JP5219274B2 - 質量分析計 - Google Patents

質量分析計 Download PDF

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Publication number
JP5219274B2
JP5219274B2 JP2008503596A JP2008503596A JP5219274B2 JP 5219274 B2 JP5219274 B2 JP 5219274B2 JP 2008503596 A JP2008503596 A JP 2008503596A JP 2008503596 A JP2008503596 A JP 2008503596A JP 5219274 B2 JP5219274 B2 JP 5219274B2
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JP
Japan
Prior art keywords
ions
analyte
mass spectrometer
ion
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008503596A
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English (en)
Japanese (ja)
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JP2008535170A (ja
JP2008535170A5 (enExample
Inventor
ベイトマン、ロバート、ハロルド
Original Assignee
マイクロマス ユーケー リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB0506665.9A external-priority patent/GB0506665D0/en
Application filed by マイクロマス ユーケー リミテッド filed Critical マイクロマス ユーケー リミテッド
Publication of JP2008535170A publication Critical patent/JP2008535170A/ja
Publication of JP2008535170A5 publication Critical patent/JP2008535170A5/ja
Application granted granted Critical
Publication of JP5219274B2 publication Critical patent/JP5219274B2/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7233Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724Nebulising, aerosol formation or ionisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/84Preparation of the fraction to be distributed
    • G01N2030/8447Nebulising, aerosol formation or ionisation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/88Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86
    • G01N2030/8809Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86 analysis specially adapted for the sample
    • G01N2030/8868Integrated analysis systems specially adapted therefor, not covered by a single one of the groups G01N30/04 - G01N30/86 analysis specially adapted for the sample elemental analysis, e.g. isotope dilution analysis

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2008503596A 2005-04-01 2006-04-03 質量分析計 Expired - Fee Related JP5219274B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB0506665.9 2005-04-01
GBGB0506665.9A GB0506665D0 (en) 2005-04-01 2005-04-01 Mass spectrometer
US67136405P 2005-04-14 2005-04-14
US60/671,364 2005-04-14
PCT/GB2006/001207 WO2006103465A2 (en) 2005-04-01 2006-04-03 Mass spectrometer

Publications (3)

Publication Number Publication Date
JP2008535170A JP2008535170A (ja) 2008-08-28
JP2008535170A5 JP2008535170A5 (enExample) 2009-04-09
JP5219274B2 true JP5219274B2 (ja) 2013-06-26

Family

ID=36939199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008503596A Expired - Fee Related JP5219274B2 (ja) 2005-04-01 2006-04-03 質量分析計

Country Status (4)

Country Link
EP (1) EP1864315B1 (enExample)
JP (1) JP5219274B2 (enExample)
CA (1) CA2603015C (enExample)
WO (1) WO2006103465A2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5362586B2 (ja) * 2007-02-01 2013-12-11 サイオネックス コーポレイション 質量分光計のための微分移動度分光計プレフィルタ
US7772548B2 (en) * 2008-05-12 2010-08-10 Shimadzu Corporation “Droplet pickup ion source” coupled to mobility analyzer apparatus and method
JP4699535B2 (ja) * 2009-03-05 2011-06-15 公立大学法人首都大学東京 インターフェイス
US8809769B2 (en) * 2012-11-29 2014-08-19 Bruker Daltonics, Inc. Apparatus and method for cross-flow ion mobility spectrometry
KR101470363B1 (ko) * 2012-12-26 2014-12-10 한국표준과학연구원 연소전처리-동위원소희석질량분석법
CN114527187B (zh) * 2020-11-02 2025-01-07 岛津分析技术研发(上海)有限公司 离子分析装置和方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6120860A (ja) * 1984-07-09 1986-01-29 Shimadzu Corp 同位体比測定装置
US5012052A (en) * 1988-03-22 1991-04-30 Indiana University Foundation Isotope-ratio-monitoring gas chromatography-mass spectrometry apparatus and method
JPH08122317A (ja) * 1994-10-27 1996-05-17 Shimadzu Corp ガス分析システム
US5811059A (en) * 1995-10-16 1998-09-22 The United States Of America As Represented By The Secretary Of The Army Automated, on-demand ion mobility spectrometry analysis of gas chromatograph effluents
WO1997023779A1 (en) * 1995-12-23 1997-07-03 The University Court Of The University Of Dundee Gas inlet system
EP0979306A4 (en) * 1997-02-14 2004-09-01 Univ George Washington Procedure for measuring DNA synthesis rates
IL131798A (en) * 1997-03-14 2004-02-19 George Washington University S Device for continuous isotope ratio monitoring following fluorine based chemical reactions
JP2000009694A (ja) * 1998-06-29 2000-01-14 Kawasaki Steel Corp 定量分析方法および定量分析装置
CA2260572A1 (en) * 1998-08-05 2000-02-05 Randy W. Purves Apparatus and method for atmospheric pressure 3-dimensional ion trapping
US6815668B2 (en) * 1999-07-21 2004-11-09 The Charles Stark Draper Laboratory, Inc. Method and apparatus for chromatography-high field asymmetric waveform ion mobility spectrometry
AU2002257177B2 (en) * 2001-04-17 2004-11-25 The Charles Stark Draper Laboratory, Inc. Methods and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry
US7019291B2 (en) * 2002-10-12 2006-03-28 Sionex Corporation NOx monitor using differential mobility spectrometry

Also Published As

Publication number Publication date
EP1864315B1 (en) 2016-03-30
CA2603015A1 (en) 2006-10-05
JP2008535170A (ja) 2008-08-28
WO2006103465A3 (en) 2007-10-25
CA2603015C (en) 2014-05-20
WO2006103465A2 (en) 2006-10-05
EP1864315A2 (en) 2007-12-12

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