JP5199478B2 - プラント診断装置 - Google Patents

プラント診断装置 Download PDF

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Publication number
JP5199478B2
JP5199478B2 JP2011533967A JP2011533967A JP5199478B2 JP 5199478 B2 JP5199478 B2 JP 5199478B2 JP 2011533967 A JP2011533967 A JP 2011533967A JP 2011533967 A JP2011533967 A JP 2011533967A JP 5199478 B2 JP5199478 B2 JP 5199478B2
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plant
database
category
data
diagnostic
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Japanese (ja)
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JPWO2011039823A1 (ja
Inventor
孝朗 関合
徹 江口
尚弘 楠見
嘉成 堀
雅之 深井
悟 清水
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Hitachi Ltd
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Hitachi Ltd
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2011533967A 2009-10-02 2009-10-02 プラント診断装置 Active JP5199478B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2009/005123 WO2011039823A1 (ja) 2009-10-02 2009-10-02 プラント診断装置

Publications (2)

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JPWO2011039823A1 JPWO2011039823A1 (ja) 2013-02-21
JP5199478B2 true JP5199478B2 (ja) 2013-05-15

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JP2011533967A Active JP5199478B2 (ja) 2009-10-02 2009-10-02 プラント診断装置

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JP (1) JP5199478B2 (enrdf_load_stackoverflow)
CN (1) CN102576227B (enrdf_load_stackoverflow)
IN (1) IN2012DN02779A (enrdf_load_stackoverflow)
WO (1) WO2011039823A1 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3831553A4 (en) * 2018-07-31 2021-08-04 Nissan Motor Co., Ltd. DEVICE AND PROCESS FOR DETERMINATION OF ANOMALY

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103454515B (zh) * 2012-05-31 2017-06-23 Ge医疗系统环球技术有限公司 图形化自诊断系统和方法
JP6078019B2 (ja) * 2014-04-02 2017-02-08 三菱電機ビルテクノサービス株式会社 設備監視装置及びプログラム
JP6685124B2 (ja) * 2015-12-22 2020-04-22 株式会社日立製作所 診断装置及び診断方法
JP6620056B2 (ja) * 2016-03-31 2019-12-11 三菱日立パワーシステムズ株式会社 機器の異常診断方法及び機器の異常診断装置
JP6591937B2 (ja) * 2016-06-29 2019-10-16 株式会社日立製作所 運用保守知識情報の策定支援システムおよび策定支援方法
JP2018106432A (ja) * 2016-12-27 2018-07-05 株式会社日立製作所 オンライン監視装置、及びオンライン監視方法
JP6842299B2 (ja) * 2016-12-28 2021-03-17 三菱パワー株式会社 診断装置、診断方法及びプログラム
US11112782B2 (en) * 2017-06-19 2021-09-07 Jfe Steel Corporation Process anomalous state diagnostic device and process anomalous state diagnosis method
US10838413B2 (en) * 2017-10-02 2020-11-17 Fisher-Rosemount Systems, Inc. Systems and methods for multi-site performance monitoring of process control systems
JP6861653B2 (ja) * 2018-01-10 2021-04-21 三菱電機株式会社 監視制御支援装置
JP7180985B2 (ja) * 2018-03-01 2022-11-30 株式会社日立製作所 診断装置および診断方法
WO2020027207A1 (ja) * 2018-08-03 2020-02-06 パナソニックIpマネジメント株式会社 異常検出方法、情報処理装置及び異常検出システム
JP7184636B2 (ja) * 2018-12-27 2022-12-06 三菱重工業株式会社 データ選別装置及び方法、ならびに監視診断装置
CN109885951A (zh) * 2019-02-28 2019-06-14 中科云创(厦门)科技有限公司 设备故障诊断方法及装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004206583A (ja) * 2002-12-26 2004-07-22 Nisshin Flour Milling Inc 学習型異常通知装置及びその方法
JP2005258649A (ja) * 2004-03-10 2005-09-22 Hitachi Ltd データ分類方法及び装置
JP2007123007A (ja) * 2005-10-27 2007-05-17 Hitachi Ltd 燃料電池システムの診断方法および診断装置
JP2009042997A (ja) * 2007-08-08 2009-02-26 Hitachi Ltd データ分類方法および装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004206583A (ja) * 2002-12-26 2004-07-22 Nisshin Flour Milling Inc 学習型異常通知装置及びその方法
JP2005258649A (ja) * 2004-03-10 2005-09-22 Hitachi Ltd データ分類方法及び装置
JP2007123007A (ja) * 2005-10-27 2007-05-17 Hitachi Ltd 燃料電池システムの診断方法および診断装置
JP2009042997A (ja) * 2007-08-08 2009-02-26 Hitachi Ltd データ分類方法および装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3831553A4 (en) * 2018-07-31 2021-08-04 Nissan Motor Co., Ltd. DEVICE AND PROCESS FOR DETERMINATION OF ANOMALY
US11433539B2 (en) 2018-07-31 2022-09-06 Nissan Motor Co., Ltd. Abnormality determination device and abnormality determination method

Also Published As

Publication number Publication date
IN2012DN02779A (enrdf_load_stackoverflow) 2015-09-18
CN102576227A (zh) 2012-07-11
JPWO2011039823A1 (ja) 2013-02-21
WO2011039823A1 (ja) 2011-04-07
CN102576227B (zh) 2014-06-25

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