JP4721416B2 - 検体検査素子、及び検体検査装置 - Google Patents

検体検査素子、及び検体検査装置 Download PDF

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Publication number
JP4721416B2
JP4721416B2 JP2005256545A JP2005256545A JP4721416B2 JP 4721416 B2 JP4721416 B2 JP 4721416B2 JP 2005256545 A JP2005256545 A JP 2005256545A JP 2005256545 A JP2005256545 A JP 2005256545A JP 4721416 B2 JP4721416 B2 JP 4721416B2
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Japan
Prior art keywords
specimen
transmission path
terahertz wave
holding
terahertz
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JP2005256545A
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Japanese (ja)
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JP2007071585A (ja
JP2007071585A5 (https=
Inventor
健明 井辻
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Canon Inc
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Canon Inc
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Priority to JP2005256545A priority Critical patent/JP4721416B2/ja
Priority to US11/468,063 priority patent/US7608826B2/en
Publication of JP2007071585A publication Critical patent/JP2007071585A/ja
Publication of JP2007071585A5 publication Critical patent/JP2007071585A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2005256545A 2005-09-05 2005-09-05 検体検査素子、及び検体検査装置 Expired - Fee Related JP4721416B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2005256545A JP4721416B2 (ja) 2005-09-05 2005-09-05 検体検査素子、及び検体検査装置
US11/468,063 US7608826B2 (en) 2005-09-05 2006-08-29 Specimen testing element, specimen information obtaining method and specimen testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005256545A JP4721416B2 (ja) 2005-09-05 2005-09-05 検体検査素子、及び検体検査装置

Publications (3)

Publication Number Publication Date
JP2007071585A JP2007071585A (ja) 2007-03-22
JP2007071585A5 JP2007071585A5 (https=) 2009-11-05
JP4721416B2 true JP4721416B2 (ja) 2011-07-13

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JP2005256545A Expired - Fee Related JP4721416B2 (ja) 2005-09-05 2005-09-05 検体検査素子、及び検体検査装置

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US (1) US7608826B2 (https=)
JP (1) JP4721416B2 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004286716A (ja) * 2003-03-25 2004-10-14 Institute Of Physical & Chemical Research テラヘルツ波分光計測によるターゲット判別方法及び装置
JP4955966B2 (ja) * 2005-09-05 2012-06-20 キヤノン株式会社 導波路、それを用いた装置及び検出方法
CA2680478A1 (en) * 2007-03-05 2008-09-12 University Of Virginia Patent Foundation Method of local electro-magnetic field enhancement of terahertz (thz) radiation in sub wavelength regions and improved coupling of radiation to materials through the use of the discontinuity edge effect
JP5173850B2 (ja) * 2009-01-05 2013-04-03 キヤノン株式会社 検査装置
US8330110B2 (en) * 2009-09-10 2012-12-11 Advantest Corporation Container, container positioning method, and measuring method
US10041745B2 (en) * 2010-05-04 2018-08-07 Fractal Heatsink Technologies LLC Fractal heat transfer device
JP2013127451A (ja) * 2011-11-17 2013-06-27 Canon Inc Ｄｎａの状態を分析する分析装置及び方法
JP2013167591A (ja) * 2012-02-17 2013-08-29 Murata Mfg Co Ltd 物質センシング方法及び物質センシング装置
JP2013238401A (ja) * 2012-05-11 2013-11-28 Canon Inc 電磁波を用いる測定装置及び測定方法
FR3000327B1 (fr) * 2012-12-21 2016-02-05 Thales Sa Dispositif de commutation de signaux hyperfrequences notamment de dimensions nanometriques, et composant electronique incorporant un tel dispositif
CN107885403B (zh) * 2017-09-04 2024-05-24 深圳市环波科技有限责任公司 基于表面电磁波的触摸屏及触摸屏系统
DE102020121478A1 (de) 2020-08-14 2022-02-17 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren und Vorrichtung zum Verarbeiten von mit einem Modell assoziierten Daten

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5623145A (en) 1995-02-15 1997-04-22 Lucent Technologies Inc. Method and apparatus for terahertz imaging
US5710430A (en) 1995-02-15 1998-01-20 Lucent Technologies Inc. Method and apparatus for terahertz imaging
US6485905B2 (en) * 1998-02-02 2002-11-26 Signature Bioscience, Inc. Bio-assay device
US6777244B2 (en) * 2000-12-06 2004-08-17 Hrl Laboratories, Llc Compact sensor using microcavity structures
RU2237267C2 (ru) * 2001-11-26 2004-09-27 Волков Леонид Викторович Способ формирования изображений в миллиметровом и субмиллиметровом диапазоне волн (варианты) и система формирования изображений в миллиметровом и субмиллиметровом диапазоне волн
JP3937954B2 (ja) * 2002-07-18 2007-06-27 キヤノン株式会社 プローブ担体の製造方法および製造装置
JP2004120260A (ja) 2002-09-25 2004-04-15 Tdk Corp 伝送線路、共振器、及び、電子部品
JP4012125B2 (ja) * 2003-06-25 2007-11-21 キヤノン株式会社 電磁波制御装置およびセンシングシステム
JP3950820B2 (ja) * 2003-06-25 2007-08-01 キヤノン株式会社 高周波電気信号制御装置及びセンシングシステム
WO2005027611A1 (ja) * 2003-09-08 2005-03-24 Juridical Foundation Osaka Industrial Promotion Organization フラクタル構造体、フラクタル構造集合体およびそれらの製造方法ならびに用途
US20070004046A1 (en) * 2005-07-01 2007-01-04 Platypus Technologies, Llc Detection of analytes
JP2008518196A (ja) * 2004-07-02 2008-05-29 プラティパス テクノロジーズ エルエルシー 分析物の検出
JP2006153852A (ja) * 2004-10-29 2006-06-15 Canon Inc 物体の性状を分析又は同定するためのセンサ、それを用いたセンシング装置及び方法
JP4154388B2 (ja) * 2004-12-27 2008-09-24 キヤノン株式会社 被対象物を透過した電磁波の状態を検出するための検出装置

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JP2007071585A (ja) 2007-03-22
US20070108382A1 (en) 2007-05-17
US7608826B2 (en) 2009-10-27

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