JP5267515B2 - Inspection target - Google Patents

Description

  The present invention relates to a test subject receiver for conducting chemical, medical, and biological tests.

  Conventionally, a test object receiver called a microchip or a test chip used for testing biological substances and chemical substances has been proposed (see, for example, Patent Document 1). By using such a receptor to be examined, DNA (Deoxyribo Nucleic Acid), enzyme, antigen, antibody, protein, virus, cell, etc. can be detected or quantified.

  As shown in FIG. 21, in the test chip 100 described in Patent Document 1, a sample (blood or the like) to be tested is injected into the inside from the opening 101 and rotated by a centrifuge. The blood injected from the opening 101 passes through the outlet capillary 102 by the centrifugal force applied by the centrifugal device and is put into the separation chamber 103. In the separation chamber 103, centrifugation is performed with a centrifugal force to which the introduced blood is applied to obtain a supernatant. Thereafter, the supernatant liquid is measured in the sample measuring chamber 105. On the other hand, the reaction reagent for expressing the optical characteristics necessary for the blood test by mixing and reacting with the supernatant and the diluent are separately sealed in the reaction reagent chamber 107 and the diluent chamber 108 in advance. Then, the centrifugal force applied by the centrifugal device passes through the restriction opening 109 and flows into the reaction reagent measuring chamber 110. In the reaction reagent measuring chamber 110, a predetermined amount is measured after the reaction reagent and diluent are mixed to form a mixed solution. The obtained supernatant liquid and the mixed liquid are circulated in a predetermined order through the grooves formed on the surface of the chip due to the change in the direction of centrifugal force obtained by changing the holding angle of the test chip 100 in the centrifuge. It is mixed and reaches the cuvette chamber 111. By irradiating the cuvette chamber 111 with light, the optical characteristic of the liquid in which the supernatant liquid and the mixed liquid are mixed is measured, and the sample is inspected.

JP 60-238760 A

  In the inspection chip 100 disclosed in Patent Document 1, the supernatant liquid separated in the separation chamber 103 that separates the supernatant liquid from the sample is measured in the sample measurement chamber 105. At this time, the supernatant liquid is introduced into the sample measuring chamber 105 through the inlet / outlet portion 106, but the position of the outlet of the inlet / outlet portion 106 is not particularly defined with respect to the sample measuring chamber 105. In the example of FIG. 21, it is located on the left from the center with respect to the opening of the sample measuring chamber 105. In addition, with respect to the reaction reagent measurement chamber 110 that measures the mixture of the reaction reagent and the diluent, the outlet of the restriction opening 109 is slightly inside the left (left side in FIG. 21) end of the opening of the reaction reagent measurement chamber 110. Is located.

  When the sample measuring chamber 105 and the reaction reagent measuring chamber 110 are filled with blood or a mixed solution, the liquid level of the blood or the mixed solution is formed in the opening. However, when the inlet / outlet portion 106 and the outlet of the restriction opening 109 are located at the positions described above, when blood or a mixed solution further flows into the sample measuring chamber 105 or the reaction reagent measuring chamber 110, There has been a problem that blood or a mixed liquid directly flows into the formed liquid surface and the liquid surface is disturbed, resulting in a measurement error, which in turn affects the accuracy of the inspection.

  The present invention has been made to solve the above-described problems, and an object of the present invention is to provide an inspection object receiver that can perform an inspection with high accuracy with little liquid measurement error.

In order to achieve the above object, the test object receptacle of the invention according to claim 1 of the present invention holds the action of the centrifugal force by holding it at a predetermined rotation angle by rotation with respect to the direction of the centrifugal force generated by revolution. When the centrifugal force is generated in the first direction by being held at the first rotation angle, the test object receiver used for the purpose of inspecting the liquid to be inspected by moving it inside A first guide unit that guides the liquid in the first direction; a fixed unit that receives the liquid guided through the first guide unit and can store a predetermined amount of the liquid; and the fixed unit When the predetermined amount of the liquid is stored in the section and the centrifugal force is generated in the first direction, a second portion for guiding the excess liquid flowing out from the metering section Two guides and the second guide In addition, when the centrifugal force is generated in the second direction by being held at a second rotation angle different from the first rotation angle, and an excess portion in which the excess liquid is stored, A third guide part provided in a direction in which the liquid stored in the quantification part flows out, an outlet part on the quantification part side of the first guide part, and a second guide part side of the quantification part Of the first guide portion outlet portion and the fixed portion entrance / exit section, which is a plane including the end portion on the third guide portion side and projected in the first direction, are superimposed on each other. The outer periphery and the outer periphery of the fixed-portion entrance / exit section are circumscribed at the respective end portions on the third guide portion side .

The test object receptacle of the invention according to claim 1 includes an outlet portion on the quantitative portion side of the first guide portion, an end portion on the second guide portion side and an end portion on the third guide portion side of the quantitative portion. When projecting and superimposing the quantitative section entrance / exit cross-section that is a plane including the outer circumference of the first guide section outlet section and the outer periphery of the quantitative section entrance / exit section, By circumscribing at the end of each of the third guide portions , the liquid flowing from the first guide portion is in the vicinity of the end of the liquid surface of the liquid formed at the metering portion inlet / outlet. Since the liquid flows in, the liquid level of the liquid is not disturbed, so that the liquid quantification error does not occur in the quantification unit, and the liquid can be inspected with high accuracy.

1 is a plan view of an inspection apparatus 1. FIG. 2 is a left side view of the inspection apparatus 1. FIG. It is a top view of the test | inspection chip 40 which is embodiment of this invention. 4 is an enlarged plan view of the vicinity of a front end portion of a fixed amount portion 50 of the inspection chip 40. FIG. 4 is a perspective view of an inspection chip 40. FIG. FIG. 6 is a projection view when the specimen guide unit 46 and the quantitative unit entrance / exit surface 57 are projected from the front of the test chip 40 onto the same plane. 3 is a flowchart of an inspection process executed by the inspection apparatus 1. It is a top view of the test | inspection chip 40 of the state filled with the sample and the reagent. It is a top view of the test | inspection chip 40 which shows the state of the angle "0 degree" of a centrifugal force direction. It is a top view of the test | inspection chip 40 which shows the state of the angle "80 degrees" of a centrifugal force direction. It is another top view of the test | inspection chip 40 which shows the state of the angle "0 degree" of a centrifugal force direction. It is an enlarged plan view near the front end part of the fixed quantity part 50 of the test | inspection chip 140 of another embodiment. It is a projection view when the specimen guide unit 146 and the quantitative unit entrance / exit surface 57 are projected on the same plane from the front of the test chip 140. It is an enlarged plan view near the front end part of the fixed quantity part 50 of the test | inspection chip 240 of another embodiment. It is a projection view when the sample guide part 246 and the quantitative part entrance / exit surface 57 are projected on the same plane from the front of the test chip 240. It is an enlarged plan view near the front end part of the fixed quantity part 50 of the test | inspection chip 340 of another embodiment. It is a projection view from the front of the test | inspection chip 340 of the sample guide part 346 and the fixed_quantity | quantitative_assay entrance / exit surface 57. FIG. It is a top view of the test | inspection chip 440 of another embodiment. It is an enlarged plan view near the front end part of the fixed quantity part 50 of the test | inspection chip 440 of another embodiment. It is a projection view when the sample guide part 446 and the quantitative part entrance / exit surface 57 are projected onto the same plane from the front of the test chip 440. It is a top view of the conventional test | inspection chip 100. FIG.

  In the present embodiment, the inspection apparatus 1 uses the inspection chip 40 that can store a liquid to be inspected (hereinafter referred to as a specimen) and a liquid mixed with the specimen (hereinafter referred to as a reagent). The case where it is performed is illustrated. The inspection device 1 can apply a centrifugal force by rotating the inspection chip 40 at a high speed. At that time, the inspection device 1 is applied to the inspection chip 40 by changing the rotation angle of the inspection chip 40. The direction of centrifugal force (hereinafter referred to as centrifugal force direction) can be switched.

  With reference to FIGS. 1-2, the schematic structure of the test | inspection apparatus 1 is demonstrated. In the following description, the upper, lower, right, and left sides in FIG. 1 are the right side, left side, front side, and rear side of the inspection apparatus 1, respectively. The upper, lower, right, and left sides in FIG. 2 are the upper, lower, front, and rear of the inspection apparatus 1, respectively. In addition, in order to facilitate understanding, in FIG. 2, the outer wall portion 2 is shown as a cross-sectional view in the direction of the arrow in the XX line shown in FIG. 1.

  The inspection apparatus 1 includes an outer wall portion 2 that is a cylindrical casing. Inside the outer wall 2, a turntable 3, which is a disk body having a smaller diameter than the outer wall 2, is rotatably provided. A pair of chip holders 4 are provided at both ends in the diameter direction of the turntable 3, that is, in the vicinity of the circumference of the turntable 3.

  An inner wall 21 is provided on the inner surface of the outer wall 2 so as to bisect the space in the outer wall 2. A hole 23 is provided near the center of the inner wall 21. A motor 5 is provided on the lower surface near the center of the inner wall 21. The motor 5 includes a shaft 6 that extends upward from the motor 5 through the hole 23.

  A turntable 3 is connected to the upper end of the shaft 6. The shaft 6 is connected to the plane center of the turntable 3. As the motor 5 rotates the shaft 6, the turntable 3 also rotates about the shaft 6.

  A shaft 18 extends through the hole 24 in the vertical direction of the turntable 3 at a position spaced in the outer peripheral direction from the rotation center of the turntable 3 (position where the shaft 6 is connected). The tip holder 4 is rotatably supported on the upper end portion of the shaft 18. As an example, the chip holder 4 is a box-shaped body having an outer shape formed of a bottom plate, an upper plate, and a side wall. Specifically, the chip holder 4 is a box formed in a rectangular shape as viewed from the upper side, which is slightly larger than the inspection chip 40, so that the inspection chip 40 formed in a rectangular shape as viewed from the upper side can be accommodated and held therein. Shaped member.

  An angle changing mechanism 19 is provided on the lower surface at a position spaced from the rotation center of the turntable 3 in the outer circumferential direction. The angle changing mechanism 19 can have an arbitrary configuration as long as the shaft 18 is rotated by its operation and the tip holder 4 rotates by a predetermined angle.

  In the present embodiment, when the turntable 3 is rotationally driven by the motor 5, the inspection chip 40 held by the chip holder 4 also rotates about the shaft 6 as a rotation center. The rotation of the inspection chip 40 around the axis 6 is called “revolution” of the inspection chip 40. On the other hand, when the chip holder 4 is rotated by a predetermined angle by the angle changing mechanism 19, the inspection chip 40 held by the chip holder 4 also rotates by a predetermined angle around the shaft 18 as a rotation center. The rotation of the inspection chip 40 around the axis 18 is referred to as “rotation” of the inspection chip 40.

  The inspection device 1 is connected to a control device 70 provided outside the outer wall portion 2. The control device 70 incorporates a CPU, RAM, ROM, etc., not shown, and controls various operations of the inspection device 1 (for example, rotation of the turntable 3 and rotation of the chip holder 4). The control device 70 is provided with an operation unit (not shown) for an inspector to instruct various operations of the inspection device 1.

  An outer wall extending portion 22 is provided in front of the inspection apparatus 1 (to the right in FIGS. 1 and 2) so as to extend above the turntable 3, and a turntable is provided on the lower surface of the distal end portion of the outer wall extending portion 22. 3 is provided with an optical inspection unit 9 including a light source 7 and a detector 8 for the chip holder 4 provided on the upper surface. The light source 7 irradiates the mixture of the reagent and the specimen generated in the test chip 40 held by the chip holder 4 with light, and the detector 8 applies the light reflected by the reaction product to the test chip 40. Detect above. The control device 70 can perform various measurements based on the amount of received light detected by the detector 8.

  Next, the schematic structure of the test chip 40 will be described with reference to FIGS. 3 is a plan view of the test chip 40, FIG. 4 is an enlarged view of the vicinity of the front end portion of the fixed amount portion 50 of the test chip 40, and FIG. 5 is a perspective view of the test chip 40. In the following, the upper, lower, right, and left sides in FIG. 3 will be described as the front, rear, right, and left sides of the test chip 40, respectively. Also, the front side and the back side of FIG. 3 will be described as being above and below the inspection chip 40, respectively.

  In this embodiment, when the inspection chip 40 is used in the inspection apparatus 1, the inspector attaches the inspection chip 40 to the chip holder 4 so that the vertical direction of the inspection chip 40 coincides with the vertical direction of the inspection apparatus 1. To do. At this time, the inspector attaches the inspection chip 40 to the chip holder 4 so that the rear side surface of the inspection chip 40 faces in the radial direction (that is, the direction indicated by the arrow A) (see FIG. 1).

  The inspection chip 40 is a thin box-like body having a rectangular shape when viewed from above, with the front-rear direction being the longitudinal direction, and is composed of a plate material 43 and a cover material 71. The plate member 43 is a plate member that is rectangular when viewed from above and has a predetermined thickness. The material is particularly limited to organic materials such as thermoplastic resins and thermosetting resins, and inorganic materials such as silicon, glass, and quartz. Not.

  A sample inlet 41 for injecting a sample and a reagent inlet 42 for introducing a reagent are formed in the plate member 43 so that the upper side is opened as a circular depression as viewed from above. The sample injection port 41 and the reagent injection port 42 are formed on the upper surface of the plate member 43 side by side from the right side to the left side (see FIG. 3).

  The specimen injection port 41 is a part where the examiner injects the specimen in order to supply the specimen into the examination chip 40. A sample supply path 44 is connected to the sample injection port 41. The specimen supply path 44 is formed on the upper surface of the plate member 43 in the shape of a groove having a rectangular cross section open upward, and is provided on the rear side of the specimen injection port 41 so as to extend in the front-rear direction. A sample guide 46 is provided at the rear end of the sample supply path 44 so as to extend in the front-rear direction in the rear region as an outlet having a reduced width.

  The reagent injection port 42 is a part where the inspector injects the reagent in order to supply the reagent into the inspection chip 40. A reagent supply path 45 is connected to the reagent inlet 42. The reagent supply path 45 is formed on the upper surface of the plate member 43 in the shape of a groove having a square cross section with the upper part open, and is provided on the rear side of the reagent inlet 42 in the front-rear direction. A reagent guide 47 is provided at the rear end of the reagent supply path 45 as an outlet having a narrow width, extending in the front-rear direction in the rear region.

  In the test chip 40, only one reagent injection port 42 is provided, and the inspector can inject one reagent into one sample in the test chip 40 and mix these samples and reagents. it can. Further, the sample supply path 44 and the reagent supply path 45 extend in parallel to each other in the front-rear direction of the test chip 40.

  On the rear side (the lower side in FIG. 4) of the sample supply path 44, a quantitative unit 50 for measuring a predetermined amount of the sample supplied from the sample supply path 44 is formed. The quantification unit 50 is a portion that is provided between the first wall portion 51 and the second wall portion 52 so as to extend to the right rear and can store the specimen. The second wall portion 52 is opposed to the sample guide portion 46 that is the outlet of the sample supply channel 44 in the front-rear direction with a space therebetween, and the second wall portion right wall surface 52A that is the right wall surface of the second wall portion 52. And a second wall portion front wall surface 52B which is a front wall surface. The first wall portion 51 includes a first wall portion left wall surface 51 </ b> A that is a left wall surface, and a first wall portion front wall surface 51 </ b> B that is a front wall surface. The fixed amount portion 50 is partitioned by a first wall portion left wall surface 51A and a second wall portion right wall surface 52A. The quantitative unit 50 is formed as a depression that is recessed downward from the upper surface of the plate member 43, and is open to the upper surface of the plate member 43.

  The first wall portion left wall surface 51A forming the first wall portion 51 and the first wall portion front wall surface 51B are in contact with each other at an angle at the contact point 51C. The tip of the first wall front wall surface 51B on the side opposite to the contact 51C is located on the right side of the contact 51C.

  As shown in FIG. 3, the angle formed between the extending direction of the second wall portion right wall surface 52 </ b> A and the horizontal direction of the test chip 40, that is, the direction orthogonal to the direction in which the sample supply path 44 and the reagent supply path 45 extend. The first angle θ1. More specifically, the first angle θ1 is the second wall portion rightward with the intersection point of the line extending in the extending direction of the second wall portion right wall surface 52A and the line extending in the left-right direction of the inspection chip 40 as the rotation center. This is the angle when the wall surface 52A is rotated clockwise until it becomes parallel to the left-right direction. In the present embodiment, the second wall portion 52 is formed so that the first angle θ1 is at least an acute angle (for example, 70 °). The second wall portion front wall surface 52B is in contact with the second wall portion right wall surface 52A at an angle at a contact point 52C with the second wall portion right wall surface 52A. The angle formed between the extending direction of the second wall portion front wall surface 52B and the horizontal direction of the inspection chip 40 is the second angle θ2. More specifically, the second angle θ2 is the second wall front wall surface 52B with the intersection point between the line extending in the extending direction of the second wall front wall surface 52B and the line extending in the left-right direction of the inspection chip 40 as the rotation center. Is the angle when rotating clockwise until it is parallel to the left-right direction. In the present embodiment, the second wall portion 52 is formed so that the second angle θ2 is smaller than the first angle θ1 (for example, 10 °). By forming in this way, the second wall portion right wall surface 52A and the second wall front wall surface 52B are in contact with each other at an angle at the contact 52C.

  As shown in FIG. 4, the contact point 52 </ b> C is provided on a straight line 56 extending rearward from the left side surface 46 </ b> A of the specimen guide unit 46. FIG. 6 is a projection view in which the quantitative portion entrance / exit surface 57 formed including the contact point 51C and the contact point 52C and the specimen guide unit 46 are overlapped and projected onto the same plane from the front. Note that the lower side of FIG. 6 is the upper side of the inspection chip 40 (the front side in FIG. 3), and the rear side of the page is the rear side (lower side in FIG. 3). As shown in FIG. 6, the contact point 52 </ b> C overlaps the left side surface 46 </ b> A of the sample guide unit 46, and the sample guide unit 46 is provided at a position inscribed in the quantitative unit entrance / exit surface 57.

  A flow path 61 is formed in a groove shape by the second wall portion 52 and the fourth wall portion 59 provided facing the left side of the second wall portion 52. The channel 61 is a channel for guiding the sample measured by the quantification unit 50 to the mixing tank 55 described later. On the other hand, the surplus specimen is guided to the surplus tank 54 by the flow path 60 formed by the first wall 51 and the third wall 58 provided facing the right side of the first wall 51. . The surplus tank 54 is a portion provided in the rear of the first wall portion 51 and having a rectangular shape in the rear, and stores the specimen that has flowed out of the quantification unit 50. The flow path 61, the flow path 60, and the excess tank 54 are formed as grooves and depressions that are recessed downward from the upper surface of the plate material 43, respectively, and open to the upper surface of the plate material 43.

  In the first wall portion 51, the wall surface continuously extending rearward from the right end portion (that is, the end portion on the surplus tank 54 side) of the first wall portion front wall surface 51 </ b> B is a guide surface 53. The guide surface 53 guides the specimen that has flowed into the flow path 60 toward the surplus tank 54.

  A mixing tank 55 is formed on the rear side (the lower side in FIG. 3) of the reagent supply path 45. The mixing tank 55 is a rectangular portion formed on the rear side of the reagent supply path 45 (reagent guide portion 47) and the flow path 61. In the mixing tank 55, the sample flowing out through the flow path 61 and the reagent supplied from the reagent supply path 45 through the reagent guide 47 are mixed to generate a mixed solution. The mixing tank 55 is formed as a depression that is recessed downward from the upper surface of the plate material 43, and is open to the upper surface of the plate material 43.

  On the upper surface of the plate member 43, as shown in FIG. 5, the supply paths 44, 45, the fixed amount portion 50, the surplus portion 54, the mixing tank 55, and the flow connecting them are provided by opening the upper surface side of the plate member 43. A cover material 71 is provided so as to cover the road and the like. The cover material 71 is provided by being affixed to the upper surface of the plate material 43. FIG. 3 shows a state where the cover material 71 is transparent.

  The material of the cover material 71 is not particularly limited as long as it is partially transparent and can be bonded to the plate material 43. On the upper surface of the specimen inlet 41 and the reagent inlet 42 of the cover material 71, holes 41A and 42A are formed smaller than the specimen inlet 41 and the reagent inlet 42. When injecting a specimen or a reagent from each of the injection ports 41 and 42, the sample and the reagent are injected through these holes 41A and 42A.

  In addition, the portion of the cover material 71 covering the upper surface of the mixing tank 55 is configured to be transparent by a material that transmits light as the optical measurement window 72. Of course, as shown in FIG. 5, the entire cover member 71 may be transparent. The cover material 71 can be attached to the plate material 43 by a bonding method such as thermal welding, adhesion using UV light or laser light, or hot melt adhesion.

  Next, an inspection method using the inspection apparatus 1 and the inspection chip 40 will be described with reference to FIGS. In the following description, the state change of the inspection chip 40 will be described with reference to FIGS. 8 to 11 as appropriate while explaining the operation of the inspector and the operation of the inspection apparatus 1 with reference to FIG. 8 to 11 show a state where the cover material 71 is transparent.

  First, the examiner installs the test chip 40 so that the injection ports 41 and 42 are on the upper side, and then injects the sample into the sample injection port 41 of the test chip 40. Similarly, the examiner injects a reagent into the reagent injection port 42 (S11). As a result, the specimen and the reagent are supplied into the test chip 40 and stay in the supply paths 44 and 45 (see FIG. 8).

  After execution of S11, the inspector operates the operation unit (not shown) of the control device 70 to turn on the power of the inspection device 1 (S12). Next, the inspector attaches the inspection chip 40 to the chip holder 4 so that the rear side surface of the inspection chip 40 faces in the radial direction (that is, the direction indicated by the arrow A in FIG. 1) (see FIG. 1). (S13). Then, when the inspector operates the operation unit of the control device 70, the CPU (not shown) of the control device 70 performs the centrifugal process of the inspection chip 40 based on the control program stored in the ROM (not shown). Is executed (S14).

  In the centrifuge processing (S14) of the test chip 40, first, in the state where the angle between the front-rear direction of the test chip 40 (the extending direction of the sample supply path 44 and the reagent supply path 45) and the centrifugal force direction is “0 °”, Revolution to which a centrifugal force of 200 G is applied is performed for 10 seconds. At this time, the rear side surface of the test chip 40 faces the centrifugal force direction. As a result, as shown in FIG. 9, the sample injected from the sample injection port 41 and staying in the sample supply path 44 flows out to the quantification unit 50 through the sample guide unit 46 by centrifugal force. In the quantification unit 50, as described above, a predetermined amount of specimen is stored, and a surplus specimen flows out into the surplus tank 54 and stored.

  At this time, the centrifugal force direction is a direction from the front to the rear of the inspection chip 40. Therefore, the contact point 52 </ b> C of the second wall portion 52 is positioned on a straight line 56 that extends the left side surface 46 </ b> A of the specimen guide portion 46 in the centrifugal force direction.

  At the same time, the reagent injected from the reagent inlet 42 and staying in the reagent supply path 45 flows out into the mixing tank 55 through the reagent guide 47 by centrifugal force. This reagent is stored in the mixing tank 55 by the action of centrifugal force.

  Next, the tip holder 4 is rotated by a predetermined angle. Specifically, as shown in FIG. 10, the tip holder 4 is rotated counterclockwise until the angle in the centrifugal force direction becomes “80 °”. In this state, a revolution to which a centrifugal force of 200 G is applied is performed for 10 seconds. At this time, the centrifugal force direction is inclined by 80 ° clockwise compared to the example shown in FIG. Of the angle formed between the applied centrifugal force direction and the extending direction of the second wall portion right wall surface 52A, the angle θ11 on the quantifying unit 50 side is an obtuse angle, and therefore the sample measured by the quantifying unit 50 is the first one. It moves to the front end side along the right wall surface 52A of the two wall portions. Furthermore, among the angles formed by the applied centrifugal force direction and the extending direction of the second wall front wall surface 52B, the angle θ12 on the flow channel 61 side is obtuse as in the angle θ11. It moves in 61 and flows into the mixing tank 55, and the liquid mixture which consists of a test substance and a reagent is produced | generated and stored.

  Finally, the tip holder 4 is rotated so as to return to the original state. Specifically, as shown in FIG. 11, the tip holder 4 is rotated clockwise until the angle in the centrifugal force direction becomes “0 °”. In this state, a revolution to which a centrifugal force of 200 G is applied is performed for 10 seconds. At this time, as in the example shown in FIG. 8, the rear side surface of the test chip 40 faces the centrifugal force direction. As a result, the liquid mixture accumulates in the lower portion of the mixing tank 55 by the action of centrifugal force.

  Thereafter, the rotation of the turntable 3 (that is, the revolution of the chip holder 4) is stopped, and the application of the centrifugal force is terminated. At this time, the turntable 3 is stopped at a predetermined rotational position so that the optical inspection window 62 provided on the inspection chip 40 is positioned directly below the optical inspection portion 9 (S15). After the execution of S16, light is irradiated from the light source 7 to the inspection chip 40. By detecting the light reflected by the specimen in the test chip 40 by the detector 8, the test result is measured (S16). Finally, the inspection result measured in S16 is displayed on the screen (not shown) of the control device 70 (S17).

  As shown in FIGS. 3, 4, and 6, the test chip 40 of the present embodiment has a contact point 52 </ b> C between the second wall portion right wall surface 52 </ b> A and the second wall front wall surface 52 </ b> B of the second wall portion 52. 46 is provided so as to be positioned on a straight line 56 extending rearward from the left side surface 46A. That is, when the sample guide 46 and the quantitative unit entrance / exit surface 57 are projected toward the back of the test chip 40, the contact 52C overlaps the left side surface 46A of the sample guide 46, and the sample guide 46 is connected to the quantitative unit entrance / exit. It is provided at a position so as to be inscribed in the surface 57. As a result, when a centrifugal force is applied from the front to the rear of the test chip 40 (that is, when the centrifugal force direction is “0 °”), the sample flowing from the sample guide 46 is applied to the quantitative portion entrance / exit surface 57. Since the liquid flows in the vicinity of the end of the liquid surface of the formed sample, the liquid surface of the sample staying in the quantification unit 50 is not disturbed, and thereby the quantification error of the sample in the quantification unit 50 does not occur. The sample can be quantified well, and the sample can be examined with high accuracy.

  In the test chip 40 of the present embodiment, when the sample guide 46 and the quantitative portion entrance / exit surface 57 are projected toward the rear of the test chip 40, the contact point 52C overlaps the left side surface 46A of the sample guide 46, and the sample guide. Although the part 46 is provided at a position inscribed in the fixed part entrance / exit surface 57, the test chip 40 of the present invention is not limited to this.

  In the test chip 40 of the present embodiment, the sample guide unit 46 is formed in a groove shape. However, as in the test chip 140 shown in FIGS. 12 and 13, the sample guide unit 46 conducts from the sample supply path 44 toward the fixed amount unit 50. The sample guide 146 may have a simple hole shape. Even in this case, when the sample guide unit 146 and the metering unit entrance / exit surface 57 are projected toward the rear of the test chip 140, the contact point 52C overlaps the left side surface 146A of the sample guide unit 146, and the sample guide unit 146 performs the metering. By being provided at a position that is inscribed in the partial entrance / exit surface 57, the same effect as the inspection chip 40 can be obtained.

  In addition, when the sample guides 46 and 146 and the metering unit entrance / exit surface 57 are projected toward the rear of the test chips 40 and 140, the contact point 52C overlaps the left side surfaces 46A and 146A of the sample guides 46 and 146. Although the sample guides 46 and 146 are shown to be provided at positions that are inscribed in the quantitative unit entrance / exit surface 57, the present invention is not necessarily limited to this, and as shown in FIGS. The test chip 240 may be configured such that the outer periphery of the projection surface of the specimen guide 246 intersects at two locations with respect to the outer periphery of the 57 projection surface. Even in this case, the same effect as the test chips 40 and 140 can be obtained.

  Also, as shown in FIGS. 16 and 17, the contact point 52 </ b> C between the second wall portion right wall surface 52 </ b> A of the second wall portion 52 and the second wall front wall surface 52 </ b> B is from the right side surface 346 </ b> B of the sample guide portion 346. The inspection chip 340 may be provided so as to be positioned on a straight line 356 extending rearward. That is, when the specimen guide 346 and the quantitative unit entrance / exit surface 57 are projected toward the rear of the test chip 340, the contact 52C overlaps the right side surface 346B of the specimen guide 346, and the specimen guide 346 is provided in the quantitative unit entrance / exit. It has a configuration that is provided at a position that circumscribes the surface 57. Even in this case, the same effects as those of the inspection chips 40, 140, and 240 can be obtained.

  18-20, the contact point 51C between the first wall portion left wall surface 51A of the first wall portion 51 and the first wall portion front wall surface 51B is located on the right side of the sample guide portion 446. You may provide so that it may be located on the straight line 456 extended backward from the side surface 446B. In this case, when the sample guide unit 446 and the quantitative unit entrance / exit surface 57 are projected toward the rear of the test chip 440, the contact point 51C overlaps with the right side surface 446B of the sample guide unit 446, and the sample guide unit 446 is the fixed unit. It is provided at a position inscribed in the entrance / exit surface 57. As a result, when a centrifugal force is applied from the front to the rear of the test chip 440 (that is, when the centrifugal force direction is “0 °”), the sample flowing from the sample guide unit 446 is applied to the quantitative unit entrance / exit surface 57. Since the liquid flows in the vicinity of the end of the liquid surface of the formed sample, the liquid surface of the sample staying in the quantification unit 50 is not disturbed, and thereby the quantification error of the sample in the quantification unit 50 does not occur. The sample can be quantified well, and the sample can be examined with high accuracy.

  The sample guides 46, 146, 246, 346, and 446 correspond to the “first guide” of the present invention. The first wall portion front wall surface 51B corresponds to the “second guide portion” of the present invention. The second wall front wall surface 52B corresponds to the “third guide portion” of the present invention. Further, the centrifugal force direction “0 °” corresponds to the “first direction” of the present invention, and the centrifugal force direction “80 °” corresponds to the “second direction” of the present invention.

DESCRIPTION OF SYMBOLS 1 Test | inspection apparatus 40 Test | inspection chip 41 Specimen injection port 42 Reagent injection port 43 Plate material 44 Specimen supply path 45 Reagent supply path 46 Specimen guide part 46A (Sample guide part) Side surface 51 First wall part 51A First wall part left wall surface 51B First wall front wall surface 51C Contact point 52 Second wall portion 52A Second wall right wall surface 52B Second wall front wall surface 52C Contact point 53 Guide surface 54 Surplus tank 55 Mixing tank 71 Cover material 72 Optical measurement window 100 (conventional ) Test chip 140 Test chip 146 Specimen guide unit 146A Side surface (of sample guide unit) 240 Test chip 246 Specimen guide unit 340 Test chip 346 Specimen guide unit 346B (Sample test unit) Side surface 440 Test chip 446 Specimen guide unit 446B (Sample) Side of the guide

Claims (1)

A test object receiver used for a purpose of inspecting a liquid to be inspected by moving it inside by the action of the centrifugal force by holding it at a predetermined rotation angle by rotation with respect to the direction of centrifugal force generated by revolution. ,
When the centrifugal force is generated in the first direction by being held at the first rotation angle, a first guide portion that guides the liquid in the first direction;
Receiving the liquid guided through the first guide unit, and a fixed amount unit capable of storing a predetermined amount of the liquid;
When the predetermined amount of the liquid is stored in the quantification unit and the centrifugal force is generated in the first direction, the excess liquid flowing out from the quantification unit is guided. A second guide to
A surplus part in which the liquid for the surplus guided by the second guide part is stored;
When the centrifugal force is generated in the second direction by being held at a second rotation angle different from the first rotation angle, the liquid stored in the metering unit is provided in a direction in which the liquid flows out. With a third guide section,
A metering portion inlet / outlet cross section which is a plane configured to include an outlet portion of the first guide portion on the metering portion side, an end portion on the second guide portion side of the metering portion and an end portion on the third guide portion side; Are projected in the first direction and overlapped, the outer periphery of the first guide portion outlet portion and the outer periphery of the metering portion inlet / outlet cross section at the end portion on the third guide portion side , respectively. A test object receiver characterized by circumscribing .