JP4880294B2 - Ｘ線視野、光学視野及び主要レセプターに関する偏差を決定するためのシステム、方法及び装置 - Google Patents

Ｘ線視野、光学視野及び主要レセプターに関する偏差を決定するためのシステム、方法及び装置 Download PDF

Info

Publication number
JP4880294B2
JP4880294B2 JP2005343129A JP2005343129A JP4880294B2 JP 4880294 B2 JP4880294 B2 JP 4880294B2 JP 2005343129 A JP2005343129 A JP 2005343129A JP 2005343129 A JP2005343129 A JP 2005343129A JP 4880294 B2 JP4880294 B2 JP 4880294B2
Authority
JP
Japan
Prior art keywords
ray
electromagnetic energy
field
sensor
visible light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2005343129A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006158965A (ja
JP2006158965A5 (enExample
Inventor
ジョン・マイケル・サンドリック
ローランド・エフ・サウンダース
ジェリー・エイ・トーマス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2006158965A publication Critical patent/JP2006158965A/ja
Publication of JP2006158965A5 publication Critical patent/JP2006158965A5/ja
Application granted granted Critical
Publication of JP4880294B2 publication Critical patent/JP4880294B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B42/00—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means
    • G03B42/02—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means using X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
JP2005343129A 2004-12-02 2005-11-29 Ｘ線視野、光学視野及び主要レセプターに関する偏差を決定するためのシステム、方法及び装置 Expired - Fee Related JP4880294B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/002,007 2004-12-02
US11/002,007 US7176467B2 (en) 2004-12-02 2004-12-02 Systems, methods and apparatus for determining deviation of an x-ray field, a light field and a primary receptor

Publications (3)

Publication Number Publication Date
JP2006158965A JP2006158965A (ja) 2006-06-22
JP2006158965A5 JP2006158965A5 (enExample) 2009-01-15
JP4880294B2 true JP4880294B2 (ja) 2012-02-22

Family

ID=36481199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005343129A Expired - Fee Related JP4880294B2 (ja) 2004-12-02 2005-11-29 Ｘ線視野、光学視野及び主要レセプターに関する偏差を決定するためのシステム、方法及び装置

Country Status (3)

Country Link
US (1) US7176467B2 (enExample)
JP (1) JP4880294B2 (enExample)
FR (1) FR2878982B1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE526928C2 (sv) * 2003-11-03 2005-11-22 Unfors Instr Ab Anordning, arrangemang och förfarande för att indikera position vid ytor exponerade för röntgenstrålning- och ljuskällor
KR101140199B1 (ko) * 2008-01-28 2012-05-02 리플렉티브 엑스-레이 옵틱스 엘엘씨 Ｘ선 촬영법에 의한 ｘ선 촬상을 위한 광학 위치 맞춤 시스템 및 위치 맞춤 방법
DE102008026497A1 (de) * 2008-06-03 2010-01-07 Astrium Gmbh Verfahren zum Optimieren des Betriebs eines aktiven Seitensichtsensors bei veränderlicher Höhe über der zu erfassenden Oberfläche
WO2010132002A1 (en) * 2009-05-12 2010-11-18 Rti Electronics Ab Method and equipment for an x-ray apparatus
WO2010140944A1 (en) 2009-06-05 2010-12-09 Rti Electronics Ab X-ray detection device
US20130114798A1 (en) * 2010-07-16 2013-05-09 David Eric Hintenlang Digital x-ray field and light field alignment
FR3147875A1 (fr) * 2023-04-17 2024-10-18 Fibermetrix Procédé de réalisation d’un dispositif de radioprotection pour visualiser l’interaction avec un rayonnement ionisant

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0612065Y2 (ja) * 1989-10-24 1994-03-30 近畿イシコ株式会社 移動式カウンターウエイトの駆動装置
US5480439A (en) * 1991-02-13 1996-01-02 Lunar Corporation Method for periprosthetic bone mineral density measurement
JP3456718B2 (ja) * 1993-01-27 2003-10-14 株式会社東芝 Ｘ線撮影装置
US5431639A (en) * 1993-08-12 1995-07-11 Boston Scientific Corporation Treating wounds caused by medical procedures
JPH07148159A (ja) * 1993-11-29 1995-06-13 Shimadzu Corp Ｘ線可動絞り装置
JP3554129B2 (ja) * 1997-01-17 2004-08-18 キヤノン株式会社 放射線撮影装置
AU738093B2 (en) * 1997-09-11 2001-09-06 Marc G. Apple Medical radiation treatment delivery apparatus
US6162165A (en) * 1997-12-05 2000-12-19 Cook Incorporated Medical radiation treatment device
AU2773599A (en) * 1998-02-20 1999-09-06 Cook Incorporated Medical, radiotherapy source vial
JPH11309140A (ja) * 1998-04-30 1999-11-09 Nikkusu:Kk 歯科用ｘ線検知センサ
JP2001340332A (ja) * 2000-06-05 2001-12-11 Hitachi Medical Corp Ｘ線画像診断装置
US6428512B1 (en) * 2000-10-10 2002-08-06 Advanced Cardiovascular Systems, Inc. Guidewire with improved lesion measurement
JP2004283367A (ja) * 2003-03-20 2004-10-14 Fuji Photo Film Co Ltd 放射線撮像システム

Also Published As

Publication number Publication date
FR2878982A1 (fr) 2006-06-09
US20060118701A1 (en) 2006-06-08
US7176467B2 (en) 2007-02-13
FR2878982B1 (fr) 2012-03-23
JP2006158965A (ja) 2006-06-22

Similar Documents

Publication Publication Date Title
US7519156B2 (en) Method and apparatus for hot swapping portable detectors in x-ray systems
US20140064450A1 (en) Body motion detection device and method, as well as radiographic imaging apparatus and method
JP5780931B2 (ja) 放射線断層撮影装置および被曝線量計算方法並びにプログラム
JP3904543B2 (ja) Ｘ線結晶方位測定装置及びｘ線結晶方位測定方法
US9128029B2 (en) X-ray analysis apparatus
EP3383273B1 (en) Apparatus for x-ray imaging an object
US5539799A (en) Method and device for acceptance and stability testing of filmless dental radiographic equipment
JP2012000452A (ja) 可搬型検出装置用の位置感知装置
JP2015167603A (ja) 撮影台
JP4880294B2 (ja) Ｘ線視野、光学視野及び主要レセプターに関する偏差を決定するためのシステム、方法及び装置
EP3671111A1 (en) Method for calibrating a 3d camera for patient thickness measurements
JP4537090B2 (ja) トモシンセシス装置
US7056020B2 (en) Alignment systems and methods for radiographic imaging systems
US10729390B2 (en) Rotary collimator for determining the position of an element provided with sensors in an X-ray imaging system
US7286631B2 (en) Method and apparatus for tomosynthesis image quality control
US6398408B1 (en) Automated image chain geometric quantification
JP3655778B2 (ja) Ｘ線分析装置
JP3846576B2 (ja) コンピュータ断層撮影装置
US5872830A (en) Device and method of imaging or measuring of a radiation source
JP2002315743A (ja) ディジタル放射線画像イメージング・システムにおける線源−画像間距離を決定する方法及び装置
CN101112318B (zh) X射线照相设备和旋转平面的布置方法
CN108937976B (zh) X射线系统、测量x射线管的焦点的偏移的方法、准直器
JP2005265502A (ja) Ｘ線結晶方位測定装置及びｘ線結晶方位測定方法
US20190302277A1 (en) Detector strip for radiographic film
JP3629542B2 (ja) 蛍光ｘ線分析装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20081126

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20081126

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20101221

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20101221

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110517

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20110519

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110713

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20111108

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20111201

R150 Certificate of patent or registration of utility model

Ref document number: 4880294

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20141209

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees