JP4869499B2 - 素子基板の検査方法 - Google Patents

素子基板の検査方法 Download PDF

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Publication number
JP4869499B2
JP4869499B2 JP2001170104A JP2001170104A JP4869499B2 JP 4869499 B2 JP4869499 B2 JP 4869499B2 JP 2001170104 A JP2001170104 A JP 2001170104A JP 2001170104 A JP2001170104 A JP 2001170104A JP 4869499 B2 JP4869499 B2 JP 4869499B2
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JP
Japan
Prior art keywords
pixel
element substrate
pixel electrode
electrode
counter detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001170104A
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English (en)
Japanese (ja)
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JP2002072918A5 (enrdf_load_stackoverflow
JP2002072918A (ja
Inventor
舜平 山崎
潤 小山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2001170104A priority Critical patent/JP4869499B2/ja
Publication of JP2002072918A publication Critical patent/JP2002072918A/ja
Publication of JP2002072918A5 publication Critical patent/JP2002072918A5/ja
Application granted granted Critical
Publication of JP4869499B2 publication Critical patent/JP4869499B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP2001170104A 2000-06-06 2001-06-05 素子基板の検査方法 Expired - Fee Related JP4869499B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001170104A JP4869499B2 (ja) 2000-06-06 2001-06-05 素子基板の検査方法

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2000168327 2000-06-06
JP2000168327 2000-06-06
JP2000-168327 2000-06-06
JP2001170104A JP4869499B2 (ja) 2000-06-06 2001-06-05 素子基板の検査方法

Publications (3)

Publication Number Publication Date
JP2002072918A JP2002072918A (ja) 2002-03-12
JP2002072918A5 JP2002072918A5 (enrdf_load_stackoverflow) 2008-07-17
JP4869499B2 true JP4869499B2 (ja) 2012-02-08

Family

ID=26593363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001170104A Expired - Fee Related JP4869499B2 (ja) 2000-06-06 2001-06-05 素子基板の検査方法

Country Status (1)

Country Link
JP (1) JP4869499B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4017586B2 (ja) 2003-10-29 2007-12-05 三洋電機株式会社 電池の充電方法
JP4301498B2 (ja) 2003-11-13 2009-07-22 インターナショナル・ビジネス・マシーンズ・コーポレーション Ｔｆｔを検査する検査装置
JP4791023B2 (ja) 2004-11-08 2011-10-12 インターナショナル・ビジネス・マシーンズ・コーポレーション Ｔｆｔの検査装置および検査方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62115690A (ja) * 1985-11-13 1987-05-27 富士通株式会社 表示素子のライン欠陥検査方法
JPH02140794A (ja) * 1988-11-21 1990-05-30 Toshiba Corp 液晶ディスプレイの欠陥検査方法
JP2889132B2 (ja) * 1994-10-12 1999-05-10 株式会社フロンテック 薄膜トランジスタの検査装置
JP3271548B2 (ja) * 1997-04-30 2002-04-02 日新電機株式会社 静電チャック回路の断線検知方法
JP3613968B2 (ja) * 1998-03-18 2005-01-26 セイコーエプソン株式会社 半導体素子検査装置及び半導体素子検査方法

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Publication number Publication date
JP2002072918A (ja) 2002-03-12

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