JP5027728B2 - 固体撮像装置およびｘ線検査システム - Google Patents

固体撮像装置およびｘ線検査システム Download PDF

Info

Publication number
JP5027728B2
JP5027728B2 JP2008114210A JP2008114210A JP5027728B2 JP 5027728 B2 JP5027728 B2 JP 5027728B2 JP 2008114210 A JP2008114210 A JP 2008114210A JP 2008114210 A JP2008114210 A JP 2008114210A JP 5027728 B2 JP5027728 B2 JP 5027728B2
Authority
JP
Japan
Prior art keywords
unit
output
row
pixel
readout
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2008114210A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009267712A (ja
Inventor
竜次 久嶋
一樹 藤田
治通 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2008114210A priority Critical patent/JP5027728B2/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to PCT/JP2009/058003 priority patent/WO2009131150A1/ja
Priority to KR1020107015107A priority patent/KR101632757B1/ko
Priority to US12/989,132 priority patent/US8477907B2/en
Priority to EP09735012.8A priority patent/EP2276236B1/en
Priority to CN200980114758.5A priority patent/CN102017609B/zh
Priority to TW098113772A priority patent/TWI484942B/zh
Publication of JP2009267712A publication Critical patent/JP2009267712A/ja
Application granted granted Critical
Publication of JP5027728B2 publication Critical patent/JP5027728B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/667—Camera operation mode switching, e.g. between still and video, sport and normal or high- and low-resolution modes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/42—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/443—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Medical Informatics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Biomedical Technology (AREA)
  • General Physics & Mathematics (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Biophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Electromagnetism (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2008114210A 2008-04-24 2008-04-24 固体撮像装置およびｘ線検査システム Active JP5027728B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2008114210A JP5027728B2 (ja) 2008-04-24 2008-04-24 固体撮像装置およびｘ線検査システム
KR1020107015107A KR101632757B1 (ko) 2008-04-24 2009-04-22 고체 촬상 장치 및 ｘ선 검사 시스템
US12/989,132 US8477907B2 (en) 2008-04-24 2009-04-22 Solid-state image pickup apparatus and X-ray inspection system
EP09735012.8A EP2276236B1 (en) 2008-04-24 2009-04-22 Solid-state image pickup apparatus and x-ray inspection system
PCT/JP2009/058003 WO2009131150A1 (ja) 2008-04-24 2009-04-22 固体撮像装置およびｘ線検査システム
CN200980114758.5A CN102017609B (zh) 2008-04-24 2009-04-22 固体摄像装置及x射线检查系统
TW098113772A TWI484942B (zh) 2008-04-24 2009-04-24 Solid-state imaging device and X-ray inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008114210A JP5027728B2 (ja) 2008-04-24 2008-04-24 固体撮像装置およびｘ線検査システム

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2012120634A Division JP5337281B2 (ja) 2012-05-28 2012-05-28 Ｘ線検査システム

Publications (2)

Publication Number Publication Date
JP2009267712A JP2009267712A (ja) 2009-11-12
JP5027728B2 true JP5027728B2 (ja) 2012-09-19

Family

ID=41216879

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008114210A Active JP5027728B2 (ja) 2008-04-24 2008-04-24 固体撮像装置およびｘ線検査システム

Country Status (7)

Country Link
US (1) US8477907B2 (ko)
EP (1) EP2276236B1 (ko)
JP (1) JP5027728B2 (ko)
KR (1) KR101632757B1 (ko)
CN (1) CN102017609B (ko)
TW (1) TWI484942B (ko)
WO (1) WO2009131150A1 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5094530B2 (ja) 2008-04-24 2012-12-12 浜松ホトニクス株式会社 Ｘ線検査システム
JP5628103B2 (ja) * 2011-06-30 2014-11-19 富士フイルム株式会社 放射線検出器、放射線画像撮影システム、断線検出プログラム、及び断線検出方法
US8872120B2 (en) * 2012-08-23 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Imaging device and method for driving the same
JP6274501B2 (ja) * 2013-11-26 2018-02-07 キヤノンメディカルシステムズ株式会社 Ｘ線診断装置
JP2016019708A (ja) * 2014-07-16 2016-02-04 浜松ホトニクス株式会社 固体撮像装置、ｘ線撮像システムおよび固体撮像装置駆動方法
JP6700673B2 (ja) * 2015-05-15 2020-05-27 キヤノン株式会社 撮像装置、撮像システム
KR102018189B1 (ko) * 2017-12-20 2019-09-04 주식회사 에이치앤아비즈 엑스레이 디텍터의 비닝 모드 제어장치 및 방법
JP7200520B2 (ja) * 2018-07-09 2023-01-10 コニカミノルタ株式会社 制御システム及び放射線撮影システム

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2557865B2 (ja) * 1987-01-28 1996-11-27 キヤノン株式会社 固体撮像装置
US7123687B2 (en) 2003-04-10 2006-10-17 Varian Medical Systems Technologies, Inc. Method for displaying digital X-ray image data at high resolution
JP2005184358A (ja) * 2003-12-18 2005-07-07 Sony Corp 固体撮像装置、及び画素信号読み出し方法
JP2006068512A (ja) * 2004-08-06 2006-03-16 Canon Inc 撮像装置、撮像システム、撮像方法、およびコンピュータプログラム
DE112006000869B4 (de) 2005-04-11 2017-10-19 J. Morita Mfg. Corp. Radiographievorrichtung mit Übersichtsbildfunktion
JP4773768B2 (ja) * 2005-08-16 2011-09-14 キヤノン株式会社 放射線撮像装置、その制御方法及び放射線撮像システム
US8005187B2 (en) 2005-10-17 2011-08-23 J. Morita Manufacturing Corporation Medical digital X-ray imaging apparatus and medical digital X-ray sensor
JP2007144064A (ja) 2005-11-30 2007-06-14 Shimadzu Corp 撮像センサおよびそれを用いた撮像装置
JP2007244443A (ja) * 2006-03-14 2007-09-27 Shizuo Nakayama 人間の動作のレッスンシステム及びレッスン方法
JP4868926B2 (ja) * 2006-04-21 2012-02-01 キヤノン株式会社 放射線撮像装置
JP5094530B2 (ja) * 2008-04-24 2012-12-12 浜松ホトニクス株式会社 Ｘ線検査システム

Also Published As

Publication number Publication date
US8477907B2 (en) 2013-07-02
WO2009131150A1 (ja) 2009-10-29
JP2009267712A (ja) 2009-11-12
KR101632757B1 (ko) 2016-06-22
TWI484942B (zh) 2015-05-21
EP2276236B1 (en) 2015-06-03
CN102017609A (zh) 2011-04-13
EP2276236A4 (en) 2011-08-17
CN102017609B (zh) 2013-05-15
KR20110005770A (ko) 2011-01-19
EP2276236A1 (en) 2011-01-19
TW201008261A (en) 2010-02-16
US20110064195A1 (en) 2011-03-17

Similar Documents

Publication Publication Date Title
JP5094530B2 (ja) Ｘ線検査システム
JP5027728B2 (ja) 固体撮像装置およびｘ線検査システム
JP5096946B2 (ja) 固体撮像装置
JP4927669B2 (ja) 固体撮像装置
JP5058057B2 (ja) 医療用ｘ線撮像システム
WO2009131147A1 (ja) 医療用ｘ線撮像システム
JP2008017019A (ja) 固体撮像装置
JP2009182127A (ja) 固体撮像装置
JP5155759B2 (ja) 固体撮像装置
JP5091695B2 (ja) 固体撮像装置
JP4912990B2 (ja) 固体撮像装置
JP5337281B2 (ja) Ｘ線検査システム
JP5436639B2 (ja) 固体撮像装置
JP2015003041A (ja) 医療用ｘ線撮像システム
WO2009093658A1 (ja) 固体撮像装置及びフレームデータ補正方法
JP5468114B2 (ja) 医療用ｘ線撮像システム

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20101214

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120403

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120521

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120619

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120622

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150629

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 5027728

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250