JP4643848B2 - Mounting component inspection method - Google Patents

Mounting component inspection method Download PDF

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Publication number
JP4643848B2
JP4643848B2 JP2001097037A JP2001097037A JP4643848B2 JP 4643848 B2 JP4643848 B2 JP 4643848B2 JP 2001097037 A JP2001097037 A JP 2001097037A JP 2001097037 A JP2001097037 A JP 2001097037A JP 4643848 B2 JP4643848 B2 JP 4643848B2
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Japan
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inspection
component
appearance
data
feature amount
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JP2002299900A (en
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知博 木村
一晴 神原
大介 永井
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Panasonic Corp
Panasonic Holdings Corp
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Panasonic Corp
Matsushita Electric Industrial Co Ltd
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Description

【0001】
【発明の属する技術分野】
本発明は、回路基板上に実装された部品の外観検査方法に関し、複数枚の基板上の同じ位置に特性が同じでも外観が異なる複数種類の部品がそれぞれ実装されている場合に、部品検査データを入れ替える必要のない実装部品検査方法及びその装置に関する。
【0002】
【従来の技術】
近年、大量生産の場合、同一の部品メーカーからの部品の安定した購入が難しくなってきた。そこで納期や数量の不足などを避け、少しでも低価格で部品を購入できるように複数の部品メーカーから同じ特性の部品を購入する多社購買が広く採用されている。このように多社購買の方式をとって複数の部品メーカーから購買した部品を使用して部品の実装を行うと、特性は同じでも、極性マークの違い、外形寸法の違いなどの外観の相違により、実装部品の外観検査において同じ部品検査データを使用して検査を行うことが困難になってきた。
そこで、予め複数の部品メーカーからの購買部品の種類に応じた部品検査データをそれぞれの種類の数だけ作成しておき、基板上に実装部品を装着するときに、基板検査データをメーカー別の部品に該当する部品検査データに変更して検査を行っていた。
【0003】
【発明が解決しようとする課題】
しかしながら、購買部品の種類が多く、その入れ替えが激しい場合は、部品を入れ替えて基板に装着する度に、検査装置を止めて基板検査データを装着した部品に適合する部品検査データに変更しなければならない。したがって、購買部品の種類が多くその入れ替えが頻繁に行われると、工程変更のための不要な時間が発生し、さらに基板検査データの変更ミスなどが発生しやすくなる。
【0004】
また、複数種類の購買部品が複数の基板上の複数の位置に実装される場合、その組み合わせも多くなり、組み合わせの数だけの基板検査データを用意する必要があり、そのための準備の手間がかかる。
例えば、実装位置Aに部品種類数10、実装位置Bに部品種類数5、実装位置Cに部品種類数2がそれぞれ実装されている場合は、その組み合わせ数は10×5×2=100通りにもなる。
【0005】
本発明は、購買部品の種類が多い場合でも、記憶手段に記憶されている複数の種類の部品検査データを用いて検査を実施することにより、基板検査データを入れ替えなくてよい実装部品外観検査方法及びその方法のための装置を提供することを目的とする。
【0006】
【課題を解決するための手段】
本発明の実装部品検査方法は、同じ特性でも外観の異なる複数種類の部品が複数枚の基板上の同一対応位置に実装されている部品の外観検査を行う検査方法であって、予め前記複数種類の部品のそれぞれの種類に対応する部品検査データを記憶手段に記憶させる工程、前記部品検査データに基づき実装されている位置の検査対象部品の種類数を判別する種類数判別工程、前記検査対象部品の外観の特徴量を抽出する特徴量抽出工程、前記検査対象部品の特徴量に基づきその部品の種類を判別する種類判別工程、及び判別した前記検査対象部品の種類に一致した部品検査データを前記記憶手段から選択し、その部品検査データに基づき外観検査を行う工程を有する。
【0007】
この構成によれば、同じ特性でも外観の異なる複数種類の部品が複数枚の基板上の同一対応位置に実装されている実装基板の検査において、記憶手段に基板検査データとして、予め多社購買部品の種類数だけの部品検査データを記憶させている。そして、複数種類の部品が実装された位置の検査の際に、まず部品の特徴量を自動的に判別し、その判別した特徴量によりその部品に適合した部品検査データを自動的に選択して実装部品検査を行うことができる。
その結果、同じ位置に実装される部品の種類(メーカー)が変わった場合においても、基板検査データを入れ替えることが不要となり、検査装置を一次停止したり、基板検査データを入れ替える際の煩雑な作業やミスを防止できる。
【0008】
上記構成の実装部品検査方法において、複数枚の基板を順次検査する場合、n枚目以降の基板の検査においてn−1枚目の基板の検査で選択された部品検査データを使用して検査を実施し、検査の結果不良の判別をした場合に、前記特徴量抽出工程及び前記種類判別工程を実施し、判別した検査対象部品の種類に一致した部品検査データを選択して検査を行うのが好ましい。一枚ごとに実装されている部品の種類が異なることは殆どないため、n枚目以降の特徴量抽出工程及び種類判別工程を省略できる。
【0009】
本発明の他の観点による実装部品検査方法は、同じ特性でも外観の異なる複数種類の部品が複数枚の基板上の同一対応位置に実装されている部品の外観検査を行う検査方法であって、予め前記複数種類の部品のそれぞれの種類に対応する部品検査データを記憶手段に記憶させる工程、前記部品検査データに基づき実装されている位置の検査対象部品の種類数を判別する種類数判別工程、前記複数種類の部品が実装されている位置の検査対象部品の検査を行う際に、複数種類の部品検査データを用いて順次前記検査対象部品の検査を実施する工程、及びそれぞれの部品検査データによる検査結果から前記検査対象部品の良否を判別する良否判別工程を有している。
【0010】
この構成によれば、複数種類の部品検査データを用いて順次検査しているので、良品となった時点で以降の検査を省略することができる。また、特徴量抽出による種類判別工程を省略できる。
上記構成の実装部品検査方法において、前記良否判別工程において前記それぞれの部品検査データによる検査結果に所定の重み付けを実施し、重み付けした検査結果から前記検査対象部品の良否を判別するのが望ましい。これにより、部品の種類判別の際に発生する判別誤差を小さくすることが可能となり、より検査精度の向上を図れる。
また、この検査方法に特徴量抽出の工程を加えて、(1)特徴量抽出により判別された部品の検査結果の重みを大きくすること、(2)あるいは特徴量との相関の度合に応じて部品の検査結果の重みを変更すること、でさらに検査精度の向上が図れる。
【0011】
【発明の実施の形態】
以下、本発明の実装部品検査方法の好適な実施例について添付の図面を参照しつつ説明する。
【0012】
《実施例1》
図1は、本発明の実施例1の実装部品検査方法による実装基板外観検査装置の構成を示すブロック図である。
図1において、実装基板2上の4箇所に、部品A 11、部品B 12、部品C13、部品D 14を搭載したものが、図示されていない移動機構で移動する外観測定センサー1によりそれぞれ測定され、センサー1は測定データ3を出力する。
実施例1の場合、実装基板2に実装されている部品A 11は、4社(Ap社、Aq社、Ar社、As社)からの購買部品であり、実装基板2には4種類の部品A 11が実装されている。部品Dは、2社(Dp社、Dq社)からの購買部品であり、実装基板2には2種類の部品D 14が実装されている。部品Bと部品Cとはそれぞれ1社(Bp社、Cp社)からの購買部品であり、どの基板にもそれぞれ同種の部品B 12と部品C 13が実装されている。
【0013】
一方実装される複数種類の部品A 11〜D 14に対応するそれぞれの部品検査データ(11a〜14b)は、予め基板検査データ4として記憶装置5に記憶させる。
種類数判別部6aは、記憶装置5に記憶されている基板検査データ4から,基板上のそれぞれの位置に実装されている部品の種類数を判別する。
判別した部品の種類数が複数であった場合は、特徴量抽出部6bが外観測定センサー1で測定した寸法、明るさなどの測定データ3から特徴量を抽出する。また種類判別部6cが、その特徴量抽出部6bで抽出した特徴量と基板検査データ4の中のそれぞれの部品検査用基準データとを比較し、検査対象部品の種類を判別する。
検査部7は、基板検査データ4の中から検査対象部品の種類に対応する部品検査用基準データと測定データ3とを比較照合し、その良否を判別して検査結果8を得る。
【0014】
図2は、実施例1の実装部品検査方法における記憶装置5に記憶されている基板検査データ4の構成を示すブロック図である。
部品Aの4種類の部品検査データ11a〜11d及び部品Dの2種類の部品検査データ14a〜14bには、それぞれの購買先(Ap社〜Dq社)の部品の特徴量を表す複数のデータ及び検査項目に対応したデータが収められている。これらの特徴量データは、例えば、部品表面からの反射光データ、ラベルの印刷データ、極性マークの種別データ、部品高さデータなどである。
【0015】
次に、図3のフローチャートを参照して、実施例1の実装部品検査方法について説明する。
図3に示すように、ステップS1においては、使用されている4社の部品A、1社の部品B、1社の部品C、及び2社の部品Dのそれぞれの特徴量を含む部品検査用基準データ11a〜14bを抽出して記憶装置5に記憶させる。ステップS2において、基板にそれぞれ実装されている部品A〜部品Dが複数社からの購買部品か否かを判別する。この判別は、例えば部品Aの基板検査データに収められていている部品検査用基準データ11a〜11dの数を用いて実施される。ステップS3においては、部品Bや部品Cのように複数社からの購買部品ではないものは、それぞれ1種類の部品検査データ12a,13aを用いて検査し、判別結果を出力する。
【0016】
ステップS3において、部品Aや部品Dのように複数社からの購買部品の場合は、図1に示す外観の測定データ3から検査対象部品の特徴量を抽出する。それらの特徴量は、ステップS4において、それぞれの部品検査データ11a〜14bに収められている特徴量データと比較され、どの社の部品であるかの判別がされる。種類判別ステップS5においては、判別された種類の部品検査データを抽出する。部品検査ステップS6においては、抽出した部品検査データを用いて検査を実施し、その検査結果を出力する。
【0017】
このように、実施例1の検査方法によれば、特徴量データにより実装されている部品の種類を判別し、記憶装置5(図1)に記憶されている基板検査データから、その種類の部品検査データを選択して検査できる。その結果、基板検査データとして,実装されている部品の種類に適合した部品検査データを入れ替えることが不要となり、検査装置を一次停止することが必要ない。したがって検査時間を短縮できるとともに,基板検査データを入れ替える際の煩雑な作業やミスを防止できる。
【0018】
実施例1の実装部品検査方法において、複数枚の基板を順次検査する場合は、まず、1枚目の基板検査において特徴量抽出を行う。引き続く2枚目以降の基板検査では、1枚目で抽出した部品検査データを用いて検査する。
このような検査の仕方で、検査結果が不良となった場合にのみ特徴量抽出を行い、その特徴量に適合した部品検査用基準データを用いるようにするのが好ましい。こうすることにより、特徴量抽出に費やす時間を短くしてさらに検査時間を短縮することができる。
【0019】
この場合に、特徴量抽出を行って決定した部品検査データが1枚目の部品検査データと同じ場合、再検査を行わずに不良と判別することにより、さらなる検査時間の短縮をはかれる。複数のメーカーからの購買部品は、通常基板1枚ごとにその部品の種類が変更されることはないので、このように特徴量抽出を省略することで検査時間の短縮がはかれる。
【0020】
《実施例2》
図4は、本発明の実施例2の実装部品検査方法のフローチートである。実施例2は実施例1のものと比較して、複数社からの購買部品と判別されたステップ以降の検査の流れのみが異なるものである。したがって、図1〜図3での実施例1と同様の部分についての重複する説明は省略する。
図4に示すように、実施例2の実装部品検査方法は、ステップS6において、複数社からの購買部品の場合には、予め基板検査データとして記憶装置5に記憶されている部品検査データ11a〜11dを順次用いてステップS6a〜ステップS6dの検査を実施する。ここで、例えばAp社部品検査データ11aを用いた検査で良品となれば、実装されている部品はAp社の部品Aとして合格と判別する。
【0021】
このように、少なくとも1つの部品検査データ11aで良品と判別された場合には検査対象部品の検査結果を合格とすることで、以降の部品検査データ11b〜11dを用いたステップ6a〜ステップ6dの検査を省略できる。その結果、検査時間の短縮をはかることができる。また、特徴量抽出も行わないため、特徴量抽出や部品検査データの判別等のステップに費やす時間を省略できる。
【0022】
図4の実施例2の実装部品検査方法において、それぞれの部品検査データによる検査結果から総合的に判断する方法として、図1に点線で示す重み付け部9により検査結果に対して重み付けをする方法がある。
重み付けの方法としては、例えば、測定データから特徴量を抽出し、その特徴量により判別される部品検査データによる検査結果の重みを大きくする方法がある。具体的には、図2に示すように、部品Aの測定データから抽出した部品表面からの反射光データから判別した部品の種類がAq社のものであれば、部品検査データ11bに基づく検査結果の重みを大きくする。
【0023】
また、別の重み付けの方法としては、測定データから抽出された特徴量とそれぞれの部品検査データが有する特徴量とを比較して相関関係を求め、その相関関係の強弱に応じてそれぞれの部品検査データに基づく検査結果に重みを付ける方法がある。具体的には、部品Aの測定データから抽出した部品表面からの反射光データが、それぞれの部品検査データ11a〜11dの有する反射光データの中でAr社のものと相関関係が強い場合は、部品検査データ11cに基づく検査結果の重みを大きくする。
これにより、特徴量による部品の種類判別の際に発生する判別誤差を小さくすることが可能となり、より検査精度の向上を図ることができる。
【0024】
《実施例3》
実施例3の実装部品検査方法は、検査時間、多社購買部品の種類数、検査精度を考慮し、多社購買の検査対象部品ごとに、実施例1及び実施例2の実装基板検査方法のうちどの方法を使用するかを設定する方法である。これにより、その実装基板の検査に最適な検査を実施することができる。
例えば、その日に使用される多社購買部品の種類が分かっている場合は、使用しない部品検査データを予め定めておくことにより、検査時間の短縮、検査精度の向上を図ることができる。
【0025】
【発明の効果】
以上実施例で詳細に説明したように、複数の種類の購買部品が複数枚の基板に実装されている基板の検査において、異なる部品メーカーの異なる種類の部品に入れ替えが発生した場合でも、基板検査データを入れ替えることなく実装基板の検査を行うことができる。
その結果、基板検査データの入れ替えの際に発生する時間ロスや、基板検査データの入れ替えミスをなくし、高効率、高精度な検査が可能となる。
【図面の簡単な説明】
【図1】本発明の実施例の実装基板外観検査装置の構成を示すブロック図
【図2】実施例1の基板検査データの構成を示すブロック図
【図3】本発明の実施例1の実装基板査方法のフロー図
【図4】本発明の実施例2の実装基板査方法のフロー図
【符号の説明】
1 外観測定センサー
2 実装基板
3 測定データ
4 基板検査データ
5 記憶装置
6a 種類数判別部
6b 特徴量抽出部
6c 種類判別部
7 検査部
9 重み付け部
11 部品A
11a Ap社の部品検査データ
11b Aq社の部品検査データ
11c Ar社の部品検査データ
11d As社の部品検査データ
12 部品B
12a Bp社の部品検査データ
13 部品C
13a Cp社の部品検査データ
14 部品D
14a Dp社の部品検査データ
14b Dq社の部品検査データ
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an appearance inspection method for components mounted on a circuit board, and component inspection data when multiple types of components having the same characteristics but different appearances are mounted at the same position on a plurality of substrates. It is related with the mounting component inspection method and its apparatus which do not need to replace.
[0002]
[Prior art]
In recent years, in the case of mass production, it has become difficult to stably purchase parts from the same parts manufacturer. Therefore, multi-company purchasing, in which parts with the same characteristics are purchased from a plurality of parts manufacturers, is widely adopted so that parts can be purchased at a low price as much as possible to avoid shortage of delivery date and quantity. In this way, when parts are mounted using parts purchased from multiple parts manufacturers using the multi-company purchasing method, even if the characteristics are the same, due to differences in appearance such as differences in polarity marks and differences in external dimensions In the appearance inspection of the mounted component, it has become difficult to perform the inspection using the same component inspection data.
Therefore, parts inspection data corresponding to the types of purchased parts from multiple parts manufacturers is created in advance for each type, and when mounting parts are mounted on the board, the board inspection data is classified by manufacturer. Inspected by changing to the part inspection data corresponding to.
[0003]
[Problems to be solved by the invention]
However, if there are many types of purchased parts and the replacement is severe, every time the parts are replaced and mounted on the board, the inspection device must be stopped and the board inspection data must be changed to the part inspection data that matches the mounted part. Don't be. Therefore, if there are many types of purchased parts and their replacement is frequently performed, unnecessary time for process change occurs, and mistakes in changing the board inspection data are likely to occur.
[0004]
In addition, when multiple types of purchased parts are mounted at multiple positions on multiple boards, the number of combinations increases, and it is necessary to prepare as many board inspection data as the number of combinations, which requires time for preparation. .
For example, when 10 component types are mounted at the mounting position A, 5 component types are mounted at the mounting position B, and 2 component types are mounted at the mounting position C, the number of combinations is 10 × 5 × 2 = 100. Also become.
[0005]
The present invention provides a mounted component appearance inspection method that does not require replacing board inspection data by performing inspection using a plurality of types of component inspection data stored in the storage means even when there are many types of purchased parts. And an apparatus for the method.
[0006]
[Means for Solving the Problems]
The mounting component inspection method of the present invention is an inspection method for inspecting the appearance of a component in which a plurality of types of components having the same characteristics but different appearances are mounted at the same corresponding position on a plurality of substrates. A step of storing in a storage means component inspection data corresponding to each type of component, a number of types determination step of determining the number of types of components to be inspected at a position mounted based on the component inspection data, and the components to be inspected A feature amount extracting step of extracting a feature amount of the appearance of the device, a type determining step of determining the type of the component based on the feature amount of the inspection target component, and component inspection data matching the determined type of the inspection target component It has the process of selecting from a memory | storage means and performing an external appearance inspection based on the component inspection data.
[0007]
According to this configuration, in the inspection of a mounting board in which a plurality of types of components having the same characteristics but different appearances are mounted at the same corresponding position on a plurality of boards, the multi-company purchasing parts are previously stored as board inspection data in the storage means. As many parts inspection data as the number of types are stored. Then, when inspecting the position where a plurality of types of parts are mounted, the feature amount of the component is automatically determined first, and the component inspection data that matches the component is automatically selected based on the determined feature amount. Mounting component inspection can be performed.
As a result, even if the type (manufacturer) of the parts mounted at the same position changes, it is not necessary to replace the board inspection data, and the troublesome work when temporarily stopping the inspection apparatus or replacing the board inspection data And prevent mistakes.
[0008]
In the mounting component inspection method having the above-described configuration, when a plurality of substrates are sequentially inspected, the inspection is performed using the component inspection data selected in the inspection of the n−1th substrate in the inspection of the nth and subsequent substrates. When the defect is determined as a result of the inspection, the feature amount extraction step and the type determination step are performed, and the inspection is performed by selecting the component inspection data that matches the determined type of the inspection target component. preferable. Since there is almost no difference in the type of components mounted for each sheet, the feature quantity extraction step and the type determination step for the nth and subsequent sheets can be omitted.
[0009]
A mounting component inspection method according to another aspect of the present invention is an inspection method for performing an appearance inspection of a component in which a plurality of types of components having the same characteristics but different appearances are mounted at the same corresponding position on a plurality of substrates, A step of storing in a storage means component inspection data corresponding to each type of the plurality of types of components in advance, a number of types determination step of determining the number of types of components to be inspected at positions mounted based on the component inspection data, When inspecting an inspection target part at a position where the plurality of types of parts are mounted, a step of sequentially inspecting the inspection target part using a plurality of types of part inspection data, and the respective part inspection data It has a pass / fail discrimination step of discriminating pass / fail of the part to be inspected from the inspection result.
[0010]
According to this configuration, since inspection is sequentially performed using a plurality of types of component inspection data, subsequent inspection can be omitted when the product becomes a non-defective product. Further, the type determination step by feature amount extraction can be omitted.
In the mounted component inspection method having the above-described configuration, it is preferable that a predetermined weighting is performed on the inspection result based on the respective component inspection data in the quality determination step, and the quality of the inspection target component is determined from the weighted inspection result. As a result, it is possible to reduce the discrimination error that occurs when discriminating the type of component, and the inspection accuracy can be further improved.
In addition, a feature amount extraction step is added to the inspection method, (1) the weight of the inspection result of the part determined by the feature amount extraction is increased, (2) or according to the degree of correlation with the feature amount. The inspection accuracy can be further improved by changing the weight of the inspection result of the component.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
Preferred embodiments of the mounting component inspection method of the present invention will be described below with reference to the accompanying drawings.
[0012]
Example 1
FIG. 1 is a block diagram illustrating a configuration of a mounting board visual inspection apparatus according to a mounting component inspection method according to a first embodiment of the present invention.
In FIG. 1, components A 11, B 12, C 13, and D 14 mounted at four locations on the mounting substrate 2 are respectively measured by an appearance measuring sensor 1 that moves by a moving mechanism (not shown). The sensor 1 outputs measurement data 3.
In the case of Example 1, the component A 11 mounted on the mounting board 2 is a purchased part from four companies (Ap, Aq, Ar, As), and the mounting board 2 includes four types of parts. A11 is implemented. The part D is a purchased part from two companies (Dp company and Dq company), and two types of parts D14 are mounted on the mounting substrate 2. The parts B and C are purchased parts from one company (Bp company and Cp company), and the same kind of parts B 12 and C 13 are mounted on each board.
[0013]
On the other hand, component inspection data (11a to 14b) corresponding to a plurality of types of components A 11 to D 14 to be mounted is stored in the storage device 5 in advance as substrate inspection data 4.
The number-of-types discriminating unit 6a discriminates the number of types of components mounted at respective positions on the board from the board inspection data 4 stored in the storage device 5.
When there are a plurality of discriminated types of parts, the feature quantity extraction unit 6b extracts feature quantities from the measurement data 3 such as dimensions and brightness measured by the appearance measurement sensor 1. The type discriminating unit 6c compares the feature amount extracted by the feature amount extracting unit 6b with each component inspection reference data in the board inspection data 4, and discriminates the type of the inspection target component.
The inspection unit 7 compares the reference data for component inspection corresponding to the type of component to be inspected with the measurement data 3 from the substrate inspection data 4, determines the quality, and obtains the inspection result 8.
[0014]
FIG. 2 is a block diagram illustrating a configuration of the board inspection data 4 stored in the storage device 5 in the mounting component inspection method according to the first embodiment.
The four types of component inspection data 11a to 11d of the component A and the two types of component inspection data 14a to 14b of the component D include a plurality of data representing the feature quantities of the components of the respective suppliers (Ap to Dq) Data corresponding to inspection items is stored. These feature amount data are, for example, reflected light data from the component surface, label print data, polarity mark type data, component height data, and the like.
[0015]
Next, the mounted component inspection method according to the first embodiment will be described with reference to the flowchart of FIG.
As shown in FIG. 3, in step S <b> 1, for part inspection including the respective feature amounts of the parts A of 4 companies, the parts B of 1 company, the parts C of 1 company, and the parts D of 2 companies. The reference data 11a to 14b are extracted and stored in the storage device 5. In step S2, it is determined whether or not the parts A to D mounted on the board are purchased parts from a plurality of companies. This determination is performed using, for example, the number of component inspection reference data 11a to 11d stored in the substrate inspection data of the component A. In step S3, parts that are not purchased parts from a plurality of companies, such as part B and part C, are inspected using one kind of part inspection data 12a and 13a, respectively, and a discrimination result is output.
[0016]
In step S3, in the case of parts purchased from a plurality of companies, such as part A and part D, the feature quantity of the inspection target part is extracted from the appearance measurement data 3 shown in FIG. In step S4, these feature amounts are compared with the feature amount data stored in the respective component inspection data 11a to 14b to determine which company the component is. In the type discrimination step S5, component inspection data of the discriminated type is extracted. In the component inspection step S6, inspection is performed using the extracted component inspection data, and the inspection result is output.
[0017]
As described above, according to the inspection method of the first embodiment, the type of component mounted is determined based on the feature amount data, and the component of that type is determined from the board inspection data stored in the storage device 5 (FIG. 1). Inspection data can be selected and inspected. As a result, it is not necessary to replace the component inspection data suitable for the type of mounted component as the substrate inspection data, and it is not necessary to temporarily stop the inspection apparatus. Therefore, the inspection time can be shortened, and complicated operations and mistakes when replacing the substrate inspection data can be prevented.
[0018]
In the mounting component inspection method of the first embodiment, when a plurality of substrates are sequentially inspected, first, feature amount extraction is performed in the first substrate inspection. In the subsequent board inspection for the second and subsequent sheets, inspection is performed using the component inspection data extracted for the first sheet.
In such an inspection method, it is preferable to extract the feature amount only when the inspection result is defective and to use the component inspection reference data suitable for the feature amount. By doing so, it is possible to shorten the time spent for feature extraction and further reduce the inspection time.
[0019]
In this case, when the part inspection data determined by extracting the feature quantity is the same as the first part inspection data, it is possible to further reduce the inspection time by discriminating the defect without performing re-inspection. Since purchased parts from a plurality of manufacturers are not usually changed in type for each board, inspection time can be shortened by omitting feature amount extraction in this way.
[0020]
Example 2
FIG. 4 is a flowchart of the mounting component inspection method according to the second embodiment of the present invention. The second embodiment is different from the first embodiment only in the flow of inspection after the step determined to be a purchased part from a plurality of companies. Therefore, the overlapping description of the same parts as those in the first embodiment in FIGS.
As shown in FIG. 4, in the mounted component inspection method of the second embodiment, in the case of purchased parts from a plurality of companies in step S6, the component inspection data 11a to 11a stored in the storage device 5 in advance as board inspection data. Steps S6a to S6d are inspected using 11d sequentially. Here, for example, if the inspection using the Ap company part inspection data 11a results in a non-defective product, the mounted part is determined to be acceptable as the Ap company part A.
[0021]
As described above, when it is determined that the product is non-defective by at least one component inspection data 11a, the inspection result of the inspection target component is accepted, and the subsequent steps 6a to 6d using the component inspection data 11b to 11d are performed. Inspection can be omitted. As a result, the inspection time can be shortened. Further, since feature quantity extraction is not performed, time spent for steps such as feature quantity extraction and part inspection data discrimination can be omitted.
[0022]
In the mounted component inspection method of the second embodiment shown in FIG. 4, as a method of comprehensively judging from the inspection results based on the respective component inspection data, there is a method of weighting the inspection results by the weighting unit 9 indicated by a dotted line in FIG. is there.
As a weighting method, for example, there is a method of extracting feature amounts from measurement data and increasing the weight of inspection results based on component inspection data determined by the feature amounts. Specifically, as shown in FIG. 2, if the type of the part determined from the reflected light data from the part surface extracted from the measurement data of the part A is from Aq, the inspection result based on the part inspection data 11b Increase the weight of.
[0023]
As another weighting method, the feature quantity extracted from the measurement data is compared with the feature quantity of each part inspection data to obtain a correlation, and each part inspection is performed according to the strength of the correlation. There is a method of weighting inspection results based on data. Specifically, when the reflected light data from the component surface extracted from the measurement data of the component A has a strong correlation with that of Ar in the reflected light data of the respective component inspection data 11a to 11d, The weight of the inspection result based on the component inspection data 11c is increased.
As a result, it is possible to reduce the discrimination error that occurs when discriminating the type of the component based on the feature amount, and the inspection accuracy can be further improved.
[0024]
Example 3
The mounted component inspection method of the third embodiment takes into consideration the inspection time, the number of types of multi-company purchased parts, and the inspection accuracy, and the mounting board inspection method of the first and second embodiments for each inspection target part purchased by the multi-company. It is a method of setting which method to use. As a result, it is possible to perform an inspection optimal for the inspection of the mounting board.
For example, when the type of multi-company purchase parts used on the day is known, the inspection time can be shortened and the inspection accuracy can be improved by preliminarily determining the parts inspection data not to be used.
[0025]
【The invention's effect】
As explained in detail in the above embodiment, in the inspection of a board in which a plurality of types of purchased parts are mounted on a plurality of boards, even if a replacement of different types of parts from different parts manufacturers occurs, the board inspection The mounting board can be inspected without replacing data.
As a result, it is possible to eliminate the time loss that occurs when the board inspection data is replaced and the mistake in replacing the board inspection data, thereby enabling highly efficient and highly accurate inspection.
[Brief description of the drawings]
FIG. 1 is a block diagram showing a configuration of a mounting board visual inspection apparatus according to an embodiment of the present invention. FIG. 2 is a block diagram showing a configuration of board inspection data according to the first embodiment. Flow diagram of substrate inspection method [FIG. 4] Flow diagram of mounting substrate inspection method of embodiment 2 of the present invention [Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Appearance measurement sensor 2 Mounting board 3 Measurement data 4 Board inspection data 5 Storage device 6a Type number discrimination | determination part 6b Feature-value extraction part 6c Type discrimination | determination part 7 Inspection part 9 Weighting part 11 Parts A
11a Ap part inspection data 11b Aq part inspection data 11c Ar part inspection data 11d As part inspection data 12 Part B
12a Bp parts inspection data 13 Part C
13a Cp parts inspection data 14 Part D
14a Dp parts inspection data 14b Dq parts inspection data

Claims (5)

同じ特性でも外観の異なる複数種類の部品が複数枚の基板上の同一対応位置に実装されている部品の外観検査を行う検査方法であって、
予め前記複数種類の部品のそれぞれの種類に対応する部品検査データを記憶手段に記憶させる工程、前記部品検査データに基づき実装されている位置の検査対象部品の種類数を判別する種類数判別工程、前記検査対象部品の外観の特徴量を抽出する特徴量抽出工程、前記検査対象部品の特徴量に基づきその部品の種類を判別する種類判別工程、及び判別した前記検査対象部品の種類に一致した部品検査データを前記記憶手段から選択し、その部品検査データに基づき外観検査を行う工程を有し、
複数枚の基板を順次外観検査する場合、n枚目以降の基板の外観検査においてn−1枚目の基板の外観検査で選択された部品検査データを使用して外観検査を実施し、外観検査の結果不良の判別をした場合に、前記特徴量抽出工程及び前記種類判別工程を実施し、判別した検査対象部品の種類に一致した部品検査データを選択して外観検査を行う、
実装部品検査方法。
An inspection method for inspecting the appearance of parts mounted on the same corresponding position on a plurality of substrates with a plurality of different types of parts having the same characteristics,
A step of storing in a storage means component inspection data corresponding to each type of the plurality of types of components in advance, a number of types determination step of determining the number of types of components to be inspected at positions mounted based on the component inspection data, A feature amount extraction step for extracting the feature amount of the appearance of the inspection target component, a type determination step for determining the type of the component based on the feature amount of the inspection target component, and a component that matches the determined type of the inspection target component select test data from said storage means, have a step of performing a visual inspection based on the component inspection data,
When sequentially inspecting the appearance of a plurality of substrates, the appearance inspection is performed using the component inspection data selected in the appearance inspection of the (n-1) th substrate in the appearance inspection of the nth and subsequent substrates. If the result of the failure is determined, the feature amount extraction step and the type determination step are performed, and the appearance inspection is performed by selecting component inspection data that matches the determined type of the inspection target component.
Mounting component inspection method.
前記検査対象部品の外観の特徴量が、その部品の表面状態による光反射量の相違量であることを特徴とする請求項1記載の実装部品検査方法。  The mounting component inspection method according to claim 1, wherein the feature amount of the appearance of the component to be inspected is a difference in light reflection amount depending on a surface state of the component. 前記検査対象部品の外観の特徴量が、その部品の表面に印刷されたパターンの相違量であることを特徴とする請求項1記載の実装部品検査方法。  2. The mounting component inspection method according to claim 1, wherein the feature amount of the appearance of the inspection target component is a difference amount of a pattern printed on the surface of the component. 前記検査対象部品の外観の特徴量が、その部品の極性マークの表示状態の相違量であることを特徴とする請求項1記載の実装部品検査方法。  2. The mounting component inspection method according to claim 1, wherein the feature amount of the appearance of the component to be inspected is a difference amount of the display state of the polarity mark of the component. 前記検査対象部品の外観の特徴量が、その部品の高さ寸法の相違量であることを特徴とする請求項1記載の実装部品検査方法。  The mounted component inspection method according to claim 1, wherein the feature amount of the appearance of the component to be inspected is a difference amount of the height dimension of the component.
JP2001097037A 2001-03-29 2001-03-29 Mounting component inspection method Expired - Fee Related JP4643848B2 (en)

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JP4998485B2 (en) 2009-01-23 2012-08-15 パナソニック株式会社 Component mounting line and component mounting method
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JPS63257808A (en) * 1987-04-16 1988-10-25 Hitachi Ltd Device for inspecting parts fitting
JPH04259849A (en) * 1991-02-15 1992-09-16 Toshiba Corp Inspecting apparatus
JPH06125196A (en) * 1992-10-12 1994-05-06 Matsushita Electric Ind Co Ltd Part mounting method
JPH07326900A (en) * 1994-05-30 1995-12-12 Matsushita Electric Ind Co Ltd Part inspection method when part is replenished for electronic parts packaging unit
JPH09152317A (en) * 1995-12-01 1997-06-10 Omron Corp Method and apparatus for inspection of mounting component

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63257808A (en) * 1987-04-16 1988-10-25 Hitachi Ltd Device for inspecting parts fitting
JPH04259849A (en) * 1991-02-15 1992-09-16 Toshiba Corp Inspecting apparatus
JPH06125196A (en) * 1992-10-12 1994-05-06 Matsushita Electric Ind Co Ltd Part mounting method
JPH07326900A (en) * 1994-05-30 1995-12-12 Matsushita Electric Ind Co Ltd Part inspection method when part is replenished for electronic parts packaging unit
JPH09152317A (en) * 1995-12-01 1997-06-10 Omron Corp Method and apparatus for inspection of mounting component

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