JP4729477B2 - 物体検出 - Google Patents

物体検出 Download PDF

Info

Publication number
JP4729477B2
JP4729477B2 JP2006506587A JP2006506587A JP4729477B2 JP 4729477 B2 JP4729477 B2 JP 4729477B2 JP 2006506587 A JP2006506587 A JP 2006506587A JP 2006506587 A JP2006506587 A JP 2006506587A JP 4729477 B2 JP4729477 B2 JP 4729477B2
Authority
JP
Japan
Prior art keywords
voltage
electrode
capacitor
electric field
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2006506587A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006525635A (ja
JP2006525635A5 (https=
Inventor
コーネリス、バン、ベルケル
アッシャー、ジェイ．ホスキンス
デイビッド、エス．ジョージ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV, Koninklijke Philips Electronics NV filed Critical Koninklijke Philips NV
Publication of JP2006525635A publication Critical patent/JP2006525635A/ja
Publication of JP2006525635A5 publication Critical patent/JP2006525635A5/ja
Application granted granted Critical
Publication of JP4729477B2 publication Critical patent/JP4729477B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/945—Proximity switches
    • H03K17/955—Proximity switches using a capacitive detector
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16—Constructional details or arrangements
    • G06F1/1613—Constructional details or arrangements for portable computers
    • G06F1/1626—Constructional details or arrangements for portable computers with a single-body enclosure integrating a flat display, e.g. Personal Digital Assistants [PDAs]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16—Constructional details or arrangements
    • G06F1/1613—Constructional details or arrangements for portable computers
    • G06F1/1633—Constructional details or arrangements of portable computers not specific to the type of enclosures covered by groups G06F1/1615 - G06F1/1626
    • G06F1/1684—Constructional details or arrangements related to integrated I/O peripherals not covered by groups G06F1/1635 - G06F1/1675
    • G06F1/169—Constructional details or arrangements related to integrated I/O peripherals not covered by groups G06F1/1635 - G06F1/1675 the I/O peripheral being an integrated pointing device, e.g. trackball in the palm rest area, mini-joystick integrated between keyboard keys, touch pads or touch stripes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/96—Touch switches
    • H03K2217/9607—Capacitive touch switches
    • H03K2217/960755—Constructional details of capacitive touch and proximity switches
    • H03K2217/960775—Emitter-receiver or "fringe" type detection, i.e. one or more field emitting electrodes and corresponding one or more receiving electrodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • General Engineering & Computer Science (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Electronic Switches (AREA)
  • Switches That Are Operated By Magnetic Or Electric Fields (AREA)
  • Position Input By Displaying (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Electrically Driven Valve-Operating Means (AREA)
  • Glass Compositions (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP2006506587A 2003-05-07 2004-04-28 物体検出 Expired - Lifetime JP4729477B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0310409.8 2003-05-07
GBGB0310409.8A GB0310409D0 (en) 2003-05-07 2003-05-07 Object sensing
PCT/IB2004/001426 WO2004099964A2 (en) 2003-05-07 2004-04-28 Capacitive object sensing system and corresponding method

Publications (3)

Publication Number Publication Date
JP2006525635A JP2006525635A (ja) 2006-11-09
JP2006525635A5 JP2006525635A5 (https=) 2007-04-05
JP4729477B2 true JP4729477B2 (ja) 2011-07-20

Family

ID=9957548

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006506587A Expired - Lifetime JP4729477B2 (ja) 2003-05-07 2004-04-28 物体検出

Country Status (10)

Country Link
US (1) US7560938B2 (https=)
EP (1) EP1623313B1 (https=)
JP (1) JP4729477B2 (https=)
KR (1) KR20060008984A (https=)
CN (1) CN1853155B (https=)
AT (1) ATE377788T1 (https=)
DE (1) DE602004009916T2 (https=)
GB (1) GB0310409D0 (https=)
TW (1) TW200504336A (https=)
WO (1) WO2004099964A2 (https=)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006025003A1 (en) * 2004-08-31 2006-03-09 Koninklijke Philips Electronics N.V. Proximity sensor for x-ray apparatus
WO2007013011A1 (en) * 2005-07-28 2007-02-01 Koninklijke Philips Electronics N.V. Object sensing system
US7812827B2 (en) 2007-01-03 2010-10-12 Apple Inc. Simultaneous sensing arrangement
US8493331B2 (en) 2007-06-13 2013-07-23 Apple Inc. Touch detection using multiple simultaneous frequencies
US7876311B2 (en) 2007-06-13 2011-01-25 Apple Inc. Detection of low noise frequencies for multiple frequency sensor panel stimulation
US8318098B2 (en) * 2007-10-30 2012-11-27 General Electric Company Method and apparatus for detecting an analyte
EP2289168B1 (en) * 2008-06-13 2016-09-07 Koninklijke Philips N.V. Capacitive proximity device and electronic device comprising the capacitive proximity device
US8057288B2 (en) * 2008-06-20 2011-11-15 Nissan North America, Inc. Contact-free vehicle air vent
US9606663B2 (en) 2008-09-10 2017-03-28 Apple Inc. Multiple stimulation phase determination
US8592697B2 (en) 2008-09-10 2013-11-26 Apple Inc. Single-chip multi-stimulus sensor controller
US9348451B2 (en) 2008-09-10 2016-05-24 Apple Inc. Channel scan architecture for multiple stimulus multi-touch sensor panels
CA2740719C (en) 2008-10-17 2016-09-13 Faurecia Bloc Avant Object detection device for an automotive vehicle
US8138771B2 (en) * 2008-12-05 2012-03-20 Nokia Corporation Touch controller with read-out line
JP5854991B2 (ja) * 2009-06-24 2016-02-09 マイクロチップ テクノロジー ジャーマニー ゲーエムベーハー ディスプレイデバイスの電極配置
US9036650B2 (en) 2009-09-11 2015-05-19 Apple Inc. Automatic low noise frequency selection
JP5607335B2 (ja) * 2009-10-19 2014-10-15 アルプス電気株式会社 静電容量式近接センサ装置、静電容量式モーション検出装置及びそれらを用いた入力装置
DE102009057933B3 (de) * 2009-12-11 2011-02-24 Ident Technology Ag Sensoreinrichtung sowie Verfahren zur Annäherungs- und Berührungsdetektion
DE102009057947A1 (de) 2009-12-11 2011-06-16 Ident Technology Ag Multifunktionaler Berührungs- und/oder Annäherungssensor
TWI410851B (zh) * 2010-04-27 2013-10-01 Htc Corp 手持裝置及其觸控感測裝置
DE102010044820B4 (de) * 2010-09-09 2015-01-22 Ident Technology Ag Sensoreinrichtung sowie Verfahren zur Annäherungs- und Berührungsdetektion
KR101735715B1 (ko) * 2010-11-23 2017-05-15 삼성전자주식회사 입력 감지 소자 및 이를 구비한 터치 패널
DE102012002193B4 (de) * 2012-02-07 2021-07-29 Polyic Gmbh & Co. Kg Kapazitives Sensorelement
AT512878B1 (de) * 2012-04-23 2015-10-15 Thomas Schlegl Vorrichtung zur Lokalisierung und Unterscheidung von Objekten an Sensorgebieten
US9261963B2 (en) 2013-08-22 2016-02-16 Qualcomm Incorporated Feedback for grounding independent haptic electrovibration
KR102127928B1 (ko) * 2013-10-15 2020-06-29 엘지전자 주식회사 입체적 입력장치를 갖는 글래스형 단말기 및 그의 화면 제어방법
DE102013019197A1 (de) * 2013-11-15 2015-05-21 Audi Ag Kraftfahrzeug-Klimatisierung mit adaptivem Luftausströmer
KR101605070B1 (ko) * 2015-05-04 2016-03-24 김정일 저온 수중 플라즈마 발생 장치
CA3208465A1 (en) 2021-03-03 2022-09-09 Guardian Glass, LLC Systems and/or methods for creating and detecting changes in electrical fields

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6125087A (ja) * 1984-07-16 1986-02-03 Honda Motor Co Ltd 物体検知装置
JPS61273822A (ja) * 1985-05-29 1986-12-04 オムロン株式会社 近接スイツチ
ES2252911T3 (es) * 1991-04-03 2006-05-16 Tagsys Sa Sistema de clasificacion de articulos.
US5844415A (en) * 1994-02-03 1998-12-01 Massachusetts Institute Of Technology Method for three-dimensional positions, orientation and mass distribution
US6114862A (en) * 1996-02-14 2000-09-05 Stmicroelectronics, Inc. Capacitive distance sensor
SE507933C2 (sv) * 1996-07-15 1998-07-27 Asea Brown Boveri Förfarande, anordning och sensor för att kapacitivt detektera fält och spänning samt användning därav
JP3394187B2 (ja) * 1997-08-08 2003-04-07 シャープ株式会社 座標入力装置および表示一体型座標入力装置
US6483931B2 (en) * 1997-09-11 2002-11-19 Stmicroelectronics, Inc. Electrostatic discharge protection of a capacitve type fingerprint sensing array
WO2000044018A1 (en) * 1999-01-26 2000-07-27 Harald Philipp Capacitive sensor and array
DE60032286T8 (de) * 1999-06-10 2007-09-27 Nippon Telegraph And Telephone Corp. Gerät zur Erkennung von Oberflächengestalten
JP4233698B2 (ja) * 1999-08-12 2009-03-04 セイコーインスツル株式会社 指紋読み取り装置及び方法
CN1155794C (zh) * 1999-12-02 2004-06-30 株式会社三丰 静电电容式变位检测装置
US6512381B2 (en) * 1999-12-30 2003-01-28 Stmicroelectronics, Inc. Enhanced fingerprint detection
GB0114456D0 (en) * 2001-06-14 2001-08-08 Koninkl Philips Electronics Nv Object sensing
JP2003058872A (ja) * 2001-08-21 2003-02-28 Sony Corp 指紋検出装置、その製造方法及び成膜装置
JP2005326167A (ja) * 2004-05-12 2005-11-24 Alps Electric Co Ltd 容量検出型センサ

Also Published As

Publication number Publication date
CN1853155A (zh) 2006-10-25
US20070052428A1 (en) 2007-03-08
JP2006525635A (ja) 2006-11-09
WO2004099964A3 (en) 2006-04-06
US7560938B2 (en) 2009-07-14
DE602004009916D1 (de) 2007-12-20
TW200504336A (en) 2005-02-01
ATE377788T1 (de) 2007-11-15
EP1623313B1 (en) 2007-11-07
WO2004099964A2 (en) 2004-11-18
DE602004009916T2 (de) 2008-08-21
KR20060008984A (ko) 2006-01-27
EP1623313A2 (en) 2006-02-08
GB0310409D0 (en) 2003-06-11
CN1853155B (zh) 2010-08-04

Similar Documents

Publication Publication Date Title
JP4729477B2 (ja) 物体検出
US11481072B2 (en) Capacitance detection circuit, touch detection apparatus and electronic device
US8598894B2 (en) Noise handling in capacitive touch sensors
US11054949B2 (en) Touch detection circuit, input device and electronic apparatus
US8866500B2 (en) Multi-functional capacitance sensing circuit with a current conveyor
US20150242043A1 (en) Signal processing circuit, signal processing method, position detector, and electronic device
CN107092407B (zh) 感应电容测量装置
KR101511162B1 (ko) 다중접촉 감지회로
EP3379271B1 (en) Capacitance detection apparatus, electronic device and force detection apparatus
US20100065341A1 (en) Driving scanned channel and non-scanned channels of a touch sensor with same amplitude and same phase
KR20190038187A (ko) 터치 검출을 위한 장치 및 방법
CN101263446B (zh) 坐标位置检测装置
EP3285204A1 (en) Touch detection circuit, fingerprint module and control method thereof
KR20150123488A (ko) 터치 감지 장치
KR20170029377A (ko) 호버 감지를 위한 좌표 측정 장치 및 방법
EP3770738B1 (en) Capacitance detection circuit, capacitance detection method, touch chip and electronic device
KR20170052051A (ko) 터치 센싱 방법, 터치 센싱 콘트롤러 및 이를 갖는 터치 센싱장치
US11188166B2 (en) Input device
CN108475133B (zh) 触摸板用驱动电路及利用其的触摸感测方法
US8653836B2 (en) Coordinate detecting device
JP2011113188A (ja) 静電容量型タッチパネルの信号処理回路
KR101209114B1 (ko) 저주파 노이즈를 제거한 터치 패널의 전하량 감지장치
KR102440297B1 (ko) 노이즈 필터를 갖는 단일 누적연산증폭기를 이용한 정전용량 감지장치
JP2002108553A (ja) タッチ検出信号発生回路、座標入力装置およびタッチ検出信号発生方法
KR101463894B1 (ko) 효율적인 면적의 전하 신호 변환기를 사용하는 터치스크린 감지 장치

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070219

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070426

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20070522

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100302

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100531

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110322

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20110418

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 4729477

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140422

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term