JP4975034B2 - ダブル光ファイバ接続を利用した微小空洞測定装置および方法 - Google Patents

ダブル光ファイバ接続を利用した微小空洞測定装置および方法 Download PDF

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Publication number
JP4975034B2
JP4975034B2 JP2008530300A JP2008530300A JP4975034B2 JP 4975034 B2 JP4975034 B2 JP 4975034B2 JP 2008530300 A JP2008530300 A JP 2008530300A JP 2008530300 A JP2008530300 A JP 2008530300A JP 4975034 B2 JP4975034 B2 JP 4975034B2
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Prior art keywords
microcavity
coupler
optical fiber
measurement
measuring device
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JP2009508114A (ja
JP2009508114A5 (enExample
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タン、ジュービン
チュイ、ジウェン
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ハルビン インスティチュート オブ テクノロジー
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/201Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures for measuring roundness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2408Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring roundness

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2008530300A 2005-09-14 2006-07-19 ダブル光ファイバ接続を利用した微小空洞測定装置および方法 Expired - Fee Related JP4975034B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CNB2005101024786A CN1329711C (zh) 2005-09-14 2005-09-14 基于双光纤耦合的微小内腔体尺寸测量装置与方法
CN200510102478.6 2005-09-14
PCT/CN2006/001770 WO2007030993A1 (en) 2005-09-14 2006-07-19 Micro-cavity measuring equipment and method based on double optical fiber coupling

Publications (3)

Publication Number Publication Date
JP2009508114A JP2009508114A (ja) 2009-02-26
JP2009508114A5 JP2009508114A5 (enExample) 2011-04-21
JP4975034B2 true JP4975034B2 (ja) 2012-07-11

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JP2008530300A Expired - Fee Related JP4975034B2 (ja) 2005-09-14 2006-07-19 ダブル光ファイバ接続を利用した微小空洞測定装置および方法

Country Status (6)

Country Link
US (1) US7733477B2 (enExample)
JP (1) JP4975034B2 (enExample)
CN (1) CN1329711C (enExample)
DE (1) DE112006001788B4 (enExample)
GB (1) GB2440851B (enExample)
WO (1) WO2007030993A1 (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1882579A1 (de) * 2006-07-27 2008-01-30 Soudronic AG Verfahren und Vorrichtung zur Herstellung von mit einer Siegelnaht versehenen Gegenständen
US7603785B2 (en) * 2007-02-20 2009-10-20 Electro Scientific Industries, Inc. Air bearing assembly for guiding motion of optical components of a laser processing system
US7886449B2 (en) * 2007-02-20 2011-02-15 Electro Scientific Industries, Inc. Flexure guide bearing for short stroke stage
US7889322B2 (en) * 2007-02-20 2011-02-15 Electro Scientific Industries, Inc. Specimen inspection stage implemented with processing stage coupling mechanism
WO2010108365A1 (en) * 2009-03-24 2010-09-30 Harbin Institute Of Technology Micro focal-length collimation based micro-cavity measuring method and detecting equipment thereof
CN101586942B (zh) * 2009-06-19 2011-02-02 北京工业大学 接触式光纤测头测量方法及其装置
CN101963491B (zh) * 2010-09-10 2012-10-31 珠海华伦造纸科技有限公司 造纸纤维图像测量方法
CN102410836B (zh) * 2011-07-26 2014-01-29 清华大学 基于二维位置敏感传感器的空间六自由度物体定位系统
CN102589439B (zh) * 2011-12-16 2015-04-22 哈尔滨工业大学 基于光纤布拉格光栅的接触式温度无感三维探测传感器
CN102589422B (zh) * 2011-12-16 2014-10-15 哈尔滨工业大学 正交光路二维微焦准直与三维坐标传感器
CN102564309B (zh) * 2011-12-16 2014-08-20 哈尔滨工业大学 基于光纤布拉格光栅的微孔尺寸测量装置
CN103900466B (zh) * 2014-03-20 2017-05-17 哈尔滨工业大学 基于偏振态检测的温度自补偿双光纤耦合球微尺度传感器
CN103900468A (zh) * 2014-03-20 2014-07-02 哈尔滨工业大学 带有端面微结构的双光纤共球耦合微测量力瞄准传感器
CN103900470B (zh) * 2014-03-20 2017-01-11 哈尔滨工业大学 基于三光纤共球耦合的微测量力瞄准传感器
CN103900471A (zh) * 2014-03-20 2014-07-02 哈尔滨工业大学 基于双入射光纤共球耦合的微测量力瞄准传感器
CN103900481B (zh) * 2014-03-20 2016-08-24 哈尔滨工业大学 基于偏振态检测的保偏平光纤耦合球微尺度传感器
CN103900472B (zh) * 2014-03-20 2017-01-25 哈尔滨工业大学 基于偏振态检测的双入射保偏平光纤耦合球微尺度传感器
CN104907889B (zh) * 2015-07-06 2017-03-22 哈尔滨工业大学 一种基于psd原理的二维测力主轴夹具
CN105750928B (zh) * 2016-04-01 2017-11-21 哈尔滨工程大学 一种实现光纤沿轴心旋转的机械结构
KR101817132B1 (ko) * 2016-05-17 2018-01-10 주식회사 엑스엘 간섭계와 영상을 이용한 정밀 측정 시스템
JP6797639B2 (ja) * 2016-11-02 2020-12-09 株式会社キーエンス 画像測定装置
JP6797638B2 (ja) * 2016-11-02 2020-12-09 株式会社キーエンス 画像測定装置
CN111649651B (zh) * 2020-07-28 2021-11-19 怀化学院 一种产品设计用测量装置
CN112050755B (zh) * 2020-08-07 2021-11-12 深圳烯湾科技有限公司 测量超细纤维横截面积的方法
CN112904336A (zh) * 2021-02-10 2021-06-04 深圳市云视机器人有限公司 探测装置及自移动机器人
CN118565291B (zh) * 2024-07-08 2025-07-11 苏州丰泰精密机械有限公司 一种三坐标测量仪及其测量机械零部件尺寸公差的方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5943302A (ja) * 1982-09-06 1984-03-10 Mitsutoyo Mfg Co Ltd タツチプロ−ブ装置
JPS61103762A (ja) * 1984-10-29 1986-05-22 Osaka Kiko Co Ltd ワ−ク自動計測装置
US4806016A (en) * 1987-05-15 1989-02-21 Rosemount Inc. Optical displacement sensor
JP2817975B2 (ja) * 1989-12-20 1998-10-30 株式会社ソキア 三次元測定装置
US5434669A (en) * 1990-10-23 1995-07-18 Olympus Optical Co., Ltd. Measuring interferometric endoscope having a laser radiation source
JPH0792381B2 (ja) * 1991-11-07 1995-10-09 株式会社ミツトヨ 三次元測定機用プローブ
CN1028383C (zh) * 1992-05-21 1995-05-10 清华大学 激光高精度测量大型工件内外径装置及方法
CN1093163A (zh) * 1993-04-01 1994-10-05 浙江大学 光纤位移传感器
CN1104765A (zh) * 1993-12-30 1995-07-05 天津大学 测量盲小孔与狭槽的三维测头和测量方法
JP3464835B2 (ja) * 1994-10-31 2003-11-10 東京航空計器株式会社 微小円筒形部品の穴径・同心度測定装置
EP0988505B1 (de) * 1997-06-12 2002-01-09 Werth Messtechnik GmbH Koordinatenmessgerät mit biegeelastischer Tasterverlängerung und optischem Sensor
DE19805892A1 (de) * 1997-06-12 1998-12-24 Werth Messtechnik Gmbh Verfahren und Anordnung zur Messung von Strukturen eines Objekts
JPH11108640A (ja) * 1997-09-30 1999-04-23 Mitsubishi Cable Ind Ltd 光学式触覚センサ
DE29808683U1 (de) * 1998-05-13 1998-08-20 Kunzmann, Horst, 38116 Braunschweig Anordnung zur Sensierung der dritten Raumrichtung bei einem mikromechanischen Tastsystem
JP2003004433A (ja) * 2001-06-21 2003-01-08 Sankyo Seiki Mfg Co Ltd 微小内径測定方法及び装置
US7016052B2 (en) * 2001-09-28 2006-03-21 The Boeing Company Apparatus for measuring characteristics of a hole and associated method
CN1346965A (zh) * 2001-10-15 2002-05-01 天津大学 一种光纤干涉测量距离的方法及测量设备
CN2578823Y (zh) * 2002-11-01 2003-10-08 秦书乐 一种光纤探头
DE10258283B4 (de) * 2002-12-13 2011-02-17 Carl Mahr Holding Gmbh Tasteinrichtung zur Werkstückvermessung
US7023557B2 (en) * 2003-08-05 2006-04-04 Agilent Technologies, Inc. Parallel interferometric measurements using an expanded local oscillator signal
CN1267696C (zh) * 2004-09-22 2006-08-02 哈尔滨工业大学 采用布里渊环形激光器测量超窄激光线宽的装置和方法

Also Published As

Publication number Publication date
GB0718827D0 (en) 2007-11-07
DE112006001788T5 (de) 2008-06-26
GB2440851B (en) 2010-11-10
US7733477B2 (en) 2010-06-08
CN1731084A (zh) 2006-02-08
GB2440851A (en) 2008-02-13
GB2440851B8 (en) 2010-01-05
JP2009508114A (ja) 2009-02-26
US20080209746A1 (en) 2008-09-04
CN1329711C (zh) 2007-08-01
DE112006001788B4 (de) 2015-10-15
WO2007030993A1 (en) 2007-03-22
WO2007030993A8 (en) 2007-09-27

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