JP5042016B2 - 同期復調を介するアナログ・ディジタル変換器の校正 - Google Patents
同期復調を介するアナログ・ディジタル変換器の校正 Download PDFInfo
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- JP5042016B2 JP5042016B2 JP2007516803A JP2007516803A JP5042016B2 JP 5042016 B2 JP5042016 B2 JP 5042016B2 JP 2007516803 A JP2007516803 A JP 2007516803A JP 2007516803 A JP2007516803 A JP 2007516803A JP 5042016 B2 JP5042016 B2 JP 5042016B2
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- 230000001360 synchronised effect Effects 0.000 title claims description 25
- 238000000034 method Methods 0.000 claims description 28
- 238000006243 chemical reaction Methods 0.000 claims description 8
- 230000000295 complement effect Effects 0.000 claims description 6
- 230000000087 stabilizing effect Effects 0.000 claims description 5
- 230000006641 stabilisation Effects 0.000 claims description 4
- 238000011105 stabilization Methods 0.000 claims description 4
- 230000008859 change Effects 0.000 claims description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
- H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
- H03M1/1061—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
- H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
- H03M1/068—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS
- H03M1/0682—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS using a differential network structure, i.e. symmetrical with respect to ground
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/44—Sequential comparisons in series-connected stages with change in value of analogue signal
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Analogue/Digital Conversion (AREA)
Description
120 変換器コア部
125 経路
140 同期復調器
Claims (19)
- ディジタル変換器を校正する方法であって、
校正モードにおいて、前記変換器の少なくとも一部を、それぞれ所定の出力信号を提供する少なくとも2つの所定の校正状態の間で切り換える切換工程と、
前記少なくとも2つの所定の校正状態のシーケンスにわたって変換器出力信号を提供する出力信号提供工程と、
前記変換器出力信号を同期復調する同期復調工程とを備え、
前記切換工程が状態切換周波数で実行され、前記同期復調工程の帯域幅が前記状態切換周波数を中心とする、ディジタル変換器校正。 - 請求項1において、前記2つの所定の校正状態が前記ディジタル変換器を通る2つの別個の信号経路によって提供される、ディジタル変換器校正方法。
- 請求項1において、前記ディジタル変換器が1つまたは複数の可変スプリッタを用いて所定の出力信号を生成する、ディジタル変換器校正方法。
- 請求項1において、前記所定の校正状態のそれぞれが、公称上は同一の変換器出力信号を提供する、ディジタル変換器校正方法。
- 請求項1において、さらに、復調された変換器出力を用いて、前記変換器に訂正信号を提供する訂正信号提供工程を備えた、ディジタル変換器校正方法。
- 請求項1において、前記変換器が逐次近似変換器である、ディジタル変換器校正方法。
- 請求項1において、前記変換器が、内部に2つの変換信号経路を有する相補型変換器であって、第1変換信号経路が正信号経路として動作し、第2変換信号経路が負信号経路として動作する、ディジタル変換器校正方法。
- 請求項6において、
校正入力の第1セットを前記正信号経路に加え、校正入力の第2セットを前記負信号経路に加えることで、前記2つの所定の校正状態の第1状態が提供され、
校正入力の前記第2セットと同一のセットを前記正信号経路に加え、校正入力の前記第1セットと同一のセットを前記負信号経路に加えることで、前記2つの所定の校正状態の第2状態が提供される、ディジタル変換器校正方法。 - 請求項1において、前記同期復調工程が、さらに、
前記変換器出力を積分することにより誤差信号を提供する、ディジタル変換器校正方法。 - 請求項9において、前記誤差信号が、雑音がない場合はランプ波形である、ディジタル変換器校正方法。
- 請求項10において、前記変換器によって生じるオフセット電圧が、前記ランプ波形上に鋸歯状波形を重畳する、ディジタル変換器校正方法。
- 請求項11において、さらに、前記変換器の状態変化と同時に、積分された復調信号をラッチして前記誤差を生成する、ディジタル変換器校正方法。
- 請求項8において、共通基準入力Vcmが前記正信号経路と前記負信号経路とに供給される、ディジタル変換器校正方法。
- 請求項8において、前記校正モードにおいて前記ディジタル変換器によって用いられる段数が、ノーマル動作モードにおいて前記ディジタル変換器によって用いられる段数よりも少なくとも1つ多い、ディジタル変換器校正方法。
- 請求項7において、前記2つの変換信号経路が、パイプラインの電荷結合素子(CCD)段である、ディジタル変換器校正方法。
- 請求項15において、前記校正入力がそれぞれ一連の可変電荷スプリッタに供給され、電荷スプリッタがそれぞれパイプライン段の1つに結合されている、ディジタル変換器校正方法。
- 請求項16において、さらに、
前記同期復調出力信号から誤差信号を生成する誤差信号生成工程と、
前記誤差信号から可変スプリッタを制御する調整信号を得る調整信号取得工程とを備えた、ディジタル変換器校正方法。 - 請求項1において、さらに、
ノーマル動作モードの間において、前記ディジタル変換器の少なくとも1つの構成要素をチョッパ安定化するチョッパ安定化工程を備えた、ディジタル変換器校正方法。 - 請求項18において、さらに、
前記校正モードの間において、前記同期復調工程の一部として、チョッパ安定化工程で用いられる回路の一部を動作させる動作工程を備えた、ディジタル変換器校正方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/870,330 | 2004-06-17 | ||
US10/870,330 US7106230B2 (en) | 2004-06-17 | 2004-06-17 | Analog to digital converter calibration via synchronous demodulation |
PCT/US2005/021568 WO2006009896A2 (en) | 2004-06-17 | 2005-06-17 | Analog to digital converter calibration via synchronous demodulation |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008503940A JP2008503940A (ja) | 2008-02-07 |
JP2008503940A5 JP2008503940A5 (ja) | 2008-07-24 |
JP5042016B2 true JP5042016B2 (ja) | 2012-10-03 |
Family
ID=35480060
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007516803A Expired - Fee Related JP5042016B2 (ja) | 2004-06-17 | 2005-06-17 | 同期復調を介するアナログ・ディジタル変換器の校正 |
Country Status (7)
Country | Link |
---|---|
US (2) | US7106230B2 (ja) |
EP (1) | EP1766781A4 (ja) |
JP (1) | JP5042016B2 (ja) |
KR (1) | KR101203531B1 (ja) |
CA (1) | CA2571228A1 (ja) |
TW (1) | TWI370619B (ja) |
WO (1) | WO2006009896A2 (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7106230B2 (en) * | 2004-06-17 | 2006-09-12 | Kenet, Inc. | Analog to digital converter calibration via synchronous demodulation |
US7095354B2 (en) * | 2004-08-12 | 2006-08-22 | General Electric Company | Very linear wide-range pipelined charge-to-digital converter |
EP1921749B1 (en) * | 2006-11-13 | 2010-08-04 | Rohde & Schwarz GmbH & Co. KG | Circuit and method for generating a set of intermediate voltages |
TWI357215B (en) * | 2006-12-28 | 2012-01-21 | Realtek Semiconductor Corp | Clock generating ciruit and digital circuit incorp |
US7551109B1 (en) | 2007-03-14 | 2009-06-23 | Ashmore Jr Benjamin H | Method, system and apparatus for dual mode operation of a converter |
EP2280486A1 (en) * | 2009-07-10 | 2011-02-02 | Interuniversitair Micro-Elektronica Centrum | Interleaved pipelined binary search A/D converter |
TWI404417B (zh) * | 2010-02-09 | 2013-08-01 | Mediatek Inc | 同步訊號截波裝置與同步訊號截波方法 |
US8350737B2 (en) | 2011-01-12 | 2013-01-08 | International Business Machines Corporation | Flash analog to digital converter with method and system for dynamic calibration |
US8614587B1 (en) | 2013-03-12 | 2013-12-24 | Cypress Semiconductor Corp. | Capacitance sensing circuits and methods |
DK3072308T3 (en) * | 2013-11-22 | 2018-04-23 | Kamstrup As | CONSUMER FAULT WITH ERROR CORRECTION |
CN108594147B (zh) * | 2017-12-15 | 2020-06-16 | 中国航空工业集团公司北京长城计量测试技术研究所 | 一种模拟信号和数字信号同步采集及同步时间差校准方法 |
TWI819303B (zh) * | 2021-05-04 | 2023-10-21 | 瑞昱半導體股份有限公司 | 斜坡訊號校正裝置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4375059A (en) | 1980-04-25 | 1983-02-22 | Ibm Corporation | Fast charge transfer analog-to-digital converter |
JPH0529939A (ja) * | 1991-07-24 | 1993-02-05 | Matsushita Electric Ind Co Ltd | アナログ−デイジタル変換装置 |
US5844415A (en) * | 1994-02-03 | 1998-12-01 | Massachusetts Institute Of Technology | Method for three-dimensional positions, orientation and mass distribution |
US5579007A (en) | 1994-07-07 | 1996-11-26 | Massachusetts Institute Of Technology | Charge-to-digital converter |
US5990814A (en) * | 1997-09-05 | 1999-11-23 | Cirrus Logic, Inc. | Method and circuit for calibration of flash analog to digital converters |
US6850563B1 (en) * | 1998-06-19 | 2005-02-01 | Netwave Communications | Data slicer for combined trellis decoding and equalization |
JP3857488B2 (ja) * | 2000-02-17 | 2006-12-13 | 富士通株式会社 | 誤り訂正装置 |
SE516799C2 (sv) | 2000-04-25 | 2002-03-05 | Ericsson Telefon Ab L M | Ett förfarande och en anordning för kalibrering av A/D- omvandlare |
US6735535B1 (en) * | 2000-05-05 | 2004-05-11 | Electro Industries/Gauge Tech. | Power meter having an auto-calibration feature and data acquisition capabilities |
JP2001339303A (ja) * | 2000-05-30 | 2001-12-07 | Matsushita Electric Ind Co Ltd | A/d変換回路 |
US6587061B2 (en) * | 2001-07-03 | 2003-07-01 | Linear Technology Corporation | Analog computation circuits using synchronous demodulation and power meters and energy meters using the same |
US7106230B2 (en) * | 2004-06-17 | 2006-09-12 | Kenet, Inc. | Analog to digital converter calibration via synchronous demodulation |
-
2004
- 2004-06-17 US US10/870,330 patent/US7106230B2/en not_active Expired - Lifetime
-
2005
- 2005-06-10 TW TW094119264A patent/TWI370619B/zh not_active IP Right Cessation
- 2005-06-17 WO PCT/US2005/021568 patent/WO2006009896A2/en active Application Filing
- 2005-06-17 CA CA002571228A patent/CA2571228A1/en not_active Abandoned
- 2005-06-17 JP JP2007516803A patent/JP5042016B2/ja not_active Expired - Fee Related
- 2005-06-17 KR KR1020077001066A patent/KR101203531B1/ko active IP Right Grant
- 2005-06-17 EP EP05760909A patent/EP1766781A4/en not_active Withdrawn
-
2006
- 2006-09-11 US US11/519,336 patent/US7400280B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2008503940A (ja) | 2008-02-07 |
WO2006009896A3 (en) | 2007-11-08 |
EP1766781A2 (en) | 2007-03-28 |
US20070008207A1 (en) | 2007-01-11 |
US7400280B2 (en) | 2008-07-15 |
CA2571228A1 (en) | 2006-01-26 |
KR101203531B1 (ko) | 2012-11-21 |
TWI370619B (en) | 2012-08-11 |
EP1766781A4 (en) | 2011-12-07 |
WO2006009896A2 (en) | 2006-01-26 |
US20050280565A1 (en) | 2005-12-22 |
TW200623647A (en) | 2006-07-01 |
KR20070058434A (ko) | 2007-06-08 |
US7106230B2 (en) | 2006-09-12 |
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