JP5265279B2 - ナノワイヤ・マルチスペクトル画像化アレイ - Google Patents
ナノワイヤ・マルチスペクトル画像化アレイ Download PDFInfo
- Publication number
- JP5265279B2 JP5265279B2 JP2008233443A JP2008233443A JP5265279B2 JP 5265279 B2 JP5265279 B2 JP 5265279B2 JP 2008233443 A JP2008233443 A JP 2008233443A JP 2008233443 A JP2008233443 A JP 2008233443A JP 5265279 B2 JP5265279 B2 JP 5265279B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- antennas
- nanowire
- gap
- antenna
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0225—Shape of the cavity itself or of elements contained in or suspended over the cavity
- G01J5/024—Special manufacturing steps or sacrificial layers or layer structures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0837—Microantennas, e.g. bow-tie
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0853—Optical arrangements having infrared absorbers other than the usual absorber layers deposited on infrared detectors like bolometers, wherein the heat propagation between the absorber and the detecting element occurs within a solid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0881—Compact construction
- G01J5/0884—Monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J5/22—Electrical features thereof
- G01J5/24—Use of specially adapted circuits, e.g. bridge circuits
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/191—Photoconductor image sensors
- H10F39/193—Infrared image sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
- Spectrometry And Color Measurement (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US97212007P | 2007-09-13 | 2007-09-13 | |
| US60/972,120 | 2007-09-13 | ||
| US11/977,767 US7786440B2 (en) | 2007-09-13 | 2007-10-26 | Nanowire multispectral imaging array |
| US11/977,767 | 2007-10-26 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009133824A JP2009133824A (ja) | 2009-06-18 |
| JP2009133824A5 JP2009133824A5 (https=) | 2011-05-19 |
| JP5265279B2 true JP5265279B2 (ja) | 2013-08-14 |
Family
ID=40128121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008233443A Expired - Fee Related JP5265279B2 (ja) | 2007-09-13 | 2008-09-11 | ナノワイヤ・マルチスペクトル画像化アレイ |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7786440B2 (https=) |
| EP (1) | EP2037243A3 (https=) |
| JP (1) | JP5265279B2 (https=) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8835831B2 (en) | 2010-06-22 | 2014-09-16 | Zena Technologies, Inc. | Polarized light detecting device and fabrication methods of the same |
| US8866065B2 (en) | 2010-12-13 | 2014-10-21 | Zena Technologies, Inc. | Nanowire arrays comprising fluorescent nanowires |
| US8735797B2 (en) | 2009-12-08 | 2014-05-27 | Zena Technologies, Inc. | Nanowire photo-detector grown on a back-side illuminated image sensor |
| US8269985B2 (en) | 2009-05-26 | 2012-09-18 | Zena Technologies, Inc. | Determination of optimal diameters for nanowires |
| US9343490B2 (en) | 2013-08-09 | 2016-05-17 | Zena Technologies, Inc. | Nanowire structured color filter arrays and fabrication method of the same |
| US8890271B2 (en) | 2010-06-30 | 2014-11-18 | Zena Technologies, Inc. | Silicon nitride light pipes for image sensors |
| US20100148221A1 (en) * | 2008-11-13 | 2010-06-17 | Zena Technologies, Inc. | Vertical photogate (vpg) pixel structure with nanowires |
| US9000353B2 (en) | 2010-06-22 | 2015-04-07 | President And Fellows Of Harvard College | Light absorption and filtering properties of vertically oriented semiconductor nano wires |
| US8229255B2 (en) | 2008-09-04 | 2012-07-24 | Zena Technologies, Inc. | Optical waveguides in image sensors |
| US8748799B2 (en) | 2010-12-14 | 2014-06-10 | Zena Technologies, Inc. | Full color single pixel including doublet or quadruplet si nanowires for image sensors |
| US9406709B2 (en) | 2010-06-22 | 2016-08-02 | President And Fellows Of Harvard College | Methods for fabricating and using nanowires |
| US9082673B2 (en) | 2009-10-05 | 2015-07-14 | Zena Technologies, Inc. | Passivated upstanding nanostructures and methods of making the same |
| US8546742B2 (en) | 2009-06-04 | 2013-10-01 | Zena Technologies, Inc. | Array of nanowires in a single cavity with anti-reflective coating on substrate |
| US8299472B2 (en) | 2009-12-08 | 2012-10-30 | Young-June Yu | Active pixel sensor with nanowire structured photodetectors |
| US8519379B2 (en) | 2009-12-08 | 2013-08-27 | Zena Technologies, Inc. | Nanowire structured photodiode with a surrounding epitaxially grown P or N layer |
| US8889455B2 (en) | 2009-12-08 | 2014-11-18 | Zena Technologies, Inc. | Manufacturing nanowire photo-detector grown on a back-side illuminated image sensor |
| US9515218B2 (en) * | 2008-09-04 | 2016-12-06 | Zena Technologies, Inc. | Vertical pillar structured photovoltaic devices with mirrors and optical claddings |
| US8791470B2 (en) | 2009-10-05 | 2014-07-29 | Zena Technologies, Inc. | Nano structured LEDs |
| US9299866B2 (en) | 2010-12-30 | 2016-03-29 | Zena Technologies, Inc. | Nanowire array based solar energy harvesting device |
| US9478685B2 (en) | 2014-06-23 | 2016-10-25 | Zena Technologies, Inc. | Vertical pillar structured infrared detector and fabrication method for the same |
| US8274039B2 (en) | 2008-11-13 | 2012-09-25 | Zena Technologies, Inc. | Vertical waveguides with various functionality on integrated circuits |
| US8495048B2 (en) * | 2009-08-26 | 2013-07-23 | International Business Machines | Applying user-generated deployment events to a grouping of deployable portlets |
| JP5641420B2 (ja) * | 2010-11-15 | 2014-12-17 | 日本信号株式会社 | テラヘルツ検出器 |
| US8729456B2 (en) * | 2011-02-02 | 2014-05-20 | The Boeing Company | Frequency selective electromagnetic detector |
| US9800805B2 (en) * | 2011-02-02 | 2017-10-24 | The Boeing Company | Frequency selective imaging system |
| US8664583B2 (en) * | 2011-07-01 | 2014-03-04 | The Boeing Company | Nonlinear optical surface sensing with a single thermo-electric detector |
| US11674850B1 (en) * | 2020-04-22 | 2023-06-13 | National Technology & Engineering Solutions Of Sandia, Llc | Continuous full-resolution two-color infrared detector |
| CN113991284B (zh) * | 2021-11-03 | 2022-12-30 | 中国科学技术大学 | 对微波场局域的器件及其制备方法 |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4638345A (en) * | 1983-06-01 | 1987-01-20 | Rca Corporation | IR imaging array and method of making same |
| US4584475A (en) * | 1984-05-29 | 1986-04-22 | Allied Corporation | Surface acoustic wave infrared line imaging array |
| US5300915A (en) | 1986-07-16 | 1994-04-05 | Honeywell Inc. | Thermal sensor |
| US5021663B1 (en) | 1988-08-12 | 1997-07-01 | Texas Instruments Inc | Infrared detector |
| US5286976A (en) | 1988-11-07 | 1994-02-15 | Honeywell Inc. | Microstructure design for high IR sensitivity |
| US5237334A (en) * | 1989-06-29 | 1993-08-17 | Waters William M | Focal plane antenna array for millimeter waves |
| JPH05264343A (ja) * | 1992-03-19 | 1993-10-12 | Advance Co Ltd | 遠赤外線分光検出素子 |
| DE69328440T3 (de) | 1992-06-19 | 2009-05-07 | Honeywell, Inc., Minneapolis | Infrarot kamera mit thermoelektrischer temperaturstabilisierung |
| JPH0661465A (ja) * | 1992-08-11 | 1994-03-04 | Mitsubishi Electric Corp | 赤外線撮像素子 |
| US5729019A (en) * | 1995-12-29 | 1998-03-17 | Honeywell Inc. | Split field-of-view uncooled infrared sensor |
| US5990469A (en) * | 1997-04-02 | 1999-11-23 | Gentex Corporation | Control circuit for image array sensors |
| US6310346B1 (en) * | 1997-05-30 | 2001-10-30 | University Of Central Florida | Wavelength-tunable coupled antenna uncooled infrared (IR) sensor |
| FI107407B (fi) * | 1997-09-16 | 2001-07-31 | Metorex Internat Oy | Alimillimetriaalloilla toimiva kuvausjärjestelmä |
| US6953932B2 (en) * | 1999-10-07 | 2005-10-11 | Infrared Solutions, Inc. | Microbolometer focal plane array with temperature compensated bias |
| FR2826725B1 (fr) * | 2001-06-28 | 2004-02-27 | Commissariat Energie Atomique | Microbolometres resistants aux temperatures de scenes elevees. |
| AU2003259908A1 (en) * | 2002-08-20 | 2004-03-11 | Lockheed Martin Corporation | Antenna-coupled microbolometer |
| US20050060884A1 (en) * | 2003-09-19 | 2005-03-24 | Canon Kabushiki Kaisha | Fabrication of nanoscale thermoelectric devices |
| US7038623B2 (en) * | 2003-12-04 | 2006-05-02 | Raytheon Company | Method and apparatus for detecting radiation at one wavelength using a detector for a different wavelength |
| US7095027B1 (en) * | 2004-02-25 | 2006-08-22 | University Of Central Florida Research Foundation, Inc. | Multispectral multipolarization antenna-coupled infrared focal plane array |
| FR2867273B1 (fr) * | 2004-03-04 | 2006-09-08 | Commissariat Energie Atomique | Procede de realisation d'un dispositif pour la detection thermique d'un rayonnement comportant un microbolometre actif et un microbolometre passif |
| KR100584188B1 (ko) * | 2004-03-08 | 2006-05-29 | 한국과학기술연구원 | 나노선 광센서 및 이를 포함하는 키트 |
| US7126330B2 (en) * | 2004-06-03 | 2006-10-24 | Honeywell International, Inc. | Integrated three-dimensional magnetic sensing device and method to fabricate an integrated three-dimensional magnetic sensing device |
| US7280068B2 (en) * | 2005-07-14 | 2007-10-09 | Agilent Technologies, Inc. | System and method for microwave imaging with suppressed sidelobes using a sparse antenna array |
| US7385199B2 (en) * | 2005-09-26 | 2008-06-10 | Teledyne Licensing, Llc | Microbolometer IR focal plane array (FPA) with in-situ mirco vacuum sensor and method of fabrication |
| US7510668B2 (en) * | 2005-11-10 | 2009-03-31 | General Electric Company | Low cost antenna array fabrication technology |
| US7937054B2 (en) * | 2005-12-16 | 2011-05-03 | Honeywell International Inc. | MEMS based multiband receiver architecture |
-
2007
- 2007-10-26 US US11/977,767 patent/US7786440B2/en active Active
-
2008
- 2008-09-09 EP EP08164002A patent/EP2037243A3/en not_active Withdrawn
- 2008-09-11 JP JP2008233443A patent/JP5265279B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP2037243A2 (en) | 2009-03-18 |
| JP2009133824A (ja) | 2009-06-18 |
| EP2037243A3 (en) | 2011-03-16 |
| US20090072145A1 (en) | 2009-03-19 |
| US7786440B2 (en) | 2010-08-31 |
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