JP5023513B2 - Electronic device test apparatus and electronic device test method - Google Patents

Description

  The present invention relates to an electronic device test apparatus and an electronic device test method for testing an electronic device such as a mobile phone.

  In general, an electronic device such as a mobile phone is actually subjected to a wireless connection test (test) using a radio wave as to whether or not the electronic device normally operates and functions after manufacture and repair. Such tests are called large special rooms called anechoic chambers (anechoic chambers) where external radio waves are blocked, and shield boxes (radio-shielding boxes) in order to perform accurate reception capability tests. (See, for example, Patent Document 1).

In the shield box described in Patent Document 1, a measurement antenna that transmits and receives measurement radio waves to and from an electronic device to be tested, and an electronic device mounting portion that is provided to face the measurement antenna are provided. And configured to directly transmit and receive radio waves between the electronic device placed on the electronic device placement unit and the measurement antenna.
JP-A-10-78465 (Claim 1, paragraph 0032, FIG. 1)

  However, since the conventional technology does not consider the direction of the polarization plane, it may be difficult to set an environment in which the change in the electric field of the radio wave radiated from the antenna can be easily received by the antenna of the electronic device. In addition, since the distance between the transmission / reception antenna and the measurement antenna included in the electronic device is not defined in the conventional technology, the position of the electronic device arranged in the shield box is slightly different, and is radiated from the measurement antenna. In some cases, the electric field strength of the radio waves changes significantly. For this reason, it has been impossible to accurately and easily test electronic devices.

  Accordingly, an object of the present invention is to provide an electronic device test apparatus and an electronic device test method that can accurately and easily test an electronic device in order to solve such a problem.

As means for solving the above-mentioned problems, the invention according to claim 1 is a test that has an electronic device inserted therein and has a radio wave absorptivity and a radio wave absorptivity that absorbs radio waves radiated from the outside. An electronic device test apparatus comprising: a box; a measurement antenna that transmits and receives radio waves to and from the electronic device antenna; and a holding unit that holds the electronic device, wherein the measurement antenna is a housing of the test box. The holding means is provided via an antenna waveguide rotatably provided on a side wall of the body, and is configured to change the direction of the antenna by rotating the antenna waveguide. Fixed to a fixed plate provided so as to cover the entire floor of the housing, a holding fixture for holding and fixing an electronic device on the fixed plate, and a back plate of the holding fixture Mounting plate and electronics And a fixing tool formed with an insertion portion for inserting and holding the fixing tool.The fixing tool is rotatably attached to the mounting plate, and can be attached by changing the mounting direction and position. The holding fixture is detachably fixed to a plurality of fixing positions of the fixing plate, the distance between the antenna of the electronic device and the antenna for measurement is adjustable, and the antenna of the electronic device and the measurement The distance from the antenna for measurement is set to be larger than the wavelength λ of the radio wave radiated from the measurement antenna, and the polarization plane of the radio wave radiated from the measurement antenna and the electronic device It is possible to adjust so that the plane of polarization of the radio wave radiated from the antenna is parallel.

According to such an electronic apparatus test apparatus, the measurement antenna or the holding means is arranged so that the plane of polarization of the radio wave radiated from the antenna for measurement is parallel to the plane of polarization of the radio wave radiated from the antenna of the electronic apparatus. Can be adjusted. Thereby, it is possible to easily set an environment in which the change in the electric field of the radio wave radiated from the measurement antenna is easily received (good sensitivity) by the antenna of the electronic device. In addition, since the test box has radio wave absorptivity, it is possible to prevent radio waves radiated inside from resonating in the test box. As a result, Ru can be to refine the test of electronic equipment. Further, by adjusting both the measurement antenna and the holding means, it is possible to measure both radio waves having a vertical polarization plane (vertical waves) and radio waves having a horizontal polarization plane (horizontal waves).
Note that the polarization plane refers to a plane in which the wave of an electric field vibrates in an electromagnetic wave. A radio wave radiated from a normal antenna is linearly polarized.

According to a second aspect of the present invention, there is provided a test box having an electronic device inserted therein, a shielding property against external radio waves and a radio wave absorption property for absorbing radio waves radiated inside, an antenna of the electronic device and radio waves A test antenna for electronic devices, and a holding means for holding the electronic device, wherein the measurement antenna is rotatably provided on a side wall of the casing of the test box. The antenna is provided via an antenna waveguide, and is configured to change the direction of the antenna by rotating the antenna waveguide. The holding means covers the entire floor of the casing. A fixing plate provided so as to hold, a holding and fixing jig for holding and fixing the electronic device on the fixing plate, a mounting plate fixed to a back plate of the holding and fixing jig, and an electronic device being inserted A holding insertion part is formed. A fixing tool, and the fixing tool is rotatably attached to the mounting plate so that the mounting direction and position can be changed, and the holding fixing jig is attached to the fixing plate. The antenna is configured to be movable back and forth along the provided rail, the distance between the antenna of the electronic device and the antenna for measurement can be adjusted, and the distance between the antenna of the electronic device and the antenna for measurement can be adjusted. And configured to be larger than the wavelength λ of the radio wave radiated from the measurement antenna, and radiated from the polarization plane of the radio wave radiated from the measurement antenna and the antenna of the electronic device. It can be adjusted to be parallel to the plane of polarization of the radio wave .

According to a third aspect of the present invention, in the electronic apparatus testing apparatus according to the first or second aspect, a radio wave absorbing sheet having radio wave absorptivity is provided on the upper surface of the fixing plate .

The invention according to claim 4 is the electronic apparatus testing apparatus according to claim 1 or 2, wherein the fixing plate itself has a radio wave absorption structure .

  The invention according to claim 5 is the electronic apparatus test apparatus according to any one of claims 1 to 4, wherein a λ / 4 type wave absorber is provided inside the test box. To do.

  According to such a test apparatus for electronic equipment, it is possible to prevent a radio wave resonance phenomenon and perform a precise test of the electronic equipment. The radio wave resonance phenomenon refers to a phenomenon in which, when a radio wave is radiated from a measurement antenna in a test box having radio wave shielding properties, the radio wave repeatedly reflects on the wall surface in the test box to cause an interference phenomenon.

  The invention according to claim 6 is the electronic apparatus test apparatus according to any one of claims 1 to 5, wherein the measurement antenna disposed in the test box is a radio wave in a high frequency band. It is a fan antenna which can send and receive.

  According to such a test apparatus for electronic equipment, since the measurement antenna disposed in the test box can radiate radio waves having a frequency band of 0.8 to 6.0 GHz, the wideband can be obtained without replacing the measurement antenna. Electronic devices can be tested over a wide range.

  The invention according to claim 7 is the electronic device test apparatus according to any one of claims 1 to 6, wherein the inner surface of the test box in the vicinity of the measurement antenna disposed in the test box. Has a magnetic tape.

  According to such a test apparatus for electronic equipment, electromagnetic induction due to radio waves radiated from the measurement antenna disposed in the test box can be suppressed, and the generation of eddy currents in the test box can be effectively prevented. can do.

  According to an eighth aspect of the present invention, in the electronic device test apparatus according to any one of the first to seventh aspects, the test box includes a metal casing having a radio wave shielding property. It is characterized by.

  According to such a test apparatus for electronic equipment, radio waves can be reliably shielded by the metal casing having conductivity. Moreover, the rigidity of a housing | casing is improved by being metal, As a result, durability of a test box can be improved.

  The invention according to claim 9 is the electronic apparatus testing apparatus according to claim 8, wherein the metal casing is configured by assembling a plurality of metal members, and the plurality of metal members are welded together. It is characterized by being joined.

  According to such a test apparatus for electronic equipment, a plurality of metal members are joined together by welding, so that radio waves in the assembly portion are also reliably shielded, and radio waves leak between the inside and outside of the test box. This can be surely prevented.

  The invention according to claim 10 is the electronic apparatus test apparatus according to any one of claim 8 or claim 9, wherein the metal casing is made of aluminum or an aluminum alloy. To do.

  According to such a test apparatus for electronic equipment, it is possible to provide a test box with a beautiful appearance and reduced weight.

  The invention according to claim 11 is the electronic apparatus test apparatus according to any one of claims 1 to 10, wherein the test box has a window through which the electronic apparatus can be visually recognized. .

  According to such a test apparatus for electronic equipment, the inside of the test box can be visually recognized from the outside through the window while testing the electronic equipment.

  According to a twelfth aspect of the present invention, in the electronic apparatus testing apparatus according to the eleventh aspect, the window has a radio wave shielding property.

  According to such a test apparatus for electronic equipment, the shielding of the radio wave in the test box can be maintained by the window reflecting the radio wave. Such a window is desirably arranged at a position where the radio wave radiated from the measurement antenna is not irradiated as much as possible. This is because when the radio wave radiated from the antenna of the electronic device is directly irradiated on the window, the radio wave is reflected on the window surface and causes a resonance phenomenon of the radio wave inside the test box. Examples of means for reflecting radio waves include vapor deposition of an ITO (Indium Tin Oxide) film or the like. According to this, since it is translucent with respect to visible light, the inside of the test box can be visually recognized from the outside while testing the electronic device.

  According to a thirteenth aspect of the present invention, in the electronic apparatus testing apparatus according to any one of the first to twelfth aspects, the test box has a door that can be freely opened and closed.

  According to such a test apparatus for electronic equipment, the electronic equipment can be freely put in and out by appropriately opening and closing the door of the test box. Further, it is desirable to provide a frame-like packing at the edge portion of the door, which is in contact with the test box when the door is closed. According to this, the shielding property of the radio wave when the door is closed can be improved.

  The invention according to claim 14 is the electronic apparatus testing apparatus according to any one of claims 1 to 13, wherein the test box is configured to prevent a radio wave interference and connect a cable from the outside of the box to the inside of the box. An EMI duct that enables wiring is provided.

  According to such a test apparatus for electronic equipment, a cable can be wired from the outside of the box into the box while preventing radio wave interference. The EMI duct is obtained by winding a noise suppression sheet represented by a magnetic tape or the like around a cable and passing a part of the cable through a duct arranged in a test box. According to this EMI duct, electromagnetic waves below a specific frequency are blocked by the effect of the duct as a waveguide, and at the same time, radiation and propagation of noise from the cable can be suppressed by the noise suppression sheet.

  According to a fifteenth aspect of the present invention, in the electronic apparatus test apparatus according to the fourteenth aspect, a cable is disposed from the outside of the box to the inside of the box via the EMI duct, and the cable absorbs noise. It is characterized by being covered with a noise absorber.

  According to such a test apparatus for electronic equipment, it is possible to reliably prevent noise from being generated from the cable, and precise inspection of the electronic equipment becomes possible. In addition, as a cable wired in the box from the outside of the box, for example, a cable connected to an antenna, a power cable of an electronic device arranged inside, and the like can be cited.

  The invention according to claim 16 is the electronic apparatus test apparatus according to any one of claims 1 to 15, wherein illumination is provided inside the test box.

  According to such a test apparatus for electronic equipment, the inside of the test box can be illuminated brightly. The illumination is preferably an LED lamp (Light Emitting Diode Lump). This is because, unlike a fluorescent lamp, an LED lamp hardly generates noise when blinking.

  An invention according to claim 17 is an electronic device test method using the electronic device test apparatus according to any one of claims 1 to 16, wherein the measurement antenna, the antenna of the electronic device, Is set to be larger than the wavelength λ of the radio wave radiated from the measurement antenna, and the test is performed by receiving the radio wave with the antenna of the electronic device.

  According to such an electronic device test method, the distance between the antenna for measurement and the antenna of the electronic device can be set to be larger than the wavelength λ of the radio wave radiated from the antenna for measurement. An antenna can be arranged, and an electronic device can be installed at a position where electric field strength is stable. Thereby, the test of an electronic device can be accurately performed by a simple operation.

  The invention according to claim 18 is the electronic device test method according to claim 17, wherein the frequency of the radio wave radiated from the measurement antenna is 0.8 to 6.0 GHz.

  According to such an electronic device testing method, the electronic device can be tested over a wide band in the electronic device. When the electronic device is a mobile phone, almost all models distributed in the market can be inspected.

  Further, by connecting an attenuator (ATT), a filter (BEF: Band elimination filter) and a receiving antenna to the measuring antenna, the receiving antenna receives radio waves transmitted from the base station. The electronic device can be tested by radiating the radio wave from the measurement antenna provided in the electronic device testing apparatus.

  ADVANTAGE OF THE INVENTION According to this invention, the test device for electronic devices and the electronic device test method which can test an electronic device precisely and easily can be provided.

  Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings as appropriate. In the drawings to be described, FIG. 1 is a front view of a test apparatus for electronic equipment. In the present embodiment, the electronic device is assumed to be a mobile phone, but the electronic device to be tested in the present invention is not limited to a mobile phone.

≪Configuration of electronic equipment test equipment≫
As shown in FIG. 1, an electronic device test apparatus 1 includes a test box 10 in which an electronic device T is placed inside (a radio wave shielding space), an antenna 20 (a measurement antenna) that transmits radio waves to the electronic device T, It mainly includes an attachment unit 30 (holding means) to which the electronic device T is attached and a test unit 40 (see FIG. 2) for testing the electronic device T.

<Test box>
2A is a cross-sectional view taken along the line II-II in FIG. 1, and FIG. 2B is an enlarged cross-sectional view showing the test box of FIG. 2A with the door closed.
As shown in FIG. 2A, the test box 10 includes a housing 11, an openable / closable door 12 provided on the front side of the housing 11, and radio waves provided on the inner surface of the housing 11 and the door 12. An absorber 13, an EMI duct 14 provided on the back side of the housing 11, and an LED (Light Emitting Diode) lamp 15 (see FIG. 3) are provided. T can be taken in and out of the housing 11. Further, a frame-shaped packing S <b> 1 having radio wave shielding is provided in a portion sandwiched between the door 12 and the housing 11 when the door 12 is closed.

  The casing 11 is formed in a substantially rectangular parallelepiped box shape having a front side opened by welding a plurality of metal panels 11a to a frame (not shown) serving as a skeleton. The metal forming the panel 11a and the frame (not shown) is not particularly limited in the present invention, and may be, for example, an alloy as well as a pure metal. The casing 11 is formed of a metallic panel 11a, thereby having a predetermined rigidity, enhancing its durability, and shielding from external radio waves. The panel 11a and the frame (not shown) are welded so as not to form a gap, so that the sealing property of the housing 11, that is, the shielding property of radio waves is enhanced. In particular, when the panel 11a or the like is formed of aluminum or an aluminum alloy (hereinafter referred to as an aluminum alloy or the like), the casing 11 can be reduced in weight while maintaining a desired rigidity. In addition, since aluminum or the like has a unique luster, it has excellent aesthetics.

  The door 12 is made of a metal panel 12a, and a window 12b is attached to the right side (see FIG. 1) of the panel 12a by a frame 12c. The panel 12a is rotatably attached to the side surface of the housing 11 via a hinge H so that the door 12 can be opened and closed appropriately. The window 12b is composed of a rectangular glass plate having transparency. Thereby, it is possible to monitor the electronic device T from outside the test box 10 and observe, for example, whether or not the incoming lamp is lit due to reception of radio waves. Further, the window 12b has radio wave reflectivity (blocking property) for preventing radio waves from passing through the window 12b, so that the radio wave shielding property of the test box 10 is maintained. Yes. For example, such a window 12b is formed by forming an ITO (Indium Tin Oxide) film on one surface of a glass plate. The frame 12c is a metal frame member and is welded to the panel 12a while covering the peripheral edge of the window 12b. In addition, packing S2 which has radio wave shielding is provided in the peripheral part of the window 12b. Thereby, the shielding property of the electromagnetic wave in the vicinity of the window 12b is ensured. Incidentally, it is desirable that the panel 12a and the frame 12c be formed of aluminum or the like, similarly to the housing 11.

  A radio wave absorber 13 is provided on the inner surface side of the housing 11 and the door 12. The radio wave absorber 13 has a structure based on a known method (λ / 4 type) for absorbing radio waves, and is constructed so as to cover the inner surfaces of the panels 11a and 12a as shown in FIG. In this structure, radio waves radiated from the electronic device T and the antenna 20 are artificially absorbed without being reflected by the inner surface of the housing 11. That is, the radio wave absorber 13 has a structure that prevents radio waves radiated from the electronic device T and the antenna 20 from resonating with radio waves reflected by the inner surface of the housing 11.

  The radio wave absorber 13 includes a spacer 13a disposed on the inner side of the housing 11, a resistance film sheet 13b disposed on the inner side and having a function of transmitting half of the radio wave, and a resistance film disposed on the inner side. And a protective film 13c for protecting the film sheet 13b.

  The spacer 13a is for setting the interval between the resistive film sheet 13b and the housing 11 to λ / 4, where λ is the wavelength of the radio wave radiated from the electronic device T and the antenna 20, It has a thickness T1. The spacer 13a has radio wave permeability and is formed of, for example, polystyrene foam. Thus, when formed from a polystyrene foam, thickness T1 of the spacer 13a can be adjusted easily.

  The resistance film sheet 13b is a thin sheet adjusted so that the surface resistance value thereof is substantially equal to the impedance (376.7Ω) of free space. As such a resistance film sheet 13b, it is possible to use a sheet in which a carbon conductive paint is applied to an appropriate base sheet, or a film formed by adjusting the resistance value of the ITO film.

  The protective film 13c is laminated inside the resistance film sheet 13b, and protects the surface of the resistance film sheet 13b.

  And the surface of such a wave absorber 13 is flat. Thereby, compared with the case where a plurality of convex wave absorbers are provided, for example, the inside of the test box 10 can be enlarged or the outer shape of the test box 10 can be reduced.

Here, the mechanism of radio wave absorption by the radio wave absorber 13 will be described.
When the radio wave W1 radiated from the electronic device T or the antenna 20 enters from the vertical direction of the protective film 13c, after passing through the protective film 13c, ½ of the radio wave W1 passes through the resistive film sheet 13b. / 2 is reflected by the resistance film sheet 13b. Here, a radio wave transmitted through the resistance film sheet 13b is a radio wave W2, and a reflected radio wave is a radio wave W3. After traveling through the spacer 13a, the radio wave W2 is reflected by the panel 11a on the side surface of the housing 11, and becomes the radio wave W4. Note that the phase of the radio wave is inverted upon reflection by the resistance film sheet 13b and the panel 11a.

  Then, the radio wave W4 that has reached the resistance film sheet 13b after being reflected by the casing 11 is twice the thickness T1 of the spacer 13a, that is, “λ / 4 × 2 = λ / 2 ”, and the phase of the radio wave W3 and the phase of the radio wave W4 are reversed. Accordingly, the radio wave W3 and the radio wave W4 cancel each other, and as a result, the radio wave W1 incident on the resistance film sheet 13b is absorbed in a pseudo manner.

  The EMI duct 14 is a duct that allows a later-described cable 41 to be inserted from the outside of the housing 11 while preventing electromagnetic interference, and is fixed to the housing 11 via a gasket (not shown). As a result, the cable 41 can be routed through the EMI duct 14, electromagnetic interference from the insertion portion of the cable 41 is prevented, and the shielding property of the housing 11 is ensured. Further, the electromagnetic interference is suitably prevented by wiring the cable 41 so that a predetermined length (for example, 100 mm or more) of the cable 41 passes through the EMI duct 14.

FIG. 3 is a longitudinal sectional view showing the electronic apparatus testing apparatus according to the present embodiment.
As shown in FIG. 3, the LED lamp 15 is illumination that illuminates the inside of the test box 10, and is provided on the upper wall of the housing 11. Thereby, while testing the electronic device, the inside of the test box 10 is illuminated and the electronic device T is easily observed. Note that unlike a fluorescent lamp, an LED hardly generates noise at the time of blinking and is preferably used.

  The antenna 20 is a fan antenna for sending (transmitting / receiving) a radio wave to the electronic device T, and can radiate a radio wave having a frequency band of 0.8 to 6.0 GHz. The antenna 20 is provided on a connector 21 fixed to the side wall of the housing 11 via an antenna waveguide 22 (radio wave shielding means). A cable (not shown) is connected to the antenna 20, and this cable is drawn to the outside via the antenna waveguide 22 and connected to a variable radio wave generation unit (not shown). Then, after the electric signal is amplified by an amplifier built in a variable radio wave generation unit (not shown), the antenna 20 generates a radio wave based on the signal sent therefrom and sends it to the electronic device T. ing.

  The connector 21 is fixed to the side wall of the housing 11 so that the antenna waveguide 22 can be fixed. By loosening the connector 21, the antenna waveguide 22 can be rotated to change the direction of the antenna 20. In this state, the antenna waveguide 22 can be fixed again. The connector 21 may be provided with a spare connector 21 '(see FIG. 4) at a position shifted laterally in the horizontal direction. According to this, the antenna waveguide 22 can be replaced at a desired position.

  The antenna waveguide 22 is a waveguide bent in a cylindrical shape and an L shape, and the inside and the outside of the test box 10 are communicated with each other through the hollow portion. The antenna waveguide 22 is made of a metal such as an aluminum alloy and has radio wave shielding properties. Further, a rectangular ground plate 23 is fixed to the tip of the antenna waveguide 22. The specifications of the antenna waveguide are set based on the wavelength of the radio wave that does not propagate in the antenna waveguide. Specifically, the inner diameter and length of the antenna waveguide 22 are set so that radio waves having a wavelength longer than a predetermined wavelength do not leak from the inside of the test box 10 to the outside. Yes.

  The radio wave shielding property of the test box 10 is suitably maintained by preventing the propagation in the antenna waveguide 22 while wiring the cable 20a in the antenna waveguide 22. In general, if the shape and size (length) of the opening of the waveguide are the same, the longer the waveguide is, the more difficult it is for radio waves to propagate through it, and the shielding performance is improved. Although it depends on the shape of the opening of the waveguide, the limit frequency (predetermined frequency) of the radio wave that can be shielded by the waveguide increases as the area of the opening decreases.

  The attachment unit 30 is a unit that fixes the electronic device T in the housing 11. The mounting unit 30 includes a fixing plate 31 provided so as to cover the entire floor of the housing 11 and a holding and fixing jig 32 for holding and fixing the electronic device T on the fixing plate 31.

  The fixed plate 31 is a plate material having a rectangular shape in plan view. The fixing plate 31 is formed with a plurality of bolt holes 31 a for fixing the holding and fixing jig 32. The bolt holes 31a are provided in parallel in the left-right direction of the housing 11 so that the fixing position of the holding fixture 32 can be changed to a desired position (see FIG. 2). Note that a radio wave absorbing sheet having radio wave absorptivity may be provided on the fixed plate 31, or the fixed plate 31 itself may have a radio wave absorbing structure.

  The holding and fixing jig 32 is an L-shaped member as viewed from the side, and has a bolt hole 32a for screwing the bolt B into the bottom. The holding and fixing jig 32 is fixed to the fixing plate 31 by the bolt B being screwed into the bolt hole 31 a of the fixing plate 31 through the bolt hole 32 a of the holding and fixing jig 32. An attachment plate 33 and a fixture 34 are attached to the back plate of the holding fixture 32. The mounting plate 33 is a long plate material (see FIG. 2) and is fixed to the holding and fixing jig 32. The fixture 34 is a member that holds the electronic device T, and is formed with an insertion portion 34a that inserts and holds the electronic device T. The fixture 34 is detachably attached to the attachment plate 33, and can be attached by changing the attachment direction and position as desired.

  As shown in FIG. 2, the test unit 40 is a unit that detects a radio wave reception (transmission / reception) state of the electronic device T and determines whether or not the electronic device T is normal. The test unit 40 can be connected to an electronic device T to be tested via a cable 41. That is, one end of the cable 41 is connected to the test unit 40, and the other end is drawn into the test box 10 via the EMI duct 14 and connected to the electronic device T. In addition, the other end of the cable 41 is provided with a connector (not shown) for detachably connecting to the electronic device T.

  A portion of the cable 41 that passes through the EMI duct 14 and an outer peripheral surface before and after the predetermined passage are covered with a noise absorber 42 that absorbs noise that is conducted through the cable 41. Thereby, the radio wave reception state of the electronic device T is detected with high accuracy in the test unit 40 via the cable 41. Such a noise absorber 42 is configured by winding the cable 41 with a predetermined length (for example, 300 mm or more) by using an EMI tape “Lumionion (registered trademark) ET” manufactured by Toyo Service Co., Ltd. .

  The electronic device testing method according to the present embodiment will be described with reference to FIGS. 4 and 5 (and FIGS. 2 and 3 as appropriate) while explaining the operation of the electronic device testing apparatus 1 configured as described above. . 4 is a cross-sectional view taken along the line IV-IV of the electronic device test apparatus of FIG. 1, and FIG. 5 is a diagram illustrating the positional relationship between the measurement antenna and the electronic device antenna during the test. (a) is a figure which shows the positional relationship at the time of a vertical wave measurement, (b) is a figure which shows the positional relationship at the time of a horizontal wave measurement.

  First, the positional relationship between the two when the electronic device T receives a vertical wave from the antenna 20 and the positional relationship between both when the electronic device T receives a horizontal wave will be described, and then the main operation of the electronic device testing apparatus 1 will be described. .

  When testing the reception state of the vertical wave, as shown in FIG. 5A, the test box 10 (see FIG. 3) so that the opening of the antenna waveguide 22 faces upward (the antenna 20 faces upward). It is fixed to. On the other hand, the electronic device T is attached to the attachment plate 33 with the fixture 34 oriented so that the antenna Ta extends upward (see FIG. 3). Thereby, the polarization plane of the radio wave radiated from the antenna 20 and the polarization plane of the radio wave radiated from the antenna Ta of the electronic device T are adjusted to be parallel.

  On the other hand, when testing the reception state of the horizontal wave, as shown in FIG. 4, the connector 21 is loosened, the antenna waveguide 22 is rotated, and the opening is laterally (horizontal) (antenna The test box 10 is fixed to the test box 10 with 20 facing sideways. On the other hand, as shown in FIG. 5B, the electronic device T is attached to the mounting plate 33 with the fixture 34 oriented so that the antenna Ta extends in the lateral direction (horizontal direction). ing. Thereby, the polarization plane of the radio wave radiated from the antenna 20 and the polarization plane of the radio wave radiated from the antenna Ta of the electronic device T are adjusted to be parallel. When testing a vertical wave or a horizontal wave, the position of the opening of the antenna waveguide 22 and the center of the antenna Ta of the electronic device T are shown in FIGS. Are set to have the same height.

  Next, the operation of the electronic apparatus testing apparatus 1 will be described. In the electronic apparatus testing apparatus 1, a fixture is previously set so that the positional relationship of FIG. 5A is measured when measuring a vertical wave, and the positional relationship of FIG. 5B is measured when measuring a horizontal wave. 33 and the antenna waveguide 22 are aligned and fixed to the test box 10.

  First, as shown in FIG. 2, the operator opens the door 12, inserts the electronic device T into the test box 10, and attaches it to the fixture 34. Further, a connector (not shown) of the cable 41 is connected to the electronic device T.

  When the operator turns on an inspection start switch (not shown), a variable radio wave generation unit (not shown) transmits an electrical signal to the antenna 20. The antenna 20 generates a radio wave and transmits the radio wave to the electronic device T.

  In this way, the reception state of the electronic device T is detected by the test unit 40 while the antenna 20 sends radio waves to the electronic device T. The test unit 40 detects the reception state of the electronic device T and determines whether or not it is normal. When the horizontal wave and the vertical wave are tested and determined to be in a normal state, the position of the holding and fixing jig 32 is changed and fixed to the fixing plate 31, and the distance from the antenna 20 is changed. Test whether the electronic device T can receive radio waves by testing whether T can receive radio waves or changing the intensity of radio waves generated from the antenna 20 by an amplifier built in the variable radio wave generating unit. You can do a test. At this time, the distance between the antenna Ta and the antenna 20 of the electronic device T is set to be larger than the wavelength λ of the radio wave radiated from the antenna 20. According to this, it becomes possible to arrange | position the antenna Ta of the electronic device T in the area | region of a far electromagnetic field, and the electronic device T can be installed in the position where electric field strength is stabilized. As a result, the electronic device T can be tested with a simple operation.

  The preferred embodiments of the present invention have been described above. However, the present invention is not limited to the above-described embodiments, and the following modifications can be made without departing from the spirit of the present invention.

  In the above-described embodiment, the case where the electronic device is a mobile phone has been described. However, for example, a PDA (Personal Digital Assistance) or a notebook computer having a wireless LAN function may be used.

  In the above-described embodiment, a radio wave is transmitted from the antenna 20 to the electronic device T, and it is determined whether or not the electronic device T can normally receive the radio wave. However, for example, a radio wave is transmitted from the electronic device T to the antenna 20. The electronic device T may be tested.

  In the above-described embodiment, the test box 10 is illustrated as the test apparatus main body. However, for example, a large anechoic chamber may be used.

  In the above-described embodiment, the variable radio wave generation unit that generates radio waves by the antenna 20 includes an amplifier that amplifies an electric signal, and the electric signal appropriately amplified by this amplifier is sent to the antenna 20 and generated by the antenna 20. In addition, for example, the variable radio wave generation unit includes an attenuator, and appropriately attenuates the electric signal to change the intensity of the radio wave generated by the antenna 20. It is good.

  In the embodiment described above, the fixture 34 is configured to be detachable from the mounting plate 33, but the fixture 34 may be rotatably attached to the mounting plate 33.

  In the embodiment described above, the holding and fixing jig 32 is positioned on the fixing plate 31 and fixed with the bolts B. However, the holding and fixing jig 32 is attached to the antenna 20 along the rail provided on the fixing plate 31. It may be configured to move forward and backward. According to this, the distance between the antenna 20 and the holding fixture 32 can be easily adjusted.

  The radio wave absorber 13 is not limited to the above configuration. For example, a configuration in which a resistive film sheet (impedance 1088Ω), a spacer (38 mm), a resistive film sheet (impedance 280Ω), a spacer (38 mm), and a protective film (aluminum plate (foil)) are arranged in this order from the panel 11a or 12a side. It is good. According to such a configuration, two types of radio waves around 880 MHz and 2050 MHz can be absorbed.

  Moreover, the material of the housing | casing 11 is not restricted to aluminum etc. As long as it has electroconductivity, other materials, such as steel, stainless steel, and copper, may be sufficient.

  Also, a magnetic sheet 50 may be provided in the vicinity of the antenna 20 in the housing 11 as shown in FIG. In general, when an antenna is installed close to a metal object, re-radiation due to a soot current flowing through the metal object occurs, and this interferes with a radio wave to be properly radiated to the specimen, and has an adverse effect. This effect can be eliminated by providing the magnetic sheet 50 on the wall surface (on the side opposite to the specimen) on which is installed.

FIG. 1 is a front view of an electronic apparatus test apparatus. (A) is the II-II arrow directional cross-sectional view of FIG. 1, (b) is an expanded sectional view which shows the test box of (a) in the state which closed the door. It is a longitudinal cross-sectional view which shows the testing apparatus for electronic devices which concerns on this embodiment. FIG. 4 is a cross-sectional view taken along the line IV-IV of the electronic device test apparatus of FIG. 1. It is a figure which shows the positional relationship of the antenna for a measurement under test implementation, and the antenna of an electronic device, (a) is a figure which shows the positional relationship at the time of a vertical wave measurement, (b) is a figure which shows the positional relationship at the time of a horizontal wave measurement It is.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Test apparatus for electronic devices 10 Test box 11 Case 12 Door 12b Window 13 Wave absorber 14 EMI duct 15 LED lamp 20 Antenna 21 Connector 22 Antenna waveguide 30 Mounting unit 31 Fixing plate 32 Holding fixing jig 40 Test unit 41 Cable 42 Noise absorber

Claims (18)

A test box having an electronic device placed inside, a radio wave shielding property that absorbs radio waves radiated from inside and shields radio waves from outside,
A measuring antenna for transmitting and receiving radio waves to and from the antenna of the electronic device;
Holding means for holding the electronic device;
An electronic device testing apparatus comprising:
The measurement antenna is provided via an antenna waveguide rotatably provided on a side wall of the test box casing, and the antenna waveguide is rotated to change the direction of the antenna. Configured to be able to
The holding means includes a fixing plate provided so as to cover the entire floor of the housing, a holding fixing jig for holding and fixing an electronic device on the fixing plate, and a back plate of the holding fixing jig. A fixed mounting plate, and a fixture formed with an insertion portion for inserting and holding the electronic device,
The fixture is attached to the mounting plate so as to be rotatable, and can be attached by changing the direction and position of the attachment,
The holding and fixing jig is detachably fixed to a plurality of fixing positions of the fixing plate, the distance between the antenna of the electronic device and the antenna for measurement can be adjusted, and the antenna of the electronic device and the measurement The distance from the antenna is configured to be set larger than the wavelength λ of the radio wave radiated from the measurement antenna,
An apparatus for testing an electronic device, wherein the plane of polarization of a radio wave radiated from the antenna for measurement and the plane of polarization of a radio wave radiated from the antenna of the electronic device can be adjusted to be parallel. A test box having an electronic device placed inside, a radio wave shielding property that absorbs radio waves radiated from inside and shields radio waves from outside,
A measuring antenna for transmitting and receiving radio waves to and from the antenna of the electronic device;
Holding means for holding the electronic device;
An electronic device testing apparatus comprising:
The measurement antenna is provided via an antenna waveguide rotatably provided on a side wall of the test box casing, and the antenna waveguide is rotated to change the direction of the antenna. Configured to be able to
The holding means includes a fixing plate provided so as to cover the entire floor of the housing, a holding fixing jig for holding and fixing an electronic device on the fixing plate, and a back plate of the holding fixing jig. A fixed mounting plate, and a fixture formed with an insertion portion for inserting and holding the electronic device,
The fixture is attached to the mounting plate so as to be rotatable, and can be attached by changing the direction and position of the attachment,
The holding fixture is configured to be movable forward and backward with respect to the antenna along a rail provided on the fixing plate, the distance between the antenna of the electronic device and the antenna for measurement can be adjusted, and the electronic device The distance between the antenna and the measurement antenna can be set to be larger than the wavelength λ of the radio wave radiated from the measurement antenna,
An apparatus for testing an electronic device, wherein the plane of polarization of a radio wave radiated from the antenna for measurement and the plane of polarization of a radio wave radiated from the antenna of the electronic device can be adjusted to be parallel. The electronic apparatus test apparatus according to claim 1 , wherein a radio wave absorbing sheet having radio wave absorptivity is provided on an upper surface of the fixing plate . The electronic apparatus test apparatus according to claim 1 , wherein the fixing plate itself has a radio wave absorption structure .   5. The electronic apparatus testing apparatus according to claim 1, further comprising a λ / 4 type wave absorber inside the test box. 6.   6. The measurement antenna disposed in the test box is a fan antenna capable of transmitting and receiving radio waves in a high frequency band, according to any one of claims 1 to 5. Test equipment for electronic equipment.   7. The electron according to claim 1, wherein a magnetic tape is provided on an inner surface of the test box near the measurement antenna disposed in the test box. 8. Equipment testing equipment.   The test apparatus for an electronic device according to any one of claims 1 to 7, wherein the test box includes a metal casing having a radio wave shielding property.   The electronic apparatus testing apparatus according to claim 8, wherein the metal casing is configured by assembling a plurality of metal members, and the plurality of metal members are joined together by welding.   The electronic apparatus testing apparatus according to claim 8, wherein the metal casing is formed of aluminum or an aluminum alloy.   11. The electronic device testing apparatus according to claim 1, wherein the test box includes a window through which the electronic device can be visually recognized.   The test apparatus for an electronic device according to claim 11, wherein the window has a radio wave shielding property.   The test apparatus for an electronic device according to any one of claims 1 to 12, wherein the test box has a door that can be freely opened and closed.   14. The electron according to claim 1, wherein the test box includes an EMI duct that enables a cable to be wired from the outside of the box to the inside of the box while preventing electromagnetic interference. Equipment testing equipment.   15. The electronic device according to claim 14, wherein a cable is disposed from outside the box to the inside of the box via the EMI duct, and the cable is covered with a noise absorber that absorbs noise. Test equipment.   The electronic apparatus test apparatus according to claim 1, wherein illumination is provided inside the test box.   17. An electronic device test method using the electronic device test apparatus according to claim 1, wherein a distance between the measurement antenna and the antenna of the electronic device is determined from the measurement antenna. An electronic device testing method, wherein the test is performed by setting a wavelength larger than the wavelength λ of the radiated radio wave and receiving the radio wave with an antenna of the electronic device.   18. The electronic device test method according to claim 17, wherein the frequency of the radio wave radiated from the measurement antenna is 0.8 to 6.0 GHz.

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