JP5112037B2 - 画像のデシメーションのための方法 - Google Patents
画像のデシメーションのための方法 Download PDFInfo
- Publication number
- JP5112037B2 JP5112037B2 JP2007324407A JP2007324407A JP5112037B2 JP 5112037 B2 JP5112037 B2 JP 5112037B2 JP 2007324407 A JP2007324407 A JP 2007324407A JP 2007324407 A JP2007324407 A JP 2007324407A JP 5112037 B2 JP5112037 B2 JP 5112037B2
- Authority
- JP
- Japan
- Prior art keywords
- image
- concentric
- substrate
- shape
- printed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 54
- 238000007639 printing Methods 0.000 claims description 39
- 239000000463 material Substances 0.000 claims description 37
- 230000008859 change Effects 0.000 claims description 9
- 230000000873 masking effect Effects 0.000 claims description 7
- 230000000704 physical effect Effects 0.000 claims description 7
- 239000000758 substrate Substances 0.000 description 53
- 230000008569 process Effects 0.000 description 20
- 239000013598 vector Substances 0.000 description 15
- 238000009825 accumulation Methods 0.000 description 12
- 239000010410 layer Substances 0.000 description 9
- 239000012782 phase change material Substances 0.000 description 9
- 239000001993 wax Substances 0.000 description 9
- 238000000059 patterning Methods 0.000 description 7
- 238000004581 coalescence Methods 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 239000012071 phase Substances 0.000 description 6
- 239000011295 pitch Substances 0.000 description 6
- 238000007711 solidification Methods 0.000 description 6
- 230000008023 solidification Effects 0.000 description 6
- 238000003892 spreading Methods 0.000 description 6
- 230000007480 spreading Effects 0.000 description 6
- 238000001459 lithography Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- 238000009736 wetting Methods 0.000 description 5
- 238000012937 correction Methods 0.000 description 4
- 238000000151 deposition Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 230000010076 replication Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000008021 deposition Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 238000004590 computer program Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000008014 freezing Effects 0.000 description 2
- 238000007710 freezing Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 238000007641 inkjet printing Methods 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000006194 liquid suspension Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000005055 memory storage Effects 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 239000011253 protective coating Substances 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 238000007712 rapid solidification Methods 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000005549 size reduction Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000007704 wet chemistry method Methods 0.000 description 1
- 239000000080 wetting agent Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J29/00—Details of, or accessories for, typewriters or selective printing mechanisms not otherwise provided for
- B41J29/38—Drives, motors, controls or automatic cut-off devices for the entire printing mechanism
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T3/00—Geometric image transformations in the plane of the image
- G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
- G06T3/4023—Scaling of whole images or parts thereof, e.g. expanding or contracting based on decimating pixels or lines of pixels; based on inserting pixels or lines of pixels
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1241—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by ink-jet printing or drawing by dispensing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Ink Jet (AREA)
- Image Processing (AREA)
- Manufacturing Of Printed Wiring (AREA)
Description
により求められ、ここで、Taは雰囲気温度、Tfは融解温度、αとkは各々、溶融した液滴の熱拡散率と熱伝導率であり、ksは基板の熱伝導率、Lは融解潜熱、cは溶融液滴の比熱である。
によって与えられる。基板上に拡がる液滴の動力学は、ウェーバー数Weとオーネゾルゲ(Ohnesorge)数Zに主として支配され、
ここで、μは粘度、ρは密度、σは表面張力、Vは衝突速度、及びaは液滴の半径である。
(a)印刷された材料の物理的特性に基づいてM画素ごとにラスタ画像の所望の形状をスケルトン化し(例えばM=([スポット半径]/[セル・サイズ]))、
(b)スケルトン化された輪郭の1画素を残す。
(c)全画像を終えるまで(a)を続ける。
(d)残った形状のN番目の画素ごとに保持し、残りを除去する。この場合も、Nは概ねMに等しい。数が小さい方が、通常は、より優れた形状エッジの平滑度を与えることになるが、数が極端に小さい場合は、印刷材料の蓄積が生じ、形状は滑らかにならないことになる。
(a)適切な(すなわち、水平又は垂直)コンボリューション・マスクを画像に重ね合わせる。
(b)一致した項を掛け合わせる。
(c)全ての結果を合計する。
(d)次の画素に移動し、ラスタ化された画像全体にわたって続ける。
104:熱源
108:リザーバ
109:圧盤
112:液滴供給源
113:マーク
116:液滴
120:基板
121:空間
122:電界
123:温度制御回路
124:制御回路
128:駆動回路
130:カメラ
140:パターン
142、146:ライン
144:スポット
150、152:コンボリューション・マスク
154、156:マスク・フィルタ
158:ハーフトーン・パターン
Claims (3)
- 1つ又はそれ以上の形状を有する画像をデシメーションする方法であって、
前記形状の同心円状輪郭を有する画像を作成し、
印刷材料の物理的特性に応じたマスキング・フィルタを適用するステップを含むことを特徴とする方法。 - 1つ又はそれ以上の形状を有する画像をデシメーションする方法であって、
前記形状の同心円状外部輪郭及びハーフトーンの内部塗りつぶしを有する画像を作成し、
印刷材料の物理的特性に基づき、前記同心円状輪郭とハーフトーンの塗りつぶしに対して1つ又はそれ以上のマスキング・フィルタを適用するステップを
を含むことを特徴とする方法。 - 1つ又はそれ以上の形状を有するラスタ画像をデシメーションする方法であって、
前記形状を外部成分及び内部塗りつぶし成分に分離し、
前記画像の前記外部成分をM画素ごとにスケルトン化し、
スケルトン化された輪郭の1画素を黒く残して内部領域を白く塗りつぶし、所望の同心円状外部輪郭が完了するまで続け、
前記同心円状外部輪郭のN番目の画素ごとに保持し、残りを除去し、
前記内部塗りつぶし成分をハーフトーンのパターンに変更し、
前記同心円状外部輪郭とハーフトーンの内部塗りつぶしを組み合わせるステップを
を含み、
前記Nは、印刷された液滴の物理的性質に基づく正数であり、前記Mは、印刷される液滴の大きさに基づいて決定される正数であることを特徴とする方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/644,238 US8079656B2 (en) | 2006-12-22 | 2006-12-22 | Method for decimation of images |
US11/644,238 | 2006-12-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008159051A JP2008159051A (ja) | 2008-07-10 |
JP5112037B2 true JP5112037B2 (ja) | 2013-01-09 |
Family
ID=39232895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007324407A Expired - Fee Related JP5112037B2 (ja) | 2006-12-22 | 2007-12-17 | 画像のデシメーションのための方法 |
Country Status (5)
Country | Link |
---|---|
US (3) | US8079656B2 (ja) |
EP (1) | EP1936565A3 (ja) |
JP (1) | JP5112037B2 (ja) |
CN (1) | CN101207696B (ja) |
TW (2) | TWI452524B (ja) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI327047B (en) * | 2007-03-21 | 2010-07-01 | Ind Tech Res Inst | Method for calculating ink-jet printing data |
US8968985B2 (en) * | 2007-03-30 | 2015-03-03 | Palo Alto Research Center Incorporated | Method and system for patterning a mask layer |
JP5505761B2 (ja) | 2008-06-18 | 2014-05-28 | 株式会社リコー | 撮像装置 |
US20100155494A1 (en) * | 2008-12-18 | 2010-06-24 | Pitney Bowes Inc. | Print containment of pixels to improve readability |
US9129352B2 (en) * | 2012-08-30 | 2015-09-08 | Samsung Electronics Co., Ltd. | Optical proximity correction modeling method and system |
US9700908B2 (en) | 2012-12-27 | 2017-07-11 | Kateeva, Inc. | Techniques for arrayed printing of a permanent layer with improved speed and accuracy |
US11141752B2 (en) | 2012-12-27 | 2021-10-12 | Kateeva, Inc. | Techniques for arrayed printing of a permanent layer with improved speed and accuracy |
US9352561B2 (en) | 2012-12-27 | 2016-05-31 | Kateeva, Inc. | Techniques for print ink droplet measurement and control to deposit fluids within precise tolerances |
US11673155B2 (en) | 2012-12-27 | 2023-06-13 | Kateeva, Inc. | Techniques for arrayed printing of a permanent layer with improved speed and accuracy |
US9832428B2 (en) | 2012-12-27 | 2017-11-28 | Kateeva, Inc. | Fast measurement of droplet parameters in industrial printing system |
JP5936294B2 (ja) | 2012-12-27 | 2016-06-22 | カティーバ, インコーポレイテッド | 精密な公差内で流体を堆積させる印刷インク量制御のための技法 |
KR102495563B1 (ko) | 2013-12-12 | 2023-02-06 | 카티바, 인크. | 두께를 제어하기 위해 하프토닝을 이용하는 잉크-기반 층 제조 |
TWI686312B (zh) * | 2014-09-02 | 2020-03-01 | 美商凱特伊夫公司 | 製造電子產品的薄膜疊層的方法 |
EP3185655B8 (de) * | 2015-12-22 | 2024-01-03 | Heraeus Electronics GmbH & Co. KG | Verfahren zur individuellen codierung von metall-keramik-substraten |
US11092560B2 (en) * | 2019-03-29 | 2021-08-17 | Nanjing University | Device and method for realizing high-speed temperature drop of micro material by droplet cooling |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63169171A (ja) * | 1987-01-06 | 1988-07-13 | Mitsubishi Electric Corp | 縮小画像形成方法 |
JP2633567B2 (ja) * | 1987-06-30 | 1997-07-23 | キヤノン株式会社 | 画像処理方法 |
JPH0670797B2 (ja) * | 1989-11-28 | 1994-09-07 | 川崎重工業株式会社 | 画像のランレングスの算出方法 |
US5661507A (en) * | 1994-02-10 | 1997-08-26 | Hewlett-Packard Company | Inkjet printing modes to optimize image-element edges for best printing quality |
US6006128A (en) * | 1997-06-02 | 1999-12-21 | Izatt; Joseph A. | Doppler flow imaging using optical coherence tomography |
JP3521729B2 (ja) * | 1998-02-24 | 2004-04-19 | 富士ゼロックス株式会社 | インクジェット記録方法および装置 |
US6366690B1 (en) * | 1998-07-07 | 2002-04-02 | Applied Materials, Inc. | Pixel based machine for patterned wafers |
JP3574036B2 (ja) * | 1999-08-24 | 2004-10-06 | シャープ株式会社 | インクジェット画像形成方法 |
US6678390B1 (en) * | 1999-12-02 | 2004-01-13 | Eastman Kodak Company | Method and computer program for embedding and extracting an embedded message from a digital image |
US6247787B1 (en) | 2000-04-29 | 2001-06-19 | Hewlett-Packard Company | Print mode for improved leading and trailing edges and text print quality |
JP3799218B2 (ja) * | 2000-06-29 | 2006-07-19 | 理想科学工業株式会社 | 画像処理方法および装置 |
JP2003092250A (ja) * | 2001-09-18 | 2003-03-28 | Hitachi Ltd | 半導体装置及びその製造方法 |
US6972261B2 (en) | 2002-06-27 | 2005-12-06 | Xerox Corporation | Method for fabricating fine features by jet-printing and surface treatment |
US6890050B2 (en) | 2002-08-20 | 2005-05-10 | Palo Alto Research Center Incorporated | Method for the printing of homogeneous electronic material with a multi-ejector print head |
US7155299B2 (en) * | 2004-06-01 | 2006-12-26 | Manufacturing Integration Technology Ltd | Method and apparatus for precise marking and placement of an object |
KR20080021602A (ko) * | 2005-05-25 | 2008-03-07 | 아그파 그래픽스 엔브이 | 도트 매트릭스 프린터의 이미지 품질을 향상시키기 위한이미지 처리 방법 및 장치 |
JP4673200B2 (ja) * | 2005-12-01 | 2011-04-20 | キヤノン株式会社 | 印刷処理システムおよび印刷処理方法 |
CN100368767C (zh) * | 2006-03-29 | 2008-02-13 | 东南大学 | 基于光栅投影的二维图像区域定位方法 |
-
2006
- 2006-12-22 US US11/644,238 patent/US8079656B2/en not_active Expired - Fee Related
-
2007
- 2007-12-17 JP JP2007324407A patent/JP5112037B2/ja not_active Expired - Fee Related
- 2007-12-19 EP EP07123662.4A patent/EP1936565A3/en not_active Withdrawn
- 2007-12-20 TW TW096148848A patent/TWI452524B/zh not_active IP Right Cessation
- 2007-12-20 TW TW103107340A patent/TWI524278B/zh not_active IP Right Cessation
- 2007-12-21 CN CN2007101621733A patent/CN101207696B/zh not_active Expired - Fee Related
-
2010
- 2010-10-28 US US12/913,842 patent/US20110087718A1/en not_active Abandoned
- 2010-10-28 US US12/913,825 patent/US8136901B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TWI524278B (zh) | 2016-03-01 |
TW200847032A (en) | 2008-12-01 |
CN101207696B (zh) | 2013-10-23 |
EP1936565A3 (en) | 2015-12-09 |
EP1936565A2 (en) | 2008-06-25 |
US20080150972A1 (en) | 2008-06-26 |
US20110087718A1 (en) | 2011-04-14 |
TW201426566A (zh) | 2014-07-01 |
JP2008159051A (ja) | 2008-07-10 |
TWI452524B (zh) | 2014-09-11 |
CN101207696A (zh) | 2008-06-25 |
US20110087717A1 (en) | 2011-04-14 |
US8136901B2 (en) | 2012-03-20 |
US8079656B2 (en) | 2011-12-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5112037B2 (ja) | 画像のデシメーションのための方法 | |
JP2008160105A (ja) | 滑らかなマイクロスケールの形状の印刷方法 | |
Liu et al. | High precision solder droplet printing technology and the state-of-the-art | |
EP2395394B1 (en) | Method for printing etch masks using phase-change materials | |
JP5583321B2 (ja) | 高いスポット配置精度で印刷する方法 | |
EP1392091B1 (en) | Method and system for printing integrated circuit patterns | |
EP1367871B1 (en) | Wiring forming systems for forming wiring on wiring board | |
JP4761227B2 (ja) | ラスタ化された画像の垂直成分と水平成分とを分離する方法 | |
US20070014974A1 (en) | Method and system for creating fine lines using ink jet technology | |
US20090155732A1 (en) | Method for Patterning Using Phase-Change Material | |
JP2007273533A (ja) | 導電パターンの形成方法及び形成装置 | |
JP6333152B2 (ja) | 生成方法、情報処理装置、インプリント方法及び物品の製造方法 | |
KR101946014B1 (ko) | 잉크젯 프린팅을 이용한 배선 형성 방법 및 잉크젯 프린팅 장치 | |
US9451706B1 (en) | Protocol for assigning features and tuning resolution in digital lithography | |
US20120169820A1 (en) | Method for Patterning Using Phase-Change Material |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20101217 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20111208 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20111219 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120316 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120910 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20121010 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20151019 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5112037 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |