JP5244586B2 - 部分放電の検出、位置測定、判定 - Google Patents

部分放電の検出、位置測定、判定 Download PDF

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JP5244586B2
JP5244586B2 JP2008511521A JP2008511521A JP5244586B2 JP 5244586 B2 JP5244586 B2 JP 5244586B2 JP 2008511521 A JP2008511521 A JP 2008511521A JP 2008511521 A JP2008511521 A JP 2008511521A JP 5244586 B2 JP5244586 B2 JP 5244586B2
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signal
electrical equipment
probe
partial discharge
module
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JP2008541099A5 (cg-RX-API-DMAC10.html
JP2008541099A (ja
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ダニエル フルニエ，
ブルーノ カンティン，
ジャン−マルク ブルジョア，
フランソワ レオナール，
イヴァン ロイ，
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Hydro-Québec
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Relating To Insulation (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Ignition Installations For Internal Combustion Engines (AREA)
  • Electronic Switches (AREA)
JP2008511521A 2005-05-20 2006-05-18 部分放電の検出、位置測定、判定 Expired - Lifetime JP5244586B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CA2,508,428 2005-05-20
CA002508428A CA2508428A1 (fr) 2005-05-20 2005-05-20 Detection, localisation et interpretation de decharge partielle
PCT/CA2006/000811 WO2006122415A1 (en) 2005-05-20 2006-05-18 Detection, localization and interpretation of partial discharge

Publications (3)

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JP2008541099A JP2008541099A (ja) 2008-11-20
JP2008541099A5 JP2008541099A5 (cg-RX-API-DMAC10.html) 2011-06-30
JP5244586B2 true JP5244586B2 (ja) 2013-07-24

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US (1) US8126664B2 (cg-RX-API-DMAC10.html)
EP (1) EP1883829B1 (cg-RX-API-DMAC10.html)
JP (1) JP5244586B2 (cg-RX-API-DMAC10.html)
AT (1) ATE527548T1 (cg-RX-API-DMAC10.html)
CA (1) CA2508428A1 (cg-RX-API-DMAC10.html)
ES (1) ES2372021T3 (cg-RX-API-DMAC10.html)
WO (1) WO2006122415A1 (cg-RX-API-DMAC10.html)

Cited By (1)

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US8594187B2 (en) 2007-03-02 2013-11-26 Qualcomm Incorporated Efficient video block mode changes in second pass video coding

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CA2508428A1 (fr) 2006-11-20
EP1883829A4 (en) 2009-04-08
WO2006122415A1 (en) 2006-11-23
US20090177420A1 (en) 2009-07-09
ATE527548T1 (de) 2011-10-15
US8126664B2 (en) 2012-02-28
EP1883829B1 (en) 2011-10-05
JP2008541099A (ja) 2008-11-20
ES2372021T3 (es) 2012-01-13
EP1883829A1 (en) 2008-02-06

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