JP4955240B2 - 膜測定装置およびそれを用いる塗工装置 - Google Patents
膜測定装置およびそれを用いる塗工装置 Download PDFInfo
- Publication number
- JP4955240B2 JP4955240B2 JP2005254331A JP2005254331A JP4955240B2 JP 4955240 B2 JP4955240 B2 JP 4955240B2 JP 2005254331 A JP2005254331 A JP 2005254331A JP 2005254331 A JP2005254331 A JP 2005254331A JP 4955240 B2 JP4955240 B2 JP 4955240B2
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- JP
- Japan
- Prior art keywords
- film
- thickness
- color
- color component
- copper foil
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C1/00—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating
- B05C1/04—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to work of indefinite length
- B05C1/08—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to work of indefinite length using a roller or other rotating member which contacts the work along a generating line
- B05C1/0826—Apparatus in which liquid or other fluent material is applied to the surface of the work by contact with a member carrying the liquid or other fluent material, e.g. a porous member loaded with a liquid to be applied as a coating for applying liquid or other fluent material to work of indefinite length using a roller or other rotating member which contacts the work along a generating line the work being a web or sheets
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Coating Apparatus (AREA)
Description
2 塗工装置
3,15 ロール
4 シート
5 ガイドロール
6 塗工部
7 乾燥炉
8 カラーCCDセンサ
9 照明用光源
10 コントローラ
11 ビデオボード
12 画像処理ボード
13 テーブル
14 演算回路
20 マーカー
21 塗工量コントローラ
22 入力手段
23 照度センサ
24 照明制御回路
Claims (6)
- 基材となる銅箔上に、アルミナ、酸化チタンまたはマグネシアの塗料による無機酸化物膜が製膜されて成る被検査物における膜の厚みを測定する膜測定装置において、
前記被検査物をカラー画像で撮像し、膜の色調をR,G,Bの各色成分の階調データに変換する撮像手段と、
特定の色成分について、予め測定された各階調レベルに対する膜厚の基準値を格納している基準厚みテーブルと、
前記撮像手段からの前記R,G,Bの各色成分の階調データの内、前記銅箔上にカーボンを含む合剤層が成膜された後、前記無機酸化物膜が形成されている場合には、前記特定の色成分として前記R,G,Bの任意の色成分の階調データを、一方、前記銅箔上に直接前記無機酸化物膜が形成されている場合には、前記特定の色成分として前記Gの色成分の階調データを、それぞれ前記基準厚みテーブルに対照し、膜厚を求める演算手段とを含むことを特徴とする膜測定装置。 - 基材となる銅箔上に、アルミナ、酸化チタンまたはマグネシアの塗料による無機酸化物膜が製膜されて成る被検査物における膜の単位面積当りの重量を測定する膜測定装置において、
前記被検査物をカラー画像で撮像し、膜の色調をR,G,Bの各色成分の階調データに変換する撮像手段と、
特定の色成分について、予め測定された各階調レベルに対する重量の基準値を格納している基準重量テーブルと、
前記撮像手段からの前記R,G,Bの各色成分の階調データの内、前記銅箔上にカーボンを含む合剤層が成膜された後、前記無機酸化物膜が形成されている場合には、前記特定の色成分として前記R,G,Bの任意の色成分の階調データを、一方、前記銅箔上に直接前記無機酸化物膜が形成されている場合には、前記特定の色成分として前記Gの色成分の階調データを、それぞれ前記基準重量テーブルに対照し、単位面積当りの重量を求める演算手段とを含むことを特徴とする膜測定装置。 - 照明光の照度を検出する照度検出手段と、
前記照度検出手段の検出結果に応答し、前記照度が一定となるように光源をフィードバック制御する照度制御手段とをさらに備えることを特徴とする請求項1記載の膜測定装置。 - 前記基準厚みテーブルに対して、実測された厚みを前記基準値として、対応する階調レベルに対応付けて入力する入力手段をさらに備えることを特徴とする請求項1または3記載の膜測定装置。
- 前記請求項1,3または4記載の膜測定装置を用い、
塗工手段における塗工量を前記演算手段で求められた膜厚に応答して制御する塗工量制御手段を備えることを特徴とする塗工装置。 - 前記請求項1,3または4記載の膜測定装置を用い、
前記演算手段で求められた膜厚が予め定める基準値からの許容範囲内か否かの判定を行い、前記許容範囲から外れた部分を含む予め定めた膜の所定領域を欠陥部分と検出する検出手段を備えることを特徴とする塗工装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005254331A JP4955240B2 (ja) | 2005-09-02 | 2005-09-02 | 膜測定装置およびそれを用いる塗工装置 |
US11/507,620 US20070062447A1 (en) | 2005-09-02 | 2006-08-22 | Film measuring device and method, coater equipped with film measuring device, and coating method using film measuring method |
KR1020060083593A KR20070026204A (ko) | 2005-09-02 | 2006-08-31 | 막측정 장치 및 방법, 및 막측정 장치를 갖는 도공 장치 및막측정 방법을 이용한 도공 방법 |
CNA200610126780XA CN1924517A (zh) | 2005-09-02 | 2006-09-01 | 膜测定装置及方法、涂敷装置及涂敷方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005254331A JP4955240B2 (ja) | 2005-09-02 | 2005-09-02 | 膜測定装置およびそれを用いる塗工装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007061780A JP2007061780A (ja) | 2007-03-15 |
JP4955240B2 true JP4955240B2 (ja) | 2012-06-20 |
Family
ID=37817256
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005254331A Expired - Fee Related JP4955240B2 (ja) | 2005-09-02 | 2005-09-02 | 膜測定装置およびそれを用いる塗工装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20070062447A1 (ja) |
JP (1) | JP4955240B2 (ja) |
KR (1) | KR20070026204A (ja) |
CN (1) | CN1924517A (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100151115A1 (en) * | 2008-12-17 | 2010-06-17 | Honeywell International Inc. | Method and system for producing a gas-sensitive substrate |
GB0919059D0 (en) * | 2009-10-30 | 2009-12-16 | Sencon Europ Ltd | Application and inspection system |
RU2515123C1 (ru) * | 2010-05-19 | 2014-05-10 | Шарп Кабусики Кайся | Способ контроля формы |
JP5862286B2 (ja) * | 2011-12-27 | 2016-02-16 | 株式会社リコー | 薄膜製造装置、薄膜製造方法、液滴吐出ヘッドの製造方法 |
CN104858106B (zh) * | 2015-06-01 | 2018-01-26 | 合肥京东方光电科技有限公司 | 涂布系统和涂布方法 |
US10985355B2 (en) * | 2015-10-23 | 2021-04-20 | Sumitomo Chemical Company, Limited | Method for producing functional film, control device, and control method |
US10753728B2 (en) * | 2016-01-07 | 2020-08-25 | Arkema Inc. | Optical method to measure the thickness of coatings deposited on substrates |
KR102195240B1 (ko) * | 2017-11-28 | 2020-12-24 | 주식회사 고영테크놀러지 | 기판 검사 장치 및 기판 검사 방법 |
US10859371B2 (en) | 2017-11-28 | 2020-12-08 | Koh Young Technology Inc. | Apparatus for inspecting substrate and method thereof |
US10852125B2 (en) | 2017-11-28 | 2020-12-01 | Koh Young Technology Inc. | Apparatus for inspecting film on substrate by using optical interference and method thereof |
CN111605064B (zh) * | 2019-06-05 | 2021-08-06 | 北新集团建材股份有限公司 | 一种墙板质量控制方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5441187A (en) * | 1977-09-08 | 1979-04-02 | Nippon Kokan Kk | Device for detecting surface flaw of columnar or cylindrical metal |
JPS6133907Y2 (ja) * | 1981-05-15 | 1986-10-03 | ||
JPH0472554A (ja) * | 1990-07-13 | 1992-03-06 | Hajime Sangyo Kk | 透明容器検査装置 |
JPH05312738A (ja) * | 1992-05-08 | 1993-11-22 | Hitachi Ltd | 分析装置 |
JPH07311020A (ja) * | 1994-05-19 | 1995-11-28 | Asahi Glass Eng Kk | 薄膜の膜厚測定方法および測定装置 |
JP3411395B2 (ja) * | 1994-07-11 | 2003-05-26 | 日本たばこ産業株式会社 | ベンチレーション測定装置 |
JP3324343B2 (ja) * | 1994-07-28 | 2002-09-17 | 松下電器産業株式会社 | ペーストの塗着装置および方法 |
US5678126A (en) * | 1996-09-30 | 1997-10-14 | Xerox Corporation | Filming attenuation correcting toner concentration sensor assembly and method |
US5795394A (en) * | 1997-06-02 | 1998-08-18 | Honeywell-Measurex | Coating weight measuring and control apparatus |
JPH11174011A (ja) * | 1997-12-13 | 1999-07-02 | Kosu:Kk | アンモニア濃度計 |
JPH11307604A (ja) * | 1998-04-17 | 1999-11-05 | Toshiba Corp | プロセスモニタ方法及びプロセス装置 |
JP2000117181A (ja) * | 1998-10-16 | 2000-04-25 | Tokyo Nekki Kk | 塗工膜厚制御方法及び制御システム |
JP2000168750A (ja) * | 1998-12-04 | 2000-06-20 | Mitsui Chemicals Inc | 異物検査装置 |
JP3598054B2 (ja) * | 2000-11-06 | 2004-12-08 | 東京エレクトロン株式会社 | 塗布膜形成装置 |
JP2002236004A (ja) * | 2001-02-08 | 2002-08-23 | Dac Engineering Kk | 透光体の厚み計測方法および厚み計測装置 |
JP2004279175A (ja) * | 2003-03-14 | 2004-10-07 | Sumitomo Metal Ind Ltd | オンライン測定装置の測定精度評価方法及び校正方法並びにこれらの方法を用いた鋼板の製造方法 |
-
2005
- 2005-09-02 JP JP2005254331A patent/JP4955240B2/ja not_active Expired - Fee Related
-
2006
- 2006-08-22 US US11/507,620 patent/US20070062447A1/en not_active Abandoned
- 2006-08-31 KR KR1020060083593A patent/KR20070026204A/ko not_active Application Discontinuation
- 2006-09-01 CN CNA200610126780XA patent/CN1924517A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
CN1924517A (zh) | 2007-03-07 |
US20070062447A1 (en) | 2007-03-22 |
JP2007061780A (ja) | 2007-03-15 |
KR20070026204A (ko) | 2007-03-08 |
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