JP4737427B2 - インラインx線透視装置 - Google Patents

インラインx線透視装置 Download PDF

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Publication number
JP4737427B2
JP4737427B2 JP2006129833A JP2006129833A JP4737427B2 JP 4737427 B2 JP4737427 B2 JP 4737427B2 JP 2006129833 A JP2006129833 A JP 2006129833A JP 2006129833 A JP2006129833 A JP 2006129833A JP 4737427 B2 JP4737427 B2 JP 4737427B2
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Japan
Prior art keywords
ray
line sensor
inspection object
image
display
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Expired - Fee Related
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JP2006129833A
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English (en)
Japanese (ja)
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JP2007303851A5 (enExample
JP2007303851A (ja
Inventor
俊道 政木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
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Shimadzu Corp
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Priority to JP2006129833A priority Critical patent/JP4737427B2/ja
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Publication of JP2007303851A5 publication Critical patent/JP2007303851A5/ja
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Publication of JP4737427B2 publication Critical patent/JP4737427B2/ja
Expired - Fee Related legal-status Critical Current
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  • Analysing Materials By The Use Of Radiation (AREA)
JP2006129833A 2006-05-09 2006-05-09 インラインx線透視装置 Expired - Fee Related JP4737427B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006129833A JP4737427B2 (ja) 2006-05-09 2006-05-09 インラインx線透視装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006129833A JP4737427B2 (ja) 2006-05-09 2006-05-09 インラインx線透視装置

Publications (3)

Publication Number Publication Date
JP2007303851A JP2007303851A (ja) 2007-11-22
JP2007303851A5 JP2007303851A5 (enExample) 2008-10-09
JP4737427B2 true JP4737427B2 (ja) 2011-08-03

Family

ID=38837908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006129833A Expired - Fee Related JP4737427B2 (ja) 2006-05-09 2006-05-09 インラインx線透視装置

Country Status (1)

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JP (1) JP4737427B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009080030A (ja) * 2007-09-26 2009-04-16 Ishida Co Ltd X線検査装置
JP2009270866A (ja) * 2008-05-01 2009-11-19 Ishida Co Ltd X線検査装置
JP5559471B2 (ja) 2008-11-11 2014-07-23 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
JP5981598B2 (ja) * 2015-03-31 2016-08-31 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
KR102521568B1 (ko) * 2021-05-12 2023-04-14 제이피아이헬스케어(주) 실시간 인라인 디지털 단층영상 합성 시스템

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3492509B2 (ja) * 1998-02-04 2004-02-03 株式会社神戸製鋼所 表面欠陥探傷装置及び蛍光磁粉探傷方法
JP4460139B2 (ja) * 2000-10-25 2010-05-12 アンリツ産機システム株式会社 X線異物検出装置

Also Published As

Publication number Publication date
JP2007303851A (ja) 2007-11-22

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