JP4878238B2 - 標的物質検出用の素子及びそれを用いた標的物質の検出方法、並びにそのための検出装置及びキット - Google Patents

標的物質検出用の素子及びそれを用いた標的物質の検出方法、並びにそのための検出装置及びキット Download PDF

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JP4878238B2
JP4878238B2 JP2006208777A JP2006208777A JP4878238B2 JP 4878238 B2 JP4878238 B2 JP 4878238B2 JP 2006208777 A JP2006208777 A JP 2006208777A JP 2006208777 A JP2006208777 A JP 2006208777A JP 4878238 B2 JP4878238 B2 JP 4878238B2
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target substance
detecting
metal
substance according
substrate
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JP2007064968A5 (enExample
JP2007064968A (ja
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淳太 山道
秀則 塩塚
朋宏 山田
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Canon Inc
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Canon Inc
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JP2006208777A 2005-08-01 2006-07-31 標的物質検出用の素子及びそれを用いた標的物質の検出方法、並びにそのための検出装置及びキット Expired - Fee Related JP4878238B2 (ja)

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JP2006208777A JP4878238B2 (ja) 2005-08-01 2006-07-31 標的物質検出用の素子及びそれを用いた標的物質の検出方法、並びにそのための検出装置及びキット

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JP2005223505 2005-08-01
JP2005223505 2005-08-01
JP2006208777A JP4878238B2 (ja) 2005-08-01 2006-07-31 標的物質検出用の素子及びそれを用いた標的物質の検出方法、並びにそのための検出装置及びキット

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JP2007064968A5 JP2007064968A5 (enExample) 2009-09-24
JP4878238B2 true JP4878238B2 (ja) 2012-02-15

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9658165B2 (en) 2014-05-08 2017-05-23 Seiko Epson Corporation Electronic field enhancement element, analysis device, and electronic apparatus

Families Citing this family (9)

* Cited by examiner, † Cited by third party
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JP2008286778A (ja) * 2007-04-16 2008-11-27 National Institute Of Advanced Industrial & Technology 周期構造を有するマイクロプレートおよびそれを用いた表面プラズモン励起増強蛍光顕微鏡または蛍光マイクロプレートリーダー
US20080280374A1 (en) * 2007-05-08 2008-11-13 General Electric Company Methods and systems for detecting biological and chemical materials on a submicron structured substrate
JP5116362B2 (ja) * 2007-05-28 2013-01-09 株式会社リコー バイオセンサ
JP5026359B2 (ja) * 2008-07-04 2012-09-12 株式会社日立ハイテクノロジーズ 核酸分析デバイス、核酸分析装置及び核酸分析方法
FR2977937B1 (fr) * 2011-07-15 2013-08-16 Centre Nat Rech Scient Detecteur bolometrique a performances ameliorees
JP5975480B2 (ja) * 2012-01-31 2016-08-23 国立研究開発法人産業技術総合研究所 バイオチップ、バイオアッセイ用キット、及びバイオアッセイ方法
JP2014169955A (ja) 2013-03-05 2014-09-18 Seiko Epson Corp 分析装置、分析方法、これらに用いる光学素子および電子機器、並びに光学素子の設計方法
JP6365817B2 (ja) 2014-02-17 2018-08-01 セイコーエプソン株式会社 分析装置、及び電子機器
JP7066120B2 (ja) * 2018-04-27 2022-05-13 国立研究開発法人物質・材料研究機構 狭帯熱放射スペクトルを有する構造体

Family Cites Families (9)

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JPH10267841A (ja) * 1997-03-24 1998-10-09 Kokuritsu Shintai Shogaisha Rehabilitation Center Souchiyou 表面プラズモン共鳴センシングデバイス
JP3452837B2 (ja) * 1999-06-14 2003-10-06 理化学研究所 局在プラズモン共鳴センサー
JP3957199B2 (ja) * 2003-03-19 2007-08-15 富士フイルム株式会社 センサチップおよびセンサチップの製造方法並びにそのセンサチップを用いたセンサ
RS20150135A1 (sr) * 2003-05-30 2015-08-31 Genentech Inc. Tretman sa anti-vegf antitelima
JP2005016963A (ja) * 2003-06-23 2005-01-20 Canon Inc 化学センサ、化学センサ装置
FR2860872A1 (fr) * 2003-10-09 2005-04-15 Commissariat Energie Atomique Micro-capteurs et nano-capteurs d'especes chimiques et biologiques a plasmons de surface
JP4436109B2 (ja) * 2003-11-07 2010-03-24 積水化学工業株式会社 光学的測定装置及びそれを用いた特異的結合物の光学的測定方法
JP4224641B2 (ja) * 2003-11-28 2009-02-18 国立大学法人東京工業大学 局在化表面プラズモンセンサ、センシング装置およびセンシング方法
JP4109205B2 (ja) * 2004-01-07 2008-07-02 富士フイルム株式会社 被検体検出方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9658165B2 (en) 2014-05-08 2017-05-23 Seiko Epson Corporation Electronic field enhancement element, analysis device, and electronic apparatus
US9880100B2 (en) 2014-05-08 2018-01-30 Seiko Epson Corporation Electronic field enhancement element, analysis device, and electronic apparatus

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