 - 前記電気伝導度変化体は、前記pn接合構造での接合界面近傍に、前記p型半導体及び前記n型半導体とは別体として配置されていることを特徴とする請求項6記載の太陽電池素子。
- 前記n型半導体は前記電気伝導度変化体によって構成され、前記電気伝導度変化体及び前記p型半導体によって前記pn接合構造が構成されていることを特徴とする請求項6記載の太陽電池素子。
- 前記層状三角格子構造を有する化合物は、RFe2O4−δであることを特徴とする請求項6〜8のいずれか一項記載の太陽電池素子。
- 前記電気伝導度変化体は、0.3eV以上1.4eV以下のエネルギを有する光の入射に対して電気伝導度が変化する前記層状三角格子構造を有する化合物によって構成されていることを特徴とする請求項6〜9のいずれか一項記載の太陽電池素子。
- 前記電気伝導度変化体は、2μm以上の波長を有する赤外光の入射に対して電気伝導度が変化する前記層状三角格子構造を有する化合物によって構成されていることを特徴とする請求項6〜10のいずれか一項記載の太陽電池素子。
- 前記電気伝導度変化体は、前記層状三角格子構造を有する化合物の単結晶、多結晶、またはその粉末の集合体からなることを特徴とする請求項6〜11のいずれか一項記載の太 陽電池素子。
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JP2007219049 | 2007-08-24 | ||
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JP2008099466 | 2008-04-07 | ||
PCT/JP2008/065042 WO2009028424A1 (ja) | 2007-08-24 | 2008-08-22 | 電子素子及び電気伝導度制御方法 |
JP2009530089A JP5273621B2 (ja) | 2007-08-24 | 2008-08-22 | 光検出素子及び太陽電池素子 |
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JP5626946B2 (ja) * | 2008-08-29 | 2014-11-19 | 国立大学法人 岡山大学 | 酸化物、電気導体、p型半導体、及びn型半導体 |
WO2010038785A1 (ja) * | 2008-09-30 | 2010-04-08 | 国立大学法人岡山大学 | 光センサ及びその製造方法 |
WO2010038788A1 (ja) * | 2008-09-30 | 2010-04-08 | 国立大学法人岡山大学 | 電流制御素子及びその製造方法 |
JP5360838B2 (ja) * | 2008-09-30 | 2013-12-04 | 国立大学法人 岡山大学 | 光電変換素子及びその製造方法 |
GB2517755A (en) | 2013-08-30 | 2015-03-04 | Ibm | State-changeable device |
CN107104166A (zh) * | 2017-05-03 | 2017-08-29 | 常州大学怀德学院 | 一种ZnO/NiFe2O4纳米阵列复合异质结材料及其制备的太阳能电池 |
Citations (2)
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JP2000095522A (ja) * | 1998-06-29 | 2000-04-04 | Sharp Corp | ペロブスカイト型マンガン酸化物薄膜、その製造方法及びそれを用いた赤外線検出素子 |
JP2004172164A (ja) * | 2002-11-15 | 2004-06-17 | Zenji Hiroi | 遷移金属酸化物光伝導デバイス |
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JP2000095522A (ja) * | 1998-06-29 | 2000-04-04 | Sharp Corp | ペロブスカイト型マンガン酸化物薄膜、その製造方法及びそれを用いた赤外線検出素子 |
JP2004172164A (ja) * | 2002-11-15 | 2004-06-17 | Zenji Hiroi | 遷移金属酸化物光伝導デバイス |
Non-Patent Citations (5)
Title |
---|
JPN6012021321; N.Ikeda et al.: '"Ferroelectricity from iron valence ordering in the charge-frustrated system LuFe2O4"' Nature Vol.436, No.7054, August 2005, pp.1136-1138 * |
JPN7012001555; N.Ikeda et al.: '"Charge Frustration and Dielectric Dispersion in LuFe2O4"' Journal of the Physical Society of Japan Vol.69, No.5, May 2000, pp.1526-1532 * |
JPN7012001558; 浜川圭広ら: 「アドバンスト エレクトロニクス I-3 太陽エネルギー工学」 , 19940520, pp.20-23, 培風館 * |
JPN7012001559; Y.Tokunaga et al.: '"Rotation of orbital stripes and the consequent charge-polarized state in bilayer magnetics"' Nature Materials Vol.5, December 2006, pp.937-941 * |
JPN7012001560; N.Kimizuka et al.: Handbook on the Physics and Chemistry of Rare Earths Vol.13, Chapter 90 (1990), The Systems R2O3-M2O3-M'O, pp.283-384 * |
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