JP5215671B2 - 質量分析計 - Google Patents

質量分析計 Download PDF

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Publication number
JP5215671B2
JP5215671B2 JP2007554650A JP2007554650A JP5215671B2 JP 5215671 B2 JP5215671 B2 JP 5215671B2 JP 2007554650 A JP2007554650 A JP 2007554650A JP 2007554650 A JP2007554650 A JP 2007554650A JP 5215671 B2 JP5215671 B2 JP 5215671B2
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Japan
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electrodes
voltage
ions
electrode
ion
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Japanese (ja)
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JP2008530748A (ja
JP2008530748A5 (enExample
Inventor
ジャイルズ、ケビン
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マイクロマス ユーケー リミテッド
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/624—Differential mobility spectrometry [DMS]; Field asymmetric-waveform ion mobility spectrometry [FAIMS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2007554650A 2005-02-14 2006-02-14 質量分析計 Expired - Fee Related JP5215671B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GBGB0503010.1A GB0503010D0 (en) 2005-02-14 2005-02-14 Mass spectrometer
GB0503010.1 2005-02-14
US65779205P 2005-03-02 2005-03-02
US60/657,792 2005-03-02
PCT/GB2006/000504 WO2006085110A2 (en) 2005-02-14 2006-02-14 Mass spectrometer

Publications (3)

Publication Number Publication Date
JP2008530748A JP2008530748A (ja) 2008-08-07
JP2008530748A5 JP2008530748A5 (enExample) 2012-04-19
JP5215671B2 true JP5215671B2 (ja) 2013-06-19

Family

ID=34356264

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007554650A Expired - Fee Related JP5215671B2 (ja) 2005-02-14 2006-02-14 質量分析計

Country Status (6)

Country Link
US (2) US7829849B2 (enExample)
EP (1) EP1849176B1 (enExample)
JP (1) JP5215671B2 (enExample)
CA (1) CA2594406C (enExample)
GB (2) GB0503010D0 (enExample)
WO (1) WO2006085110A2 (enExample)

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JP5341753B2 (ja) * 2006-07-10 2013-11-13 マイクロマス ユーケー リミテッド 質量分析計
JP4918846B2 (ja) * 2006-11-22 2012-04-18 株式会社日立製作所 質量分析装置及び質量分析方法
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US7964843B2 (en) 2008-07-18 2011-06-21 The George Washington University Three-dimensional molecular imaging by infrared laser ablation electrospray ionization mass spectrometry
US8901487B2 (en) 2007-07-20 2014-12-02 George Washington University Subcellular analysis by laser ablation electrospray ionization mass spectrometry
US8067730B2 (en) 2007-07-20 2011-11-29 The George Washington University Laser ablation electrospray ionization (LAESI) for atmospheric pressure, In vivo, and imaging mass spectrometry
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GB201018184D0 (en) * 2010-10-27 2010-12-08 Micromass Ltd Asymmetric field ion mobility in a linear geometry ion trap
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US8969798B2 (en) * 2011-07-07 2015-03-03 Bruker Daltonics, Inc. Abridged ion trap-time of flight mass spectrometer
US9184040B2 (en) * 2011-06-03 2015-11-10 Bruker Daltonics, Inc. Abridged multipole structure for the transport and selection of ions in a vacuum system
US8927940B2 (en) * 2011-06-03 2015-01-06 Bruker Daltonics, Inc. Abridged multipole structure for the transport, selection and trapping of ions in a vacuum system
JP2014524121A (ja) 2011-07-14 2014-09-18 ザ・ジョージ・ワシントン・ユニバーシティ レーザアブレーション・エレクトロスプレイイオン化質量分析用のプルームコリメーション
GB201122267D0 (en) * 2011-12-23 2012-02-01 Micromass Ltd Multi-pass ion mobility separation device with moving exit aperture
CN103187237B (zh) * 2011-12-28 2015-11-25 同方威视技术股份有限公司 非对称场离子迁移谱仪
US9188565B2 (en) * 2012-05-31 2015-11-17 The University Of North Carolina At Chapel Hill High field asymmetric ion mobility spectrometry (FAIMS) methods and devices with voltage-gas composition linked scans
CN103107060A (zh) * 2013-01-18 2013-05-15 中国科学院大连化学物理研究所 一种具备射频约束功能的离子迁移谱
WO2014146724A1 (en) * 2013-03-22 2014-09-25 Eth Zurich Laser ablation cell
WO2015173562A1 (en) 2014-05-13 2015-11-19 Micromass Uk Limited Multi-dimensional ion separation
CN104393785B (zh) * 2014-12-04 2019-04-02 北京声迅电子股份有限公司 高场不对称电压发生器
EP3270148B1 (en) * 2015-03-09 2019-11-20 Shimadzu Corporation Parallel plate-type non-uniform electric field ion mobility spectrometry device
CN106373854B (zh) 2015-07-23 2018-12-21 株式会社岛津制作所 一种离子导引装置
EP4300540A3 (en) * 2016-04-02 2024-03-27 DH Technologies Development Pte. Ltd. System and method for filtering high mobility ions
CN107305833B (zh) * 2016-04-25 2019-05-28 株式会社岛津制作所 离子光学装置
JP6330154B2 (ja) * 2016-05-24 2018-05-30 パナソニックＩｐマネジメント株式会社 電界非対称性イオン移動度分光計、およびそれを用いた混合物分離方法
JP7022884B2 (ja) * 2017-03-31 2022-02-21 パナソニックＩｐマネジメント株式会社 電界非対称性イオン移動度分光計、およびそれを用いた混合物分離方法
JP6937462B2 (ja) * 2017-04-24 2021-09-22 パナソニックＩｐマネジメント株式会社 電界非対称性イオン移動度分光計、およびそれを用いた混合物分離方法
CN111758146A (zh) * 2018-01-17 2020-10-09 Dh科技发展私人贸易有限公司 用于提高msms置信度的dm-swath获取
JP7251307B2 (ja) * 2019-05-16 2023-04-04 株式会社リコー 分析システム、便臭ガス分析システム及び呼気ガス分析システム

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GB0503010D0 (en) 2005-02-14 2005-03-16 Micromass Ltd Mass spectrometer

Also Published As

Publication number Publication date
JP2008530748A (ja) 2008-08-07
GB2423866B (en) 2008-09-24
GB0503010D0 (en) 2005-03-16
GB2423866A (en) 2006-09-06
US20090057546A1 (en) 2009-03-05
WO2006085110A3 (en) 2007-07-26
GB0602961D0 (en) 2006-03-29
US8440967B2 (en) 2013-05-14
EP1849176A2 (en) 2007-10-31
US7829849B2 (en) 2010-11-09
US20110042563A1 (en) 2011-02-24
WO2006085110A2 (en) 2006-08-17
EP1849176B1 (en) 2019-01-16
CA2594406A1 (en) 2006-08-17
CA2594406C (en) 2014-05-06

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