JP5055157B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP5055157B2
JP5055157B2 JP2008028297A JP2008028297A JP5055157B2 JP 5055157 B2 JP5055157 B2 JP 5055157B2 JP 2008028297 A JP2008028297 A JP 2008028297A JP 2008028297 A JP2008028297 A JP 2008028297A JP 5055157 B2 JP5055157 B2 JP 5055157B2
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Japan
Prior art keywords
mass
temperature
time
ions
power supply
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Expired - Fee Related
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JP2008028297A
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Japanese (ja)
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JP2009187850A5 (https=
JP2009187850A (ja
Inventor
伸治 永井
博幸 安田
司 師子鹿
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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JP2008028297A 2008-02-08 2008-02-08 質量分析装置 Expired - Fee Related JP5055157B2 (ja)

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JP2008028297A JP5055157B2 (ja) 2008-02-08 2008-02-08 質量分析装置

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Application Number Priority Date Filing Date Title
JP2008028297A JP5055157B2 (ja) 2008-02-08 2008-02-08 質量分析装置

Publications (3)

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JP2009187850A JP2009187850A (ja) 2009-08-20
JP2009187850A5 JP2009187850A5 (https=) 2011-02-17
JP5055157B2 true JP5055157B2 (ja) 2012-10-24

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JP2008028297A Expired - Fee Related JP5055157B2 (ja) 2008-02-08 2008-02-08 質量分析装置

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3388826A1 (en) * 2015-10-16 2018-10-17 Shimadzu Corporation Method for correcting measurement error resulting from measurement device temperature displacement and mass spectrometer using said method
CN108352290B (zh) 2015-11-17 2020-04-03 Atonarp株式会社 分析装置及其控制方法
CN118311188B (zh) * 2024-06-11 2024-08-16 信联电子材料科技股份有限公司 杂质检测方法及设备、电子设备、可读存储介质

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05217548A (ja) * 1992-01-31 1993-08-27 Shimadzu Corp 四重極型質量分析計
JP4576775B2 (ja) * 2001-08-29 2010-11-10 株式会社島津製作所 飛行時間型質量分析装置
JP3659216B2 (ja) * 2001-11-13 2005-06-15 株式会社島津製作所 飛行時間型質量分析装置
JP4816794B2 (ja) * 2007-05-30 2011-11-16 株式会社島津製作所 飛行時間型質量分析装置

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JP2009187850A (ja) 2009-08-20

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