JP4982087B2 - 質量分析装置及び質量分析方法 - Google Patents

質量分析装置及び質量分析方法 Download PDF

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Publication number
JP4982087B2
JP4982087B2 JP2006031585A JP2006031585A JP4982087B2 JP 4982087 B2 JP4982087 B2 JP 4982087B2 JP 2006031585 A JP2006031585 A JP 2006031585A JP 2006031585 A JP2006031585 A JP 2006031585A JP 4982087 B2 JP4982087 B2 JP 4982087B2
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Japan
Prior art keywords
sample
ion source
ionization
mass
apci
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JP2006031585A
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English (en)
Japanese (ja)
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JP2007213934A (ja
JP2007213934A5 (enExample
Inventor
益義 山田
正男 管
泉 和氣
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2006031585A priority Critical patent/JP4982087B2/ja
Priority to US11/699,366 priority patent/US7420180B2/en
Priority to US11/712,922 priority patent/US7375316B2/en
Publication of JP2007213934A publication Critical patent/JP2007213934A/ja
Publication of JP2007213934A5 publication Critical patent/JP2007213934A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/107—Arrangements for using several ion sources

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2006031585A 2006-02-08 2006-02-08 質量分析装置及び質量分析方法 Expired - Fee Related JP4982087B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006031585A JP4982087B2 (ja) 2006-02-08 2006-02-08 質量分析装置及び質量分析方法
US11/699,366 US7420180B2 (en) 2006-02-08 2007-01-30 Mass spectrometer and mass spectrometry
US11/712,922 US7375316B2 (en) 2006-02-08 2007-03-02 Mass spectrometer and mass spectrometry

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006031585A JP4982087B2 (ja) 2006-02-08 2006-02-08 質量分析装置及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2007213934A JP2007213934A (ja) 2007-08-23
JP2007213934A5 JP2007213934A5 (enExample) 2008-11-20
JP4982087B2 true JP4982087B2 (ja) 2012-07-25

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JP2006031585A Expired - Fee Related JP4982087B2 (ja) 2006-02-08 2006-02-08 質量分析装置及び質量分析方法

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US (2) US7420180B2 (enExample)
JP (1) JP4982087B2 (enExample)

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JP2008139130A (ja) * 2006-12-01 2008-06-19 Hitachi Ltd リアルタイム分析装置及び方法
JP5002365B2 (ja) * 2007-08-06 2012-08-15 株式会社日立製作所 質量分析装置及び質量分析方法
US8173960B2 (en) * 2007-08-31 2012-05-08 Battelle Memorial Institute Low pressure electrospray ionization system and process for effective transmission of ions
US7811071B2 (en) * 2007-10-24 2010-10-12 Emerson Climate Technologies, Inc. Scroll compressor for carbon dioxide refrigerant
JP2009162665A (ja) * 2008-01-08 2009-07-23 Rigaku Corp ガス分析方法及びガス分析装置
US10386333B2 (en) 2012-02-10 2019-08-20 Waters Technology Corporation Performing chemical reactions and/or ionization during gas chromatography-mass spectrometry runs
US9406491B2 (en) * 2014-03-20 2016-08-02 Lockheed Martin Corporation Multiple ionization sources for a mass spectrometer
GB201405625D0 (en) * 2014-03-28 2014-05-14 Micromass Ltd Synchronised variation of source conditions of an atmospheric pressure chemical ionisation mass spectrometer coupled to a gas chromatograph
US10141172B2 (en) 2014-03-28 2018-11-27 Micromass Uk Limited Synchronised variation of source conditions of an atmospheric pressure chemical ionisation mass spectrometer coupled to a gas chromatograph to improve stability during analysis
US9368335B1 (en) * 2015-02-02 2016-06-14 Thermo Finnigan Llc Mass spectrometer
EP3570315B1 (en) 2015-03-06 2024-01-31 Micromass UK Limited Rapid evaporative ionisation mass spectrometry ("reims") and desorption electrospray ionisation mass spectrometry ("desi-ms") analysis of biopsy samples
US10777398B2 (en) * 2015-03-06 2020-09-15 Micromass Uk Limited Spectrometric analysis
WO2016142686A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Liquid trap or separator for electrosurgical applications
CN108700590B (zh) 2015-03-06 2021-03-02 英国质谱公司 细胞群体分析
JP6783240B2 (ja) 2015-03-06 2020-11-11 マイクロマス ユーケー リミテッド 生体内内視鏡的組織同定機器
EP3265822B1 (en) 2015-03-06 2021-04-28 Micromass UK Limited Tissue analysis by mass spectrometry or ion mobility spectrometry
US10978284B2 (en) * 2015-03-06 2021-04-13 Micromass Uk Limited Imaging guided ambient ionisation mass spectrometry
WO2016142690A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Inlet instrumentation for ion analyser coupled to rapid evaporative ionisation mass spectrometry ("reims") device
EP3266037B8 (en) * 2015-03-06 2023-02-22 Micromass UK Limited Improved ionisation of samples provided as aerosol, smoke or vapour
GB2551669B (en) 2015-03-06 2021-04-14 Micromass Ltd Physically guided rapid evaporative ionisation mass spectrometry ("Reims")
CN107548516B (zh) 2015-03-06 2019-11-15 英国质谱公司 用于改进电离的碰撞表面
GB2553918B (en) 2015-03-06 2022-10-12 Micromass Ltd Ambient ionization mass spectrometry imaging platform for direct mapping from bulk tissue
US11282688B2 (en) * 2015-03-06 2022-03-22 Micromass Uk Limited Spectrometric analysis of microbes
GB201517195D0 (en) 2015-09-29 2015-11-11 Micromass Ltd Capacitively coupled reims technique and optically transparent counter electrode
EP3443354B1 (en) 2016-04-14 2025-08-20 Micromass UK Limited Spectrometric analysis of plants
JP6964065B2 (ja) * 2018-12-10 2021-11-10 株式会社日立ハイテク 液体クロマトグラフ質量分析装置
CN113793796B (zh) * 2020-05-29 2022-11-11 同方威视技术股份有限公司 电晕放电型电离源组件和离子迁移谱仪
CN114171369B (zh) * 2021-12-22 2025-03-21 北京雪迪龙科技股份有限公司 一种多离子源质谱仪器

Family Cites Families (14)

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JPS5451885A (en) * 1977-09-30 1979-04-24 Shimadzu Corp Method and apparatus for mass analysis
US4507555A (en) * 1983-03-04 1985-03-26 Cherng Chang Parallel mass spectrometer
JPS62165659U (enExample) * 1986-04-11 1987-10-21
JPS63167262A (ja) * 1986-12-27 1988-07-11 Shimadzu Corp クロマトグラフ質量分析計
US5218203A (en) * 1991-03-22 1993-06-08 Georgia Tech Research Corporation Ion source and sample introduction method and apparatus using two stage ionization for producing sample gas ions
JPH06215729A (ja) * 1993-01-20 1994-08-05 Hitachi Ltd 質量分析計
JPH0915207A (ja) 1995-06-29 1997-01-17 Osaka Oxygen Ind Ltd ガスの高感度分析装置
JPH11307041A (ja) * 1998-04-22 1999-11-05 Shimadzu Corp イオン化装置
AU6265799A (en) * 1998-09-25 2000-04-17 State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University, The Tandem time-of-flight mass spectrometer
JP3707348B2 (ja) * 1999-04-15 2005-10-19 株式会社日立製作所 質量分析装置及び質量分析方法
JP4054493B2 (ja) 1999-09-20 2008-02-27 株式会社日立製作所 イオン源
US7303727B1 (en) * 2002-03-06 2007-12-04 Caliper Life Sciences, Inc Microfluidic sample delivery devices, systems, and methods
JP4492267B2 (ja) 2004-09-16 2010-06-30 株式会社日立製作所 質量分析装置
US7687771B2 (en) * 2006-01-12 2010-03-30 Ionics Mass Spectrometry Group High sensitivity mass spectrometer interface for multiple ion sources

Also Published As

Publication number Publication date
JP2007213934A (ja) 2007-08-23
US7375316B2 (en) 2008-05-20
US7420180B2 (en) 2008-09-02
US20070181802A1 (en) 2007-08-09
US20070181801A1 (en) 2007-08-09

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