CN101688891A - Electronic apparatus testing device and electronic apparatus testing method - Google Patents

Electronic apparatus testing device and electronic apparatus testing method Download PDF

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Publication number
CN101688891A
CN101688891A CN200880001281A CN200880001281A CN101688891A CN 101688891 A CN101688891 A CN 101688891A CN 200880001281 A CN200880001281 A CN 200880001281A CN 200880001281 A CN200880001281 A CN 200880001281A CN 101688891 A CN101688891 A CN 101688891A
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CN
China
Prior art keywords
electronic apparatus
testing device
machine
apparatus testing
chamber
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Pending
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CN200880001281A
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Chinese (zh)
Inventor
笹田雅昭
长嶋道夫
内田胜也
青木一男
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Nippon Light Metal Co Ltd
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Nippon Light Metal Co Ltd
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Publication date
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Publication of CN101688891A publication Critical patent/CN101688891A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

Abstract

Provided is an electronic apparatus testing device capable of precisely and consecutively testing the operation of many electronic apparatuses such as cellular phones. The electronic apparatus testingdevice (1) has a test box (10) for testing the electronic apparatuses (P), waveguides (20A, 20B) which communicate the outside and inside of the test box (10) with each other and have slide doors (23) for blocking radio waves from the outside by closing their opening parts at least when performing the test, and a belt conveyer (30) having a belt (31) for conveying the electronic apparatuses (P).The electronic apparatus testing device is characterized in that the belt (31) can pass through the insides of the waveguides (20A, 20B) to convey the electronic apparatuses (P) into the test box (10)and out of the same.

Description

Electronic apparatus testing device and electronic apparatus testing method
Technical field
The present invention relates to can be accurate and continuously e-machines such as a plurality of portable phones are moved the electronic apparatus testing device and the e-machine test method of test.
Background technology
E-machines such as portable phone are after the manufacturing or after repairing, utilize sometimes radio magnetic wave can regular event to it or performance function carry out wireless connections and test (hereinafter referred to as " test ").Present stage, in order to carry out the test of correct received signal ability, in the large-scale particular room that shields being called as of external electromagnetic ripple no electromagnetic response chamber (electromagnetic wave darkroom) or the inside that is called as shielding box (electromagnetic wave shielding case) carry out this test.
For example, Japanese kokai publication hei 5-249163 communique (claim 1,0008 section, Fig. 1) in, disclosing has following electromagnetic wave darkroom device, this electromagnetic wave darkroom device comprises: the metal combined shielding case that electromagnetic wave absorb is installed at inside surface; Be arranged on a side of this case and have the window portion of the lid of high shield effectiveness; The aerial line of test that is provided with in case, in the position relative with window portion; With with the perpendicular and door that can take off configuration, the side that is arranged on the side etc. in the side with window portion.
In addition, in TOHKEMY 2006-153841 communique (claim 1,0045 section, Fig. 1, Fig. 3), disclosing has following electronic apparatus testing case, and this electronic apparatus testing case comprises: the chamber body with electromagnetic wave shielding performance and electromagnetic wave absorbability; Be fixed on front one side of chamber body, the outside of connection test case body and two inner hands insert uses waveguide; Be arranged on the chamber body window that can its inside of visualization with electromagnetic wave shielding performance; Be configured in the inside of chamber body, and carry out the antenna of electromagnetic wave transmitting-receiving between the e-machine; With the inside that is configured in the chamber body, the cable that is connected with e-machine.
According to above-mentioned prior art, can test the action of e-machine by platform simply.The electronic apparatus testing case of putting down in writing in TOHKEMY 2006-153841 communique particularly, it has following advantage, Yi Bian that is: the laboratory technician can directly handle e-machine, Yi Bian critically e-machine is tested.Yet, such prior art must repeat following operation, that is: put into after e-machine tests in the inside of combined shielding case or chamber body, e-machine after the test need be fetched into the outside, put into another e-machine again, so, be suitable for situation about the action of e-machine being tested by platform, be not suitable in that the situation that the action of a plurality of e-machines is tested is next.
Summary of the invention
Therefore, the present invention proposes in order to address the above problem, its purpose be to provide a kind of can be accurate and continuously e-machines such as a plurality of portable phones are moved the electronic apparatus testing device and the e-machine test method of test.
As the means that are used for addressing the above problem, a first aspect of the present invention is a kind of electronic apparatus testing device, comprising: the chamber that e-machine is tested; Passage, the described chamber of this channel connection outside and inner, and have at least that shielding comes from outside electromagnetic electromagnetic wave screen unit when testing; With the conveyance unit, conveying unit with the described e-machine of conveyance, this electronic apparatus testing device is characterised in that: described conveying unit constitutes can be by the inside of described passage, described e-machine can be moved into described chamber, and described e-machine can be taken out of from described chamber.
According to this electronic apparatus testing device, owing to moved into the inside of chamber continuously by the inside of passage as the e-machine of subjects, and the e-machine after the test is taken out of from chamber continuously, so can test the action of a plurality of e-machines continuously.And, have and when testing, shield external electromagnetic electromagnetic wave screen unit at least owing to possess passage and this passage, so can critically the action of e-machine be tested under the state of chamber to electromagnetic wave shielding performance keeping.
Wherein, in the present invention, so-called " chamber " also comprises can the come in and go out large-scale house of its inside of the laboratory technician as electromagnetic wave darkroom and so on.
A second aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, the inboard of above-mentioned passage has electromagnetic wave absorbability.
According to this electronic apparatus testing device, utilize the electromagnetic wave absorbability of the inboard of passage to be absorbed in the electromagnetic wave of hollow bulb (inside) transmission of passage, thereby keep the electromagnetic wave shielding performance in the chamber well.
A third aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned passage is made of a pair of entrance side passage and outlet side passage, and above-mentioned entrance side passage and outlet side passage are configured along straight line.
According to this electronic apparatus testing device, the conveyance configuration of cells of linearity can be become the outside and inner of connection test case, can be when the e-machine before will testing continuously to be moved into the inside of chamber, the e-machine after will testing is continuously taken out of the outside of chamber.
A fourth aspect of the present invention is characterised in that: to the either side in the third aspect in the described electronic apparatus testing device, above-mentioned electromagnetic wave screen unit comprises the curtain that is formed by conductive fabric in first aspect.
According to this electronic apparatus testing device, to will be in the hollow bulb (inside) of the outside of connection test case and inner passage transmission electromagnetic, from the inside of chamber to the transmission degree of outside and from the outside of chamber to the transmission degree of inside, with compare under the situation that does not have curtain, can make its further reduction.That is, because being configured the metal ingredient diffraction of the conductive fabric of curtain, the electromagnetic part of hollow bulb (inside) that will be by passage loses, so can reduce electromagnetic transmission degree.So-called conductive fabric is meant the cloth that comprises metal ingredient, particularly, can list the cloth that the composition fiber by metal fibre and macromolecular fibre constitutes, the cloth that is made of the macromolecular fibre of the metal of plating Ni or Cu etc. etc.
Wherein, so-called diffraction loss is meant that electromagnetic wave is reflected by the metal ingredient of the metal fibre or the coat of metal etc., causes being difficult to the phenomenon in electromagnetic wave direct of travel (be the rear side of curtain this moment) propagation.
In addition, because curtain is soft cloth, therefore can in chamber, moves into or take out of in the mode that can not damage e-machine to these e-machines.
A fifth aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned electromagnetic wave screen unit comprises the door part that the action interlock with above-mentioned conveying unit opens and closes above-mentioned passage.
According to this electronic apparatus testing device, compare with the situation that does not possess door part, can further make in the hollow bulb (inside) of the outside of connection test case and inner passage, propagate electromagnetic, from the inside of chamber to the transmission degree of outside and from the outside of chamber to the transmission degree reduction of inside.
A sixth aspect of the present invention is characterised in that: aspect the 5th in the described electronic apparatus testing device, above-mentioned door part comprises a body and the rubber-like electromagnetic wave absorb that sticks on this body, wherein, still aluminium sheet or aluminium alloy plate constitute above-mentioned door body.
According to this electronic apparatus testing device, the door body that the electromagnetic part of hollow bulb (inside) that will be by passage is made of aluminium sheet or aluminium alloy plate is reflected, and the rubber-like electromagnetic wave absorb that is secured on the body absorbs, so can reduce electromagnetic transmission degree.
A seventh aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned passage is the waveguide that the long electromagnetic wave of wavelength ratio provision wavelengths is not propagated.
According to this electronic apparatus testing device, do not propagate the long electromagnetic waveguide of wavelength ratio provision wavelengths as passage owing to dispose, so, even under the situation that does not have above-mentioned curtain or door part, also can absorb the long electromagnetic wave of wavelength ratio provision wavelengths that in the hollow bulb (inside) of waveguide (passage), to propagate reliably, thereby can keep the shielding electromagnetic waves of chamber suitably.In addition, by using above-mentioned curtain, door part simultaneously, can further keep the shielding electromagnetic waves of chamber well.
So-called " do not propagate wavelength ratio provision wavelengths long electromagnetic wave " is meant " can not decay with the electromagnetic wave of wavelength below provision wavelengths, the specification that can propagate well of portion designs " within it.
A eighth aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned chamber is made of the metal framework with electromagnetic wave shielding performance.
According to this electronic apparatus testing device, can utilize metal framework shielding electromagnetic wave reliably with electric conductivity.In addition because be metal, so that the rigidity of framework is improved, its result can make the permanance of chamber be improved.
A ninth aspect of the present invention is characterised in that: in the described electronic apparatus testing device of eight aspect, above-mentioned metal framework is assembling many metal parts and constituting, and these many metal parts engage by welding each other.
According to this electronic apparatus testing device, can assemble many metal parts suitably, thereby be easy to constitute the framework of required form.In addition, because be by engaging many metal parts, will be so can shield reliably by the electromagnetic wave of bonding part, thus prevent that reliably electromagnetic wave from leaking between chamber inside and outside.
A tenth aspect of the present invention is characterised in that: in the described electronic apparatus testing device, at least one in above-mentioned metal framework and the above-mentioned passage formed by aluminium or aluminium alloy aspect eight aspect or the 9th.
According to this electronic apparatus testing device, can make at least one the realization lightweight in metal framework and the passage.
A eleventh aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned chamber has can be visually observed its inner window portion.
According to this electronic apparatus testing device, can be in the test of carrying out e-machine, through window portion thus from the outside Visual Confirmation of the chamber running-active status etc. of the e-machine of the inside of chamber for example.
A twelveth aspect of the present invention is characterised in that: the tenth on the one hand in the described electronic apparatus testing device, above-mentioned window portion has shielding electromagnetic waves.
According to this electronic apparatus testing device, because window portion has shielding electromagnetic waves, so can keep the shielding electromagnetic waves of chamber suitably.
A thirteenth aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned chamber have can freely openable door.
According to this electronic apparatus testing device,, e-machine etc. is is freely come in and gone out by opening and closing the door of chamber aptly.
A fourteenth aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, in the inside of above-mentioned chamber, be provided with and above-mentioned e-machine between the transmitting-receiving electromagnetic mensuration antenna.
According to this electronic apparatus testing device,, can between measuring, carry out electromagnetic transmitting-receiving with antenna and e-machine in the inside of chamber.
A fifteenth aspect of the present invention is characterised in that: aspect the 14 in the described electronic apparatus testing device, said determination can be rotated around axle with antenna, makes from said determination parallel or vertical with the electromagnetic plane of polarization of launching from the antenna of above-mentioned e-machine with the electromagnetic plane of polarization of antenna emission.
According to this electronic apparatus testing device, can be rotated adjustment to the axle of measuring with antenna, make from measuring parallel or vertical with the electromagnetic plane of polarization of launching from the antenna of e-machine with the electromagnetic plane of polarization of antenna emission.Thus, no matter be under the environment of the easy received signal of antenna of utilizing e-machine, still be difficult under the environment of received signal at the antenna that utilizes e-machine, can both set simply from measuring electromagnetic electric field change with the antenna emission.
So-called plane of polarization is meant the vibration plane of the ripple of electric field in electromagnetic wave, and it has certain plane electromagnetic wave and is called as linearly polarized wave.From the electromagnetic wave of common antenna emission all is linearly polarized wave.
A sixteenth aspect of the present invention is characterised in that: aspect the 14 or in the described electronic apparatus testing device in the 15 aspect, said determination is from more than the electromagnetic wavelength X of said determination with the antenna emission with the distance between the antenna of antenna and above-mentioned e-machine.
According to this electronic apparatus testing device, can be in the inside of chamber, the antenna of configuration e-machine can carry out the test of e-machine in the stable position of electric field intensity in the zone of remote electromagnetic field.Thus, can critically carry out the test of e-machine.
Wherein, so-called remote electromagnetic field zone is meant that wave impedance equals the wave impedance Z in space 0The zone.From measure electromagnetic wave with the antenna emission in this zone to approach the form transmission of plane wave.
A seventeenth aspect of the present invention is characterised in that: aspect the 14 in the described electronic apparatus testing device, dispose the magnetic sheet material at the said determination of the inside surface of above-mentioned chamber near with antenna.
According to this electronic apparatus testing device, can suppress to prevent from effectively to produce vortex flow in the inside of chamber from the mensuration of the inside that is configured in chamber the caused electromagnetic induction of electromagnetic wave with the antenna emission.
A eighteenth aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned conveying unit has a plurality of holding units that are used for keeping above-mentioned e-machine, and above-mentioned holding unit comprises the joint that is connected and above-mentioned cable is electrically connected with above-mentioned e-machine with an end of cable.
According to this electronic apparatus testing device, since conveying unit have a plurality of be used for keeping e-machine holding unit, so, by e-machine is placed on the holding unit, the test of the action of e-machine is carried out in the inside that e-machine can be provided with in proper order and continuous and regularly move into chamber according to it.
In addition, because holding unit comprises the joint that is connected and cable is electrically connected with e-machine with an end of cable, so, by e-machine is arranged on the holding unit, e-machine is connected with joint, e-machine is electrically connected with cable by this joint.
A nineteenth aspect of the present invention is characterised in that: in the described electronic apparatus testing device of the tenth eight aspect, the noise absorption body that above-mentioned cable is absorbed noise covers.
According to this electronic apparatus testing device, owing to cable is covered by the noise absorption body, thus can absorb the noise that produces by cable in test effectively, thus can critically test e-machine.
A twentieth aspect of the present invention is characterised in that: aspect the tenth eight aspect or the 19 in the described electronic apparatus testing device, above-mentioned cable is set up with the above-mentioned holding unit adjacency that is arranged on above-mentioned conveying unit, have terminal at the other end opposite with an above-mentioned end, above-mentioned terminal is connected when testing at least with the outside terminal that is connected with the test unit of judging above-mentioned e-machine state.
According to this electronic apparatus testing device, cable has terminal at the other end with an end opposition side that is connected holding unit, this terminal is connected with outside terminal on the test unit that is connected the state of judging e-machine when testing at least, therefore, can confirm whether the action of e-machine is normal via cable, and can send various indications to e-machine and make its action.
The of the present invention the 20 is characterised in that on the one hand: in the described electronic apparatus testing device of the tenth eight aspect, and the travelling belt of above-mentioned conveying unit for constituting by the rubber-like electromagnetic wave absorb.
According to this electronic apparatus testing device, because conveying unit is the travelling belt that is made of the rubber-like electromagnetic wave absorb, thus can absorb the noise that produces from cable in test, thus the test that can critically carry out to e-machine.
The 22 aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned passage has shielding and comes from outside electromagnetic metal wave filter below the above-mentioned conveying unit by its inside
According to this electronic apparatus testing device, come from outside electromagnetic metal wave filter owing to below the conveying unit of the inside by passage, have to be used to shield, thus can further reduce will the internal delivery of the outside of connection test case and inner passage electromagnetic, from the outside of chamber to the transmission degree of inside.
The 23 aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, at least one in above-mentioned chamber and the above-mentioned passage has the electromagnetic wave absorb of λ/4 types in inside.
According to this electronic apparatus testing device, because have the electromagnetic wave absorb of λ/4 types, so can absorb effectively in test from measuring electromagnetic wave with the antenna emission.Thus, electromagnetic resonance effect can be prevented, the test of e-machine can be critically carried out.
Wherein, so-called electromagnetic resonance effect is meant, in the inside of the chamber with electromagnetic wave shielding performance, when from measuring when launching electromagnetic wave with antenna, electromagnetic wave is caused the phenomenon of interference by the reflection of the wall of the inside of repetition test case.
The 24 aspect of the present invention is characterised in that: in the described electronic apparatus testing device of first aspect, above-mentioned chamber portion within it has lighting device.
According to this electronic apparatus testing device, can throw light on to the inside of chamber.Be preferably LED lamp (LED light lamp) as lighting device.The LED lamp is different with fluorescent light, and it is luminous and produce noise when extinguishing hardly.
The present invention the 25 aspect provides a kind of e-machine test method of using the described electronic apparatus testing device of first aspect, it is characterized in that, comprises the steps: successively a plurality of e-machines to be positioned on the above-mentioned conveying unit of above-mentioned conveyance unit; Described e-machine is moved into the assigned position of the inside of above-mentioned chamber; Above-mentioned e-machine is tested; And utilize above-mentioned conveyance unit above-mentioned e-machine to be taken out of the outside of above-mentioned chamber.
According to this e-machine test method, by using above-mentioned electronic apparatus testing device, successively a plurality of e-machines are positioned in the conveying unit of conveyance unit, move into the assigned position of the inside of chamber, e-machine is tested, afterwards, utilized the conveyance unit e-machine to be taken out of the outside of above-mentioned chamber, thus, can test the action of a plurality of e-machines continuously.
In addition, according to this e-machine test method, because above-mentioned electronic apparatus testing device comprises passage, and this passage has can shield the electromagnetic electromagnetic wave screen unit that comes from the outside at least when testing, so can critically carry out the test of the action of e-machine under the state of the shielding electromagnetic waves of keeping chamber.
According to the present invention, a kind of electronic apparatus testing device and e-machine test method can be provided, it can be accurate and carries out the test of the action of e-machines such as a plurality of portable phones continuously.
Description of drawings
Fig. 1 is the stereographic map of an embodiment of expression electronic apparatus testing device of the present invention.
Fig. 2 is the sectional view of electronic apparatus testing device on the X-X direction shown in Figure 1.
Fig. 3 is the sectional view of electronic apparatus testing device on the Y-Y direction shown in Figure 1.
Fig. 4 is the sectional view that is illustrated in the electromagnetic wave absorb that forms on the inside surface of chamber of the electronic apparatus testing device that constitutes an embodiment.
Fig. 5 is the sectional view of electronic apparatus testing device on the Z-Z direction shown in Figure 1.
Fig. 6 is the front view (FV) of peristome of outer side of the waveguide of the expression electronic apparatus testing device that constitutes an embodiment.
Fig. 7 (a) and (b) be the sectional view of the sliding gate of the expression electronic apparatus testing device that constitutes an embodiment.
Fig. 8 is the stereographic map of the belt conveyer of the expression electronic apparatus testing device that constitutes an embodiment.
Fig. 9 is the figure of action that is used for illustrating the electronic apparatus testing device of an embodiment, (a) is the sectional view of chamber and waveguide; (b) be the outboard profile of the end of belt conveyer; (c) be the planimetric map of the end of belt conveyer.
Figure 10 is the figure of action that is used for illustrating the electronic apparatus testing device of an embodiment, (a) is the sectional view of chamber and waveguide; (b) be the outboard profile of the end of belt conveyer; (c) be the planimetric map of the end of belt conveyer.
Figure 11 is the figure of action that is used for illustrating the electronic apparatus testing device of an embodiment, (a) is the sectional view of chamber and waveguide; (b) be the outboard profile of the end of belt conveyer; (c) be the planimetric map of the end of belt conveyer.
Figure 12 is the figure of action that is used for illustrating the electronic apparatus testing device of an embodiment, (a) is the sectional view of chamber and waveguide; (b) be the outboard profile of the end of belt conveyer; (c) be the planimetric map of the end of belt conveyer.
Figure 13 (a) is the sectional view of the shutter door of the expression electronic apparatus testing device that constitutes variation; (b) be the stereographic map of the shutter door of the expression electronic apparatus testing device that constitutes variation.
Figure 14 (a) is the stereographic map of the shutter door of the expression electronic apparatus testing device that constitutes another variation; (b) be the stereographic map of the sliding gate of the expression electronic apparatus testing device that constitutes another variation.
Symbol description
1: the electronic apparatus testing device; 10: chamber; 11: framework; 11a: plate (metal parts); 12: door; 12b: window portion; 13: electromagnetic wave absorb; 14: antenna; 14c: magnetic sheet; 15:LED lamp (lighting device); 20A, 20B: waveguide (passage); 22: electromagnetic wave absorb; 23: sliding gate (door part, electromagnetic wave screen unit); 23a: door body; 23b: rubber-like electromagnetic wave absorb; 24: curtain (electromagnetic wave screen unit); 25: wave filter; 30: belt conveyer (conveyance unit); 31: travelling belt (conveying unit); 33: holding unit; 33a: joint (connect); 34: cable; 40: test unit; P: e-machine; RT: outside terminal; T: terminal
Embodiment
Below, with reference to suitable accompanying drawing an embodiment of the invention are described.
Fig. 1 is the stereographic map of an embodiment of expression electronic apparatus testing device.Fig. 2 is the sectional view of electronic apparatus testing device on the X-X direction shown in Figure 1, and Fig. 3 is the sectional view of electronic apparatus testing device on the Y-Y direction shown in Figure 1.Fig. 4 is the sectional view that is illustrated in the electromagnetic wave absorb that forms on the inside surface of chamber.Fig. 5 is the sectional view of electronic apparatus testing device on the Z-Z direction shown in Figure 1.Fig. 6 is the front view (FV) of peristome of the outer side of expression waveguide.(a) of Fig. 7 and (b) be the expression sliding gate sectional view.Fig. 8 is the stereographic map of expression belt conveyer.
[electronic apparatus testing device]
As shown in Figure 1, electronic apparatus testing device 1 mainly comprises: the chamber 10 that e-machine P is tested; The outside of connection test case 10 and inner and become waveguide 20A, the 20B of the passage of e-machine P; And belt conveyer 30 as the conveyance unit with travelling belt 31 (conveying unit) of conveyance e-machine P.
＜chamber 〉
As shown in Figure 1 to Figure 3, chamber 10 comprises: metal framework 11; Be arranged on the door 12 on the sidewall of framework 11; Be arranged on the electromagnetic wave absorb 13 on the inside surface of framework 11 and door 12; Be arranged on the antenna 14 of the upper wall of framework 11; With LED lamp 15 (with reference to Fig. 5).
Framework 11 is that the metal plate 11a of multi-disc is welded on as on the framework (not shown) of skeleton and form and roughly be cubical case shape.Because framework 11 is to be formed by metal plate 11a and framework (not shown) with electric conductivity, so have the rigidity that shielding comes from outside shielding electromagnetic waves and has regulation, its permanance increases.In addition, because multi-disc plate 11a and framework (not shown) be bonded together by welding, thus improved the leakproofness of framework 11, promptly to shielding electromagnetic waves.
Form the metal of plate 11a and framework (not shown), there is no particular limitation in the present invention, for example not only can be simple metal, also can be alloy.Wherein, particularly, can when keeping desired stiffness, realize the lightweight of framework 11 using aluminium or aluminium alloy to make under the situation of plate 11a, framework (not shown).In addition, because aluminium or aluminium alloy have special gloss, so can make framework 11 (chamber 10) have zingy outward appearance.
As shown in Figure 3, door 12 is that the plate 12a that is made of metal forms, and (with reference to Fig. 1) offers fenestrate 12b above the front view of this plate 12a.
Plate 12a can be installed in the side of framework 11 freely to rotate via hinge 11b, and door 12 forms the structure that can open and close suitably.Wherein, preferably when door 12 is closed, be provided with pad (packing) 11c of frame shape, for example conducting rubber pad etc. with electromagnetic wave shielding performance in the framework 11 (plate 11a) and the contact portion of door 12 (plate 12a).Can when door 12 closures, keep 10 pairs of shielding electromagnetic waves of chamber suitably thus.
The glass plate of the rectangle with transparency is installed by framework 12c on the 12b of window portion.Thus, on one side can carry out the test of e-machine P, Yi Bian whether the inside of Visual Confirmation chamber from the outside 10 for example, can Visual Confirmation exists owing to receiving electromagnetic wave to make the received signal lamp situation such as light.
In addition, because having, glass plate is used to the electromagnetic reflectivity (shielding) that prevents that electromagnetic wave from coming and going via the 12b of this window portion, so can keep 10 pairs of shielding electromagnetic waves of chamber suitably.As such 12b of window portion, for example can use on a face, to be formed with ITO (Indium Tin Oxide: the glass plate of film tin indium oxide).
Wherein, when the electromagnetic wave from e-machine P or antenna 14 emissions shines directly on the 12b of window portion (glass plate), because electromagnetic wave is reflected by the surface of the 12b of window portion (glass plate), become the reason of the resonance effect that generates electromagnetic waves in the inside of chamber 10, so, the preferred 12b of window portion be arranged on as much as possible from the electromagnetic wave irradiation of e-machine P or antenna 14 emissions less than the position.
Framework 12c is metal members of frame, is welded on the plate 12a in the mode of the circumference that covers the window 12b of portion.Preferably the contact portion at this framework 12c and the 12b of window portion (glass plate) is provided with the pad (not shown) with electromagnetic wave shielding performance.Thus, shielding electromagnetic waves can be guaranteed, thereby the electromagnetic wave shielding performance of chamber 10 can be kept suitably at the circumference of the 12b of window portion (glass plate).
Wherein, preferred plate 12a is identical with framework 11 with framework 12c, is formed by aluminium or aluminium alloy.Above-mentioned framework 11 (plate 11a) and door 12 (plate 12a) also play a role as the part of electromagnetic wave absorb 13 described later.
For electromagnetic wave absorb 13, it is according to the structure based on the electromagnetic known mode of absorption (λ/4 types), as Fig. 2, shown in Figure 3, mode with the inside surface of cover butter case 10 (framework 11 and door 12) forms, and the inside surface of chamber 10 is no longer reflected from the electromagnetic wave of e-machine P, antenna 14 emissions simulate its absorption.That is, electromagnetic wave absorb 13 can prevent to resonate from the electromagnetic wave and the electromagnetic wave that is reflected by the inside surface of chamber 10 of e-machine P, antenna 14 emissions.
As shown in Figure 4, the structure of electromagnetic wave absorb 13 comprises: plate 11a (perhaps plate 12a); Be configured in the distance piece 13a of its inner surface side; Further be configured in its inner surface side, have the resistance diaphragm 13b that makes electromagnetic 1/2 function that sees through; Further be configured in its inner surface side, be used for the diaphragm 13c of protective resistance diaphragm 13b.
For distance piece 13a, be under the situation of λ at electromagnetic wavelength from e-machine P or antenna 14 emissions, the thickness D that it has λ/4 is used for the interval between resistance diaphragm 13b and the plate 11a (or plate 12a) is set at λ/4.As long as distance piece 13a have the electromagnetic wave permeability then no matter by which kind of material form all can, for example, can form by foamed styrene etc.Wherein, under the situation that distance piece 13a is formed by foamed styrene, can regulate its thickness D at an easy rate.
For resistance diaphragm 13b, it is the thin slice that is adjusted to the impedance (376.7 Ω) that its sheet resistance value is substantially equal to free space.Resistance diaphragm 13b as such for example, can use suitably carbonaceous conductive coating is coated in on-chip diaphragm, perhaps regulates the resistance value of ITO film and diaphragm of film forming etc.
Diaphragm 13c is layered in the inner surface side of resistance diaphragm 13b, is used for the surface of protective resistance diaphragm 13b.This diaphragm 13c for example can be formed by polyethylene terephthalate (PET), polycarbonate (PC), polyoxymethylene (POM), Polyvinylchloride (PVC), tygon (PE) etc.
At this, illustrate by the electromagnetic principle of electromagnetic wave absorb 13 absorptions with reference to Fig. 4.Wherein, oversimplify, the situation from the electromagnetic wave W1 of e-machine P or antenna 14 emissions from the vertical direction incident of diaphragm 13c is described in order to make explanation.
Among the electromagnetic wave W1 that sees through inciding diaphragm 13c, the electromagnetic wave that order sees through resistance diaphragm 13b is W2, and order is W3 by the electromagnetic wave of resistance diaphragm 13b reflection.The electromagnetic wave W2 that sees through resistance diaphragm 13b is after the inside that enters distance piece 13a, by plate 11a (perhaps plate 12a) reflection (with this as electromagnetic wave W4).Wherein, by resistance diaphragm 13b or plate 11a reflex time, electromagnetic phase place is reversed respectively.
Arrived the electromagnetic wave W4 of resistance diaphragm 13b by plate 11a (perhaps plate 12a) reflection, with respect to the electromagnetic wave W3 that is reflected by resistance diaphragm 13b, the advanced twice of distance piece 13a thickness D, i.e. " λ/4 * 2=λ/2 ", the phase place of electromagnetic wave W3 is opposite with the phase place of electromagnetic wave W4.Thus, electromagnetic wave W3 and electromagnetic wave W4 cancel each other, and its result absorbs the electromagnetic wave W1 that incides on the resistance diaphragm 13b with simulateding.
In addition, in such electromagnetic wave absorb 13, being λ/4 as long as the interval between resistance diaphragm 13b and the plate 11a (or plate 12a) can be set at, is that the distance piece 13a of λ/4 is also passable even if then there is not thickness D.But it is necessary can seeing through electromagnetic wave between resistance diaphragm 13b and plate 11a (perhaps plate 12a).
Antenna 14 be used for and e-machine P between receive and dispatch electromagnetic wave, as shown in Figure 2, this antenna 14 is set at waveguide 14a in the through hole on the upper wall that is formed at framework 11 via antenna.Antenna 14 is connected with an end of cable (not shown), and this cable (not shown) is led to the outside of antenna with waveguide 14a, and its other end is connected with electromagnetic wave Transmit-Receive Unit (not shown).Electromagnetic wave Transmit-Receive Unit (not shown) can use to have electromagnetic wave is transmitted on the antenna 14, controls this electromagnetic frequency band, output etc., the well known device of the function that the electromagnetic wave that comes from e-machine P that antenna 14 is received is measured.
Wherein, for the distance of the antenna (not shown) of e-machine P and antenna 14, be preferably set to, more preferably be set at more than 2 λ from more than the electromagnetic wavelength λ of e-machine P or antenna 14 emissions.Thus, the antenna (not shown) of e-machine P can be configured in the zone of remote electromagnetic field, can carry out the test of e-machine P, so can critically carry out the test of e-machine P in the stable position of electric field intensity.
For waveguide 14a, its cross section is rounded for antenna, and an end (inside of chamber 10) bends to the L font, and for example, it is the metal cylindrical body that is formed by aluminium or aluminium alloy, has shielding electromagnetic waves.This antenna is outside and inner with waveguide 14a connection test case 10, and empty therein portion (inside) is equipped with the cable (not shown) that is connected with antenna 14.In addition, be fixed with the ground plate 14b of rectangle with the leading section (private side of chamber 10) of waveguide 14a at antenna.
Antenna is to set according to the electromagnetic wavelength of not portion's propagation within it with the specification of waveguide 14a.Particularly, antenna is set with internal diameter and the length of waveguide 14a, make the long electromagnetic wave of wavelength ratio provision wavelengths not within it portion propagate.Thus, can keep 10 pairs of shielding electromagnetic waves of chamber suitably.Wherein, generally speaking, if the shape and size of its peristome of waveguide are identical, then the length of waveguide is long more just high more to the shielding electromagnetic waves performance.In addition, also relevant with the shape of the peristome of waveguide, the area of peristome is more little, and the electromagnetic limiting frequency that waveguide can shield (frequency of regulation) is just high more.
Antenna is not defined as circle with the cross section of waveguide 14a, for example can be polygon yet.
Antenna runs through with waveguide 14a in the through hole that is arranged on the upper wall that is formed at framework 11, can serve as that axle is rotated (with reference to Fig. 5) with the axle of vertical direction.Near the end of antenna, be connected with the known driver element (not shown) that mainly comprises power source (for example motor etc.), Poewr transmission mechanism (for example gear or band etc.), control gear (sense of rotation of control antenna and rotational speed etc.) with the outer side of waveguide 14a.Thus, can rotate the axle of adjusting antenna 14, make from the electromagnetic plane of polarization of antenna 14 emissions parallel or vertical with the electromagnetic plane of polarization of launching from the antenna (not shown) of e-machine P.
Wherein, the rotation adjustment of the axle of antenna 14 is not limited thereto, for example also can be by manually adjusting.
In addition, as shown in Figure 5, preferably near the antenna 14 of the upper wall of framework 11, be provided with magnetic sheet 14c.Generally speaking,, cause electromagnetic emission once more etc. in metal object, and impact with respect to the electromagnetic wave interference of launching suitably for the examination body thereby flowing of vortex flow then can be taken place if antenna is provided with near metal object.Therefore, by be provided with the wall of antenna (with for examination body relative wall, promptly this wall with for the examination body between antenna is being set) on the magnetic sheet is set, can reduce this influence.
LED lamp 15 is the lighting devices that are used for illuminating the inside of chamber 10, and as shown in Figure 5, it is set at the upper wall of framework 11.Thus, for example e-machine P is being carried out duration of test,, making to be easy to Visual Confirmation e-machine P by illuminating the inside of chamber 10.LED lamp 15 is different with fluorescent light owing to produce interference when extinguishing hardly lighting, so can be suitably as the interior lighting of chamber 10.
Wherein, be provided with position, its configuration, the number etc. of LED lamp 15 can suitably be set, and are not limited in the structure shown in Fig. 5.In addition, illuminating the lighting device of the inside of chamber 10, also be not limited to LED lamp 15, for example also can be Halogen lamp LED or incandescent lamp etc.
Chamber 10 as described above, owing to have from the shielding electromagnetic waves of outside and absorb electromagnetic electromagnetic wave absorbability (electromagnetic wave absorb 13) by internal emission, arrive the inside of chamber 10 so can prevent the electromagnetic wave that externally produces, and can be absorbed in the inner electromagnetic wave that produces (from the electromagnetic wave of e-machine P, antenna 14 emissions), can prevent the resonance that causes because of electromagnetic reflection thus.
＜waveguide 〉
As Fig. 2, shown in Figure 3, waveguide 20A, 20B are the outside and inner passages of connection test case 10, and e-machine P is moved into chamber 10 by the inside of waveguide 20A, 20B and taken out of from chamber 10.Waveguide 20A, 20B have the electromagnetic characteristic of not transmitting wavelength ratio provision wavelengths length.
Waveguide 20A and 20B are configured on the straight line,, waveguide 20A are fixed on the side of relative sidewall of chamber 10 to the outstanding mode in the inside of chamber 10 with waveguide 20A, a 20B end separately, and waveguide 20B is fixed on the opposing party's sidewall.
Wherein, in the present embodiment, make entrance side passage from e-machine P to chamber 10 that move into as waveguide 20A, order is taken out of the outlet side passage of e-machine P as waveguide 20B from chamber 10.
For waveguide 20A, 20B, it comprises respectively separately: waveguide body 21; Be arranged on the electromagnetic wave absorb 22 on the inside surface of waveguide body 21; Be arranged on the sliding gate 23 on the peristome 21a of waveguide body 21; Be arranged on a plurality of curtains 24 of the inside of waveguide body 21; And be arranged on wave filter 25 on peristome 21a, the 21b of waveguide body 21.
As shown in Figure 6, for waveguide body 21, its cross section is rectangular, for example, is the metal cylindrical body that is formed by aluminium or aluminium alloy, has shielding electromagnetic waves.Because waveguide body 21 connection test casees 10 is outside and inner, so, can e-machine P be moved into or take out of chamber 10 via its hollow space (inside).
Wherein, in the present embodiment, in the openings at two ends portion as the waveguide body 21 of cylindrical body, order is positioned at the peristome of outside of chamber 10 as peristome 21a, and order is positioned at the peristome of inside of chamber 10 as peristome 21b.
Constitute the limit S1 and the limit S2 of the square-section of waveguide body 21, be based on not at the electromagnetic wavelength of the conducted inside of waveguide body 21 and set.Particularly, the limit S1 and the limit S2 of waveguide body 21 set, make that the long electromagnetic wave of wavelength ratio provision wavelengths can not be in the conducted inside of waveguide body 21.Thus, propagate via the hollow space of waveguide body 21 owing to can prevent the long electromagnetic wave of wavelength ratio provision wavelengths, so can keep the electromagnetic wave shielding performance of chamber 10 suitably.
Wherein, if the shape and size of peristome are identical, then the length of waveguide is long more, just high more to the shielding electromagnetic waves performance, the area of peristome is more little, and the electromagnetic frequency limit that waveguide can shield is just high more, and this is identical with the antenna that illustrates previously with waveguide 14a.
The cross section of waveguide body 21 is not limited to rectangle, for example, also can be circular or the polygon except that rectangle.
Electromagnetic wave absorb 22 forms in the mode of the inside surface that covers waveguide body 21, will improve the electromagnetic non-propagated of waveguide body 21 at the electromagnetic wave of the conducted inside of waveguide body 21 by absorbing.Owing to have this electromagnetic wave absorb 22, make waveguide 20A, 20B as the passage of e-machine P have within it side draught and receive electromagnetic electromagnetic wave absorbability.
As such electromagnetic wave absorb 22, for example, can use the electro-magnetic wave absorption sheet that is called as dipole-type.As the electro-magnetic wave absorption sheet of dipole-type, for example can enumerate (1) and form by compounds such as carbon dust, titanium dioxide, the electric field that utilizes these compounds to have absorbs electromagnetic; (2) form by ferrite, iron carbonyi compounds such as (Iron Carbonyl), utilize the magnetic field that these compounds have to absorb electromagnetic, and electromagnetic of (3) absorption of forming by the complex of resin (for example polyurethane etc.) and magnetic etc.For example specifically can using, Business Name is the commodity " Le ミ デ イ オ Application (registered trademark) " by name of " Japan サ one PVC ス society " manufacturing or the HTD-101 of company " Hitachi Metals society " by name manufacturing etc.In addition, identical with above-mentioned electromagnetic wave absorb 13, can use the electromagnetic wave absorb of λ/4 types.Wherein, for λ/4 type electromagnetic wave absorbs, because be illustrated in the above, so be described in this omission.
Sliding gate 23 can be arranged on the peristome 21a of waveguide body 21 freely openable, and it makes the peristome 21a obturation of waveguide body 21 come from outside electromagnetic door part with shielding at least when testing.As shown in Figure 7, the structure of sliding gate 23 comprises: the door body 23a that is made of aluminium or aluminium alloy; With the rubber-like electromagnetic wave absorb 23b that sticks on the outside surface of body 23a.For this rubber-like electromagnetic wave absorb, carry out mixingly after preferably EP rubbers or neoprene being cooperated with carbon black, Magnaglo etc., be the broadband electromagnetic wave absorb of sheet with the roller press molding.
For the opening/closing unit of sliding gate 23, its not special in the present invention restriction can be used known opening/closing unit.For example, both can be shown in Fig. 7 (a) like that, roll by the wire rod 23c that uses winding mechanism 23d will be installed in the top of body 23a door is opened and closed, also can be shown in Fig. 7 (b) like that, pinion wheel (pinion) 23f that is connected with motor (not shown) etc. is meshed with the tooth bar 23e that forms on door body 23a and makes to open and close.
According to such sliding gate 23, will pass through the electromagnetic part of the hollow space (inside) of waveguide body 21, be reflected because utilizing the door body 23a that constitutes by aluminium sheet or aluminium alloy plate, and be absorbed by sticking on the rubber-like electromagnetic wave absorb 23b on the outside surface of body 23a, so can reduce the electromagnetic wave propagation degree.In addition, for sliding gate 23, because make the peristome 21a obturation of waveguide body 21 at least when testing, the chamber 10 that can maintain when testing has good electromagnetic wave shielding performance.Wherein, the on-off action of sliding gate 23 is set to the action interlock with belt conveyer 30 described later (travelling belt 31), will be described below about this partial content.In addition, in the present embodiment, be to be provided with sliding gate 23, but also the slit (not shown) can be set, sliding gate is inserted in this slit at the central portion of waveguide body 21 at the peristome 21a of waveguide body 21.In the case, if form the structure that sandwiches conducting rubber or aluminium foil etc. in the gap between slit and sliding gate, then can keep electromagnetic wave shielding performance well.
Curtain 24 is the soft cloth-like things that are made of conductive fabric, as shown in Figure 2, is provided with a plurality of in the inside of waveguide body 21.So-called " conductive fabric " is meant the cloth that contains metal ingredient, more particularly, except that the cloth of being made by the composition fiber of metal fibre and macromolecular fibre, can also list the cloth made by the macromolecular fibre that is coated with metals such as Ni, Cu etc.According to such curtain 24, because the electromagnetic part of hollow bulb (inside) that will be by waveguide body 21 is caused loss by the metal ingredient diffraction that is contained in the curtain 24, so can reduce electromagnetic transmission degree.More particularly, can make electromagnetic transmission degree reduce by the degree of 30～40dB.
In addition, because curtain 24 is soft cloth,, that is, when e-machine P moves into or takes out of chamber 10,, can not damage e-machine P even e-machine P contacts with curtain 24 so have following advantage yet.
Wherein, in the present embodiment, as shown in Figure 2, be that three places of the inside (comprising peristome 21b) at waveguide body 21 respectively are provided with a curtain 24, but also be not limited thereto.For example, also the place that curtain 24 is set can be taken as 2 sentences down or more than 4 places, can also multi-disc curtain 24 be set at a place.
Wave filter 25 for example is the netted duplexer that metal stratum reticulare that multilayer is made of aluminium or aluminium alloy etc. gathers into folds, as Fig. 2, shown in Figure 6, be arranged on waveguide body 21 peristome 21a, 21b, aftermentioned travelling belt 31 (belt conveyer 30) below.Though peristome 21a and inside at waveguide body 21, be provided with electromagnetic wave screen unit (sliding gate 23 and curtain 24) in the top of travelling belt 31 (belt conveyer 30), but, preferably below travelling belt 31, also comprise such wave filter 25 in order further to reduce electromagnetic transmission degree reliably.In the inside of wave filter 25, the netted duplexer that is made of metal causes diffraction loss, can reduce electromagnetic transmission degree reliably thus.
Wherein, in the gap between wave filter 25 and travelling belt 31, preferably possesses the seal member 26 that forms by rubber-like electromagnetic wave absorb etc.In addition, also can use (deposition) metallic film of spraying plating on the macromolecular fibre of flexibility and the conduction brush that forms replaces above-mentioned seal member 26.
According to above waveguide 20A, 20B, owing to have the waveguide body 21 that can shield external electromagnetic electromagnetic wave screen unit (sliding gate 23, curtain 24), have the passage that becomes e-machine P of electromagnetic wave absorb 22, wave filter 25, even so the outside of chamber 10 and inner the connection also can keep the good electromagnetic wave shielding performance of chamber 10.
＜belt conveyer 〉
As shown in Figure 1 to Figure 3, belt conveyer 30 is conveyance unit of conveyance e-machine P, is configured to the inside by waveguide 20A, chamber 10 and waveguide 20B.Belt conveyer 30 comprises: as the travelling belt 31 of the conveying unit of conveyance e-machine P; The worktable 32 of the running roller that drives travelling belt 31 is installed; Be arranged on a plurality of holding units 33 on the conveyance face of travelling belt 31; With the cable 34 (with reference to Fig. 8) that is connected with holding unit 33.
Travelling belt 31 is the endless belts as the conveying unit of belt conveyer 30, is formed by the rubber-like electromagnetic wave absorb.Travelling belt 31 is erected on a plurality of running roller 32a on the worktable 32 that running roller is installed, and the rotation by these running rollers 32a comes transferring power, thereby drives travelling belt 31, promptly is used for conveyance e-machine P.
Wherein, the worktable 32 of running roller is installed, has no particular limits in the present invention, can use known equipment.In addition, the worktable 32 of running roller is installed, its structure can be that whole running roller 32a rotation is come to travelling belt 31 transferring power, and the drive roller wheel rotation as the part of running roller 32a is come to travelling belt 31 transferring power.
As shown in Figure 8, holding unit 33 is used for e-machine P is remained on the conveyance face of travelling belt 31, separates predetermined distance and be provided with a plurality of on the conveyance face of travelling belt 31.On this holding unit 33, be arranged on holding unit 33 on the corresponding position of splicing ear (for example communicating by letter of portable phone used the external cabling terminal) of e-machine P be provided with joint 33a.Thus, by e-machine P is arranged on the holding unit 33, can make the splicing ear (not shown) of e-machine P realize being electrically connected with joint 33a.
A plurality of holding units 33 on cable 34 and the conveyance face that is arranged on travelling belt 31 in abutting connection with and be set up, the one end is connected with joint 33a on being arranged on holding unit 33, its other end is connected with the terminal T that is formed by sheet metal on being fixed on travelling belt 31.Thus, can make e-machine P realize being electrically connected via joint 33a, cable 34, terminal T and outside terminal RT described later with test unit 40 described later.Wherein, the material of terminal T has no particular limits in the present invention, not only can be simple metal, also can be alloy, can also carry out electroplating processes in the above.
The noise absorption body that cable 34 is used to be absorbed in the noise of its inner conducting covers.Thus, because can absorb the noise that produces in test effectively, so can critically carry out the test of e-machine P.Wherein, as such noise absorption body, for example can use name to be called commodity " Le ミ デ イ オ Application (registered trademark) ET " by name that " Japan サ one PVC ス society " make etc.
About the length of cable 34, make that when one end (holding unit 33) is positioned at the assigned position (testing position) of the inside of chamber 10 its other end (terminal T) will be positioned near the end (Way in of chamber 10) of belt conveyer 30.Wherein, because a plurality of holding units 33 have this cable 34 respectively, so, on the conveyance face of travelling belt 31, make set have the bunch of cables 34C of many cables 34 to be provided with in abutting connection with holding unit 33.
According to above-mentioned belt conveyer 30, because comprising, travelling belt 31 separates a plurality of holding units 33 that predetermined distance is provided with, so by e-machine P is arranged on the holding unit 33, can carry out the test of the action of e-machine P according to order and rule being set correctly and continuously e-machine P is moved into the inside of chamber 10.
[test method of e-machine]
Below, the action of the electronic apparatus testing device 1 that as above constitutes is described, and the e-machine test method that an embodiment of the invention are related is described with reference to suitable accompanying drawing.
Fig. 9 to Figure 12 is the figure of the action of explanation electronic apparatus testing device, (a) is the sectional view of chamber and waveguide; (b) be the outboard profile of the end of belt conveyer; (c) be the planimetric map of the end of belt conveyer.Wherein, travelling belt 31 is provided with a plurality of holding units 33, but owing to the time there is no need in explanation, therefore at (b) of Fig. 9 to Figure 12 with omitted the diagram of holding unit 33 (c).
(1) in order with a plurality of e-machine P (P A, P B, P C, P D, P E...) be placed on respectively on the holding unit 33 that is arranged on the travelling belt 31 (with reference to Fig. 2), the joint 33a (with reference to Fig. 8) that is arranged on the holding unit 33 is electrically connected with the splicing ear (not shown) of e-machine P.Wherein, e-machine P is to the setting of holding unit 33, can carry out when the stopping of travelling belt 31, and also can carry out when it drives.
(2) as shown in Figure 2, be placed on the e-machine P on the holding unit 33, along with the driving of travelling belt 31, to the direction of chamber 10 by conveyance, by the inside of waveguide 20A by the inside of conveyance to (moving into) chamber 10.Then, shown in Fig. 9 (a), at e-machine P BOff-test after, e-machine P CTowards the assigned position (testing position) of the inside of chamber 10 and by conveyance.
Herein, sliding gate 23 is controlled by control module (for example computing machine etc., expression among the figure) institute, is in the state of unlatching when travelling belt 31 drivings, is in closed condition when travelling belt 31 stops.Thereby, drive e-machine P at travelling belt 31 CDuring by conveyance, because sliding gate 23 is in opening, so, e-machine P CCan be moved into towards the inside of chamber 10.
Wherein, the e-machine P of the inside by waveguide 20A C, contact with a plurality of curtains 24 that are arranged on waveguide 20A inside, but because aforesaid curtain 24 is soft cloth, therefore can be to e-machine P CCause damage.
(3) as e-machine P CWhen arriving the testing position of inside of chamber 10, shown in Figure 10 (a), the control that the control module (not shown) stops travelling belt 31, and make the control of sliding gate 23 closures.
Wherein, the control module (not shown) makes the moment of the control that travelling belt 31 stops, for example can be under the situation of the driving shaft rotation regulation number of turns that drives the drive source of travelling belt 31 (for example motor etc.), promptly under travelling belt 31 (holding unit 33) mobile predetermined distance or the situation of stipulated time, perhaps detect holding unit 33 and arrive under the situation of testing position at the sensor (not shown) on inside that is arranged at chamber 10 and/or the belt conveyer 30.
Shown in Figure 10 (b), when being placed with e-machine P CHolding unit 33 when being positioned at testing position, the terminal T of the other end of the cable 34 (with reference to Fig. 8) that the one end is connected with holding unit 33 C, be positioned at the 30E place, end of belt conveyer 30.Wherein, end 30E is the end of the Way in side of chamber 10.
As Figure 10 (b) with (c), near the 30E of end, be provided with test unit 40 and the outside terminal RT that is connected with test unit 40.Test unit 40 is to detect e-machine P to receive electromagnetic state and judge whether regular event of e-machine P with this, and can send the device that various indications make its action to e-machine P.
Wherein, move into the e-machine P that the next one is tested to the inside of waveguide 20A this moment shown in Figure 10 (a) D, in the inside of waveguide 20B, at e-machine P CThe front be to have finished the e-machine P that tests BIn addition, the e-machine P before test is being placed in the outside of waveguide 20A E(not shown) has finished the e-machine P that tests A(not shown) is at e-machine P BTaken out of the outside of waveguide 20B before.
(4) after travelling belt 31 stops, control module (not shown) such as Figure 11 (b) and
(c) shown in, implement the control that outside terminal RT is rotated.If outside terminal RT rotation, then its fore-end and terminal T CBe electrically connected, thus can be at e-machine P CAnd carry out the transmitting-receiving of electric signal between the test unit 40.After this, shown in Figure 11 (a), from antenna 14 to e-machine P CLaunching electromagnetic wave.
(5) e-machine P CThe test of action be from antenna 14 launching electromagnetic waves, on one side by test unit 40 detected electrons machine P by on one side CElectromagnetic accepting state carry out.In test unit 40, detected electrons machine P CElectromagnetic accepting state judge whether regular event of e-machine P.At this moment, by rotation driven antenna 14, can test with vertical ripple horizontal wave.In addition, variations such as electromagnetic intensity from antenna 14 emission, frequency band are tested.
(6) e-machine P CThe off-test of action after, the control module (not shown) implements to make the control of outside terminal RT reverse rotation, removes outside terminal RT and terminal T CElectrical connection (with reference to (b) of Figure 10 and (c)).Then, implement to make once more the control of travelling belt 31 drivings, shown in Figure 12 (a), beginning e-machine P CConveyance, and implement to make sliding gate 23 control of turning.Thus, make e-machine P CInside by waveguide 20B towards the outside direction of chamber 10 by conveyance (taking out of), and the e-machine P that will next time test DTesting position towards the inside of chamber 10 is carried out conveyance.
More than be a series of actions and the e-machine test method of electronic apparatus testing device 1.
According to such e-machine test method, successively with a plurality of e-machine P (P A, P B, P C, P D, P E...) be placed on the holding unit 33 on the travelling belt 31 that is arranged at belt conveyer 30, move into the testing position of the inside of chamber 10, after finishing test, take out of the outside of chamber 10, thus, can carry out the test of the action of a plurality of e-machine P continuously.
In addition, according to this e-machine test method, when testing, because shielding comes from the entirely shut peristome 21a of waveguide 20A, 20B (waveguide body 21) of outside electromagnetic sliding gate 23, so, can under the state of the shielding electromagnetic waves of keeping chamber 10, critically test the action of e-machine P.
More than, an embodiment of the invention have been described, but embodiments of the present invention are not limited thereto.For concrete structure, only otherwise the scope that exceeds purport of the present invention then can be carried out suitable change, for example, following change all is possible.
In the above-described embodiment, illustrate portable phone and it is illustrated as e-machine P, but be not limited to portable phone as the e-machine P of subjects of the present invention.Personal Digital Assistant) or have a WLAN (Local AreaNetwork: the LAN (Local Area Network)) personal computer of the notebook type of function etc. for example also can be the PDA (personal digital assistant: of carrying out electromagnetic wave transmitting-receiving with portable phone equally.In addition, also can be the precision measuring instrument of not wishing to be subjected to the external electromagnetic wave action, medicine equipment etc.And, also can be not wish electromagnetic household electrical appliance, medicine equipment etc. more than the external emission setting.
In addition, chamber 10 also is not limited to above-mentioned embodiment, for example also can be similar to the electromagnetic wave darkroom, can the come in and go out large-scale house (testing laboratory) of its inside of testing crew.Such testing laboratory can be made of the metal framework identical with chamber 10, for example, also can be the xoncrete structure with electromagnetic wave shielding performance, electromagnetic wave absorbability.
In the above-described embodiment, the metal plate 11a of multi-disc is welded on as on the framework (not shown) of skeleton and form framework 11, but being not limited thereto, for example also can be to utilize bolt etc. that the metal plate of multi-disc is assembled and form the structure that can assemble decomposition.Under the situation of this structure, preferably between the gap of the metal plate of multi-disc, fill packing material with electromagnetic wave shielding performance.Thus, can keep the electromagnetic wave shielding performance of framework (chamber) well.As the packing material with electromagnetic wave shielding performance, the electromagnetic screen with ohmic loss body (for example carbon resistance sheet, metal thin film resistor sheet, heat radiation cut off film etc.) that for example can use the one side at least of top and bottom to be insulated layer (for example paper, be also used as the splicing tape of knitting layer etc.) insulation engages uses lamellar body.Particularly, can use company " Japan サ one PVC ス society " by name commodity " Le ミ デ イ オ Application (registered trademark) IR " by name of making etc.
In the above-described embodiment, as shown in Figure 1, form the structure that door 12 is provided with the 12b of window portion, but be not limited thereto, door and window portion also can be set respectively separately.In addition, can also be provided with a plurality of doors or window portion.
In the above-described embodiment, electromagnetic wave absorb 13 is λ/4 type electromagnetic wave absorbs, but is not limited thereto.For example, also can slave plate 11a (perhaps plate 12a) side begin, set gradually resistance diaphragm (impedance 1088 Ω), distance piece (38mm), resistance diaphragm (impedance 280 Ω), distance piece (38mm), diaphragm (aluminium sheet or aluminium foil) and constitute.According to this structure, can be absorbed near the 880MHz and near two kinds of electromagnetic waves the 2050MHz.The same with above-mentioned electromagnetic wave absorb, also can use the electro-magnetic wave absorption sheet of dipole-type.
Wherein, above-mentioned electromagnetic wave absorb or electro-magnetic wave absorption sheet also can be arranged on the inner surface side of antenna with waveguide 14a.
In the above-described embodiment, as shown in Figure 1 to Figure 3, the waveguide 20A, the 20B that become the passage of e-machine P are configured on the straight line, but are not limited thereto.For example, also can waveguide 20A be installed in a side of chamber 10, the side in the side that is configured in the upright position with respect to this side installs waveguide 20B, makes waveguide 20A, 20B be configured to plan view and is L font (not shown).In addition, can also be the structure (not shown) that waveguide 20A and 20B is configured in the same side of chamber 10.Wherein, suitably change the shape of belt conveyer 30 (conveyance unit) according to the configuring condition of waveguide 20A, 20B.
In the above-described embodiment, as shown in Figure 1 to Figure 3, this structure comprises two waveguide 20A and 20B, but also is not limited thereto, and for example also can move into a waveguide and take out of, and can also possess the waveguide more than three as required.
In the above-described embodiment, the passage of e-machine P is waveguide 20A, 20B, but also is not limited thereto.For example, as shown in figure 13, also can make on the cylindrical body 27 of (for example aluminum or aluminum alloy etc.) electromagnetic wave screen unit (door part etc.) is set at metal.In such structure,, can shield electromagnetic wave, so can keep the electromagnetic wave shielding performance of chamber 10 suitably from the outside by forming the metal with electric conductivity, the electromagnetic wave screen unit (door part, curtain etc.) of cylindrical body 27.Wherein, shown in Figure 13 (a), can also be provided with above-mentioned electromagnetic wave absorb 22, seal member 26 (perhaps spraying plating (deposition) has the conduction brush of metallic film on the macromolecular fibre in flexibility) in the inner surface side of cylindrical body 27.
In the above-described embodiment,, still also be not limited thereto as door part with sliding gate 23.For example, also can be as shown in figure 13 shutter door 28.
Shutter door 28 can be installed on the cylindrical body 27 freely to rotate via the hinge (not shown), forms the structure that can suitably open and close.Shutter door 28 is identical with above-mentioned sliding gate 23, comprises door body 28a that is made of aluminum or aluminum alloy and the rubber-like electromagnetic wave absorb 28b that is bonded in the outside of body 28a.The opening/closing unit of shutter door 28 is not special in the present invention to be limited, and can use known opening/closing unit.Particularly, for example, can carry out unlatching (switching) (not shown) of door by using the winding mechanism coiling to be installed in a wire rod of the bottom of body 28a or chain etc.
In addition, shown in Figure 14 (a), also can be the structure (so-called clamshell type) that comprises a pair of shutter door 281,282.In addition, shown in Figure 14 (b), also can be structure with a pair of sliding gate 231,232 (so-called pulling the door open).
Above door part is also the same with above-mentioned sliding gate 23, by the switching of control module (not shown) control gate, make at least inaccessible passage ( waveguide 20A, 20B, cylindrical body 27 etc.) when testing thus the peristome shielding come from outside electromagnetic wave.Wherein, under the situation of the shutter door shown in Figure 14 (a) 281,282, it also can be following structure, that is: when e-machine P passes through, door itself is directly pushed open by e-machine P (holding unit 33), after e-machine P passes through, utilize the Flexible elements such as spring that are arranged on the hinge (not shown) to shut the door.
The switching direction of above-mentioned door part (comprising sliding gate 23) is not limited to the direction shown in the figure, can suitably set.The switching direction of door part also can be the direction different with the outlet side passage with the entrance side passage.
In above-mentioned embodiment and variation, as Fig. 2 and shown in Figure 13, it is the peristome (for example 21a) that door part (sliding gate 23, shutter door 28 etc.) is set at passage ( waveguide 20A, 20B, cylindrical body 27) outer side, be provided with the structure of curtain 24 at the peristome of the private side of passage or the inside of passage, but also be not limited thereto.That is, also can door part be set in the peristome (for example 21b) or the inside of passage of the private side of passage.In addition, in such structure, also can further and use curtain 24.In addition, in a passage, be provided with under the situation of a plurality of door parts, the door part of identical type can be set, also can be used in combination different types of door part.
In the above-described embodiment, as Fig. 2, shown in Figure 13, be at the peristome of the private side of passage ( waveguide 20A, 20B or cylindrical body 27 etc.) or be provided with the structure of curtain 24 in the inside of passage, but also be not limited thereto.For example, also can be to be provided with the structure that thicker rubber-like electromagnetic wave absorb replaces curtain 24.
In the above-described embodiment, the net duplexer that metal wave filter (wave filter 25) forms for overlapping a plurality of nets that constitute with aluminium or aluminium alloy, but also be not limited thereto.For example, the aluminium flake wave filter that also can use small pieces (sheet metal) set of aluminum or aluminum alloy to constitute also can be overlapping a plurality of net that is made of steel or stainless steel and the net duplexer that forms.
In above-mentioned embodiment and variation, framework 11, door 12, waveguide body 21, cylindrical body 27, door body 23a, 28a etc. are formed by aluminum or aluminum alloy, but also are not limited thereto.For example, also can use steel, stainless steel, copper etc.In addition, because use metals such as framework 11 make, thus become the structure that shielding electromagnetic waves from the outside, rigidity etc. increase, but be not limited thereto, for example, also can use sheet material and form with electromagnetic wave shielding performance.
In the above-described embodiment, the conveyance unit still is not limited thereto for being the belt conveyer 30 of conveying unit with the travelling belt 31 that sets up on the running roller 32a of the worktable 32 that running roller is installed.For example also can be net formula conveyer (net conveyor), screen type conveyer (meshconveyor), air slide (air conveyor) etc.Wherein, for e-machine P being moved into the inside of chamber 10, and its inside from chamber 10 taken out of, the conveyance face of conveying unit (for example travelling belt 31 etc.) gets final product by the inside of chamber 10 and passage ( waveguide 20A, 20B, cylindrical body 27) at least.In addition, such conveyance unit preferably constitutes by seeing through electromagnetic dielectric material easily, particularly for example is made of resin, rubber, pottery, timber etc.
In the above-described embodiment, holding unit 33 is arranged on the travelling belt 31, makes it possible to the inside of portable phone from its receiver one side conveyance to chamber 10 as e-machine P, but also is not limited thereto.For example, also can be arranged on the travelling belt 31, make it possible to move into the inside of chamber 10, perhaps also can be arranged on the travelling belt, portable phone is become laterally with respect to peristome 21a from the antenna side of portable phone.Wherein, the shape or the size of holding unit (perhaps joint) will suitably change according to the kind of e-machine P, and this is a matter of course item.
In the above-described embodiment, constitute e-machine P is placed on and carry out conveyance on the holding unit 33, but be not limited thereto, also can constitute e-machine P directly is placed on the conveyance face of the travelling belt 31 that holding unit 33 is not set and carry out conveyance.Under the situation of this spline structure, because be connected with the splicing ear of e-machine P, so e-machine P is electrically connected with test unit 40 at the set joint (not shown) of an end of cable 34.
In the above-described embodiment, be being connected of terminal T and outside terminal RT to carry out, but also can carry out in the end of chamber 10 Way out sides at the 30E place, end of the belt conveyer 30 of chamber 10 Way in sides.In addition, the method for attachment of terminal T and outside terminal RT also might not be confined to above-mentioned embodiment (with reference to Figure 11).
In the above-described embodiment, test unit 40 and outside terminal RT are arranged near the end 30E of belt conveyer 30, promptly be arranged on the outside of chamber 10, but be not limited thereto, also test unit 40 and outside terminal RT can be arranged on the inside of chamber 10.Under the situation of this structure, cable 34 for example is not set, but makes the terminal (not shown) that is electrically connected with joint 33a expose holding unit 33, when testing, this terminal (not shown) is electrically connected with outside terminal RT at least.In addition, also can only outside terminal RT be arranged on the inside of chamber 10.
Wherein, (perhaps be incorporated under the inner situation) in that cable etc. is drawn out under the outside situation from the inside of chamber 10, preferably have EMI (ElectroMagnetic Interfere: electromagnetic interference (EMI)) passage in outside from chamber 10.The EMI passage is can prevent electromagnetic interference (EMI) and cable can be inserted the inside and outside passage of logical chamber 10.Particularly, for example, the noise absorption body of magnetic band etc. is twisted on the cable, make its part pass the passage that is arranged in the chamber 10.Thus, 10 pairs of shielding electromagnetic waves of chamber can be kept suitably, and the noise that produces from cable can be absorbed effectively.
In the above-described embodiment, door part (for example sliding gate 23 etc.) is controlled by the control module (not shown), makes to be in the state that opens the door when travelling belt 31 drives, and is in closing state when travelling belt 31 stops, but also is not limited thereto.For example, also known sensor (not shown) can be set on belt conveyer 30, by detecting the switching of passing through to come the control gate parts of e-machine P (holding unit 33).
In the above-described embodiment, the structure of electronic apparatus testing device 1 comprises a chamber 10, a pair of waveguide 20A, 20B (passage) and a belt conveyer 30 (conveyance unit), but also is not limited thereto.For example, also a plurality of chamber (perhaps testing laboratory) arranged in series with pair of channels can be utilized a conveyance unit to be communicated with and are constituted.According to such structure, can carry out two or more different tests to e-machine P continuously.In addition, can also in a chamber (perhaps testing laboratory), be set up in parallel many to passage and make it have the conveyance unit respectively.
In the above-described embodiment, to from antenna 14 to e-machine P launching electromagnetic wave, utilize test unit 40 to judge that can e-machine P normally receive electromagnetic e-machine test method and be illustrated.But the test method of e-machine also is not limited thereto.For example, also can be to send various indications to e-machine P from test unit 40, send electromagnetic wave from e-machine P to antenna 14, utilize electromagnetic wave receiving and transmitting signal unit (not shown) that the electromagnetic wave that antenna 14 receives is carried out method for measuring.

Claims (25)

1. electronic apparatus testing device comprises:
The chamber that e-machine is tested;
Passage, the described chamber of this channel connection outside and inner, and have at least that shielding comes from outside electromagnetic electromagnetic wave screen unit when testing; With
The conveyance unit has the conveying unit of the described e-machine of conveyance, and this electronic apparatus testing device is characterised in that:
Described conveying unit constitutes and can described e-machine can be moved into described chamber, and described e-machine can be taken out of from described chamber by the inside of described passage.
2. electronic apparatus testing device as claimed in claim 1 is characterized in that:
The inboard of described passage has electromagnetic wave absorbability.
3. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described passage is made of a pair of entrance side passage and outlet side passage, and described entrance side passage and described outlet side passage are configured along straight line.
4. as claim 1 each described electronic apparatus testing device to the claim 3, it is characterized in that:
Described electromagnetic wave screen unit comprises the curtain that is formed by conductive fabric.
5. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described electromagnetic wave screen unit comprises the door part that makes described passage switching with the action interlock of described conveying unit.
6. electronic apparatus testing device as claimed in claim 5 is characterized in that:
Described door part comprises a body and the rubber-like electromagnetic wave absorb that sticks on this body, and wherein, described door body is made of aluminium sheet or aluminium alloy plate.
7. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described passage is the waveguide that the long electromagnetic wave of wavelength ratio provision wavelengths is not propagated.
8. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described chamber is made of the metal framework with electromagnetic wave shielding performance.
9. electronic apparatus testing device as claimed in claim 8 is characterized in that:
Described metal framework is many metal parts are assembled and to be constituted, and engages by welding each other between these many metal parts.
10. as claim 8 or the described electronic apparatus testing device of claim 9, it is characterized in that:
In described metal framework and the described passage at least one is to be formed by aluminium or aluminium alloy.
11. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described chamber has can its inner window portion of visualization.
12. electronic apparatus testing device as claimed in claim 11 is characterized in that:
Described window portion has electromagnetic wave shielding performance.
13. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described chamber have can freely openable door.
14. electronic apparatus testing device as claimed in claim 1 is characterized in that:
The inside of described chamber be provided with and described e-machine between the transmitting-receiving electromagnetic mensuration antenna.
15. electronic apparatus testing device as claimed in claim 14 is characterized in that:
Described mensuration can be rotated around axle with antenna, makes from described mensuration parallel or vertical with the electromagnetic plane of polarization of launching from the antenna of described e-machine with the electromagnetic plane of polarization of antenna emission.
16., it is characterized in that as claim 14 or the described electronic apparatus testing device of claim 15:
Described mensuration is from more than the electromagnetic wavelength X of described mensuration with the antenna emission with the distance between the antenna of antenna and described e-machine.
17. electronic apparatus testing device as claimed in claim 14 is characterized in that:
Has the magnetic sheet material in the described mensuration of the inside surface of described chamber near with antenna.
18. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described conveying unit comprises a plurality of holding units that are used for keeping described e-machine,
Described holding unit comprises the joint that is connected and described cable is electrically connected with described e-machine with an end of cable.
19. electronic apparatus testing device as claimed in claim 18 is characterized in that:
The noise absorption body that described cable is absorbed noise covers.
20., it is characterized in that as claim 18 or the described electronic apparatus testing device of claim 19:
Described cable is set up with the described holding unit adjacency that is arranged on described conveying unit, have terminal at the other end opposite with a described end, described terminal is connected when testing at least with the outside terminal that is connected with the test unit of judging described e-machine state.
21. electronic apparatus testing device as claimed in claim 18 is characterized in that:
Described conveying unit is the travelling belt that is made of the rubber-like electromagnetic wave absorb.
22. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described passage has shielding and comes from outside electromagnetic metallic wave filter below the described conveying unit by its inside.
23. electronic apparatus testing device as claimed in claim 1 is characterized in that:
In described chamber and the described passage at least one has the electromagnetic wave absorb of λ/4 types in inside.
24. electronic apparatus testing device as claimed in claim 1 is characterized in that:
Described chamber portion within it has lighting device.
25. an e-machine test method is used the described electronic apparatus testing device of claim 1, this e-machine test method is characterised in that, comprises the steps:
Successively a plurality of e-machines are positioned on the described conveying unit of described conveyance unit; Described e-machine is moved into the assigned position of the inside of described chamber; Described e-machine is tested; And utilize described conveyance unit described e-machine to be taken out of the outside of described chamber.
CN200880001281A 2008-06-03 2008-06-03 Electronic apparatus testing device and electronic apparatus testing method Pending CN101688891A (en)

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US11579179B2 (en) 2018-09-11 2023-02-14 Jabil Inc. Method for providing an antenna probe array for a compact anechoic chamber for active and passive antenna over-the-air testing
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CN105676003A (en) * 2014-12-05 2016-06-15 韩国标准科学硏究院 Electromagnetic wave power sensing apparatus and system comprising thereof
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CN112763824A (en) * 2020-12-24 2021-05-07 北京机电工程研究所 Comprehensive test box and test method

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KR101071510B1 (en) 2011-10-10

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