JP4656508B2 - Determination of selenium by chemical form - Google Patents

Determination of selenium by chemical form Download PDF

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JP4656508B2
JP4656508B2 JP2005158624A JP2005158624A JP4656508B2 JP 4656508 B2 JP4656508 B2 JP 4656508B2 JP 2005158624 A JP2005158624 A JP 2005158624A JP 2005158624 A JP2005158624 A JP 2005158624A JP 4656508 B2 JP4656508 B2 JP 4656508B2
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selenium
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裕 神田
広幸 秋保
裕三 白井
茂男 伊藤
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Central Research Institute of Electric Power Industry
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本発明は、Se(0)、Se(IV)及びSe(VI)のそれぞれの濃度を測定可能なセレンの化学形態別定量法に関する。   The present invention relates to a method for quantifying selenium by chemical form, which can measure the respective concentrations of Se (0), Se (IV), and Se (VI).

水道水などの上水や各種排水などの水質基準においてはセレン濃度が規定されており、種々の方法によって各種溶液中のセレンの定量が実施されている。従来、溶液中に存在するセレンは通常4価及び6価と考えられており、4価及び6価セレンの分別定量法が考えられている。4価及び6価セレンの分別定量法として、例えばJIS K0102に記載された方法、又は引用文献1(特許文献1参照)に記載された方法が挙げられる。   The selenium concentration is defined in water quality standards such as tap water such as tap water and various effluents, and selenium in various solutions is quantified by various methods. Conventionally, selenium present in a solution is generally considered to be tetravalent and hexavalent, and fractional quantification methods of tetravalent and hexavalent selenium are considered. Examples of the method for fractional quantification of tetravalent and hexavalent selenium include the method described in JIS K0102, or the method described in Cited Document 1 (see Patent Document 1).

しかしながら、従来から用いられているセレンの化学形態別定量法は、金属セレン(以下Se(0))の存在を考慮しておらず、Se(0)がSe(VI)として定量されている虞があった。また、セレンの処理を行う際にはSe(IV)とSe(VI)それぞれに最適とされる処理条件で処理を行っており、通常、Se(IV)は凝集沈殿させた後にろ過などの固液分離を行うことで取り除き、Se(VI)は一度還元剤を用いてSe(IV)に還元してから凝集沈殿、固液分離を行うことにより取り除いている。そのため、Se(0)がSe(VI)として定量されることにより、必要量以上の還元剤が使われてしまうという虞があった。また、水に不溶であるSe(0)が、ろ過できない微粒子で存在している場合は除去できず、Se(0)は排水に流されている虞があった。   However, the conventional quantification method for selenium by chemical form does not consider the presence of metal selenium (hereinafter, Se (0)), and Se (0) may be quantified as Se (VI). was there. In addition, when selenium is treated, it is treated under the optimum processing conditions for Se (IV) and Se (VI). Usually, Se (IV) is coagulated and precipitated, and then solidified by filtration or the like. It is removed by liquid separation. Se (VI) is once reduced to Se (IV) using a reducing agent and then removed by coagulation precipitation and solid-liquid separation. For this reason, Se (0) is quantified as Se (VI), so that there is a possibility that a reducing agent more than a necessary amount is used. Further, when Se (0) that is insoluble in water is present as fine particles that cannot be filtered, it cannot be removed, and Se (0) may flow into the waste water.

特開平11−142387号公報(特許請求の範囲等)Japanese Patent Laid-Open No. 11-142387 (claims, etc.)

本発明は、このような事情に鑑み、Se(IV)及びSe(VI)だけではなく、Se(0)も定量できるセレンの化学形態別定量法を提供することを課題とする。   In view of such circumstances, it is an object of the present invention to provide a selenium quantification method by chemical form that can quantify not only Se (IV) and Se (VI) but also Se (0).

本発明の第1の態様は、Se(0)、Se(IV)及びSe(VI)のそれぞれの定量を行うセレンの化学形態別定量法であって、定量対象となる試料を溶かした溶液を、そのまま処理して含有セレンをセレン化水素に変化させた後、誘導結合プラズマ発光分光分析を行うことによりSe(IV)量を測定してSe(IV)濃度を求める第1の工程と、前記溶液について別途、有機物分解処理及びSe(VI)をSe(IV)に還元するがSe(IV)をSe(0)に還元しない条件で還元処理を順次行い、次いで含有セレンをセレン化水素に変化させた後、誘導結合プラズマ発光分光分析を行うことによりSe(IV)量を測定して全セレン濃度を求める第2の工程と、前記溶液について別途、Se(0)をSe(IV)に酸化するがSe(IV)をSe(VI)に酸化しない条件下で酸分解処理し、次いで含有セレンをセレン化水素に変化させた後、誘導結合プラズマ発光分光分析を行うことによりSe(IV)量を測定してSe(0)及びSe(IV)の総濃度を求める第3の工程と、前記第2の工程で求めた全セレン濃度と前記第3の工程で求めたSe(0)及びSe(IV)の総濃度との差からSe(VI)濃度を求める第4の工程と、前記第1の工程で求めたSe(IV)濃度と前記第3の工程で求めたSe(0)及びSe(IV)の総濃度との差からSe(0)濃度を求める第5の工程とを具備することを特徴とするセレンの化学形態別定量法にある。
The first aspect of the present invention is a selenium chemical form quantification method for quantifying Se (0), Se (IV), and Se (VI), wherein a solution in which a sample to be quantified is dissolved. The first step of determining the Se (IV) concentration by measuring the amount of Se (IV) by performing inductively coupled plasma emission spectroscopic analysis after changing the selenium contained into hydrogen selenide by treatment as it is, Separately, the solution is subjected to organic substance decomposition treatment and reduction treatment under the condition that Se (VI) is reduced to Se (IV) but Se (IV) is not reduced to Se (0), and then the selenium contained is changed to hydrogen selenide. Then, inductively coupled plasma emission spectrometry is performed to measure the amount of Se (IV) to obtain the total selenium concentration, and separately separate Se (0) into Se (IV) for the solution. But Se (IV) is oxidized to Se (VI) The amount of Se (IV) is measured by performing inductively coupled plasma emission spectrometry after acid decomposition treatment under no conditions, and then changing the selenium contained to hydrogen selenide, and then performing Se (IV) and Se (IV) From the difference between the third step for determining the total concentration of selenium, the total selenium concentration determined in the second step and the total concentrations of Se (0) and Se (IV) determined in the third step, Se (VI ) Se (IV) from the difference between the fourth step for obtaining the concentration and the Se (IV) concentration obtained in the first step and the total concentration of Se (0) and Se (IV) obtained in the third step. And (5) a selenium chemical form quantification method characterized by comprising a fifth step of determining the concentration.

本発明の第2の態様は、第1の態様において、前記酸分解処理が前記溶液に少なくとも硝酸を含む酸性溶液を加え、加熱濃縮することによって行われることを特徴とするセレンの化学形態別定量法にある。   According to a second aspect of the present invention, in the first aspect, the acid decomposition treatment is performed by adding an acidic solution containing at least nitric acid to the solution, followed by heating and concentration. Is in the law.

本発明の第3の態様は、第2の態様において、前記硝酸の濃度が前記溶液に対して0.6%以上であることを特徴とするセレンの化学形態別定量法にある。
本発明の第4の態様は、第1又は第2の態様において、前記有機物分解処理及び前記還元処理がJIS K0102の方法に準じて行われることを特徴とするセレンの化学形態別定量法にある。
According to a third aspect of the present invention, in the second aspect, the selenium chemical form quantification method is characterized in that the concentration of the nitric acid is 0.6% or more based on the solution.
According to a fourth aspect of the present invention, in the first or second aspect, the organic substance decomposition treatment and the reduction treatment are performed according to the method of JIS K0102, characterized in that the selenium is determined by chemical form. .

本発明によれば、Se(IV)及びSe(VI)だけではなく、Se(0)も定量できるセレンの化学形態別定量法を提供できる。   ADVANTAGE OF THE INVENTION According to this invention, the quantification method according to the chemical form of selenium which can quantify not only Se (IV) and Se (VI) but also Se (0) can be provided.

以下、本発明の実施形態を詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail.

図1は、本発明の一実施形態に係るセレンの化学形態別定量法を示す図である。図1に示すように、本発明の定量方法は、定量対象となる試料を溶かした溶液である試料1について、そのまま処理して含有セレンをセレン化水素に変化させた後、誘導結合プラズマ発光分光分析を行う水素化物発生‐誘導結合プラズマ発光分光分析2によりSe(IV)量を測定してSe(IV)濃度6を求める第1の工程と、試料1について別途、有機物分解処理3及び還元処理4を順次行い、次いで水素化物発生‐誘導結合プラズマ発光分光分析2によりSe(IV)量を測定して全セレン(T−Se)濃度7を求める第2の工程と、試料1について別途、Se(0)をSe(IV)に酸化するがSe(IV)をSe(VI)に酸化しない条件下で酸分解処理5を行い、次いで水素化物発生‐誘導結合プラズマ発光分光分析2によりSe(IV)量を測定してSe(0)及びSe(IV)の総濃度8を求める第3の工程と、第2の工程で求めた全セレン濃度7と第3の工程で求めたSe(0)及びSe(IV)総濃度8との差からSe(VI)濃度9を求める第4の工程と、第1の工程で求めたSe(IV)濃度6と第3の工程で求めたSe(0)及びSe(IV)の総濃度8との差からSe(0)濃度10とを求める第5の工程とを具備する。   FIG. 1 is a diagram illustrating a selenium quantitative determination method according to one embodiment of the present invention. As shown in FIG. 1, in the quantification method of the present invention, sample 1 which is a solution in which a sample to be quantified is dissolved, and the selenium contained therein is changed to hydrogen selenide, and then inductively coupled plasma emission spectroscopy is performed. Analysis of hydride generation-Inductively coupled plasma emission spectrometry 2 The first step of measuring the amount of Se (IV) by measuring the Se (IV) concentration 6 and the sample 1 separately, organic matter decomposition treatment 3 and reduction treatment 4 and then the second step of measuring the amount of Se (IV) by hydride generation-inductively coupled plasma optical emission spectrometry 2 to obtain the total selenium (T-Se) concentration 7, Acid decomposition 5 is performed under conditions where (0) is oxidized to Se (IV) but Se (IV) is not oxidized to Se (VI), and then Se (IV) is obtained by hydride generation-inductively coupled plasma emission spectrometry 2. ) Measure quantity The third step for determining the total concentration 8 of Se (0) and Se (IV), the total selenium concentration 7 determined in the second step, and Se (0) and Se (IV) determined in the third step The fourth step for obtaining Se (VI) concentration 9 from the difference from the total concentration 8, Se (IV) concentration 6 obtained in the first step, Se (0) and Se (IV) obtained in the third step ) To obtain a Se (0) concentration of 10 from the difference from the total concentration of 8).

本発明の第1の工程においては、定量対象となる試料を溶かした溶液を、そのまま処理して含有セレンをセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことよりSe(IV)量を測定する。セレンをセレン化水素に変化させて行う誘導結合プラズマ発光分光分析は、例えばJIS K0102の方法に準じて行えばよい。ここで、Se(0)、Se(IV)及びSe(VI)の中で、セレン化水素に変化するのは、Se(IV)のみであり、Se(0)、Se(VI)はセレン化水素にはならない。したがって、Se(IV)をセレン化水素に変化させて誘導結合プラズマ発光分光分析を行うことで、Se(IV)量のみが求められる。これよりSe(IV)濃度を求める。   In the first step of the present invention, the amount of Se (IV) is obtained by treating a solution in which a sample to be quantified is treated as it is, changing the contained selenium to hydrogen selenide, and performing inductively coupled plasma emission spectrometry. Measure. The inductively coupled plasma emission spectroscopic analysis performed by changing selenium to hydrogen selenide may be performed, for example, according to the method of JIS K0102. Here, among Se (0), Se (IV) and Se (VI), only Se (IV) is changed to hydrogen selenide, and Se (0) and Se (VI) are selenized. It does not become hydrogen. Therefore, only the amount of Se (IV) can be obtained by performing inductively coupled plasma emission spectroscopic analysis by changing Se (IV) to hydrogen selenide. From this, the Se (IV) concentration is obtained.

本発明の第2の工程においては、定量対象となる試料を溶かした溶液について、まず有機物分解処理を行い、誘導結合プラズマ発光分光分析の妨害となる溶液中の有機物を排除する。この有機物分解処理は、例えばJIS K0102の方法に準じて行えばよく、具体的には定量対象となる試料を溶かした溶液に硫酸及び硝酸を加え、加熱濃縮する。加熱温度はセレンが気化しない温度であればよい。ここで、Se(0)がSe(IV)に酸化され、場合によっては、Se(IV)がSe(VI)に酸化される。   In the second step of the present invention, the organic substance decomposition treatment is first performed on the solution in which the sample to be quantified is dissolved, and the organic substance in the solution that interferes with inductively coupled plasma emission spectrometry is excluded. This organic substance decomposition treatment may be performed according to, for example, the method of JIS K0102, and specifically, sulfuric acid and nitric acid are added to a solution in which a sample to be quantified is dissolved, and the mixture is heated and concentrated. The heating temperature may be any temperature at which selenium does not vaporize. Here, Se (0) is oxidized to Se (IV), and in some cases, Se (IV) is oxidized to Se (VI).

本発明の第2の工程では次に還元処理を行う。還元処理は、例えばJIS K0102の方法に準じて行えばよく、具体的には前処理を行った定量対象の試料を溶かした溶液に、水、塩酸及び臭化カリウム溶液を加え、一定の時間加熱する。加熱温度はセレンが気化しない温度であればよい。この還元処理は、定量対象の試料中に元々存在する、又は有機分解処理により酸化されたSe(VI)を、Se(IV)に還元するものであるが、Se(IV)をSe(0)に還元しない条件で行う必要がある。   In the second step of the present invention, a reduction process is performed next. The reduction treatment may be performed according to, for example, the method of JIS K0102, and specifically, water, hydrochloric acid and potassium bromide solution are added to a solution in which the sample to be quantified which has been pretreated is dissolved, and heated for a certain period of time. To do. The heating temperature may be any temperature at which selenium does not vaporize. In this reduction treatment, Se (VI) originally present in the sample to be quantified or oxidized by the organic decomposition treatment is reduced to Se (IV). Se (IV) is reduced to Se (0). It is necessary to carry out under conditions that do not reduce the amount.

本発明の第2の工程では最後にSe(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことより、Se(IV)量を求める。有機物分解処理及び還元処理により、定量対象となる試料を溶かした溶液中のセレンはすべてSe(IV)となっているため、このSe(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことで、定量対象となる試料を溶かした溶液中の全セレンの量がわかる。これより全セレン濃度を求める。   In the second step of the present invention, Se (IV) is finally changed to hydrogen selenide, and the amount of Se (IV) is determined by performing inductively coupled plasma emission spectroscopic analysis. Since all the selenium in the solution in which the sample to be quantified is dissolved by the organic substance decomposition treatment and the reduction treatment is Se (IV), this Se (IV) is changed to hydrogen selenide, and inductively coupled plasma emission spectroscopy is performed. By performing the analysis, the amount of total selenium in the solution in which the sample to be quantified is dissolved is known. From this, the total selenium concentration is determined.

本発明の第3の工程においては、定量対象となる溶液について、まず酸分解処理を行う。この酸分解処理は、Se(0)をSe(IV)に酸化するがSe(IV)をSe(VI)に酸化しない条件下で処理することで、Se(0)をSe(IV)に酸化する。かかる酸分解処理は、具体的には硝酸を少なくとも含む酸性溶液を、定量対象となる溶液に加え、加熱濃縮することにより行う。ここでの加熱温度はセレンが気化しない温度であればよい。また、酸分解処理で用いる酸性溶液は、硝酸を含有していればよく、硝酸に加えて塩酸や硫酸などの強酸をさらに含有していてもよい。また、酸性溶液の添加量は、定量対象となる試料を溶かした溶液に対して硝酸濃度が0.6%以上であればよい。   In the third step of the present invention, first, an acid decomposition treatment is performed on a solution to be quantified. In this acid decomposition treatment, Se (0) is oxidized to Se (IV) by treating Se (0) to Se (IV) but not Se (IV) to Se (VI). To do. Specifically, the acid decomposition treatment is performed by adding an acidic solution containing at least nitric acid to the solution to be quantified and concentrating with heating. The heating temperature here may be a temperature at which selenium does not vaporize. Moreover, the acidic solution used by an acid decomposition process should just contain nitric acid, and may contain further strong acids, such as hydrochloric acid and a sulfuric acid, in addition to nitric acid. Moreover, the addition amount of an acidic solution should just have a nitric acid density | concentration of 0.6% or more with respect to the solution which melt | dissolved the sample used as fixed quantity.

本発明の第3の工程では最後に溶液中のSe(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことより、Se(IV)量を求める。このとき、酸分解処理によってSe(0)はSe(IV)に変化しているので、Se(0)及びSe(IV)の総量がわかる。これよりSe(0)及びSe(IV)の総濃度を求める。   In the third step of the present invention, Se (IV) in the solution is finally changed to hydrogen selenide, and inductively coupled plasma emission spectroscopic analysis is performed to determine the amount of Se (IV). At this time, Se (0) is changed to Se (IV) by the acid decomposition treatment, so that the total amount of Se (0) and Se (IV) is known. From this, the total concentration of Se (0) and Se (IV) is obtained.

本発明の第4の工程においては、第2の工程において求めた全セレン濃度と、第3の工程において求めたSe(0)及びSe(IV)の総濃度との差よりSe(VI)濃度を求める。   In the fourth step of the present invention, the Se (VI) concentration is determined from the difference between the total selenium concentration determined in the second step and the total concentration of Se (0) and Se (IV) determined in the third step. Ask for.

本発明の第5の工程においては、第1の工程において求めたSe(IV)濃度と、第3の工程において求めたSe(0)及びSe(IV)の総濃度との差よりSe(0)濃度を求める。   In the fifth step of the present invention, Se (0) is obtained from the difference between the Se (IV) concentration obtained in the first step and the total concentration of Se (0) and Se (IV) obtained in the third step. ) Find the concentration.

なお、本発明の第1〜第5の工程は、必ずしもこの順番に行う必要はなく、本発明の目的を達成できる範囲で適宜変更可能であり、第4の工程が第2の工程及び第3の工程の後であり、第5の工程が第1の工程及び第3の工程の後であれば特に限定されない。   It should be noted that the first to fifth steps of the present invention are not necessarily performed in this order, and can be appropriately changed as long as the object of the present invention can be achieved, and the fourth step is the second step and the third step. There is no particular limitation as long as the fifth step is after the first step and the third step.

本発明は、Se(0)の定量も行うことができるため、Se(0)、Se(IV)及びSe(VI)のそれぞれの濃度を正確に定量することができる。また、Se(0)、Se(IV)及びSe(VI)のそれぞれを適切な処理を行うことができるようになった。   Since the present invention can also quantify Se (0), the respective concentrations of Se (0), Se (IV), and Se (VI) can be accurately quantified. In addition, each of Se (0), Se (IV), and Se (VI) can be appropriately processed.

以下、本発明の詳細を実施例に基づいて説明する。   Hereinafter, details of the present invention will be described based on examples.

(実施例1)
Se(0)粉末を用いて、Se(0)濃度が1.0mg/lになるように調製した溶液を試料とした。この試料10mlについてそのままSe(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことよりSe(IV)量を測定してSe(IV)濃度を求めた。(本発明の第1の工程)
Example 1
A solution prepared using Se (0) powder so that the Se (0) concentration was 1.0 mg / l was used as a sample. Se (IV) was changed to hydrogen selenide as it was for 10 ml of this sample, and the Se (IV) concentration was determined by measuring the amount of Se (IV) by performing inductively coupled plasma optical emission spectrometry. (First step of the present invention)

この試料10mlに硝酸1.0ml(濃度60%,有害金属測定用)を加え、160℃で加熱濃縮を行った。室温まで冷やした後、Se(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行い、Se(IV)量を測定してSe(0)及びSe(IV)総濃度を求めた。(本発明の第3の工程)   To 10 ml of this sample, 1.0 ml of nitric acid (concentration 60%, for toxic metal measurement) was added and concentrated by heating at 160 ° C. After cooling to room temperature, Se (IV) was changed to hydrogen selenide, inductively coupled plasma optical emission spectrometry was performed, and the Se (IV) amount was measured to determine the total concentration of Se (0) and Se (IV). . (Third step of the present invention)

本実施例においては、定量対象の試料中に含まれるセレンがSe(0)のみであることがあらかじめわかっているので、本発明の第2の工程を省き、第1の工程と第3の工程の差からSe(0)の濃度を求めた。(本発明の第5の工程)この結果を図2に示す。   In this example, since it is known in advance that the selenium contained in the sample to be quantified is only Se (0), the second step of the present invention is omitted, and the first step and the third step. From the difference, the concentration of Se (0) was determined. (Fifth step of the present invention) The results are shown in FIG.

(実施例2)
硝酸1.0mlの代わりに硝酸1.0ml及び硫酸1.0mlを加えた以外は実施例1と同様の操作を行った。この結果を図2に示す。
(Example 2)
The same operation as in Example 1 was performed except that 1.0 ml of nitric acid and 1.0 ml of sulfuric acid were added instead of 1.0 ml of nitric acid. The result is shown in FIG.

(実施例3)
硝酸1.0mlの代わりに硝酸1.0ml及び塩酸1.0mlを加えた以外は実施例1と同様の操作を行った。この結果を図2に示す。
(Example 3)
The same operation as in Example 1 was performed except that 1.0 ml of nitric acid and 1.0 ml of hydrochloric acid were added instead of 1.0 ml of nitric acid. The result is shown in FIG.

(実施例4)
硝酸1.0mlの代わりに硝酸0.1ml及び塩酸1.0mlを加えた以外は実施例1と同様の操作を行った。この結果を図2に示す。
Example 4
The same operation as in Example 1 was performed except that 0.1 ml of nitric acid and 1.0 ml of hydrochloric acid were added instead of 1.0 ml of nitric acid. The result is shown in FIG.

(比較例1)
硝酸1.0mlの代わりに硫酸1.0mlを加えた以外は実施例1と同様の操作を行った。この結果を図2に示す。
(Comparative Example 1)
The same operation as in Example 1 was performed except that 1.0 ml of sulfuric acid was added instead of 1.0 ml of nitric acid. The result is shown in FIG.

(比較例2)
硝酸1.0mlの代わりに塩酸1.0mlを加えた以外は実施例1と同様の操作を行った。この結果を図2に示す。
(Comparative Example 2)
The same operation as in Example 1 was performed except that 1.0 ml of hydrochloric acid was added instead of 1.0 ml of nitric acid. The result is shown in FIG.

(実施例1〜4及び比較例1及び2の結果のまとめ)
実施例1〜4のように硝酸を加えて加熱濃縮を行ったものはSe(0)の定量が可能であったのに対し、比較例1及び2のように硝酸を加えずに、他の強酸のみを加えて加熱濃縮を行ったものはSe(0)の定量を行うことができなかった。これより、硝酸を加えていない条件においては、酸性条件下であってもSe(0)をSe(IV)に酸化しないことがわかる。
(Summary of results of Examples 1 to 4 and Comparative Examples 1 and 2)
As in Examples 1 to 4, the nitric acid was added and the mixture was heated and concentrated, while Se (0) could be quantified, while the nitric acid was not added as in Comparative Examples 1 and 2, and the other. Se (0) could not be quantified when heating and concentrating by adding only a strong acid. This shows that Se (0) is not oxidized to Se (IV) even under acidic conditions under conditions where nitric acid is not added.

(実施例5)
SeOを用いて、SeO濃度が1.0mg/l(Se(IV)濃度が1.0mg/l)になるように調製した溶液を試料とした。
(Example 5)
A solution prepared using SeO 2 so that the SeO 2 concentration was 1.0 mg / l (Se (IV) concentration was 1.0 mg / l) was used as a sample.

この試料10mlについてそのままSe(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことよりSe(IV)量を測定してSe(IV)濃度を求めた。(本発明の第1の工程)   Se (IV) was changed to hydrogen selenide as it was for 10 ml of this sample, and the Se (IV) concentration was determined by measuring the amount of Se (IV) by performing inductively coupled plasma emission spectroscopic analysis. (First step of the present invention)

また、別途試料10mlを用意し、これに硝酸(濃度60%,有害金属測定用)と硫酸(濃度96%,有機金属測定用)をそれぞれ1.0ml加え、加熱濃縮させ、室温まで放冷した。その後、水、塩酸(JISK8180)及び臭化カリウム溶液(1mol/l)をそれぞれ同体積加え、90℃で20分加熱し、室温まで冷やし、Se(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことよりSe(IV)量を測定して全セレン濃度を求めた。(本発明の第2の工程)   Separately, 10 ml of a sample was prepared, and 1.0 ml of nitric acid (concentration 60%, for toxic metal measurement) and sulfuric acid (concentration 96%, for organometallic measurement) were added to each sample, concentrated by heating, and allowed to cool to room temperature. . Thereafter, water, hydrochloric acid (JISK8180) and potassium bromide solution (1 mol / l) are added in the same volume, heated at 90 ° C. for 20 minutes, cooled to room temperature, Se (IV) is changed to hydrogen selenide, and inductively coupled. The total selenium concentration was determined by measuring the amount of Se (IV) by performing plasma emission spectroscopic analysis. (Second step of the present invention)

さらに別途試料10mlを用意し、これに硝酸(濃度60%,有害金属測定用)1.0mlを加え、加熱濃縮させ、室温まで放冷した。その後、Se(IV)をセレン化水素に変化させ、誘導結合プラズマ発光分光分析を行うことよりSe(IV)量を測定してSe(0)及びSe(IV)総濃度を求めた。(本発明の第3の工程)   Furthermore, 10 ml of a sample was separately prepared, 1.0 ml of nitric acid (concentration 60%, for toxic metal measurement) was added thereto, the mixture was heated and concentrated, and allowed to cool to room temperature. Thereafter, Se (IV) was changed to hydrogen selenide, and the Se (IV) amount was measured by performing inductively coupled plasma emission spectroscopic analysis to determine the total concentration of Se (0) and Se (IV). (Third step of the present invention)

第2の工程で求めた全セレン濃度と第3の工程で求めたSe(0)及びSe(IV)濃度との差からSe(VI)濃度を求め、第1の工程で求めたSe(IV)濃度と第3の工程で求めたSe(0)及びSe(IV)総濃度との差からSe(0)濃度を求めた。(本発明の第4の工程及び本発明の第5の工程)   The Se (VI) concentration is obtained from the difference between the total selenium concentration obtained in the second step and the Se (0) and Se (IV) concentrations obtained in the third step, and Se (IV obtained in the first step is obtained. ) Se (0) concentration was determined from the difference between the concentration and the total concentration of Se (0) and Se (IV) determined in the third step. (Fourth step of the present invention and fifth step of the present invention)

(実施例6)
SeOの代わりにNaSeOを用いて試料(Se(VI)濃度が1.0mg/l)を調製した以外は実施例5と同様の操作で各セレンの濃度を求めた。
(Example 6)
The concentration of each selenium was determined in the same manner as in Example 5 except that Na 2 SeO 4 was used instead of SeO 2 to prepare a sample (Se (VI) concentration was 1.0 mg / l).

(実施例7)
SeOの代わりにSe(0)粉末を用いて試料(Se(0)濃度が1.0mg/l)を調製した以外は実施例5と同様の操作で各セレンの濃度を求めた。
(Example 7)
The concentration of each selenium was determined in the same manner as in Example 5 except that a sample (Se (0) concentration was 1.0 mg / l) was prepared using Se (0) powder instead of SeO 2 .

(比較例3)
第3の工程の操作を省いた以外は実施例5と同様の操作で各セレンの濃度を求めた。
(Comparative Example 3)
The concentration of each selenium was determined in the same manner as in Example 5 except that the operation in the third step was omitted.

(比較例4)
第3の工程の操作を省いた以外は実施例6と同様の操作で各セレンの濃度を求めた。
(Comparative Example 4)
The concentration of each selenium was determined in the same manner as in Example 6 except that the operation in the third step was omitted.

(比較例5)
第3の工程の操作を省いた以外は実施例7と同様の操作で各セレンの濃度を求めた。
(Comparative Example 5)
The concentration of each selenium was determined in the same manner as in Example 7 except that the operation in the third step was omitted.

(実施例5〜7及び比較例3〜5の結果のまとめ)
実施例5〜7及び比較例3〜5で求めた各セレン濃度を図3に示す。それぞれ、0価、4価、6価のそれぞれの濃度をわけて表示した。
(Summary of results of Examples 5 to 7 and Comparative Examples 3 to 5)
Each selenium density | concentration calculated | required in Examples 5-7 and Comparative Examples 3-5 is shown in FIG. The respective concentrations of 0, 4 and 6 were separately displayed.

実施例7及び比較例5で用いたSe(0)粉末は0価のセレンであるが、比較例5においては6価のセレンとして測定された。従来から用いられている4価及び6価セレンの分別定量法では、比較例3及び4に示すように4価及び6価のセレンは測定できるが、比較例5に示すように0価のセレンは6価として測定されることがわかった。これに対し、本発明に基づいて行った実施例5〜7では、4価及び6価のセレンはそれぞれ4価及び6価として測定され、さらに0価のセレンも0価として測定される。よって、Se(0)、Se(IV)及びSe(VI)のそれぞれの濃度を正確に定量することができる。   The Se (0) powder used in Example 7 and Comparative Example 5 was zero-valent selenium, but in Comparative Example 5, it was measured as hexavalent selenium. Conventional fractional determination of tetravalent and hexavalent selenium can measure tetravalent and hexavalent selenium as shown in Comparative Examples 3 and 4, but zero-valent selenium as shown in Comparative Example 5. Was measured as hexavalent. On the other hand, in Examples 5 to 7 performed based on the present invention, tetravalent and hexavalent selenium are measured as tetravalent and hexavalent, respectively, and zero-valent selenium is also measured as zero-valent. Therefore, the respective concentrations of Se (0), Se (IV), and Se (VI) can be accurately quantified.

(実施例8)
SeO濃度が1.0mg/lである代わりにSe(0)、Se(IV)及びSe(VI)のそれぞれ0.5mg/lを混合した溶液を用いた以外は実施例5と同様の操作で各セレンの濃度を求めた。
(Example 8)
The same operation as in Example 5 except that a solution in which 0.5 mg / l each of Se (0), Se (IV) and Se (VI) was mixed instead of the SeO 2 concentration being 1.0 mg / l was used. The concentration of each selenium was determined.

(比較例6)
第3の工程の操作を省いた以外は実施例8と同様の操作で各セレンの濃度を求めた。
(Comparative Example 6)
The concentration of each selenium was determined in the same manner as in Example 8 except that the operation in the third step was omitted.

(実施例8及び比較例6の結果のまとめ)
実施例8及び比較例6で求めた各セレン濃度を図4に示す。
(Summary of results of Example 8 and Comparative Example 6)
The selenium concentrations obtained in Example 8 and Comparative Example 6 are shown in FIG.

比較例6においては、0価のセレンが6価として測定された。これに対し、実施例8においては、0価のセレンは0価として測定されており、計算値との差はわずかであった。本発明の定量方法を用いるとSe(0)、Se(IV)及びSe(VI)のそれぞれの濃度を正確に定量することができることが確認できた。   In Comparative Example 6, zero-valent selenium was measured as hexavalent. On the other hand, in Example 8, zero-valent selenium was measured as zero-valent, and the difference from the calculated value was slight. It was confirmed that the concentrations of Se (0), Se (IV) and Se (VI) can be accurately quantified by using the quantification method of the present invention.

本発明の一実施形態に係るセレンの化学形態別定量法の概略を示す図である。It is a figure which shows the outline of the determination method according to chemical form of selenium concerning one Embodiment of this invention. 実施例1〜4及び比較例1及び2の結果を示す図である。It is a figure which shows the result of Examples 1-4 and Comparative Examples 1 and 2. 実施例5〜7及び比較例3〜5の結果を示す図である。It is a figure which shows the result of Examples 5-7 and Comparative Examples 3-5. 実施例8及び比較例6の結果を示す図である。It is a figure which shows the result of Example 8 and Comparative Example 6.

符号の説明Explanation of symbols

1 試料
2 水素化物発生‐誘導結合プラズマ発光分光分析
3 有機物分解処理
4 還元処理
5 酸分解処理
6 Se(IV)
7 全セレン(T−Se)
8 Se(0)+Se(IV)
9 Se(VI)
10 Se(0)
1 Sample 2 Hydride Generation-Inductively Coupled Plasma Emission Spectroscopy 3 Organic Decomposition Treatment 4 Reduction Treatment 5 Acid Decomposition Treatment 6 Se (IV)
7 Total selenium (T-Se)
8 Se (0) + Se (IV)
9 Se (VI)
10 Se (0)

Claims (4)

Se(0)、Se(IV)及びSe(VI)のそれぞれの定量を行うセレンの化学形態別定量法であって、定量対象となる試料を溶かした溶液を、そのまま処理して含有セレンをセレン化水素に変化させた後、誘導結合プラズマ発光分光分析を行うことによりSe(IV)量を測定してSe(IV)濃度を求める第1の工程と、前記溶液について別途、有機物分解処理及びSe(VI)をSe(IV)に還元するがSe(IV)をSe(0)に還元しない条件で還元処理を順次行い、次いで含有セレンをセレン化水素に変化させた後、誘導結合プラズマ発光分光分析を行うことによりSe(IV)量を測定して全セレン濃度を求める第2の工程と、前記溶液について別途、Se(0)をSe(IV)に酸化するがSe(IV)をSe(VI)に酸化しない条件下で酸分解処理し、次いで含有セレンをセレン化水素に変化させた後、誘導結合プラズマ発光分光分析を行うことによりSe(IV)量を測定してSe(0)及びSe(IV)の総濃度を求める第3の工程と、前記第2の工程で求めた全セレン濃度と前記第3の工程で求めたSe(0)及びSe(IV)の総濃度との差からSe(VI)濃度を求める第4の工程と、前記第1の工程で求めたSe(IV)濃度と前記第3の工程で求めたSe(0)及びSe(IV)の総濃度との差からSe(0)濃度を求める第5の工程とを具備することを特徴とするセレンの化学形態別定量法。 A method for quantifying Se (0), Se (IV), and Se (VI) according to the chemical form of selenium, wherein a solution in which a sample to be quantified is dissolved is processed as it is, and the selenium contained is converted into selenium. After changing to hydrogen fluoride, inductively coupled plasma optical emission spectrometry is performed to measure the amount of Se (IV) to obtain the Se (IV) concentration, and for the solution separately from the organic matter decomposition treatment and Se (VI) is reduced to Se (IV) but Se (IV) is not reduced to Se (0) in sequence, and then the selenium contained is changed to hydrogen selenide, followed by inductively coupled plasma emission spectroscopy. A second step of measuring the amount of Se (IV) by performing an analysis to obtain the total selenium concentration, and separately oxidizing Se (0) to Se (IV) for the solution, but Se (IV) is converted to Se (IV). VI) Acid decomposition treatment under non-oxidizing conditions Next, after the contained selenium is changed to hydrogen selenide, the amount of Se (IV) is measured by performing inductively coupled plasma emission spectroscopic analysis to obtain the total concentration of Se (0) and Se (IV). A Se (VI) concentration obtained from the difference between the total selenium concentration obtained in the second step and the total concentration of Se (0) and Se (IV) obtained in the third step. A fifth step of obtaining the Se (0) concentration from the difference between the step and the Se (IV) concentration obtained in the first step and the total concentration of Se (0) and Se (IV) obtained in the third step. And a method for quantitative determination of selenium by chemical form. 請求項1において、前記酸分解処理が前記溶液に少なくとも硝酸を含む酸性溶液を加え、加熱濃縮することによって行われることを特徴とするセレンの化学形態別定量法。 2. The method according to claim 1, wherein the acid decomposition treatment is performed by adding an acidic solution containing at least nitric acid to the solution and concentrating the solution by heating. 請求項2において、前記硝酸の濃度が前記溶液に対して0.6%以上であることを特徴とするセレンの化学形態別定量法。 3. The method according to claim 2, wherein the concentration of nitric acid is 0.6% or more based on the solution. 請求項1又は請求項2において、前記有機物分解処理及び前記還元処理がJIS K0102の方法に準じて行われることを特徴とするセレンの化学形態別定量法。3. The quantitative determination method for selenium according to claim 1, wherein the organic matter decomposition treatment and the reduction treatment are performed according to the method of JIS K0102.
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