JP4942175B2 - 交流電場を用いて微粒子を質量分級する微粒子計測装置および計測方法 - Google Patents
交流電場を用いて微粒子を質量分級する微粒子計測装置および計測方法 Download PDFInfo
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- JP4942175B2 JP4942175B2 JP2006296262A JP2006296262A JP4942175B2 JP 4942175 B2 JP4942175 B2 JP 4942175B2 JP 2006296262 A JP2006296262 A JP 2006296262A JP 2006296262 A JP2006296262 A JP 2006296262A JP 4942175 B2 JP4942175 B2 JP 4942175B2
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Description
気体中に含まれる微粒子を分級しながら計測する微粒子計測装置であって、
大気圧以下の所定圧力で層流状態を保ちながら流れる気体とともに前記微粒子が通過する通路部と、
前記通路部の上流側に設けられて前記微粒子を帯電させる微粒子帯電部と、
等角度ずつ位相をずらした複数組の交流電圧を、前記気体の流れと直交する方向に印加することにより、前記通路部を通過する前記帯電した微粒子を質量によって選択的に分離する微粒子分離手段と、
前記選択的に分離された微粒子を検出する微粒子検出手段と
を備えることを要旨とする。
気体中に含まれる微粒子を分級して計測する微粒子計測方法であって、
大気圧以下の所定圧力で層流状態を保ちながら気体が流れる通路部に、前記微粒子を上流側から供給する第1の工程と、
前記通路部の上流側で前記微粒子を帯電させる第2の工程と、
等角度ずつ位相をずらした複数組の交流電場を、前記気体の流れと直交する方向に印加することにより、前記帯電した状態で前記通路部を通過する微粒子を質量によって選択的に分離する第3の工程と、
前記選択的に分離された微粒子を検出する第4の工程と
を備えることを要旨とする。
100…微粒子計測装置、 102…分級通路、 104…微粒子帯電部、
106…微粒子検出部、 108…電極、 110…電圧印加部、
112…空気取入口、 120…排気ポンプ
Claims (4)
- 気体中に含まれる微粒子を分級しながら計測する微粒子計測装置であって、
大気圧以下の所定圧力で層流状態を保ちながら流れる気体とともに前記微粒子が通過する通路部と、
前記通路部の上流側に設けられて前記微粒子を帯電させる微粒子帯電部と、
等角度ずつ位相をずらした複数組の交流電圧を、前記気体の流れと直交する方向に印加することにより、前記通路部を通過する前記帯電した微粒子を質量によって選択的に分離する微粒子分離手段と、
前記選択的に分離された微粒子を検出する微粒子検出手段と
を備える微粒子計測装置。 - 前記通路部内が、大気圧の1/10の圧力以上の所定圧力まで減圧されている請求項1に記載の微粒子計測装置。
- 請求項1に記載の微粒子計測装置であって、
前記微粒子分離手段は、
前記印加する交流電圧の周波数を変更する周波数変更手段を備えており、
前記通路部を通過する微粒子の中から前記周波数に応じた質量の微粒子を、選択的に分離する手段である微粒子計測装置。 - 気体中に含まれる微粒子を分級して計測する微粒子計測方法であって、
大気圧以下の所定圧力で層流状態を保ちながら気体が流れる通路部に、前記微粒子を上流側から供給する第1の工程と、
前記通路部の上流側で前記微粒子を帯電させる第2の工程と、
等角度ずつ位相をずらした複数組の交流電圧を、前記気体の流れと直交する方向に印加することにより、前記帯電した状態で前記通路部を通過する微粒子を質量によって選択的に分離する第3の工程と、
前記選択的に分離された微粒子を検出する第4の工程と
を備える微粒子計測方法。
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JP2006296262A JP4942175B2 (ja) | 2006-10-31 | 2006-10-31 | 交流電場を用いて微粒子を質量分級する微粒子計測装置および計測方法 |
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JP2006296262A JP4942175B2 (ja) | 2006-10-31 | 2006-10-31 | 交流電場を用いて微粒子を質量分級する微粒子計測装置および計測方法 |
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JP4942175B2 true JP4942175B2 (ja) | 2012-05-30 |
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Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5510017B2 (ja) * | 2010-04-15 | 2014-06-04 | いすゞ自動車株式会社 | 排気センサー配置構造 |
TWI745391B (zh) * | 2016-06-30 | 2021-11-11 | 美商加野麥克斯Fmt股份有限公司 | 膠體粒子尺寸質量分佈測量技術 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP3055145B2 (ja) * | 1990-02-13 | 2000-06-26 | 株式会社島津製作所 | 四重極質量分析装置 |
JP2517872B2 (ja) * | 1993-08-16 | 1996-07-24 | 工業技術院長 | エアロゾル粒子質量分析方法 |
JP3349965B2 (ja) * | 1998-11-05 | 2002-11-25 | 松下電器産業株式会社 | 微粒子分級方法及び装置 |
US7064322B2 (en) * | 2004-10-01 | 2006-06-20 | Agilent Technologies, Inc. | Mass spectrometer multipole device |
JP2006153709A (ja) * | 2004-11-30 | 2006-06-15 | Ohm Denki Kk | 浮遊粒子分析装置および浮遊粒子分析方法 |
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