JP4659395B2 - 質量分析装置及び質量分析方法 - Google Patents

質量分析装置及び質量分析方法 Download PDF

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Publication number
JP4659395B2
JP4659395B2 JP2004169749A JP2004169749A JP4659395B2 JP 4659395 B2 JP4659395 B2 JP 4659395B2 JP 2004169749 A JP2004169749 A JP 2004169749A JP 2004169749 A JP2004169749 A JP 2004169749A JP 4659395 B2 JP4659395 B2 JP 4659395B2
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Prior art keywords
mass
ions
linear trap
number range
ion
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JP2004169749A
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Japanese (ja)
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JP2005353304A (ja
JP2005353304A5 (enExample
Inventor
雄一郎 橋本
英樹 長谷川
崇 馬場
宏之 佐竹
泉 和氣
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2004169749A priority Critical patent/JP4659395B2/ja
Priority to US11/146,157 priority patent/US7348554B2/en
Publication of JP2005353304A publication Critical patent/JP2005353304A/ja
Publication of JP2005353304A5 publication Critical patent/JP2005353304A5/ja
Priority to US12/010,977 priority patent/US7569814B2/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4265—Controlling the number of trapped ions; preventing space charge effects

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2004169749A 2004-06-08 2004-06-08 質量分析装置及び質量分析方法 Expired - Fee Related JP4659395B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004169749A JP4659395B2 (ja) 2004-06-08 2004-06-08 質量分析装置及び質量分析方法
US11/146,157 US7348554B2 (en) 2004-06-08 2005-06-07 Mass spectrometer
US12/010,977 US7569814B2 (en) 2004-06-08 2008-01-31 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004169749A JP4659395B2 (ja) 2004-06-08 2004-06-08 質量分析装置及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2005353304A JP2005353304A (ja) 2005-12-22
JP2005353304A5 JP2005353304A5 (enExample) 2007-04-12
JP4659395B2 true JP4659395B2 (ja) 2011-03-30

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JP2004169749A Expired - Fee Related JP4659395B2 (ja) 2004-06-08 2004-06-08 質量分析装置及び質量分析方法

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US (2) US7348554B2 (enExample)
JP (1) JP4659395B2 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
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JP4659395B2 (ja) * 2004-06-08 2011-03-30 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
CA2629203C (en) * 2006-01-05 2014-11-04 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Mass defect triggered information dependent acquisition
JP4709024B2 (ja) * 2006-02-06 2011-06-22 株式会社日立ハイテクノロジーズ 反応装置及び質量分析装置
JP4692310B2 (ja) * 2006-02-09 2011-06-01 株式会社日立製作所 質量分析装置
JP4918846B2 (ja) * 2006-11-22 2012-04-18 株式会社日立製作所 質量分析装置及び質量分析方法
GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
US7692142B2 (en) * 2006-12-13 2010-04-06 Thermo Finnigan Llc Differential-pressure dual ion trap mass analyzer and methods of use thereof
JP5258198B2 (ja) * 2007-01-30 2013-08-07 Ｍｓｉ．Ｔｏｋｙｏ株式会社 リニアイオントラップ質量分析装置
JP5262010B2 (ja) * 2007-08-01 2013-08-14 株式会社日立製作所 質量分析計及び質量分析方法
GB0717146D0 (en) * 2007-09-04 2007-10-17 Micromass Ltd Mass spectrometer
US7847248B2 (en) * 2007-12-28 2010-12-07 Mds Analytical Technologies, A Business Unit Of Mds Inc. Method and apparatus for reducing space charge in an ion trap
JP5124293B2 (ja) * 2008-01-11 2013-01-23 株式会社日立ハイテクノロジーズ 質量分析計および質量分析方法
JP5111123B2 (ja) * 2008-01-16 2012-12-26 株式会社日立製作所 質量分析計及び質量分析方法
JP5449701B2 (ja) * 2008-05-28 2014-03-19 株式会社日立ハイテクノロジーズ 質量分析計
EP2294603A4 (en) * 2008-06-09 2017-01-18 DH Technologies Development Pte. Ltd. A multipole ion guide for providing an axial electric field whose strength increases with radial position, and a method of operating a multipole ion guide having such an axial electric field
US8822916B2 (en) 2008-06-09 2014-09-02 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
US8766170B2 (en) * 2008-06-09 2014-07-01 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
US20100032559A1 (en) * 2008-08-11 2010-02-11 Agilent Technologies, Inc. Variable energy photoionization device and method for mass spectrometry
JPWO2010044370A1 (ja) * 2008-10-14 2012-03-15 株式会社日立製作所 質量分析装置および質量分析方法
JP5603246B2 (ja) * 2008-10-14 2014-10-08 株式会社日立ハイテクノロジーズ 質量分析装置
WO2010095586A1 (ja) * 2009-02-19 2010-08-26 株式会社日立ハイテクノロジーズ 質量分析システム
WO2012067195A1 (ja) * 2010-11-19 2012-05-24 株式会社日立ハイテクノロジーズ 質量分析装置および質量分析方法
GB201120307D0 (en) 2011-11-24 2012-01-04 Thermo Fisher Scient Bremen High duty cycle mass spectrometer
WO2013176901A1 (en) 2012-05-23 2013-11-28 President And Fellows Of Harvard College Mass spectrometry for multiplexed quantitation using multiple frequency notches
JP6491097B2 (ja) 2012-10-22 2019-03-27 プレジデント アンド フェローズ オブ ハーバード カレッジ 質量分析法を使用する正確で干渉のない多重定量プロテオミクス
US20140138533A1 (en) * 2012-11-19 2014-05-22 Canon Kabushiki Kaisha Ion mass selector, ion irradiation device, surface analysis device, and ion mass selecting method
WO2014200987A2 (en) * 2013-06-10 2014-12-18 President And Fellows Of Harvard College Ms1 gas-phase enrichment using notched isolation waveforms
US11085927B2 (en) 2016-06-03 2021-08-10 President And Fellows Of Harvard College Techniques for high throughput targeted proteomic analysis and related systems and methods
CN113152273B (zh) * 2021-04-28 2022-07-29 重庆交通大学 一种吊杆病害的检测装置及检测方法
US20240222106A1 (en) * 2022-12-29 2024-07-04 Thermo Finnigan Llc Apparatus and Method for Ion Separation

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US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
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JP3495512B2 (ja) * 1996-07-02 2004-02-09 株式会社日立製作所 イオントラップ質量分析装置
US5783824A (en) * 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
JP3818671B2 (ja) * 1996-06-06 2006-09-06 エムディーエス インコーポレーテッド 多重極子質量分光計の軸方向射出方法
US6177668B1 (en) * 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
US6504148B1 (en) * 1999-05-27 2003-01-07 Mds Inc. Quadrupole mass spectrometer with ION traps to enhance sensitivity
US6627883B2 (en) * 2001-03-02 2003-09-30 Bruker Daltonics Inc. Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
US20020141347A1 (en) * 2001-03-30 2002-10-03 Harp Jeffrey C. System and method of reducing ingress noise
US6787760B2 (en) * 2001-10-12 2004-09-07 Battelle Memorial Institute Method for increasing the dynamic range of mass spectrometers
GB0210930D0 (en) * 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
JP4659395B2 (ja) * 2004-06-08 2011-03-30 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法

Also Published As

Publication number Publication date
JP2005353304A (ja) 2005-12-22
US7569814B2 (en) 2009-08-04
US7348554B2 (en) 2008-03-25
US20080156979A1 (en) 2008-07-03
US20050269504A1 (en) 2005-12-08

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