JP4605948B2 - Warpage measuring apparatus and firing apparatus using the same - Google Patents

Warpage measuring apparatus and firing apparatus using the same Download PDF

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Publication number
JP4605948B2
JP4605948B2 JP2001214745A JP2001214745A JP4605948B2 JP 4605948 B2 JP4605948 B2 JP 4605948B2 JP 2001214745 A JP2001214745 A JP 2001214745A JP 2001214745 A JP2001214745 A JP 2001214745A JP 4605948 B2 JP4605948 B2 JP 4605948B2
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Japan
Prior art keywords
setter
roller conveyor
warpage
firing
glass substrate
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JP2001214745A
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JP2003028632A (en
Inventor
晃一 旭
秀 黒澤
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Dai Nippon Printing Co Ltd
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Dai Nippon Printing Co Ltd
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Description

【0001】
【発明の属する技術分野】
本発明は、板状物の反り測定装置であって、特にローラコンベア上を搬送されている板状物の反り状態を測定する反り測定装置とそれを用いた焼成装置に関するものである。
【0002】
【従来の技術】
プラズマディスプレイ用基板などの電子部品としてのガラス基板は、その上に電極やリブなどの多数の構成要素を形成しているが、その構成要素の形成工程を通じて、ガラス基板の反り状態を管理することが重要である。特に、ガラス基板上に形成した構成要素を焼き固める焼成工程においては、後述のように、ガラス基板を載置するセッターの反りがガラス基板の反りに影響するため、セッターの反りを管理することが重要になってくる。
【0003】
従来より、この種のガラス基板上に形成された構成要素を焼き固める焼成炉としては図1に示すタイプのものが一般に使用されている。通常、構成要素である電極やリブの焼成温度は500〜600℃であるが、ローラコンベア上でガラス基板を搬送しながらこの温度で焼成処理を行うと、搬送の影響でガラス基板に反りや歪が生じてしまう。このため、図1に示すように、焼成中でも軟化しない耐熱性のセッターSの上にガラス基板Gを乗せた状態で焼成を行うようになっている。これにより、ガラス基板の熱変形が防止されるとともに、搬送系との接触による傷付きも防止される。プラズマディスプレイ用基板の焼成には、この焼成処理用セッターとして結晶化ガラス板(例えば、日本電気硝子製「ネオセラムN−O」)が用いられている。その他にセラミックス等で大判の板状のものを使用することも好ましい。
【0004】
図1に示す焼成装置では、まず焼成炉本体1の外においてリフターコンベア2の上段位置にあるセッターSの上にガラス基板Gが載せられる。そして、ガラス基板GはセッターSと共に入口コンベア3により焼成炉本体1における上段通路の中に導入され、そのままセッターSと共にローラコンベアで搬送されながら加熱部にて常温から500〜600℃程度のピーク温度まで加熱された後、徐冷部にて400℃程度にまで冷却される。次いで、上段通路の端まで搬送されたところでガラス基板GはセッターSと共にリフターコンベア4により下段通路に降下され、下段通路内をローラコンベアで逆方向に搬送されながら冷却部にて常温まで戻される。ガラス基板Gを載せたセッターSが出口まで到達すると、出口コンベア5によりリフターコンベア2に移し替えられ、そこで焼成を終えたガラス基板Gが除去される。そして、空になったセッターSはリフターコンベア2で上段位置に移動し、ここで次のガラス基板Gが載置されて焼成工程が繰り返される。このタイプの焼成装置では、上段通路の天井および床にヒーターが連続的に設置されており、これらのヒーターにより上記の如く焼成温度を管理するようになっている。このタイプの焼成装置においては、等速度で搬送する連続搬送方式が主流であったが、ガラス基板の品質を維持したり焼成時の割れを防止するため、最近では各処理ゾーンでガラス基板を所定時間停止させる、いわゆるタクト搬送方式を採用したものが増加している。
【0005】
【発明が解決しようとする課題】
上記のように、ガラス基板は耐熱性のセッターの上に載置された状態で焼成が行われる。したがって、セッターの反り状態がガラス基板の反りに直接影響する。このため、セッターはその反り状態をチェックし、反りが大きくなったと判断されれば交換する必要がある。しかしながら、セッターは焼成炉本体内をローラコンベアで搬送されて循環しているので、焼成炉本体の出口を出たところで取り出し、手で直定規を当てて反りを測定しているのが現状であり、人手がかかる上に効率も悪いことから、簡便な反り測定手段が望まれている。
【0006】
本発明は、上記のような事情に鑑みてなされたものであり、その目的とするところは、ローラコンベア上を搬送されている板状物の反り状態を簡便に測定することのできる反り測定装置を提供し、併せてそれを用いた焼成装置を提供することにある。
【0007】
【課題を解決するための手段】
上記の目的を達成するため、本発明の反り測定装置は、ローラコンベア上を別々に搬送されている個別の板状物の反り状態を測定する装置であって、板状物をローラコンベアの所定位置で停止して一定時間保持する保持手段と、板状物における複数のポイントの高さ位置を測定する高さ測定手段と、測定した値をそのまま若しくは演算して表示する表示手段とを備え、前記高さ測定手段は、ローラコンベアの搬送ラインの下方にあってその搬送ラインと平行で且つ昇降可能な横方向のフレームと、それぞれがローラコンベアのローラの間に順次位置するようにフレームに取り付けられた複数のダイヤルゲージとからなり、保持手段により板状物が一定時間保持される間に、フレームが上昇してダイヤルゲージのスピンドル先端の測定子が板状物の裏面に当接することで板状物における複数のポイントの高さ位置を測定するように構成されたことを特徴としている。
【0009】
また、本発明の焼成装置は、耐熱性のセッターにガラス基板を載せた状態で焼成炉本体の中を搬送しながらガラス基板の焼成を行う焼成装置であって、焼成炉本体の出口と入口とを繋ぐローラコンベアからなる循環経路が設けられており、セッターの反り状態を測定するために、セッターの循環経路の途中に上記構成の反り測定装置を設置したことを特徴としている。
【0010】
【発明の実施の形態】
以下、本発明の実施の形態について図面を参照して説明する。
【0011】
図2は本発明の反り測定装置を示す概略構成図であり、ローラコンベア10で搬送される板状物Bが図示の如く反り測定装置のところで停止した状態を示している。
【0012】
図2において、11はローラコンベア10の搬送ラインと平行で且つ昇降可能な横方向のフレームであり、両端と中央の3箇所にそれぞれダイヤルゲージ12が取り付けられている。このダイヤルゲージ12の付いたフレーム11は、図では見えないが、紙面に垂直な方向に3本配置されている。板状物Bはローラコンベア10上で図2に示す位置で停止して一定時間保持され、その保持される間にフレーム11とダイヤルゲージ12からなる高さ測定手段により板状物Bの反り状態が測定される。具体的には、フレーム11が上昇して、ダイヤルゲージ12のスピンドル先端の測定子が板状物Bの裏面に当接することで、図3に示すように、板状物Bにおける9つのポイントPの高さ位置を測定する。
【0013】
3つのダイヤルゲージ12で測定した値は、演算装置13に送られ、ここで予め決められた手順にしたがって演算が行われ、その演算結果が表示装置14に表示される。また、必要に応じてプリンター15により出力もできる。なお、場合によっては、ダイヤルゲージ12で測定した結果をそのまま表示したりプリントアウトするように構成することもできる。
【0015】
図4は図2に示す反り測定装置を用いた焼成装置の一例を示す概略図である。この焼成装置は、焼成炉本体20の入口21に焼成前のガラス基板をセッターに載せる搭載装置と、焼成炉本体20の出口22に焼成後のガラス基板をセッターから取り外す除去装置とが設けられ、さらに出口22と入口21とを繋ぐローラコンベアからなる循環経路23が設けられ、この循環経路23の途中に図2に示す如き反り測定装置24が設置されている。
【0016】
この図4に示す焼成装置では、焼成炉本体20の入口21にてセッターの上にガラス基板が載せられ、次いでガラス基板はセッターと共に焼成炉本体20に投入され、焼成炉本体20内をローラコンベアにて搬送されながら焼成が行われた後、出口22においてセッター上から取り出される。次いで、空になったセッターがローラコンベアで構成された循環経路23を搬送され、入口21へと戻っていくが、この循環経路23の途中にある反り測定装置24でセッターの反り状態を測定するようになっている。そして、測定したセッターの反りが大きいと新しいものと入れ替える。
【0017】
図5は図2に示す反り測定装置を用いた焼成装置の別の例を示す概略図である。この焼成装置では、焼成炉本体20の入口21に焼成前のガラス基板をセッターに載せる搭載装置が設けられ、焼成炉本体20の出口22と入口21を繋ぐローラコンベアからなる循環経路23が設けられており、この循環経路23が焼成炉本体20の入口21に至る直前のところに焼成後のガラス基板をセッターから取り外す除去装置が設けられ、循環経路23の途中に図2に示す如き反り測定装置24が設置されている。
【0018】
この図5に示す焼成装置では、焼成炉本体20の入口21にてセッターの上にガラス基板が載せられ、次いでガラス基板はセッターと共に焼成炉本体20に投入され、焼成炉本体20内をローラコンベアにて搬送されながら焼成が行われた後、出口22から排出される。次いで、ガラス基板を載せたままのセッターがローラコンベアで構成された循環経路23を搬送され、焼成炉本体20の入口21の手前にある除去装置のところに到達するが、この循環経路23の途中にある反り測定装置24でセッターの反り状態を測定するようになっている。除去装置により焼成後のガラス基板がセッター上から取り出される。次いで、空になったセッターが焼成炉本体20の入口21に運ばれ、そこで再び焼成前のガラス基板がセッターに載置される。この時、測定したセッターの反りが大きいと新しいものと入れ替える。
【0019】
以上、本発明の実施の形態について詳細に説明してきたが、本発明による反り測定装置及びそれを用いた焼成装置は、上記した実施の形態に何ら限定されるものではなく、本発明の趣旨を逸脱しない範囲において種々の変更が可能であることは当然のことである。
【0020】
【発明の効果】
以上説明したように、本発明の反り測定装置は、ローラコンベア上を別々に搬送されている個別の板状物の反り状態を測定する装置であって、板状物をローラコンベアの所定位置で停止して一定時間保持する保持手段と、板状物における複数のポイントの高さ位置を測定する高さ測定手段と、測定した値をそのまま若しくは演算して表示する表示手段とを備え、前記高さ測定手段は、ローラコンベアの搬送ラインの下方にあってその搬送ラインと平行で且つ昇降可能な横方向のフレームと、それぞれがローラコンベアのローラの間に順次位置するようにフレームに取り付けられた複数のダイヤルゲージとからなり、保持手段により板状物が一定時間保持される間に、フレームが上昇してダイヤルゲージのスピンドル先端の測定子が板状物の裏面に当接することで板状物における複数のポイントの高さ位置を測定するように構成されたことを特徴としているので、搬送中に所定の位置で板状物を停止させ、高さ測定手段にて複数のポイントの高さ位置を測定することにより、板状物の反り状態を簡単に測定することができる。
【0021】
そして、この反り測定装置を焼成装置に用いることにより、インラインで基板やセッターの反りを測定することができ、今まで手で行っていた反り量の測定作業に比べ、作業者の負担を大幅に減らすことができる。
【図面の簡単な説明】
【図1】焼成装置の一例を示す概略構成図である。
【図2】本発明の反り測定装置を示す概略構成図である。
【図3】板状物の測定ポイントを示す説明図である。
【図4】図2に示す反り測定装置を用いた焼成装置の一例を示す概略図である。
【図5】図2に示す反り測定装置を用いた焼成装置の別の例を示す概略図である。
【符号の説明】
G ガラス基板
S セッター
B 板状物
1 焼成炉本体
2 リフターコンベア
3 入口コンベア
4 リフターコンベア
5 出口コンベア
10 ローラコンベア
11 フレーム
12 ダイヤルゲージ
13 演算装置
14 表示装置
15 プリンター
20 焼成炉本体
21 入口
22 出口
23 循環経路
24 反り測定装置
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a warpage measuring device for a plate-like object, and more particularly to a warpage measuring device for measuring a warpage state of a plate-like material being conveyed on a roller conveyor and a baking apparatus using the warpage measuring device.
[0002]
[Prior art]
A glass substrate as an electronic component such as a plasma display substrate has a number of components such as electrodes and ribs formed on it, and the warpage state of the glass substrate must be managed through the component formation process. is important. In particular, in the firing step of baking and solidifying the components formed on the glass substrate, as described later, the warpage of the setter on which the glass substrate is placed affects the warpage of the glass substrate. It becomes important.
[0003]
Conventionally, the type shown in FIG. 1 is generally used as a baking furnace for baking and solidifying components formed on this type of glass substrate. Normally, the firing temperature of the constituent electrodes and ribs is 500 to 600 ° C. However, if the firing treatment is carried out at this temperature while the glass substrate is being transported on a roller conveyor, the glass substrate is warped or distorted due to the transport effect. Will occur. For this reason, as shown in FIG. 1, baking is performed with a glass substrate G placed on a heat-resistant setter S that does not soften even during baking. This prevents thermal deformation of the glass substrate and prevents damage due to contact with the transport system. For firing the plasma display substrate, a crystallized glass plate (for example, “Neoceram NO” manufactured by Nippon Electric Glass) is used as the setter for the firing treatment. In addition, it is also preferable to use a large plate of ceramics or the like.
[0004]
In the baking apparatus shown in FIG. 1, first, a glass substrate G is placed on the setter S at the upper position of the lifter conveyor 2 outside the baking furnace body 1. Then, the glass substrate G is introduced into the upper passage in the baking furnace body 1 by the entrance conveyor 3 together with the setter S, and is transported by the roller conveyor with the setter S as it is at a normal temperature to about 500 to 600 ° C. in the heating unit. And then cooled to about 400 ° C. in the slow cooling part. Next, when the glass substrate G is conveyed to the end of the upper passage, the glass substrate G is lowered to the lower passage by the lifter conveyor 4 together with the setter S, and is returned to room temperature in the cooling section while being conveyed in the reverse direction in the lower passage by the roller conveyor. When the setter S on which the glass substrate G is placed reaches the outlet, the setter S is transferred to the lifter conveyor 2 by the outlet conveyor 5, where the glass substrate G that has been baked is removed. And the setter S which became empty moves to the upper stage position with the lifter conveyor 2, and the next glass substrate G is mounted here and a baking process is repeated. In this type of baking apparatus, heaters are continuously installed on the ceiling and floor of the upper passage, and the baking temperature is controlled as described above by these heaters. In this type of baking equipment, the continuous transfer method of transferring at a constant speed was the mainstream, but recently, in order to maintain the quality of the glass substrate and prevent cracking during baking, the glass substrate is predetermined in each processing zone. The number of machines that employ a so-called tact transport system that stops for a period of time is increasing.
[0005]
[Problems to be solved by the invention]
As described above, the glass substrate is fired in a state of being placed on a heat-resistant setter. Therefore, the warpage state of the setter directly affects the warpage of the glass substrate. For this reason, the setter needs to check the warpage state and replace it if it is determined that the warpage has increased. However, since the setter is circulated by being conveyed by a roller conveyor in the main body of the firing furnace, it is taken out at the exit of the main body of the firing furnace, and the warpage is measured by applying a straight ruler by hand. In addition, since it is labor intensive and inefficient, a simple warp measuring means is desired.
[0006]
The present invention has been made in view of the circumstances as described above, and the object of the present invention is to provide a warp measuring device that can easily measure the warp state of a plate-like object being conveyed on a roller conveyor. And a baking apparatus using the same.
[0007]
[Means for Solving the Problems]
To achieve the above object, warpage measuring apparatus of the present invention is an apparatus for measuring the warpage state of the individual plate-like object being conveyed on the roller conveyor separately, the plate-like material of the roller conveyor predetermined comprising holding means for holding a predetermined time and stopped at the position, and height measuring means for measuring a height position of a plurality of points in a plate-like workpiece, and a display means for displaying the measured values directly or calculated by, The height measuring means is attached to the frame so that it is located below the roller conveyor transport line and parallel to the transport line and can be moved up and down, and each of them is sequentially positioned between the rollers of the roller conveyor. The dial rises and the probe on the spindle tip of the dial gauge is plate-shaped while the plate-like object is held for a certain period of time by the holding means. It is characterized in that it is configured to measure the height position of the plurality of points in a plate-like workpiece by abutting the rear surface of the.
[0009]
The firing apparatus of the present invention is a firing apparatus for firing a glass substrate while transporting the inside of the firing furnace main body with the glass substrate placed on a heat-resistant setter, and includes an outlet and an inlet of the firing furnace main body. A circulation path composed of roller conveyors connecting the two is provided, and in order to measure the warpage state of the setter, the warpage measuring device having the above configuration is installed in the middle of the circulation path of the setter.
[0010]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0011]
FIG. 2 is a schematic configuration diagram showing the warpage measuring apparatus of the present invention, and shows a state where the plate-like object B conveyed by the roller conveyor 10 is stopped at the warpage measuring apparatus as shown.
[0012]
In FIG. 2, reference numeral 11 denotes a horizontal frame that is parallel to the transport line of the roller conveyor 10 and can be moved up and down, and dial gauges 12 are respectively attached to the both ends and the center. Although the frame 11 with the dial gauge 12 is not visible in the figure, three frames 11 are arranged in a direction perpendicular to the paper surface. The plate-like object B stops on the roller conveyor 10 at the position shown in FIG. 2 and is held for a certain period of time. During the holding, the plate-like object B is warped by the height measuring means comprising the frame 11 and the dial gauge 12. Is measured. Specifically, when the frame 11 is raised and the probe at the tip of the spindle of the dial gauge 12 contacts the back surface of the plate-like object B, nine points P on the plate-like object B are obtained as shown in FIG. Measure the height position.
[0013]
The values measured by the three dial gauges 12 are sent to the calculation device 13, where calculation is performed according to a predetermined procedure, and the calculation result is displayed on the display device 14. Moreover, it can also be output by the printer 15 as needed. In some cases, the result measured with the dial gauge 12 can be displayed or printed out as it is.
[0015]
FIG. 4 is a schematic view showing an example of a baking apparatus using the warp measuring apparatus shown in FIG. This firing apparatus is provided with a mounting device for placing the glass substrate before firing on the setter at the entrance 21 of the firing furnace body 20, and a removal device for removing the glass substrate after firing from the setter at the exit 22 of the firing furnace body 20, Further, a circulation path 23 composed of a roller conveyor connecting the outlet 22 and the inlet 21 is provided, and a warp measuring device 24 as shown in FIG.
[0016]
In the firing apparatus shown in FIG. 4, a glass substrate is placed on the setter at the entrance 21 of the firing furnace body 20, and then the glass substrate is put into the firing furnace body 20 together with the setter. After being baked while being conveyed at, it is taken out from the setter at the outlet 22. Next, the setter that has been emptied is transported through the circulation path 23 constituted by the roller conveyor and returns to the inlet 21. The warpage measuring device 24 in the middle of the circulation path 23 measures the warpage state of the setter. It is like that. If the measured setter warpage is large, it is replaced with a new one.
[0017]
FIG. 5 is a schematic view showing another example of a baking apparatus using the warp measuring apparatus shown in FIG. In this baking apparatus, a mounting device for placing a glass substrate before baking on a setter is provided at the inlet 21 of the baking furnace body 20, and a circulation path 23 including a roller conveyor connecting the outlet 22 and the inlet 21 of the baking furnace body 20 is provided. A removal device for removing the fired glass substrate from the setter is provided immediately before the circulation path 23 reaches the inlet 21 of the baking furnace body 20, and a warp measuring device as shown in FIG. 24 is installed.
[0018]
In the firing apparatus shown in FIG. 5, a glass substrate is placed on the setter at the entrance 21 of the firing furnace body 20, and then the glass substrate is put into the firing furnace body 20 together with the setter. After being baked while being conveyed at, it is discharged from the outlet 22. Next, the setter with the glass substrate placed thereon is conveyed through a circulation path 23 constituted by a roller conveyor and reaches a removal device in front of the inlet 21 of the baking furnace body 20. The warpage measuring device 24 measures the setter warpage. The glass substrate after baking is taken out from the setter by the removing device. Next, the emptied setter is conveyed to the entrance 21 of the baking furnace body 20, where the glass substrate before baking is again placed on the setter. At this time, if the measured setter warpage is large, it is replaced with a new one.
[0019]
As described above, the embodiment of the present invention has been described in detail. However, the warpage measuring apparatus and the firing apparatus using the same according to the present invention are not limited to the above-described embodiment, and the gist of the present invention is not limited. Naturally, various changes can be made without departing from the scope.
[0020]
【The invention's effect】
As described above, warpage measuring apparatus of the present invention is an apparatus for measuring the warpage state of the individual plate-like object being conveyed on the roller conveyor separately, the plate-like material at a predetermined position of the roller conveyor Holding means for stopping and holding for a certain period of time; height measuring means for measuring the height positions of a plurality of points on the plate-like object; and display means for displaying the measured values as they are or after calculating , The height measuring means is attached to the frame so as to be positioned between the rollers of the roller conveyor, and a lateral frame which is below the roller conveyor transport line and parallel to the transport line and which can be moved up and down. While the plate is held by the holding means for a certain period of time, the frame rises and the probe at the tip of the dial gauge spindle Because characterized in that it is configured to measure the height position of the plurality of points in a plate-like workpiece by contact, the plate-like material is stopped at a predetermined position during the transport, the height measuring means By measuring the height positions of a plurality of points, the warpage state of the plate-like object can be easily measured.
[0021]
And, by using this warpage measuring device for the firing device, it is possible to measure the warpage of the substrate and setter in-line, which greatly reduces the burden on the operator compared to the work of measuring the amount of warpage that has been done by hand until now. Can be reduced.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram showing an example of a baking apparatus.
FIG. 2 is a schematic configuration diagram showing a warpage measuring apparatus of the present invention.
FIG. 3 is an explanatory diagram showing measurement points of a plate-like object.
4 is a schematic view showing an example of a baking apparatus using the warp measuring apparatus shown in FIG.
FIG. 5 is a schematic view showing another example of a baking apparatus using the warp measuring apparatus shown in FIG. 2;
[Explanation of symbols]
G glass substrate S setter B plate 1 firing furnace body 2 lifter conveyor 3 entrance conveyor 4 lifter conveyor 5 exit conveyor 10 roller conveyor 11 frame 12 dial gauge 13 computing device 14 display device 15 printer 20 firing furnace body 21 entrance 22 exit 23 Circulation path 24 Warpage measurement device

Claims (2)

ローラコンベア上を別々に搬送されている個別の板状物の反り状態を測定する装置であって、板状物をローラコンベアの所定位置で停止して一定時間保持する保持手段と、板状物における複数のポイントの高さ位置を測定する高さ測定手段と、測定した値をそのまま若しくは演算して表示する表示手段とを備え、前記高さ測定手段は、ローラコンベアの搬送ラインの下方にあってその搬送ラインと平行で且つ昇降可能な横方向のフレームと、それぞれがローラコンベアのローラの間に順次位置するようにフレームに取り付けられた複数のダイヤルゲージとからなり、保持手段により板状物が一定時間保持される間に、フレームが上昇してダイヤルゲージのスピンドル先端の測定子が板状物の裏面に当接することで板状物における複数のポイントの高さ位置を測定するように構成されたことを特徴とする反り測定装置。A device for measuring the warping state of individual plate-like objects conveyed separately on a roller conveyor, the holding means for stopping the plate-like object at a predetermined position on the roller conveyor and holding it for a certain period of time, and the plate-like object A height measuring means for measuring the height positions of a plurality of points, and a display means for displaying the measured values as they are or after being calculated. The height measuring means is located below the conveying line of the roller conveyor. A horizontal frame that is parallel to the conveying line and that can be raised and lowered, and a plurality of dial gauges attached to the frame so as to be sequentially positioned between the rollers of the roller conveyor. While the frame is held for a certain period of time, the frame rises and the probe at the tip of the dial gauge spindle abuts against the back of the plate-like object. Warpage measuring apparatus characterized by being configured to measure the height position of the. 耐熱性のセッターにガラス基板を載せた状態で焼成炉本体の中を搬送しながらガラス基板の焼成を行う焼成装置であって、焼成炉本体の出口と入口とを繋ぐローラコンベアからなる循環経路が設けられており、セッターの反り状態を測定するために、セッターの循環経路の途中に請求項1に記載の反り測定装置を設置したことを特徴とする焼成装置。A firing apparatus for firing a glass substrate while transporting the inside of the firing furnace body in a state where the glass substrate is placed on a heat-resistant setter, and a circulation path including a roller conveyor connecting the exit and the entrance of the firing furnace body A calcining apparatus which is provided and has the warpage measuring device according to claim 1 installed in the middle of a circulation path of the setter in order to measure a warpage state of the setter.
JP2001214745A 2001-07-16 2001-07-16 Warpage measuring apparatus and firing apparatus using the same Expired - Fee Related JP4605948B2 (en)

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